阅读说明：本技术 显示面板的线路缺陷的检测方法 (Method for detecting line defect of display panel ) 是由 陈少甫 于 2020-12-24 设计创作，主要内容包括：本揭示实施例提供一种显示面板的线路缺陷的检测方法,先采集显示面板对应的线路布线区,并将采集到的信息转化成对应的图像,然后对得到的图像进行解析,分别对同一区域内的像素进行标记,然后根据所有的标记结果对显示面板的线路布线结构进行分析。本揭示实施例中通过将线路转化为像素单元,并根据像素单元对应的标记结果进行判断,检测方法简单高效且精度高,检测效果好。(The embodiment of the disclosure provides a method for detecting a line defect of a display panel, which includes the steps of firstly collecting a line wiring area corresponding to the display panel, converting collected information into a corresponding image, then analyzing the obtained image, respectively marking pixels in the same area, and then analyzing a line wiring structure of the display panel according to all marking results. In the embodiment of the disclosure, the line is converted into the pixel unit, and the judgment is performed according to the marking result corresponding to the pixel unit, so that the detection method is simple, efficient, high in precision and good in detection effect.)

1. A method for detecting line defects of a display panel is characterized by comprising the following steps:

s100: collecting a region to be detected of the display panel, and converting the collected region to be detected into an image;

s101: dividing a boundary of the arrangement line corresponding to the image into a scanning starting end and a scanning ending end, and scanning the image;

s102: marking each scanned pixel from the beginning of scanning to the end of scanning to obtain marking data;

s103: and comparing the pixels according to the marking data, wherein in the same region, if the marking data of the marked pixels are the same and the marking data of the marked pixels in two adjacent regions are different, the line is free of defects.

2. The method according to claim 1, wherein when the region to be detected of the display panel is collected, the region to be detected is divided into a plurality of sub-detection regions for collection.

3. The method for detecting line defects of a display panel according to claim 1, wherein in step S101, scanning is performed along the scanning start end to the scanning end.

4. The method for detecting circuit defects of a display panel according to claim 1, wherein the same area in step S102 comprises a bright area or a dark area, the bright area is a wiring area of the display panel, and the dark area is a non-wiring area of the display panel.

5. The method of claim 4, wherein the bright area or the dark area is labeled in sequence.

6. The method as claimed in claim 5, wherein during the scanning process, if the same pixel is marked by at least two regions and there are two different marking data, the line corresponding to the pixel is short-circuited.

7. The method as claimed in claim 5, wherein the lines corresponding to two adjacent bright regions do not intersect with each other.

8. The method as claimed in claim 4, wherein after the scanning is completed, if the mark data of the pixel corresponding to the ith row of bright area is different from the mark data of the pixel corresponding to the ith row of bright area, the line is broken at the pixel corresponding to the ith row, and i is an integer greater than 1.

9. The method for detecting line defects of a display panel according to claim 1, wherein in the step S102, during the marking, the pixels corresponding to the bright regions are marked as first marks, the data corresponding to the dark regions are marked as second marks, and the first marks and the second marks are different.

10. The method as claimed in claim 9, wherein the line defect is detected if the first mark and the second mark are present in the same bright area or the same dark area.

Technical Field

The disclosure relates to the technical field of display panels, and in particular relates to a method for detecting line defects of a display panel.

Background

With the continuous development of display technology, the performance and quality of each display device are continuously improved to meet various use requirements of users.

Therefore, the quality of the display panel directly affects the user experience. In order to ensure that the display panel leaving the factory is a qualified product, the display panel needs to be detected. Among them, the Automatic Optical Inspection (AOI) is a major device for detecting defects in display panels and semiconductor industries. In the existing detection technology, firstly, an imaging unit images a detection object and performs gray scale digital processing, and then, the defect problem is detected by utilizing image comparison. However, the above detection is mainly performed by a line arrangement structure having a periodic distribution rule. For the detection of products with other structures, a surface-to-surface (P2P) comparison method or a comparison method between substrates is mainly adopted for detection, but the detection accuracy is low due to the comparison distance far exceeding the pixel period and the problem of chromatic aberration of the display Panel film forming itself, many false defects can be detected, and the detection effect is not ideal.

In summary, in the prior art, when the quality of the display panel is detected, the detection precision and the detection efficiency are often low, and even a false defect is detected, so that a problem product cannot be found out well, and the detection effect is not ideal.

Disclosure of Invention

The embodiment of the disclosure provides a method for detecting a circuit defect of a display panel, so as to solve the problems of low detection precision, unsatisfactory detection effect and the like when a product is detected in the prior art.

To solve the above technical problem, the technical solution provided by the embodiment of the present disclosure is as follows:

according to a first aspect of the embodiments of the present disclosure, there is provided a method for detecting a line defect of a display panel, including the steps of:

s100: collecting a region to be detected of the display panel, and converting the collected region to be detected into an image;

s101: dividing a boundary of the arrangement line corresponding to the image into a scanning starting end and a scanning ending end, and scanning the image;

s102: marking each scanned pixel from the beginning of scanning to the end of scanning to obtain marking data;

s103: and comparing the pixels according to the marking data, wherein in the same region, if the marking data of the marked pixels are the same and the marking data of the marked pixels in two adjacent regions are different, the line is free of defects.

According to an embodiment of the disclosure, when the region to be detected of the display panel is collected, the region to be detected is divided into a plurality of sub-detection regions for collection.

According to an embodiment of the present disclosure, in the step S101, scanning is performed along the scanning start end to the scanning end.

According to an embodiment of the present disclosure, in the step S102, the same area includes a bright area or a dark area, the bright area is a wiring area of the display panel, and the dark area is a non-wiring area of the display panel.

According to an embodiment of the present disclosure, the bright regions or the dark regions are labeled in sequence.

According to an embodiment of the present disclosure, in a scanning process, if a same pixel is marked by at least two regions and there are two different marking data, a line corresponding to the pixel is short-circuited.

According to an embodiment of the present disclosure, the lines corresponding to two adjacent bright regions do not intersect with each other.

According to an embodiment of the present disclosure, after the scanning is completed, if the marking data of the pixel corresponding to the ith row of bright areas is different from the marking data of the pixel corresponding to the ith row of bright areas, the line is disconnected at the pixel corresponding to the ith row, and i is an integer greater than 1.

In step S102, during the marking, the corresponding pixels in the bright area are marked as a first mark, the corresponding data in the dark area is marked as a second mark, and the first mark and the second mark are different.

According to an embodiment of the present disclosure, if the first mark and the second mark exist in the same bright area or the same dark area, the line has a defect.

In summary, the beneficial effects of the embodiment of the present disclosure are:

the method for detecting the line defect of the display panel, provided by the embodiment of the disclosure, includes the steps of firstly collecting a line wiring area corresponding to the display panel, converting collected information into a corresponding image, then analyzing the obtained image, respectively marking pixels in the same area, and then analyzing a line wiring structure of the display panel according to all marking results. In the embodiment of the disclosure, the line is converted into the pixel unit, and the judgment is performed according to the marking result corresponding to the pixel unit, so that the detection method is simple and efficient, the detection precision is high, the defects existing in the line wiring can be visually presented, and the detection effect is good.

Drawings

In order to illustrate the embodiments or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some of the disclosed embodiments, and that other drawings can be obtained by those skilled in the art without inventive effort.

FIG. 1 is a schematic diagram illustrating a method for inspecting a display panel according to the prior art;

FIG. 2 is a method for detecting a line defect of a display panel according to an embodiment of the present disclosure;

fig. 3 is a schematic diagram of an imaging structure of a circuit region corresponding to a display panel according to an embodiment of the disclosure;

FIG. 4 is a schematic view of a scanned image of a display panel according to an embodiment of the disclosure;

fig. 5-6 are schematic diagrams illustrating defect imaging of a metal line according to an embodiment of the disclosure.

Detailed Description

The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present disclosure. It is to be understood that the described embodiments are merely illustrative of some, but not all embodiments of the disclosure. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any inventive step, are intended to be within the scope of the present disclosure.

The circuit layout inside the display panel is complex, so that the quality of the set circuit is generally required to be detected after the preparation of each process of the display panel is completed, the detection precision is low in the traditional detection means, the detection process is complex, and the defects of the circuit area cannot be reflected visually.

In the embodiment of the disclosure, a method for detecting a line defect of a display panel is provided to improve the detection precision and the detection effect.

As shown in fig. 1, fig. 1 is a schematic diagram of a detection method of a display panel in the prior art. The display panel includes a first circuit area 100, a second circuit area 101, and a third circuit area 102, wherein the first circuit area 100, the second circuit area 101, and the third circuit area 102 are sequentially disposed. When the line arrangement is defect-free, the brightness of the pixels corresponding to the first line region 100, the second line region 101, and the third line region 102 are the same, but when the line is defective, the brightness of the pixels at the defective region is changed.

Therefore, normally, the first sub-pixel area 104 and the third sub-pixel area 105 in the first circuit area 100 and the third circuit area 102 are all identical, but there is a difference between the corresponding second sub-pixel area 103 in the second circuit area 101 and other circuit areas due to the defect of the circuit in the second circuit area 101. However, when the wiring structure of the display panel is not periodically distributed, the structures in the respective circuit regions are not completely the same, and the detection method described above is disabled.

As shown in fig. 2, fig. 2 is a method for detecting a line defect of a display panel according to an embodiment of the disclosure, the method includes the following steps:

s100: collecting a region to be detected of the display panel, and converting the collected region to be detected into an image;

in the embodiment of the disclosure, a display panel to be detected is selected, a circuit setting area to be detected of the display panel is selected at the same time, and after the area to be detected is determined, information acquisition is performed on the detection area.

Specifically, when the area to be detected of the display panel is collected, the area to be detected can be shot into an image directly through equipment, and when the area to be detected is shot into an image, the collected image can form an image with light and dark intervals by utilizing auxiliary equipment such as an automatic optical inspection machine and the like in the imaging process.

Preferably, as shown in fig. 3, fig. 3 is a schematic diagram of an imaging structure of a circuit area corresponding to a display panel provided by the embodiment of the disclosure. In the embodiment of the present disclosure, the sector of the display panel is taken as an example for illustration, and the circuit layout of the sector is complex and is prone to defects such as cracks.

The sector 31 comprises a metal track 30, the metal track 30 comprising two parts, a flat area and the sector 31 connected to the flat area. In the disclosed embodiment, the structures within the sector 31 are directly acquired and imaged.

When the detection area is imaged through the automatic optical inspection machine, the metal line is arranged in the fan-shaped area, and when light irradiates on the metal line, the light emitting capacity of the metal line is strong, so that the pixel gray scale of the image corresponding to the metal line is a bright area, and the area without wiring is a dark area due to the fact that the light cannot be reflected.

Furthermore, when the area to be detected is collected, the area to be detected can be divided into a plurality of sub-detection areas corresponding to the circuit arrangement area with the larger area to be detected, and then each sub-detection area is collected and imaged.

S101: dividing a boundary of the arrangement line corresponding to the image into a scanning starting end and a scanning ending end, and scanning the image;

and after the metal circuit structure to be detected is acquired, scanning the acquired image. Specifically, the boundary on the side where the metal wiring starts, i.e., the side boundary of the outermost end of the corresponding wire in the image, is set as the scanning start end a and the scanning end b, as shown by boundary lines a-b in fig. 3. In the scanning process, scanning is performed along the scanning start end a to the scanning end b.

Further, since a plurality of metal lines are disposed in the wiring area of the display panel, in the embodiment of the present disclosure, each scanned metal trace is numbered beginning with the scanning start end a as a mark, and preferably, the metal traces are numbered according to the sequence of 1, 2, 3. The metal line 301 is labeled as the ith metal line, and the metal line 302 is labeled as the (i + 1) th metal line, where i and N are positive integers.

Therefore, after the marking is completed, each metal wire corresponds to a number, and the imaging condition on the same numbered metal wire is the same under normal conditions.

Preferably, when the imaged image is marked, the dark area can also be directly marked. When the dark area is marked, the marking of the bright area can be performed in a manner that the marking of the dark area is not described in detail.

S102: marking each scanned pixel from the beginning of scanning to the end of scanning to obtain marking data;

in the embodiment of the disclosure, since the wiring area of the display panel is provided with the metal circuit, when imaging, a bright area is formed due to strong reflection of metal, and a dark area is formed due to poor reflection of light by an area without wiring.

Preferably, in fig. 3, because the imaging conditions of the metal traces and the non-wiring lines are different, a picture with alternating bright areas and dark areas is formed, and when there is no defect in the lines, the metal lines corresponding to two adjacent bright areas do not intersect with each other.

The embodiments of the present disclosure are illustrated with bright-area labels as examples. As shown in fig. 4, fig. 4 is a schematic view of a scanned image of a display panel according to an embodiment of the disclosure. And selecting a part of scanning images of the area to be detected for description.

The scanned image includes a bright area 403 and a dark area 402, wherein the bright area 403 corresponds to metal traces of the display panel, and the dark area 402 corresponds to an un-routed area of the display panel. Each pixel in the scanning process is marked simultaneously, i.e. each corresponding first sub-pixel 400 in the bright area 403, preferably the first sub-pixel may be marked as a first mark, e.g. marked as a, while each corresponding second sub-pixel 401 in the dark area 402 may be marked as a second mark, e.g. marked as B. And the pixels of these marks are recorded resulting in a series of mark data values, wherein the first mark and the second mark are different.

And if the mark A and the mark B exist in the same bright area or the same dark area, the line has defects.

S103: and comparing the pixels according to the marking data, wherein in the same region, if the marking data of the marked pixels are the same and the marking data of the marked pixels in two adjacent regions are different, the line is free of defects.

And when all pixels in the area to be detected are marked, analyzing the obtained marked data. The bright area 403 is taken as an example for explanation in the embodiment of the present disclosure. In the same bright area 403, when the marking data of the sub-pixels marked in the detected area are the same, it indicates that there is no difference between the images imaged in the area, and meanwhile, the marking data of the pixels in the dark area 402 adjacent to the area are different, it indicates that the bright and dark are alternate, that is, the metal trace arranged in the area is complete and continuous, and the metal line has no defect.

However, as shown in fig. 5 and 6, fig. 5 to 6 are schematic diagrams illustrating defect imaging of a metal line according to an embodiment of the present disclosure. And after the imaging of the metal wiring in the region to be detected is finished, analyzing the imaging result. The ith column of bright area 4031 and the (i + 1) th column of bright area 403 are used as an example for explanation. The marking data corresponding to any pixel point D in the area 404 is taken, when the ith row is counted, the pixel point D is counted, when the ith +1 row is counted, because the area D is directly disconnected, the pixel point D still can be counted in the ith +1 row, namely the pixel point D can exist in two counting areas. Namely, the short circuit condition of the metal wires corresponding to the region corresponding to the pixel point D is represented.

Further, as shown in fig. 6, a region 405 is selected, a pixel point F in the region is marked, and after the marking is completed, the marked data is analyzed. At this time, the pixels marked on each row are taken as reference. For the ith bright area corresponding to the ith row of metal traces and the (i + 1) th row of bright areas corresponding to the (i + 1) th row of metal traces, when the metal traces are complete and free of defects, the marking data of the pixels corresponding to the ith row of metal traces and the (i + 1) th row of metal traces should be completely the same.

However, when the metal trace is broken, as shown in the area 405 in the figure, at this time, the sub-pixels in the area 405 are marked as data in the dark area, that is, the marked data corresponding to the pixels in the area 405 corresponding to the bright area is different from the marked data in the previous bright area, and at this time, the metal trace is broken at the ith column.

Therefore, according to the line defect detection method provided by the embodiment of the disclosure, the line is converted into the pixel unit, and the judgment is performed according to the marking result corresponding to the pixel unit, so that the detection method is simple and efficient, the detection precision is high, the defects existing in the line wiring can be visually presented, the detection effect is good, the repair capacity can be effectively improved, and the yield is improved.

The above detailed description is provided for the method for detecting a line defect of a display panel provided by the embodiment of the present disclosure, and the description of the above embodiment is only used to help understanding the technical solution and the core idea of the present disclosure; those of ordinary skill in the art will understand that: it is to be understood that modifications may be made to the arrangements described in the embodiments above, and such modifications or alterations may be made without departing from the spirit of the respective arrangements of the embodiments of the present disclosure.