阅读说明：本技术 集成电路时延检测方法、装置、存储介质及电子设备 (Integrated circuit time delay detection method and device, storage medium and electronic equipment ) 是由 刘进 黄瑞锋 赵慧 于 2020-12-31 设计创作，主要内容包括：本申请提供了一种集成电路时延检测方法、装置、存储介质及电子设备。其中,该集成电路时延检测方法,包括：获取待检测的目标集成电路的电路网表以及电路版图；获取选定的目标走线,并基于所述目标走线在所述电路版图获取指定电路区域；根据所述电路网表对所述指定电路区域进行寄生参数抽取,得到精简DSPF网表文件；根据所述精简DSPF网表文件进行仿真得到所述目标走线在所述指定电路区域的第一时延；根据所述第一时延计算所述目标走线为任意长度时的目标时延。从而只需一次仿真即可计算出任意长度或者长度变化后的目标走线的目标时延,可以减少仿真次数,提高效率。(The application provides an integrated circuit time delay detection method, an integrated circuit time delay detection device, a storage medium and electronic equipment. The integrated circuit time delay detection method comprises the following steps: acquiring a circuit netlist and a circuit layout of a target integrated circuit to be detected; obtaining a selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing; parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file; simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area; and calculating the target time delay when the target routing is in any length according to the first time delay. Therefore, the target time delay of the target routing with any length or with changed length can be calculated only by one-time simulation, the simulation times can be reduced, and the efficiency is improved.)

1. A method for integrated circuit delay detection, comprising:

acquiring a circuit netlist and a circuit layout of a target integrated circuit to be detected;

obtaining a selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing;

parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file;

simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area;

and calculating the target time delay when the target routing is in any length according to the first time delay.

2. The integrated circuit delay detection method of claim 1, wherein the obtaining the selected target trace and obtaining the specified circuit region in the circuit layout based on the target trace comprises:

obtaining a selected target routing;

and simplifying the circuit layout based on the target routing line to obtain a specified circuit area, wherein the first time delay of the target routing line on the specified circuit area is not influenced by the simplification.

3. The integrated circuit delay detection method of claim 2, wherein the simplifying the circuit layout based on the target route to obtain the designated circuit area comprises:

carrying out duplicate removal processing on a plurality of functional units on the circuit layout;

and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

4. The integrated circuit delay detection method of claim 2, wherein the simplifying the circuit layout based on the target route to obtain the designated circuit area comprises:

and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

5. The method according to claim 3 or 4, wherein the deleting a target electronic component in a preset area that does not affect the delay of the preselected target trace to obtain the specified circuit area comprises:

acquiring a config configuration file, wherein the config configuration file comprises coordinates of a plurality of electronic elements connected with the target routing;

and deleting electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements according to the config configuration file to obtain a designated circuit area.

6. The integrated circuit delay detection method of claim 5, further comprising:

extracting parasitic parameters of the circuit layout according to the circuit netlist to obtain an original DSPF netlist file; simulating according to the original DSPF netlist file to obtain time delay information of the target routing from the input end to the output end;

after the first time delay of the target routing in the specified circuit area is obtained by performing simulation according to the reduced DSPF netlist file, the method further includes:

judging whether the first time delay is correct or not according to the time delay information;

if the target routing is correct, skipping to the step of calculating the target time delay when the target routing is any length according to the first time delay;

and if not, calibrating the config configuration file, and returning to the step of deleting the electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements and are used as target electronic elements according to the config configuration file.

7. The method according to claim 1, wherein the calculating a target delay of the target trace with any length according to the first delay includes:

calculating the unit time delay of the unit length of the target routing according to the first time delay;

and calculating the target time delay of the target routing when the target routing is in any length according to the unit time delay.

8. The method according to claim 7, wherein the calculating a unit delay per unit length of the target trace according to the first delay includes:

calculating the unit time delay of the unit length of the target trace according to a formula t2 ═ t + L ═ t0, where t2 is a first time delay, t is a fixed time delay constant, t0 is the unit time delay of the unit length of the target trace, and L is the length of the target trace in the specified circuit area.

9. The integrated circuit latency detection method of claim 3 or 4, wherein the target integrated circuit is a memory; the target electronic element is an MOS tube.

10. An integrated circuit delay detection apparatus, comprising:

the first acquisition module is used for acquiring a circuit netlist and a circuit layout of a target integrated circuit to be detected;

the simplifying module is used for acquiring a selected target routing and acquiring a specified circuit area in the circuit layout based on the target routing;

the extraction module is used for extracting parasitic parameters of the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file;

the first simulation module is used for carrying out simulation according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area;

and the calculating module is used for calculating the target time delay when the target routing is any length according to the first time delay.

11. An electronic device comprising a processor and a memory, the memory storing computer readable instructions that, when executed by the processor, perform the method of any of claims 1-9.

12. A storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, performs the method according to any of claims 1-9.

Technical Field

The application relates to the field of integrated circuit simulation test, in particular to a method and a device for detecting integrated circuit time delay, a storage medium and electronic equipment.

Background

In IC design, parasitic parameters, which are not design-required parameters, exist between interconnection lines. The parasitic parameters include parasitic resistance, capacitance, and inductance. In the circuit layout (layout), the distribution of parasitic resistance and parasitic capacitance is complex and dense. With the increasing scale and complexity of circuit layout and layout wiring, parasitic parameter files extracted by an EDA tool are larger and larger. Particularly, for a Memory, various repeated units exist in a circuit layout, each unit has many routing lines and MOS transistors, and if the layout of the Memory is not simplified, an extracted parasitic parameter file is very large, which results in a long time for post simulation (postsim).

In order to obtain the time delay of each trace of the Memory circuit, a clock signal is given as excitation, although the time delay of the circuit can be obtained through later simulation. However, when the length of the trace changes, the delay needs to be simulated again, which increases the burden of the simulation process and is not favorable for improving the efficiency.

Disclosure of Invention

An object of the embodiments of the present application is to provide a method and an apparatus for detecting an integrated circuit delay, a storage medium, and an electronic device, which can calculate a target delay of a target trace with any length by only one simulation, so as to reduce the simulation times and improve the efficiency.

The embodiment of the application provides a method for detecting time delay of an integrated circuit, which comprises the following steps:

acquiring a circuit netlist and a circuit layout of a target integrated circuit to be detected;

obtaining a selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing;

parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file;

simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area;

and calculating the target time delay when the target routing is in any length according to the first time delay.

According to the method provided by the embodiment of the application, the target time delay of the target routing with any length or with changed length can be calculated only through one-time simulation, the simulation times can be reduced, and the efficiency is improved.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the obtaining a selected target trace and obtaining a specified circuit region in the circuit layout based on the target trace includes:

obtaining a selected target routing;

and simplifying the circuit layout based on the target routing line to obtain a specified circuit area, wherein the first time delay of the target routing line on the specified circuit area is not influenced by the simplification.

The method provided by the embodiment of the application improves the efficiency of the simulation through simplification processing, and can reduce the calculation amount.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the simplifying a circuit layout based on the target route to obtain a designated circuit area includes:

carrying out duplicate removal processing on a plurality of functional units on the circuit layout;

and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the simplifying a circuit layout based on the target route to obtain a designated circuit area includes:

and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the deleting a target electronic component that does not affect a delay of a preselected target trace in a preset area to obtain a specified circuit area includes:

acquiring a config configuration file, wherein the config configuration file comprises coordinates of a plurality of electronic elements connected with the target routing;

and deleting electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements according to the config configuration file to obtain a designated circuit area.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the method further includes:

extracting parasitic parameters of the circuit layout according to the circuit netlist to obtain an original DSPF netlist file; simulating according to the original DSPF netlist file to obtain time delay information of the target routing from the input end to the output end;

after the first time delay of the target routing in the specified circuit area is obtained by performing simulation according to the reduced DSPF netlist file, the method further includes:

judging whether the first time delay is correct or not according to the time delay information;

if the target routing is correct, skipping to the step of calculating the target time delay when the target routing is any length according to the first time delay;

and if not, calibrating the config configuration file, and returning to the step of deleting the electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements and are used as target electronic elements according to the config configuration file.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the calculating a target delay when the target trace has any length according to the first delay includes:

calculating the unit time delay of the unit length of the target routing according to the first time delay;

and calculating the target time delay of the target routing when the target routing is in any length according to the unit time delay.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the calculating a unit delay of a unit length of the target trace according to the first delay includes:

calculating the unit time delay of the unit length of the target trace according to a formula t2 ═ t + L ═ t0, where t2 is a first time delay, t is a fixed time delay constant, L is the length of the target trace in the preset area, and t0 is the unit time delay of the unit length of the target trace.

Optionally, in the method for detecting an integrated circuit delay according to the embodiment of the present application, the target integrated circuit is a memory; the target electronic element is an MOS tube.

In a second aspect, an embodiment of the present application further provides an apparatus for detecting an integrated circuit delay, including:

the first acquisition module is used for acquiring a circuit netlist and a circuit layout of a target integrated circuit to be detected;

the simplifying module is used for acquiring a selected target routing and acquiring a specified circuit area in the circuit layout based on the target routing;

the extraction module is used for extracting parasitic parameters of the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file;

the first simulation module is used for carrying out simulation according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area;

and the calculating module is used for calculating the target time delay when the target routing is any length according to the first time delay.

In a third aspect, an embodiment of the present application further provides an electronic device, including a processor and a memory, where the memory stores computer-readable instructions, and when the computer-readable instructions are executed by the processor, the electronic device executes the steps in any of the methods described above.

In a fourth aspect, the present application further provides a storage medium, on which a computer program is stored, where the computer program is executed by a processor to execute the steps in any one of the methods described above.

As can be seen from the above, the integrated circuit delay detection method and apparatus provided in the embodiments of the present application obtain a circuit netlist and a circuit layout of a target integrated circuit to be detected; obtaining a selected target routing, and simplifying a circuit layout based on the target routing to obtain a specified circuit area, wherein the first time delay of the target routing on the specified circuit area is not influenced by the simplification; parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file; simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area; and calculating the target time delay when the target wiring is in any length according to the first time delay, so that the target time delay of the target wiring in any length or after the length is changed can be calculated only by one-time simulation, the simulation times can be reduced, and the efficiency can be improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required to be used in the embodiments of the present application will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope, and that those skilled in the art can also obtain other related drawings based on the drawings without inventive efforts.

Fig. 1 is a first flowchart of an integrated circuit delay detection method in some embodiments of the present application.

Fig. 2 is a second flowchart of an integrated circuit delay detection method in some embodiments of the present application.

Fig. 3 is a first block diagram of an integrated circuit delay detection apparatus in some embodiments of the present application.

Fig. 4 is a second block diagram of an integrated circuit delay detection apparatus in some embodiments of the present application.

FIG. 5 is a block diagram of an electronic device in some embodiments of the present application.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.

In the description of the present application, it should be noted that the terms "inside", "outside", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or orientations or positional relationships that the products of the application usually place when using, and are only used for convenience in describing the present application and simplifying the description, but do not indicate or imply that the devices or elements that are referred to must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present application. Furthermore, the terms "first," "second," and the like are used merely to distinguish one description from another, and are not to be construed as indicating or implying relative importance.

It should also be noted that, unless expressly stated or limited otherwise, the terms "disposed" and "connected" are to be construed broadly, e.g., as meaning fixedly connected, detachably connected, or integrally connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.

Referring to fig. 1, fig. 1 is a flowchart illustrating a method for detecting a delay of an integrated circuit according to some embodiments of the present disclosure. The integrated circuit time delay detection method comprises the following steps:

s101, obtaining a circuit netlist and a circuit layout of a target integrated circuit to be detected.

S102, obtaining the selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing.

S103, extracting parasitic parameters of the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file.

S104, according to the reduced DSPF netlist file, simulating to obtain a first time delay of the target routing in the specified circuit area.

And S105, calculating the target time delay when the target routing is in any length according to the first time delay.

In step S101, the target integrated circuit may be a memory array based on MOS transistors, and of course, other integrated circuits formed by arranging a plurality of functional units may also be used. For example, a pixel circuit of a liquid crystal display panel or an OLED display panel.

In step S102, a local area may be directly framed based on the selected target trace, so as to obtain the designated circuit area. Wherein, if the target integrated circuit is a memory array based on MOS tubes, the target electronic element is MOS tubes. The target trace may be one of a plurality of word lines, or one of a plurality of bit lines. Of course, the target trace may also be formed for the length of a part of the area of one trace.

In step S103, the Calibre XRC may be adopted and combined with the circuit netlist to extract the parasitic parameters of the specified circuit area, so as to obtain a reduced DSPF netlist file. Wherein the DSPF (customized standardized Parasitic Format) netlist file describes the actual Parasitic capacitance and resistance of each small segment on a trace network in SPICE format.

In step S104, the reduced DSPF netlist text is adopted and simulated in combination with the external stimulus, so as to obtain a time delay t2 of the clock signal routed from the target in the designated circuit area.

In step S105, a unit delay of the unit length of the target trace may be calculated according to the first delay and the length of the target trace in the designated circuit area, so as to calculate a target delay at any length according to the unit delay of the unit length of the target trace.

In some embodiments, in order to increase the simulation speed for the specified circuit region and reduce the calculation amount, the step S101 may further adopt: the method comprises the steps of obtaining a selected target routing, and simplifying a circuit layout based on the target routing to obtain a specified circuit area, wherein the first time delay of the target routing on the specified circuit area is not influenced by the simplification. The reduction process may include deleting the target electronic component within the designated circuit area that is not associated with the delay of the target trace. Wherein the target trace is determined based on the external stimulus, that is, to which trace the external stimulus is applied, the trace is determined as the target trace. When the target electronic component is deleted, a config profile is often used.

Wherein, in some embodiments, the step S102 may include the following sub-steps: s1021, carrying out duplicate removal processing on a plurality of functional units on the circuit layout; and S1022, deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the specified circuit area.

In some embodiments, the step S102 may only include: and step S1022, deleting the target electronic component in the preset area that does not affect the time delay of the preselected target trace, so as to obtain the specified circuit area. That is, the step S1021 is not essential.

In step S1021, for example, if there are multiple storage arrays in the memory, the duplicate storage array needs to be deleted, thereby reducing the subsequent workload.

In some embodiments, in step S1022, the following sub-steps may be specifically adopted: s10221, acquiring a config configuration file, wherein the config configuration file comprises coordinates of a plurality of electronic elements connected with the target routing; s10222, deleting the electronic components, which are not connected with the target trace, out of the plurality of electronic components as target electronic components according to the config configuration file to obtain a specified circuit area. The target routing is not connected, and the time delay of the target routing is not influenced.

The circuit netlist and the circuit layout can be combined to obtain the coordinates of each MOS tube of the target integrated circuit on the circuit layout. The config configuration file comprises coordinates of a plurality of electronic elements connected with the target routing; then, electronic components other than these electronic components are deleted as target electronic components. The circuit netlist and the circuit layout can be combined to obtain the coordinates of each MOS tube of the target integrated circuit on the circuit layout. Of course, it is understood that the deduplication process is also performed based on the config profile.

Wherein, in some embodiments, the step S105 may include the following steps: s1051, calculating the unit time delay of the unit length of the target routing according to the first time delay; and S1052, calculating the target time delay of the target routing when the target routing is in any length according to the unit time delay.

In step S1051, a unit delay of the unit length of the target trace may be calculated according to a formula t2 ═ t + L × t0, where t2 is a first delay, t is a fixed delay constant, and L is a length of the target trace on a specified circuit area or accessing to a simulated target trace. Wherein the fixed delay constant t refers to the delay of the clock. In step S1052, the equation t 3-t + L-t 0 may be substituted into the actual length of the target trace to be detected, so as to calculate the target time delay t3 when the target trace is an arbitrary length.

For example, in a memory, a memory array has 256 WL (word) word lines and 128 BL (bitline) bit lines. And after the circuit layout is simplified to obtain a specified circuit area and parasitic parameters are extracted, a simplified DSPF netlist file is obtained. And then, performing time delay post-simulation based on the DSPF netlist file to obtain a first time delay t 2. Based on the formula t2 ═ t + t0 × length (wl), length (wl) ═ 128, here, since the word line and the bit line are vertically crossed and distributed, the distance between two adjacent bit lines is equal, therefore, the length of the word line can be measured by using the number of bit lines. The unit time delay t0 of the word line with unit length is calculated, and t0 is (t 2-t)/128. The length of the word line WL changes, for example, the length (WL) is changed to 32, and simulation is not needed any more, and the new time delay is directly calculated through a formula.

As can be seen from the above, the integrated circuit delay detection method provided in the embodiment of the present application obtains the circuit netlist and the circuit layout of the target integrated circuit to be detected; obtaining a selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing; parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file; simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area; and calculating the target time delay when the target wiring is in any length according to the first time delay, so that the target time delay of the target wiring in any length or the target time delay of the target wiring after the length is changed can be calculated only by one-time simulation, the simulation times can be reduced, and the efficiency is improved.

Referring to fig. 2, fig. 2 is a flowchart illustrating a method for detecting a delay of an integrated circuit according to another embodiment of the present disclosure. The integrated circuit time delay detection method comprises the following steps:

s201, obtaining a circuit netlist and a circuit layout of a target integrated circuit to be detected.

S2021, carrying out duplication elimination treatment on the plurality of functional units on the circuit layout.

S20221, obtaining a config configuration file, where the config configuration file includes coordinates of a plurality of electronic components connected to the target trace.

S20222, deleting, according to the config configuration file, electronic components other than the plurality of electronic components and not connected to the target trace, as target electronic components, to obtain a designated circuit area.

S203, extracting parasitic parameters of the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file.

And S204, simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area.

S205, extracting parasitic parameters of the circuit layout according to the circuit netlist to obtain an original DSPF netlist file; and simulating according to the original DSPF netlist file to obtain the time delay information of the target routing from the input end to the output end.

S206, judging whether the first time delay is correct or not according to the time delay information.

S207, if the result is correct, the process goes to step S209.

And S208, if the configuration file is incorrect, calibrating the config configuration file, and returning to the step of deleting the electronic elements which are not connected with the target wire and are out of the plurality of electronic elements and used as target electronic elements according to the config configuration file.

S209, calculating the target time delay of the target routing when the circuit layout has any length according to the first time delay.

The steps S201 to S204 correspond to the steps S101 to S104 in the above embodiment, and the step S209 corresponds to the step S105, so that the description is not repeated. Here, the step S2021 is not an indispensable step.

In step S205, since the circuit layout is not reduced, the extracted parasitic parameters are not reduced. The delay information may be a delay t1 corresponding to the target trace when the circuit layout is not subjected to reduction processing, that is, only an external excitation is applied to the target trace during simulation, so as to measure a delay t1 of the target trace. Of course, the delay information may also include a delay t1 corresponding to each trace on the circuit layout when the circuit layout is not subjected to reduction processing.

In the step S206, the delay t1 can be used as a criterion for judging whether the reduction process is correct or not, or whether the first delay t2 is correct or not. If the first delay t2 of the target trace is equal to the delay t1, it indicates that there is no problem in the reduction process and the first delay t2 is correct.

In step S207, if it is correct, it indicates that the previous reduction operation is correct, and the first time delay t1 obtained by corresponding detection is also correct, so that the process directly moves to the last step, and calculates the target time delay with any length based on the first time delay.

In step S208, if not correct, the electronic component associated with the target trace is deleted when the specification is simplified, so that the config profile needs to be calibrated. And after the calibration is finished, returning to the step of deleting the electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements as target electronic elements according to the config configuration file.

According to the method and the device, parasitic parameters of the unreduced circuit layout are extracted to obtain the original DSPF netlist file, so that time delay information of the target wiring from the input end to the output end can be simulated based on the original DSPF netlist file, whether errors occur in the previous simplification operation is verified based on the time delay information, the accuracy of the second time delay is guaranteed, and the accuracy of the calculated target time delay is guaranteed.

Referring to fig. 3, fig. 3 is a structural diagram of some embodiments of the present application. The integrated circuit time delay detection device comprises: an acquisition module 301, a reduction module 302, an extraction module 303, a first simulation module 304, and a calculation module 305.

The obtaining module 301 is configured to obtain a circuit netlist and a circuit layout of a target integrated circuit to be detected. The target integrated circuit may be a memory array based on MOS transistors, and of course, may also be other integrated circuits formed by arranging a plurality of functional units. For example, a pixel circuit of a liquid crystal display panel or an OLED display panel.

The simplifying module 302 is configured to obtain a selected target trace, and obtain a specified circuit area in the circuit layout based on the target trace. A local area can be directly framed based on the selected target trace to obtain the designated circuit area. Of course, in some embodiments, in order to increase the simulation speed for the specified circuit region and reduce the calculation amount, it may also be possible to adopt: and simplifying the circuit layout based on the target routing line to obtain a specified circuit area, wherein the first time delay of the target routing line on the specified circuit area is not influenced by the simplification. The reduction processing may include deleting the target electronic component within the predetermined area that is not related to the latency of the target trace. Wherein, if the target integrated circuit is a memory array based on MOS tubes, the target electronic element is MOS tubes. The target trace may be one of a plurality of word lines, or one of a plurality of bit lines. Wherein the target trace is determined based on the external stimulus, that is, to which trace the external stimulus is applied, the trace is determined as the target trace. When the target electronic component is deleted, a config profile is often used.

The extraction module 303 is configured to extract parasitic parameters of the specified circuit region according to the circuit netlist to obtain a reduced DSPF netlist file. Calibre XRC may be employed in conjunction with the circuit netlist to extract parasitic parameters for the specified circuit region, resulting in a reduced DSPF netlist file. Wherein the DSPF (customized standardized Parasitic Format) netlist file describes the actual Parasitic capacitance and resistance of each small segment on a trace in SPICE format.

The first simulation module 304 is configured to perform simulation according to the reduced DSPF netlist file to obtain a first time delay of the target trace in the specified circuit area. And performing post simulation by adopting the reduced DSPF netlist file and combining the external excitation to obtain the time delay t2 of the clock signal in the specified circuit area from the target routing at the moment.

The calculating module 305 is configured to calculate a target time delay of the target trace when the circuit layout has any length according to the first time delay. The unit time delay of the unit length of the target trace can be calculated according to the first time delay and the length of the target trace in the designated circuit area, so that the target time delay under any length condition can be calculated according to the unit time delay of the unit length of the target trace.

Wherein, in some embodiments, the reduction module 302 is to: carrying out duplicate removal processing on a plurality of functional units on the circuit layout; and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

Alternatively, in some embodiments, the reduction module 302 is to: and deleting the target electronic element which does not influence the time delay of the preselected target routing in the preset area to obtain the appointed circuit area.

If the memory has a plurality of storage arrays, the repeated storage arrays in the memory need to be deleted, so that the subsequent workload is reduced. When a target electronic component is deleted, acquiring a config configuration file, wherein the config configuration file comprises coordinates of a plurality of electronic components connected with the target wiring; and deleting electronic elements which are not connected with the target wiring and are out of the plurality of electronic elements according to the config configuration file to obtain a designated circuit area. The target routing is not connected, and the time delay of the target routing is not influenced.

The circuit netlist and the circuit layout can be combined to obtain the coordinates of each MOS tube of the target integrated circuit on the circuit layout. The config configuration file comprises coordinates of a plurality of electronic elements connected with the target routing; then, electronic components other than these electronic components are deleted as target electronic components. The circuit netlist and the circuit layout can be combined to obtain the coordinates of each MOS tube of the target integrated circuit on the circuit layout.

In some embodiments, the calculation module 305 is specifically configured to: calculating the unit time delay of the unit length of the target routing according to the first time delay; and calculating the target time delay of the target routing when the target routing is in any length according to the unit time delay. The unit time delay of the unit length of the target trace may be calculated according to a formula t2 ═ t + L ═ t0, where t2 is a first time delay, t is a fixed time delay constant, and L is the length of the target trace on a specified circuit area or the target trace accessed to the simulation. Wherein the fixed delay constant t refers to the delay of the clock. The formula t3 ═ t + L × t0 can be substituted into the actual length of the target trace to be detected, so as to calculate the target time delay t3 when the target trace is of any length. For example, in a memory, a memory array has 256 WL (word) word lines and 128 BL (bitline) bit lines. And after the circuit layout is simplified to obtain a specified circuit area and parasitic parameters are extracted, a simplified DSPF netlist file is obtained. And then, performing time delay post-simulation based on the DSPF netlist file to obtain a first time delay t 2. Based on the formula t2 ═ t + t0 × length (wl), length (wl) ═ 128, here, since the word line and the bit line are vertically crossed and distributed, the distance between two adjacent bit lines is equal, therefore, the length of the word line can be measured by using the number of bit lines. The unit time delay t0 of the word line with unit length is calculated, and t0 is (t 2-t)/128. The length of the word line WL changes, for example, the length (WL) is changed to 32, and simulation is not needed any more, and the new time delay is directly calculated through a formula.

In some embodiments, as shown in fig. 4, the integrated circuit delay detection apparatus further includes: a second simulation module 306, a determination module 307, a jump module 308, and a calibration module 309.

The second simulation module 306 is configured to extract parasitic parameters of the circuit layout according to the circuit netlist to obtain an original DSPF netlist file; and simulating according to the original DSPF netlist file to obtain the time delay information of the target routing from the input end to the output end.

The judging module 307 is configured to judge whether the first time delay is correct according to the time delay information.

Wherein, the skip module 308 is used for skipping to the calculation module if the result is correct.

If the configuration file is incorrect, the calibration module 309 is configured to calibrate the config configuration file, and return to the simplified module 302, so that the simplified module 302 deletes, according to the config configuration file, an electronic component, which is not connected to the target trace, other than the plurality of electronic components, as the target electronic component.

As can be seen from the above, the integrated circuit delay detection apparatus provided in the embodiment of the present application obtains the circuit netlist and the circuit layout of the target integrated circuit to be detected; obtaining a selected target routing, and obtaining a specified circuit area in the circuit layout based on the target routing; parasitic parameter extraction is carried out on the specified circuit area according to the circuit netlist to obtain a reduced DSPF netlist file; simulating according to the reduced DSPF netlist file to obtain a first time delay of the target routing in the specified circuit area; and calculating the target time delay when the target wiring is in any length according to the first time delay, so that the target time delay of the target wiring in any length or the target time delay of the target wiring after the length is changed can be calculated only by one-time simulation, the simulation times can be reduced, and the efficiency is improved.

Please refer to fig. 5, fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present application, in which an electronic device 4 is provided and includes: the processor 401 and the memory 402, the processor 401 and the memory 402 being interconnected and communicating with each other via a communication bus 403 and/or other form of connection mechanism (not shown), the memory 402 storing a computer program executable by the processor 401, the processor 401 executing the computer program when the computing device is running to perform the method of any of the alternative implementations of the embodiments described above.

The embodiment of the present application provides a storage medium, and when being executed by a processor, the computer program performs the method in any optional implementation manner of the above embodiment. The storage medium may be implemented by any type of volatile or nonvolatile storage device or combination thereof, such as a Static Random Access Memory (SRAM), an Electrically Erasable Programmable Read-Only Memory (EEPROM), an Erasable Programmable Read-Only Memory (EPROM), a Programmable Read-Only Memory (PROM), a Read-Only Memory (ROM), a magnetic Memory, a flash Memory, a magnetic disk, or an optical disk.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one logical division, and there may be other divisions when actually implemented, and for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.

In addition, units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

Furthermore, the functional modules in the embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

In this document, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.

The above description is only an example of the present application and is not intended to limit the scope of the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.