阅读说明：本技术 非易失存储器内置参数配置方法 (Method for configuring built-in parameters of nonvolatile memory ) 是由 安友伟 张登军 刘大海 李迪 逯钊琦 于 2020-06-02 设计创作，主要内容包括：公开了一种非易失存储器内置参数配置方法,该方法对配置参数的每一个字均采用配置参数存储单元的多个存储单元来存储,在读取配置参数时,获取配置参数的每一个字对应的多个存储单元的存储数据,根据其中数据1的数量来确定该多个存储单元的真实存储数据,进而确定相应的配置参数的字,如此循环读取完全部全部的配置参数后使参数生效。本发明的非易失存储器内置参数配置方法可以在配置参数存储单元阵列的存储单元具有少量缺陷的存储单元的情况下,依旧可以正确读取配置参数,进行正确的参数配置,提高产品良率。(The method comprises the steps of storing each word of configuration parameters by adopting a plurality of storage units of a configuration parameter storage unit, acquiring storage data of the plurality of storage units corresponding to each word of the configuration parameters when the configuration parameters are read, determining real storage data of the plurality of storage units according to the number of data 1, further determining words of the corresponding configuration parameters, and enabling the parameters to take effect after all the configuration parameters are read in a circulating manner. The method for configuring the built-in parameters of the nonvolatile memory can still correctly read the configuration parameters and carry out correct parameter configuration under the condition that the memory cells of the configuration parameter memory cell array have a few defective memory cells, thereby improving the yield of products.)

1. A method for configuring built-in parameters of a nonvolatile memory comprises the following steps:

simultaneously storing each word of the built-in parameters to a plurality of storage units of the configuration parameter storage unit array;

when power-on parameter configuration is carried out, reading data stored in the plurality of storage units and acquiring the number of the storage units of which the stored data is 1 and the total number of the storage units of the plurality of storage units;

determining that the data stored in the plurality of storage units is 1 or 0 according to the ratio of the number of the storage units with the stored data being 1 to the total number of the storage units of the plurality of storage units, and reading the determined data 1 or data 0 to a configuration parameter register;

and after the configuration parameter data of all the addresses are read, enabling the configuration parameters in the configuration parameter register to take effect.

2. The non-volatile memory built-in parameter configuration method according to claim 1,

when the number of the storage units storing the data 1 in the plurality of storage units is larger than half of the total number of the storage units in the plurality of storage units, judging that the data stored in the plurality of storage units is 1, and otherwise, judging that the data stored in the plurality of storage units is 0.

3. The non-volatile memory built-in parameter configuration method according to claim 2, wherein the number of the plurality of memory cells is an odd number.

4. The method of claim 1, wherein the configuration parameter register refreshes data when a system is powered down and powered up again.

5. The non-volatile memory built-in parameter configuration method according to claim 1,

the number of memory cells of the plurality of memory cells for storing words of the same configuration parameter is set according to the configuration of the IO.

6. The method of configuring parameters stored in a non-volatile memory according to claim 5, further comprising:

and setting a test module to test the optimal value of the number of the storage units of the plurality of storage units for storing the words of the same configuration parameter, wherein the IO configuration is carried out according to the test result of the test module.

Technical Field

The invention relates to the technical field of semiconductor memories, in particular to a method for configuring built-in parameters of a nonvolatile memory.

Background

When the memory chip is powered on, some internal configuration parameters need to be read out from the storage unit to the configuration register, so that the parameter setting function of the memory chip is completed. If the memory cell storing these built-in parameters is defective during the production process, the parameter configuration of the memory chip cannot be completed normally, and the memory cell storing these built-in parameters of the memory chip is difficult to avoid the defect.

Disclosure of Invention

In view of the above problems, an object of the present invention is to provide a method for configuring parameters embedded in a nonvolatile memory, thereby improving the reliability of the nonvolatile memory.

According to an aspect of the present invention, a method for configuring parameters in a nonvolatile memory is provided, including:

simultaneously storing each word of the built-in parameters to a plurality of storage units of the configuration parameter storage unit array;

when power-on parameter configuration is carried out, reading data stored in the plurality of storage units and acquiring the number of the storage units of which the stored data is 1 and the total number of the storage units of the plurality of storage units;

determining that the data stored in the plurality of storage units is 1 or 0 according to the ratio of the number of the storage units with the stored data being 1 to the total number of the storage units of the plurality of storage units, and reading the determined data 1 or data 0 to a configuration parameter register;

and after the configuration parameter data of all the addresses are read, enabling the configuration parameters in the configuration parameter register to take effect.

Optionally, when the number of the storage units storing data 1 in the plurality of storage units is greater than half of the total number of the storage units in the plurality of storage units, it is determined that the data stored in the plurality of storage units is 1, and otherwise, it is 0.

Optionally, the number of the plurality of memory cells is an odd number.

Optionally, the configuration parameter register refreshes data when the system is powered down and powered up again.

Optionally, the number of memory cells of the plurality of memory cells for storing words of the same configuration parameter is set according to the configuration of the IO.

Optionally, the method further comprises:

and setting a test module to test the optimal value of the number of the storage units of the plurality of storage units for storing the words of the same configuration parameter, wherein the IO configuration is carried out according to the test result of the test module.

The method for configuring the built-in parameters of the nonvolatile memory stores each word of the configuration parameters by adopting the plurality of storage units of the configuration parameter storage unit, acquires the storage data of the plurality of storage units corresponding to each word of the configuration parameters when the configuration parameters are read, determines the real storage data of the plurality of storage units according to the number of the data 1, further determines the words of the corresponding configuration parameters, and takes the parameters into effect after all the configuration parameters are read in a circulating manner. The configuration parameters can be still correctly read under the condition that the storage units of the configuration parameter storage unit array have a few defective storage units, correct parameter configuration is carried out, and the product yield is improved.

The reasonable proportion is designed, and the plurality of storage units for storing the same configuration parameter are set to be odd number, so that the logical operation of a comparison program can be simplified, the situation of equality is avoided, and the reading accuracy is high.

Drawings

The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings, in which:

FIG. 1 is a block diagram of a power-on read system of a method for configuring built-in parameters of a non-volatile memory according to an embodiment of the present invention;

fig. 2 is a flowchart illustrating reading of internal configuration parameters of a method for configuring built-in parameters of a nonvolatile memory according to an embodiment of the present invention.

Detailed Description

Various embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Like elements in the various figures are denoted by the same or similar reference numerals. For purposes of clarity, the various features in the drawings are not necessarily drawn to scale.

The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples.

FIG. 1 is a block diagram of a power-on read system of a method for configuring a built-in parameter of a nonvolatile memory according to an embodiment of the present invention. As shown in the figure, the power-on reading system of the nonvolatile memory built-in parameter configuration method according to the embodiment of the present invention includes a control module 10, an address module 11, a configuration parameter storage unit array 12, a read operation module 13, a calculation comparison module 14, a configuration parameter register module 15, a test module 21, and an IO module 22.

The control module 10 integrally controls an address module 11, a configuration parameter storage unit array 12, a read operation module 13, a calculation comparison module 14 and a configuration parameter register module 15. The test module 21 provides IO configuration parameters of the IO module 22, and the IO module 22 performs IO encapsulation configuration according to the IO configuration parameters.

The address module 11 stores configuration parameter data into the configuration parameter storage unit array 12, and each configuration parameter data is stored into a plurality of storage units.

The read operation module 13 reads the configuration parameter data stored in a corresponding plurality of memory cells in the configuration parameter memory cell array 12 according to the memory address configured by each word of the configuration parameter.

The calculation and comparison module 14 processes the read configuration parameter data and outputs valid configuration parameters to the configuration parameter register module.

The method comprises the steps of actually controlling how many storage units are used for storing one configuration parameter data according to IO configuration, namely, the data stored in the storage units are all the same word, and the data stored in the storage units are all 1 or all 0.

The test module tests the number of the storage units to store the configuration parameter data and outputs the optimal storage unit usage, so that the yield of the product is balanced.

When data are read from the storage units, the data in the storage units are read by taking the plurality of storage units configured by the control module as a group, and the final configuration data in the corresponding configuration parameter register is determined to be 1 or 0 according to the proportion of the number of the storage units with the storage parameters of 1 or 0 in the plurality of storage units to the total number of the storage units of the plurality of storage units. Therefore, when part of the storage units have defects, the configuration accuracy can be guaranteed.

Fig. 2 is a flowchart illustrating reading of internal configuration parameters of a method for configuring built-in parameters of a nonvolatile memory according to an embodiment of the present invention. As shown in the figure, the process of reading the internal configuration parameters of the nonvolatile memory built-in parameter configuration method according to the embodiment of the present invention includes:

step S01: reading out the configuration parameter data of the current address;

step S02: calculating the number of numerical values 1 in the read parameters;

step S03: whether the number of values 1 is greater than half the total number;

step S04: writing a value of 1 into the configuration register;

step S05: writing a value of 0 into the configuration register;

step S06: whether all configuration parameter data reading is finished or not;

step S07: validating all configuration parameters;

step S08: the address is incremented.

Step S04 and step S05 determine whether the configuration parameter of the current address is 1 or 0 according to the determination in step S04, and then step S06 is performed to determine whether all the configuration data are read, if not, step S08 is performed, step S01 to step S06 are performed after address increment is performed on the current address, and if all the configuration data are read, step S07 is performed to enable all the configuration parameters to take effect, and then the process of reading the internal configuration parameters is finished, and the parameter configuration of the memory chip is completed.

The method for configuring the parameters in the nonvolatile memory according to the embodiment of the present invention obtains the best number of memory cells storing the same configuration parameter data (the number value is counted as a) through testing by the testing module 21, the IO module configures IO as a, the control module 10 stores each configuration parameter data into the corresponding memory cells with the number of a according to the IO configuration, when reading the configuration parameter data, reads the stored data of the a memory cells in each address according to the IO configuration, then counts the number of the value 1 in the stored data of the a memory cells in each address, compares the number of the value 1 with a half of the value a, if the number of the value 1 is greater than the half of the value a, determines that the configuration parameter value stored in the address is 1, otherwise, if the number of the value 1 is 0, after obtaining the configuration parameter corresponding to the address, writes the value 1 or the value 0 into the configuration parameter register, after the configuration parameter reading of all the addresses is completed, the parameter configuration can be completed. When the number of the defects of the plurality of memory cells with the number of A is less than half, if the data value stored in the address is 1, the 1 can still be read, otherwise, the 0 can be read correctly.

If the value a is set to be an odd number, for example, 7, the number of defective memory cells is not equal to half of the value a, and only the determination of greater than or less than the number of defective memory cells can be performed, so as to avoid that the correct configuration parameters cannot be uniquely determined when the value 1 is equal to half of the value a.

In this embodiment, the judgment threshold is half, and the judgment threshold can be actually determined according to the relationship between the defective memory cell ratio of the memory chip and the influence degree of the memory chip on the required function of the memory chip.

The configuration parameter register of the configuration parameter register module 15 refreshes data every time power is turned off and then power is turned on, that is, the configuration parameters are reconfigured every time power is turned on, so that it is ensured that each time the memory is used, the memory is effectively configured for this time.

The method for configuring the built-in parameters of the nonvolatile memory can normally complete parameter configuration under the condition that the memory cells of the configuration parameter memory cell array have a certain number of defects, and the product yield is improved.

While embodiments in accordance with the invention have been described above, these embodiments are not intended to be exhaustive or to limit the invention to the precise embodiments described. Obviously, many modifications and variations are possible in light of the above teaching. The embodiments were chosen and described in order to best explain the principles of the invention and the practical application, to thereby enable others skilled in the art to best utilize the invention and various embodiments with various modifications as are suited to the particular use contemplated. The invention is limited only by the claims and their full scope and equivalents.