阅读说明：本技术 用于感测放大器的补偿的设备及方法 (Apparatus and method for compensation of sense amplifier ) 是由 宫武伸一 M·A·肖尔 A·J·格伦策巴赫 于 2020-03-27 设计创作，主要内容包括：公开了用于感测放大器的补偿(例如,阈值电压补偿)的设备和方法。在确定存储器地址是否从主存储器重新映射到冗余存储器的同时,同时补偿用于访问所述主存储器的主存储器感测放大器和用于访问所述冗余存储器的冗余存储器感测放大器。在确定之后,对未被用于访问与所述存储器地址对应的所述存储器的感测放大器(例如,主存储器感测放大器和/或冗余存储器感测放大器)进行预充电。(Apparatus and methods for compensation (e.g., threshold voltage compensation) of a sense amplifier are disclosed. A main memory sense amplifier for accessing the main memory and a redundant memory sense amplifier for accessing the redundant memory are simultaneously compensated while determining whether a memory address is remapped from the main memory to the redundant memory. After the determination, sense amplifiers (e.g., main memory sense amplifiers and/or redundant memory sense amplifiers) not used to access the memory corresponding to the memory address are precharged.)

1. An apparatus, comprising:

a memory array comprising a main memory and a redundant memory;

a main memory sense amplifier to access the main memory;

a redundant memory sense amplifier to access the redundant memory;

a redundant address circuit configured to compare a received memory address to redundant memory address information identifying a memory address remapped from a main memory to a redundant memory;

a first sense amplifier compensation control circuit configured to control threshold voltage compensation to the main memory sense amplifier; and

a second sense amplifier compensation control circuit configured to control threshold voltage compensation for the redundant memory sense amplifiers,

wherein the first and second sense amplifier compensation control circuits control threshold voltage compensation to simultaneously compensate the primary and redundant memory sense amplifiers and precharge the primary or redundant memory sense amplifiers based on the address comparison by the redundant address circuit.

2. The apparatus of claim 1, wherein the first and second sense amplifier compensation control circuits further control threshold voltage compensation to precharge the main memory sense amplifier or the redundant memory sense amplifier based on the address comparison by the redundant address circuit.

3. The apparatus of claim 1, wherein the memory array comprises a plurality of sub-arrays of memory cells, each of the plurality of sub-arrays of memory cells containing a main memory and a corresponding redundant memory.

4. The apparatus of claim 3, wherein a set of sense amplifiers includes a main memory sense amplifier and a redundant memory sense amplifier, and the set of sense amplifiers is shared by two adjacent sub-arrays of memory cells of the plurality of sub-arrays of memory cells.

5. The apparatus of claim 3 wherein memory addresses corresponding to the main memory of one of the plurality of sub-arrays of memory cells are restricted to be remapped to the corresponding redundant memory of the same and immediately adjacent sub-arrays of memory cells.

6. The apparatus of claim 3, wherein memory addresses corresponding to main memory of one of the plurality of sub-arrays of memory cells are restricted to being remapped to respective redundant memory of the same sub-array of memory cells and to respective redundant memory within two adjacent sub-arrays of memory cells.

7. The apparatus of claim 1, wherein the memory array comprises a plurality of sub-arrays of main memory cells, each of the plurality of sub-arrays of memory cells containing a main memory, the memory array further comprising a sub-array of redundant memory, the sub-array of redundant memory containing the redundant memory.

8. The apparatus of claim 1, wherein the main memory sense amplifiers and the redundant memory sense amplifiers have an open digit line architecture.

9. The apparatus of claim 1, wherein the redundant address circuit is configured to provide an output having a first logic level when a received memory address matches the redundant memory address information and to provide the output having a second logic level when the received memory address does not match the redundant memory address information.

10. An apparatus, comprising:

a main memory sense amplifier including a threshold voltage compensation circuit configured to compensate for the main memory sense amplifier;

a redundant memory sense amplifier including a threshold voltage compensation circuit configured to compensate for the redundant memory sense amplifier;

redundant address circuitry configured to compare the memory address to the defective memory address to determine whether the memory address has been remapped to redundant memory; and

a sense amplifier compensation control circuit configured to control the threshold voltage compensation circuit to simultaneously compensate the respective sense amplifier before the redundant address circuit has determined whether the memory address has been remapped to redundant memory, and further configured to cause at least one of the main memory sense amplifier and the redundant memory sense amplifier to return to a pre-compensated state after the redundant address circuit has determined whether the memory address has been remapped to redundant memory.

11. The apparatus of claim 10, wherein the threshold voltage compensation circuit of the redundant memory sense amplifier and the threshold voltage compensation circuit of the main memory sense amplifier compensate for the respective sense amplifier during a comparison of the memory address to a defective memory address by the redundant address circuit.

12. The apparatus of claim 10, wherein the sense amplifier compensation control circuitry is configured to return the main memory sense amplifiers to the state prior to being compensated when the redundancy address circuitry determines that the memory address is remapped to redundancy memory, and wherein the sense amplifier compensation control circuitry is configured to return the redundancy memory sense amplifiers to the state prior to being compensated when the redundancy address circuitry determines that the memory address is not remapped to redundancy memory.

13. The apparatus of claim 10, wherein a set of sense amplifiers includes a portion of the main memory sense amplifiers and a portion of the redundant memory sense amplifiers.

14. A method, comprising:

receiving a memory address;

simultaneously compensating the main memory sense amplifier and the redundant memory sense amplifier;

comparing the memory address to redundant memory address information to determine whether the memory address matches the redundant memory address information; and

precharging the redundant memory sense amplifiers or the main memory sense amplifiers based at least in part on the comparison of the memory address to redundant memory address information.

15. The method of claim 14, wherein compensating primary and redundant memory sense amplifiers comprises compensating for a threshold voltage difference between components of the primary and redundant memory sense amplifiers.

16. The method of claim 14, wherein precharging the redundant memory sense amplifiers comprises returning the redundant memory sense amplifiers to an inactive state, and wherein precharging the main memory sense amplifiers comprises returning the main memory sense amplifiers to an inactive state.

17. The method of claim 14, wherein the main memory corresponding to the memory address is contained in a sub-array of memory cells that also contains redundant memory.

18. The method of claim 14, wherein:

precharging the redundant memory sense amplifiers in response to the memory address not matching redundant memory address information; and

precharging the main memory sense amplifiers in response to the memory address matching redundant memory address information.

19. The method of claim 14, further comprising:

in response to the memory address not matching redundant memory address information, accessing a main memory corresponding to the memory address; and

in response to the memory address matching redundant memory address information, accessing a redundant memory to which the memory address is mapped.

20. The method of claim 14, wherein compensating a main memory sense amplifier comprises compensating a plurality of main memory sense amplifiers shared by a plurality of sub-arrays of memory cells.

Technical Field

The present disclosure relates to an apparatus and method for compensation of a sense amplifier.

Background

The memory device is configured with one or more arrays of memory cells arranged at least logically in rows and columns. Each memory cell stores data as a charge that is accessed by a digit line associated with the memory cell. When the memory cell is accessed, the change in voltage on the digit line due to the charge can be sensed and amplified by the sense amplifier to indicate the value of the data state stored in the memory cell.

Conventional sense amplifiers are typically coupled to a pair of complementary digit lines to which a large number of memory cells (not shown) are connected. During a sensing operation, a voltage difference between the pair of wordlines caused by charges of accessed memory cells is sensed and amplified by a sense amplifier. However, random threshold voltage mismatches of the transistor elements of the sense amplifier can cause the sense amplifier to erroneously amplify an input signal.

Threshold voltage compensation circuitry may be included with the sense amplifier to compensate for threshold voltage differences between components of the sense amplifier. Compensation for threshold voltage differences between circuit components within the sense amplifier can mitigate the effects of small variations in performance between circuit components of the sense amplifier (e.g., due to process, voltage, and temperature (PVT) variations) and improve reliability.

However, the compensated sense amplifier typically requires additional time during the access operation. The additional time required to compensate the sense amplifier may delay the access time and slow the rate at which data is provided, which may be undesirable.

It is therefore desirable to improve access times for access operations that involve sense amplifier compensation.

Disclosure of Invention

Some embodiments of the present disclosure provide an apparatus, comprising: a memory array comprising a main memory and a redundant memory; a main memory sense amplifier to access a main memory; a redundant memory sense amplifier to access the redundant memory; redundant address circuitry configured to compare a received memory address to redundant memory address information identifying a memory address remapped from the main memory to the redundant memory; a first sense amplifier compensation control circuit configured to control threshold voltage compensation to the main memory sense amplifier; and a second sense amplifier compensation control circuit configured to control threshold voltage compensation to the redundant memory sense amplifier, the first and second sense amplifier compensation control circuits controlling the threshold voltage compensation to simultaneously compensate the main memory sense amplifier and the redundant memory sense amplifier and precharge the main memory sense amplifier or the redundant memory sense amplifier based on the address comparison by the redundant address circuit.

Some embodiments of the present disclosure provide an apparatus, comprising: a main memory sense amplifier including a threshold voltage compensation circuit configured to compensate for the main memory sense amplifier; a redundant memory sense amplifier including a threshold voltage compensation circuit configured to compensate for the redundant memory sense amplifier; redundant address circuitry configured to compare the memory address to the defective memory address to determine whether the memory address has been remapped to redundant memory; and a sense amplifier compensation control circuit configured to control the threshold voltage compensation circuit to simultaneously compensate the respective sense amplifiers before the redundant address circuit has determined whether the memory address has been remapped to the redundant memory, and further configured to cause at least one of the main memory sense amplifiers and the redundant memory sense amplifiers to return to a state before being compensated after the redundant address circuit has determined whether the memory address has been remapped to the redundant memory.

Some embodiments of the present disclosure provide a method, comprising: receiving a memory address; simultaneously compensating the main memory sense amplifier and the redundant memory sense amplifier; comparing the memory address with the redundant memory address information to determine whether the memory address matches the redundant memory address information; and precharging the redundant memory sense amplifiers or the main memory sense amplifiers based at least in part on the comparison of the memory address to the redundant memory address information.

Drawings

Fig. 1 is a schematic block diagram of a semiconductor device according to an embodiment of the present disclosure.

FIG. 2 is a schematic diagram of a sense amplifier and a pair of complementary digit lines according to an embodiment of the disclosure.

FIG. 3 is a block diagram of redundant address circuitry and sense amplifier compensation control circuitry according to an embodiment of the present disclosure.

Fig. 4A and 4B are graphs of a portion of a memory cell array and groups of sense amplifiers for example operations according to embodiments of the disclosure.

Fig. 5A and 5B are graphs of a portion of a memory cell array and groups of sense amplifiers for example operations according to embodiments of the disclosure.

FIG. 6 is a diagram of a portion of a memory cell array and groups of sense amplifiers for an example operation in accordance with an embodiment of the present disclosure.

Detailed Description

Various implementations of the present disclosure will be explained in detail below with reference to the accompanying drawings. The following detailed description refers to the accompanying drawings that show, by way of illustration, specific aspects and embodiments of the disclosure. The detailed description contains sufficient detail to enable those skilled in the art to practice the embodiments of the disclosure. Other embodiments may be utilized and structural, logical, and electrical changes may be made without departing from the scope of the present disclosure. The various embodiments disclosed herein are not necessarily mutually exclusive, as some disclosed embodiments can be combined with one or more other disclosed embodiments to form new embodiments.

Fig. 1 is a schematic block diagram of a semiconductor device 100 according to an embodiment of the present disclosure. The semiconductor device 100 may include a clock input circuit 105, an internal clock generator 107, an address command input circuit 115, an address decoder 120, a command decoder 125, a plurality of row (e.g., first access line) decoders 130, a memory cell array 145 including a sense amplifier 150 and a transmission gate 195, a plurality of column (e.g., second access line) decoders 140, a plurality of read/write amplifiers 165, an input/output (I/O) circuit 170, and a voltage generator 190. The semiconductor device 100 may include a plurality of external terminals including address and command terminals coupled to a command/address bus 110, clock terminals CK and/CK, data terminals DQ, DQs and DM, and power supply terminals VDD, VSS, VDDQ and VSSQ. In some examples, the terminals and signal lines associated with the command/address bus 110 may include a first set of terminals and signal lines configured to receive command signals and a separate second set of terminals and signal lines configured to receive address signals. In other examples, the terminals and signal lines associated with the command and address bus 110 may include common terminals and signal lines configured to receive both command signals and address signals. The semiconductor device may be mounted on a substrate such as a memory module substrate, a motherboard, or the like.

Memory cell array 145 includes a plurality of memory BANKs BANK0-N, where N is a positive integer such as 3, 7, 15, 31, etc. Each BANK0-N may include a plurality of word lines WL, a plurality of digit lines DL, and a plurality of memory cells MC arranged at intersections of the plurality of word lines WL and the plurality of digit lines DL. The word lines may generally correspond to rows of memory and the digit lines DL may generally correspond to columns of memory. The memory cell array 145 includes a memory designated as a main memory and a memory designated as a redundant memory. Memory addresses corresponding to the main memory may be remapped to the redundant memory. For example, when the main memory is defective, a memory address for the defective main memory may be remapped to the functional redundancy memory, thereby repairing the defective main memory.

The selection of the word line WL for each BANK0-N is performed by the corresponding row decoder 130 and the selection of the digit line DL is performed by the corresponding column decoder 140. A plurality of sense amplifiers 150 are coupled to corresponding digit lines DL and to at least one respective local I/O line pair LIOT/B. The local I/O line is coupled to a respective one of at least two main I/O line pairs MIOT/B via a transmission gate TG 195 acting as a switch. Sense amplifier 150 and transmission gate TG 195 may be operated based on control signals from decoder circuitry, which may include command decoder 120, row decoder 130, column decoder 140, any control circuitry of memory cell array 145 of BANK0-N, or any combination thereof.

In some examples, the plurality of sense amplifiers 150 may include a threshold voltage compensation circuit that compensates for a difference in threshold voltages between components of the sense amplifiers 150. As circuit components become smaller, clock speeds become faster, and voltage/power consumption requirements are reduced, small variations in performance between circuit components of the sense amplifier 150 (e.g., due to process, voltage, and temperature (PVT) variations) may reduce operational reliability of the semiconductor device 100. To mitigate the effects of these variations, compensating for some of these threshold voltage Vt differences may include biasing digit lines DL and DLb coupled to sense amplifier 150 using an internal node of sense amplifier 150 configured to provide sensed data to an output (e.g., a wired-node) before activating sense amplifier 150 to sense data in preparation for an access operation (e.g., a read operation, a write operation, etc.). The biasing of digit lines DL and DLb may be based on a threshold difference between at least two circuit components (e.g., transistors) of sense amplifier 150. At the same time, compensating for threshold voltage Vt differences between circuit components within the sense amplifier 150 may improve reliability.

Sense amplifier threshold voltage compensation may be controlled, at least in part, by sense amplifier compensation control circuitry 135. The sense amplifier compensation control circuit 135 may control a circuit for the compensation operation. In some embodiments of the present disclosure, the sense amplifier compensation control circuit 135 may control the compensation circuit to simultaneously compensate the sense amplifiers used to access the main memory and used to access the redundant memory. For example, in some embodiments of the present disclosure, the sense amplifier compensation control circuitry 135 may control when sense amplifier compensation is enabled and when the sense amplifier is returned to an inactive state (e.g., precharge).

The command/address input circuit 115 may receive an address signal and a bank address signal from the outside at a command/address terminal via the command/address bus 110 and transmit the address signal and the bank address signal to the address decoder 120. The address decoder 120 may decode address signals received from the address/command input circuit 115 and provide row address signals XADD to the row decoder 130 and column address signals YADD to the column decoder 140. The address decoder 120 may also receive a bank address signal and provide the bank address signal BADD to the row decoder 130 and the column decoder 140.

Command/address input circuit 115 may receive command signals from the outside (e.g., memory controller 105) at command/address terminals via command/address bus 110 and provide the command signals to command decoder 125. The command decoder 125 may decode the command signals and generate various internal command signals. The internal command signals may be used to control the operation and timing of various circuits of the semiconductor device 100. For example, the internal command signals may include row and column command signals, such as read commands or write commands, to control the circuitry to perform access operations on the selected word line and digit lines.

Accordingly, when a row activate command is issued to the semiconductor device 100 and an activate command is supplied to the bank address and the row address in time, and a read command is supplied to the column address in time, a read operation can be performed. The row and column addresses are evaluated (e.g., compared to a stored defective address) to determine whether to access the main or redundant memory. Once confirmed, read data is read from memory cells in memory cell array 145 specified by a row address and a column address. The read/write amplifier 165 may receive read data DQ and provide the read data DQ to the IO circuit 170. The IO circuit 170 may provide read data DQ to the outside via the data terminals DQ, DQs, and DM together with a data strobe signal at DQs and a data mask signal at DM. Similarly, the write operation is performed when a row activate command is issued to the semiconductor device 100 and an activate command is supplied to the bank address and the row address in time, and a write command is supplied to the column address in time. The row and column addresses are evaluated to determine whether to access the main or redundant memory. Input/output circuit 170 may receive write data at data terminals DQ, DQs, DM and a data strobe signal at DQs and a data mask signal at DM and provide the write data to memory cell array 145 via read/write amplifier 165. Write data may be written in the memory cells specified by the row address and the column address.

To help ensure the reliability of semiconductor device 100, memory cells of memory cell array 145 are tested to detect defective cells. Generally, to repair a row or column of memory (e.g., a row or column of main memory), the memory cell array 145 may contain rows and columns of redundant memory that can be swapped for a defective row or column of memory, respectively. To maintain which rows or columns have been replaced, the semiconductor device 100 may include redundant address circuitry 155. Redundant address circuitry 155 may include circuitry for each bank of memory cell array 145.

The redundant address circuitry 155 may include circuitry configured to store a row address and a column address corresponding to a row or column of the main memory that has been determined to be defective. The redundant address circuit 155 may also include circuitry to compare the row address XADD to a stored defective row address (e.g., and/or to compare the column address YADD to a stored defective column address) to detect a match. Redundant address circuit 155 may provide an active XMATCH signal to row decoder 130 in response to detecting, based on the comparison, that the memory row associated with row address XADD is defective, and may provide active YMATCH to column decoder 140 in response to detecting, based on the comparison, that the memory column associated with column address YADD is defective.

In response to the active XMATCH signal, row decoder 130 may redirect row address XADD to an alternate row address associated with a row of redundant memory in memory cell array 145 when performing the operations discussed above. Similarly, in response to the active YMATCH signal, column decoder 140 may redirect column address YADD to an alternate column address associated with a column of redundant memory in memory cell array 145 when performing the aforementioned operations.

Turning to the explanation of the external terminals included in the semiconductor device 100, the clock terminals CK and/CK may receive an external clock signal and a complementary external clock signal, respectively. An external clock signal (including a complementary external clock signal) may be supplied to the clock input circuit 105. The clock input circuit 105 may receive an external clock signal and generate an internal clock signal ICLK. The clock input circuit 105 may provide the internal clock signal ICLK to the internal clock generator 107. The internal clock generator 107 may generate the phase-controlled internal clock signal LCLK based on the received internal clock signal ICLK and the clock enable signal CKE from the address/command input circuit 115. Although not limited thereto, a DLL circuit may be used as the internal clock generator 107. The internal clock generator 107 may provide the phased internal clock signal LCLK to the IO circuit 170. The IO circuit 170 may use the phase controller internal clock signal LCLK as a timing signal for determining the output timing of the read data.

The power supply terminals may receive power supply voltages VDD and VSS. These power supply voltages VDD and VSS may be supplied to the voltage generator circuit 190. The voltage generator circuit 190 may generate various internal voltages VPP, VOD, VBLP, NSA _ BIAS, VARY, VPERI, and the like based on the power supply voltages VDD and VSS. The internal voltage VPP is mainly used in the row decoder 130, the internal voltages VOD, VBLP, NSA _ BIAS, and VARY are mainly used in the sense amplifier 150 included in the memory cell array 145, and the internal voltage VPERI is used in many other circuit blocks. IO circuit 170 may receive power supply voltages VDD and VSSQ. For example, the power supply voltages VDDQ and VSSQ may be the same voltages as the power supply voltages VDD and VSS, respectively. However, dedicated power supply voltages VDDQ and VSSQ may be used for the IO circuit 170.

Fig. 2 is a schematic diagram of a portion of a memory 200 including a sense amplifier 210 and a pair of complementary digit lines DL 220 and DLb221, according to an embodiment of the disclosure. As shown in fig. 2, the sense amplifier 210 is coupled to a pair of real and complementary digital (or bit) lines DL 220 and DLb 221. Memory cells 240(0) - (N) may be selectively coupled to digit line DL 221 by respective access devices (e.g., transistors) 251(0) - (N), and memory cells 241(0) - (N) may be selectively coupled to digit line DLb221 by respective access devices (e.g., transistors) 250(0) - (N). Word lines WL 260(0) - (N) may control which of memory cells 240(0) - (N) is coupled to digit line DL 220 by controlling the gates of respective access devices 250(0) - (N). Similarly, word lines WL 261(0) - (N) may control which of memory cells 241(0) - (N) is coupled to digit line DLb221 by controlling the gates of respective access devices 251(0) - (N). Sense amplifiers 210 may be controlled via control signals 270 received via decoder circuitry, such as any of a command decoder (e.g., command decoder 125 of FIG. 1), a row decoder (e.g., row decoder 130 of FIG. 1), a column decoder (e.g., column decoder 140 of FIG. 1), memory array control circuitry (e.g., control circuitry of memory cell array 145 of memory BANK BANK0-N of FIG. 1), or any combination thereof.

In some examples, the sense amplifier 210 includes a threshold voltage compensation circuit that compensates for threshold voltage mismatches between components of the sense amplifier 210 during a threshold voltage compensation phase. To perform threshold voltage compensation, sense amplifier 210 may precharge or bias digit lines DL 220 and DLb221 during a threshold voltage compensation phase such that the voltage difference between digit lines DL 220 and DLb221 is approximately equal to the threshold voltage difference between at least two circuit components of sense amplifier 210. In some examples, the threshold voltage difference may be based on a threshold voltage of a transistor of the sense amplifier 210. Compensation for threshold voltage Vt differences between circuit components within the sense amplifier 210 may improve reliability.

Some of word lines WL 260(0) - (N) and 261(0) - (N) may be set to an active state and in response some of access devices 250(0) - (N) and 251(0) - (N) may be enabled to couple a respective one of memory cells 240(0) - (N) and 241(0) - (N) to one of digit lines DL 220 and DLb 221. Sense amplifier 210 may be activated to perform a sensing operation to sense a data state of a coupled memory cell. That is, during a sense operation, the data state stored by the coupled memory cell is sensed and amplified by sense amplifier 210 to drive one of digit line DL 220 or digit line DLb221 to a high or low voltage level corresponding to the sensed data state, and to drive the other of digit lines DL 220 and DLb221 to a complementary voltage level during the sense operation.

Similarly, memory cells of memory cells 241(0) - (N) are coupled to digit line DLb221 by respective access devices 251(0) - (N) in response to respective word lines 261(0) - (N) becoming active. The data state stored by the memory cell is sensed and amplified by sense amplifier 210 to drive digit line DLb221 to a high or low voltage level corresponding to the sensed data state. During a sensing operation, the other digit line DL 220 is driven to a complementary voltage level (e.g., a high voltage level is complementary to a low voltage level and a low voltage level is complementary to a high voltage level).

FIG. 3 is a block diagram of a redundant address circuit 300 and sense amplifier compensation control circuits 310 and 320. In some embodiments of the present disclosure, the redundant address circuit 300 and the sense amplifier compensation control circuits 310 and 320 may be included in the redundant address circuit 155 of the semiconductor device 100 and in the sense amplifier compensation control circuit 135 of the semiconductor device 100, respectively.

The memory addresses are received simultaneously by redundant address circuit 300 and sense amplifier compensation control circuits 310 and 320. For example, a row address and/or a column address is provided from an address decoder (e.g., address decoder 120 of FIG. 1).

The compensation control circuits 310 and 320 activate the compensation circuits to provide sense amplifier threshold voltage compensation for sense amplifiers used to access the memory corresponding to the received memory address. The compensation circuits for the sense amplifiers used to access the main memory (e.g., "main memory" sense amplifiers) and the compensation circuits for the sense amplifiers used to access at least a portion of the redundant memory (e.g., "redundant memory" sense amplifiers) are activated simultaneously by compensation control circuits 310 and 320. Thus, simultaneous threshold voltage compensation is performed for main memory sense amplifiers used to access the main memory and redundant memory sense amplifiers used to access the redundant memory. In some embodiments of the present disclosure, the compensation circuit activated to compensate the sense amplifier is based on the received memory address and/or the physical location of the corresponding main memory. In some embodiments of the present disclosure, the compensation circuit for compensating the sense amplifiers for all redundant memories is activated simultaneously with the compensation circuit for compensating the main memory sense amplifiers. For example, in embodiments of the present disclosure where redundant memory is included in a section of memory accessed by a group of sense amplifiers, the compensation circuitry for the group of sense amplifiers may be activated at the same time as the compensation circuitry for the sense amplifiers used to access the memory corresponding to the received memory address, thereby providing simultaneous sense amplifier compensation.

The compensation control circuits 310 and 320 may also cause the sense amplifiers to be precharged. The sense amplifiers are precharged to prepare them for a subsequent access operation. For example, a sense amplifier that has been compensated by a threshold voltage in a ready-to-access operation may be precharged to substantially return the sense amplifier to a state prior to being compensated.

The redundant address circuit 300 compares the received memory address with redundant memory address information that identifies memory addresses that have been remapped from the main memory to the redundant memory. In some embodiments of the present disclosure, address information is stored in non-volatile memory (e.g., fuses, antifuses, non-volatile memory cells, etc.) to preserve remapped memory addresses when power is not provided. The redundant memory address information is accessible by the redundant address circuit 300. In some embodiments of the present disclosure, address information may be stored in redundant address circuitry. In some embodiments of the present disclosure, the address information is stored in another circuit accessible by the redundant address circuit 300. The redundant address circuit 300 may compare the received memory address to the redundant memory address information while sense amplifier compensating the sense amplifiers used to access the main and redundant memories.

Upon comparing the received memory address with the redundant memory address information, the redundant address circuit 300 provides an inactive signal MATCH (e.g., a low logic level) when the received address does not MATCH any of the redundant memory address information, indicating that the received memory address has not been remapped to the redundant memory and the corresponding main memory should be accessed. In contrast, when the received address matches any of the redundant memory address information, the redundant address circuit 300 provides an active signal MATCH (e.g., a high logic level) indicating that the received memory address has been remapped to the redundant memory and the redundant memory to which the received address has been mapped should be accessed.

The redundant address circuit 300 further provides a precharge signal PRE to the compensation control circuits 310 and 320. An active precharge signal (e.g., a logic high level) causes compensation control circuits 310 and/or 320 to precharge the sense amplifiers that may have been compensated by the sense amplifier compensation operation. Conversely, an inactive precharge signal (e.g., a logic low level) causes compensation control circuits 310 and/or 320 to not precharge the sense amplifiers. In some embodiments of the present disclosure, the redundant address circuit 300 provides a precharge signal PRE to independently control the compensation control circuits 310 and 320. For example, redundant address circuit 300 may provide a precharge signal PRE to cause compensation control circuit 310 to precharge sense amplifiers that may have been compensated (e.g., to precharge a first group of sense amplifiers), while compensation control circuit 320 does not precharge sense amplifiers that may also have been compensated (e.g., does not precharge a second group of sense amplifiers). Redundancy address circuit 300 may also provide a precharge signal PRE to cause compensation control circuit 320 to precharge sense amplifiers that may have been compensated (e.g., to precharge a second group of sense amplifiers), while compensation control circuit 310 does not precharge sense amplifiers that may also have been compensated (e.g., does not precharge a second group of sense amplifiers).

Memory addresses are also provided to the decoder circuit 330 and to the redundant memory decoder circuit 340. Decoder circuit 330 receives memory addresses and accesses the main memory corresponding to a memory address when the memory address is not remapped to redundant memory. The redundant memory decoder circuit 340 receives memory addresses and, when a certain memory address has been remapped to a redundant memory, accesses the redundant memory corresponding to the memory address. The MATCH signal is provided to the decoder circuit 330 and the redundant memory decoder circuit 340 to identify whether the memory address has not been remapped to redundant memory (e.g., an inactive MATCH signal) or has been remapped to redundant memory (e.g., an active MATCH signal). Subsequently, the corresponding main memory or redundant memory is accessed accordingly.

In operation, the compensation control circuits 310 and 320 cause sense amplifier compensation to be performed for the main memory sense amplifiers and the redundant memory sense amplifiers. The redundant address circuit 300 compares the received memory address with the redundant memory address information while the main memory sense amplifiers and the redundant memory sense amplifiers are compensated. The redundant address circuit 300 determines whether the received address matches the redundant memory address information. Based on the result, the redundant address circuit 300 provides an active MATCH signal (e.g., indicating a MATCH) or an inactive MATCH signal (e.g., indicating a mismatch) to enable the decoder circuit 330 to access the main memory corresponding to the received memory address or to enable the redundant memory decoder circuit 340 to access the redundant memory to which the received memory address is remapped.

Redundancy address circuit 300 further provides a precharge signal PRE to compensation control circuits 310 and 320 to cause the main memory sense amplifiers to precharge and/or the redundant memory sense amplifiers to precharge. Which sense amplifiers are precharged may be based on a comparison of the received memory address and redundant memory address information. For example, when a received memory address does not match any of the redundant memory address information, indicating that the memory address is not remapped and main memory will be accessed, the redundant address circuit 300 provides a precharge signal PRE to cause the compensation control circuit 320 to precharge the sense amplifiers of the associated group. The group of sense amplifiers may be precharged because the group of sense amplifiers will not be used to access memory for the memory address since main memory will be accessed. When the received memory address does match any of the redundant memory address information, indicating that the memory address is remapped to a redundant memory, the redundant address circuit 300 provides a precharge signal PRE to cause the compensation control circuit 310 to precharge the sense amplifiers of the associated group. The group of sense amplifier banks may be precharged because the group will not be used to access memory for the memory address since redundant memory will be accessed.

Memory access timing can be improved by performing sense amplifier threshold compensation (e.g., for both main memory sense amplifiers and redundant memory sense amplifiers) and memory address comparison simultaneously by redundant address circuit 300. For example, starting sense amplifier compensation before making a determination of whether to access main memory or redundant memory for a received memory address avoids having to wait until after the determination is made before sense amplifier compensation can begin. While additional power may be consumed due to compensating sense amplifiers that may not ultimately be used to access the memory, overlapping the operations of sense amplifier compensation and memory address comparison may reduce the overall time for accessing the memory and/or provide a greater timing margin for completing the operation, which may improve performance.

Fig. 4A and 4B are graphs of a portion of a memory cell array and groups of sense amplifiers for example operations according to embodiments of the disclosure. In some embodiments of the present disclosure, the memory cell array may be included in the memory cell array 145 of fig. 1, and several groups of sense amplifiers may be included in the semiconductor apparatus 100.

The array of memory cells is divided into sub-arrays of memory cells (mbits) 410(0) -410(3), each containing memory cells that can be accessed as rows and columns of memory. Each of the mbits 410 contains a primary memory and a redundant memory.

Sense amplifier bank 420(0) -420(4) is shared by Mbit 410 to access the memory cells. For example, sense amplifiers 420(1) are used when accessing some memory cells in Mbit 410(0) and some memory cells in Mbit 410(1), sense amplifiers 420(2) are used when accessing other memory cells in Mbit 410(1) and some memory cells in Mbit 410(2), and sense amplifiers 420(3) are used when accessing other memory cells in Mbit 410(2) and some memory cells in Mbit 410 (3). Sense amplifier 420(0) is used when accessing other memory cells in Mbit 410(0), and sense amplifier 420(4) is used when accessing other memory cells in Mbit 410 (3). In some embodiments of the present disclosure, the sense amplifier may have an open digit line architecture. That is, the sense amplifier may be coupled to a pair of digit lines, each extending to a different Mbit 410. In some embodiments, the set of sense amplifiers 420 includes main memory sense amplifiers and redundant memory sense amplifiers.

In some embodiments of the present disclosure, the memory addresses are restricted to being remapped to redundant memory contained in the same Mbit, or to redundant memory contained in an immediately adjacent Mbit, for the main memory unit corresponding to the memory address. For example, referring to FIG. 4A, the memory addresses for the rows of memories 415 and 417 in Mbit 410(1) have been remapped to redundant memories 415R and 417R, respectively. Redundant memory 415R is also in Mbit 410(1) (e.g., the same Mbit, at a row of memory 415), but redundant memory 417R is in Mbit 410(2) (e.g., the Mbit immediately adjacent to Mbit 410 (1)).

Example access operations to memory addresses associated with the main memory in Mbit 410(1), specifically memory addresses associated with rows of memory 417, are shown in fig. 4A and 4B. An example access operation will also be described with reference to fig. 3. Since Mbit 410(1) contains memory addresses that have been remapped to redundant memory (e.g., memory addresses of corresponding rows of main memory 415 or 417), it is possible that memory cells that should be accessed for the memory addresses may be contained in Mbit 410(1) and Mbit 410 (2).

The memory addresses for the rows of memory 417 are received by redundant address circuit 300 and compensation control circuits 310 and 320. Assuming that the main and/or redundant memory in Mbit 410(1) and Mbit 410(2) can be accessed as described earlier, compensation control circuits 310 and 320 activate compensation circuits to perform sense amplifier compensation for sense amplifiers 420(1), 420(2), and 420(3) based on the memory address. The sense amplifier compensated operation and redundant address circuit 300 compares the memory address with the redundant memory address information while being executed to determine whether the memory address has been remapped to the redundant memory.

After the memory address comparison, redundant address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifiers that are not being used to access the memory for the memory address. In this example, memory addresses associated with rows of memory 417 have been remapped to redundant memory, specifically to redundant memory 417R contained in Mbit 410(2), as previously described. Thus, redundancy address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifier 420(1) and continue operation of sense amplifiers 420(2) and 420 (3). Since the memory cells to be accessed for the memory address of the row of memory 417 are contained in Mbit 410(2), sense amplifiers 420(1) may be precharged (e.g., returned to a state prior to being compensated). As previously described, sense amplifiers 420(2) and 420(3) are used to access the memory of Mbit 410 (2). Sense amplifiers 420(2) and/or 420(3) are used to access redundant memory 417R.

Fig. 5A and 5B are graphs of a portion of a memory cell array and groups of sense amplifiers for example operations according to embodiments of the disclosure. In some embodiments of the present disclosure, the memory cell array may be included in the memory cell array 145 of fig. 1, and several groups of sense amplifiers may be included in the semiconductor apparatus 100.

The array of memory cells is divided into sub-arrays of memory cells (mbits) 510(0) -510(4), each containing memory cells that can be accessed as rows and columns of memory. Each of the mbits 510 contains a main memory and a redundant memory.

Groups of sense amplifiers 520(0) - (520) (5) are shared by Mbit510 to access the memory cells. For example, sense amplifiers 520(1) are used when accessing some memory cells in Mbit510 (0) and some memory cells in Mbit510(1), sense amplifiers 520(2) are used when accessing other memory cells in Mbit510(1) and some memory cells in Mbit510 (2), sense amplifiers 520(3) are used when accessing other memory cells in Mbit510 (2) and some memory cells in Mbit510 (3), and sense amplifiers 520(4) are used when accessing other memory cells in Mbit510 (3) and some memory cells in Mbit510 (4). Sense amplifier 520(0) is used when accessing other memory cells in Mbit510 (0), and sense amplifier 520(5) is used when accessing other memory cells in Mbit510 (4). In some embodiments of the present disclosure, the sense amplifier may have an open digit line architecture. That is, the sense amplifier may be coupled to a pair of digit lines, each digit line extending to a different Mbit 510. In some embodiments, the set of sense amplifiers 520 includes main memory sense amplifiers and redundant memory sense amplifiers.

In some embodiments of the present disclosure, the memory addresses are restricted to redundant memory that is remapped to a main memory unit corresponding to the memory address contained in the same Mbit, or to redundant memory contained within two adjacent mbits. For example, referring to FIG. 5A, the memory addresses for the rows of memories 515, 517, and 519 of Mbit510(1) have been remapped to redundant memories 515R, 517R, and 519R, respectively. The redundant memory 515R is in Mbit510(1) (e.g., the same Mbit, at a row of memory 515), the redundant memory 517R is in Mbit510 (2) (e.g., Mbit one above Mbit510 (1)), and the redundant memory 519R is in Mbit510 (3) (e.g., Mbit two above Mbit510 (1)).

An example access operation to a memory address associated with the main memory in Mbit510(1), specifically a memory address associated with a row of memory 517, is shown in fig. 5A and 5B. An example access operation will also be described with reference to fig. 3. Since Mbit510(1) contains memory addresses that have been remapped to redundant memory (e.g., memory addresses corresponding to rows of main memory 515, 517, or 519), it is possible that memory cells that should be accessed for the memory addresses may be contained in Mbit510(1), Mbit510 (2), and Mbit510 (3).

The memory addresses for the rows of memory 517 are received by redundant address circuit 300 and compensation control circuits 310 and 320. Assuming that the main and/or redundant memories in Mbit510(1), Mbit510 (2), and Mbit510 (3) can be accessed as described previously, compensation control circuits 310 and 320 activate compensation circuits to perform sense amplifier compensation on sense amplifiers 520(1), 520(2), 520(3), and 520(4) based on the memory address. The sense amplifier compensated operation and redundant address circuit 300 compares the memory address with the redundant memory address information while being executed to determine whether the memory address has been remapped to the redundant memory.

After the memory address comparison, redundant address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifiers that are not being used to access the memory for the memory address. In this example, as previously described, the memory addresses associated with the rows of memory 517 have been remapped to redundant memory, specifically to redundant memory 517R contained in Mbit510 (2). Thus, redundant address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifiers 520(1) and 520(4) and continue operation of sense amplifiers 520(2) and 520 (3). Since the memory cells to be accessed for the memory address of the row of memory 517 are contained in Mbit510 (2), sense amplifiers 520(1) and 520(4) may be precharged (e.g., returned to the state before being compensated). As previously described, sense amplifiers 520(2) and 520(3) are used to access the memory of Mbit510 (2). The rows of redundant memory 517R are accessed using sense amplifiers 520(2) and/or 520 (3).

As illustrated by the example operations described with reference to fig. 4A and 4B and with reference to fig. 5A and 5B, sense amplifier compensation may be performed concurrently with the comparison of the memory address to the redundant memory address information. In addition, several sets of sense amplifiers used to access the main memory and also the redundant memory can be compensated for simultaneously. Since some sense amplifiers are not used to access memory cells corresponding to a memory address, they may be precharged based on the result of the address comparison.

FIG. 6 is a diagram of a portion of a memory cell array and groups of sense amplifiers for an example operation in accordance with an embodiment of the present disclosure. In some embodiments of the present disclosure, the memory cell array may be included in the memory cell array 145 of fig. 1, and several groups of sense amplifiers may be included in the semiconductor apparatus 100.

The array of memory cells is divided into sub-arrays of memory cells (mbits) 610(0) -610(5), each containing memory cells that can be accessed as rows and columns of memory. Mbit 610(0) -610(5) contains main memory. In some embodiments of the present disclosure, Mbit 610(0) -610(5) may also include redundant memory. The memory cell array further includes redundant memory cell sub-arrays (Redun Mbit)630(0) and 630 (1). Redun Mbit 630(0) and 630(1) contain redundant memory to which memory addresses may be mapped, for example, when the main memory corresponding to the memory addresses is defective.

Groups of sense amplifiers 620(0) - (620) - (5) are shared by Mbit 610 to access the memory cells. For example, sense amplifiers 620(0) are used when accessing some memory cells in Mbit 610(0) and some memory cells in Mbit 610(1), sense amplifiers 620(1) are used when accessing other memory cells in Mbit 610(1) and some memory cells in Mbit 610(2), sense amplifiers 620(2) are used when accessing other memory cells in Mbit 610(2) and some memory cells in Mbit 610(3), sense amplifiers 620(3) are used when accessing other memory cells in Mbit 610(3) and some memory cells in Mbit 610(4), sense amplifiers 620(4) are used when accessing other memory cells in Mbit 610(4) and some memory cells in Mbit 610(5), and sense amplifiers 620(4) are used when accessing other memory cells in Mbit 610(5) and some memory cells in Mbit 610(6), sense amplifiers 620(5) are used. Sense amplifiers 635(0) are used when accessing other memory cells in Mbit 610(0) and when accessing redundant memory cells in Redun 630 (0). Sense amplifiers 635(1) are used in accessing other memory cells in Mbit 610(6) and in accessing redundant memory cells in redun Mbit 630 (1). In some embodiments of the present disclosure, the sense amplifier may have an open digit line architecture. That is, the sense amplifier may be coupled to a pair of digit lines, each digit line extending to a different Mbit. In some embodiments, the set of sense amplifiers 635 includes primary memory sense amplifiers and redundant memory sense amplifiers.

In some embodiments of the present disclosure, redundant memory may be consolidated into a limited number of mbits and may be accessed using a limited number of sets of sense amplifiers. For example, in the embodiment of FIG. 6, redundant memory for an array of memory cells is included in Mbit 630(0) and Mbit 630(1) that can be accessed using sense amplifiers 635(0) and 635(1), respectively. Thus, to access memory associated with any memory address for Mbit 610(0) - (610) (5), sense amplifiers 635(0) and 635(1) and sense amplifier 620 to be used to access Mbit 610 containing main memory associated with the memory address may be compensated for simultaneously. Additionally, sense amplifiers 620 and 635 may be compensated simultaneously with redundant address circuitry comparing memory addresses to redundant memory address information.

In embodiments having consolidated redundant memory as described previously, memory addresses may be restricted to being mapped to the consolidated redundant memory. For example, referring to FIG. 6, the memory addresses for the rows of memories 615 and 617 have been remapped to the redundant memory contained in the Redun 630(0), and the memory addresses for the rows of memory 619 have been remapped to the redundant memory contained in the Mbit 630 (1).

An example access operation to a memory address associated with the main memory in Mbit 610(2) is shown in fig. 6. An example access operation will also be described with reference to fig. 3. Since Mbit 610(2) contains memory addresses (e.g., memory cells of rows of memory 615, 617, and 619) that have been remapped to redundant memory, it is possible that memory cells that should be accessed for the memory addresses may be contained in Mbit 610(2) and also in Redun mbits 630(0) and 630 (1).

The memory addresses for the rows of memory 617 are received by redundant address circuit 300 and compensation control circuits 310 and 320. Assuming that the memories in Mbit 610(2) and Redun Mbit 630(0) and 630(1) are accessible as previously described, compensation control circuits 310 and 320 activate compensation circuits to perform sense amplifier compensation on sense amplifiers 620(1), 620(2) and 635(0) and 635(1) based on the memory address. The sense amplifier compensated operation and redundant address circuit 300 compares the memory address with the redundant memory address information while being executed to determine whether the memory address has been remapped to the redundant memory.

After the memory address comparison, redundant address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifiers that are not being used to access the memory for the memory address. In this example, as previously described, the memory addresses associated with the rows of memory 617 have been remapped to redundant memory, specifically to the redundant memory contained in the Redun Mbit 630 (0). Therefore, redundancy address circuit 300 provides precharge signal PRE to compensation control circuits 310 and 320 to precharge sense amplifiers 620(1) and 620(2) and 635(1), and continues operation of sense amplifier 635 (0). Sense amplifiers 620(1) and 620(2) and 635(1) may be precharged (e.g., returned to a state prior to being compensated) because the memory cells to be accessed for the memory address of the row of memory 517 are contained in the Redun Mbit 630 (0). As previously described, sense amplifier 635(0) is used to access redundant memory of Redun Mbit 630 (0). Sense amplifiers 635(0) are used to access rows of memory in the Redun Mbit 630(0) to which memory addresses for rows of memory 517 are mapped.

In embodiments of the present disclosure where redundant memory is consolidated into a limited number of Mbits (e.g., reduce Mbits 630(0) and 630(1)), the number of sense amplifier banks (e.g., sense amplifiers 635(0) and 635(1)) that are compensated simultaneously with the sense amplifiers used to access the main memory may be limited. By limiting the number of sense amplifiers that are compensated in addition to the sense amplifiers used to access the main memory, additional power consumed for simultaneous sense amplifier compensation may be reduced as compared to compensating a larger number of groups of sense amplifiers. In some embodiments of the present disclosure, redundant memories are merged into one Mbit, and one corresponding set of sense amplifiers may be compensated in addition to the sense amplifiers used to access the main memory corresponding to the memory address.

From the foregoing it will be appreciated that, although specific embodiments of the disclosure have been described herein for purposes of illustration, various modifications may be made without deviating from the spirit and scope of the disclosure. Thus, the scope of the present disclosure should not be limited to any particular embodiment described herein.