阅读说明：本技术 老化测试设备及其老化检测方法 (Aging test equipment and aging detection method thereof ) 是由 庞卫文 于 2020-04-14 设计创作，主要内容包括：本发明公开了一种老化测试设备及其老化检测方法,老化测试设备包括测试板、老化柜、承载台以及勾料机构,待测元件设于测试板上；老化柜用于对待测元件进行老化检测；承载台设于老化柜的外部；勾料机构设于老化柜内,用于将置于承载台上的测试板拉入老化柜内,或者将检测完成后设有待测元件的测试板推出老化柜,以用于对老化测试设备自动上下料。相比于人工搬运测试板和待测元件,不仅可以提升老化测试设备的检测效率,而且可以避免测试板跌落而造成测试板和待测元件发生损坏,或者出现误伤检测人员等安全事故,进而提升生产安全。(The invention discloses an aging test device and an aging detection method thereof, wherein the aging test device comprises a test board, an aging cabinet, a bearing platform and a material hooking mechanism, and a component to be tested is arranged on the test board; the aging cabinet is used for carrying out aging detection on the element to be detected; the bearing table is arranged outside the aging cabinet; the material hooking mechanism is arranged in the aging cabinet and used for pulling the test board arranged on the bearing platform into the aging cabinet or pushing the test board provided with the element to be tested out of the aging cabinet after the detection is finished so as to automatically feed and discharge the aging test equipment. Compare in artifical transport survey test panel and the component that awaits measuring, not only can promote the detection efficiency of aging testing equipment, can avoid surveying the test panel moreover and fall and cause survey test panel and the component that awaits measuring to take place to damage, perhaps appear accidental injury incident such as testing personnel, and then promote production safety.)

1. A burn-in apparatus, comprising:

the testing board, the component to be measured locates on said testing board;

the aging cabinet is used for carrying out aging detection on the element to be detected;

the bearing table is arranged outside the aging cabinet; and

and the material hooking mechanism is arranged in the aging cabinet and is used for pulling the test board on the bearing platform into the aging cabinet or pushing the test board out of the element to be tested out of the aging cabinet after the detection is finished so as to be used for the automatic feeding and discharging of the aging test equipment.

2. The aging testing apparatus of claim 1, wherein the hooking mechanism comprises a first driving member, a second driving member and a material taking member, the first driving member is used for driving the material taking member to approach or depart from the testing board along a first direction, the second driving member is used for driving the material taking member to hook or release the testing board along a second direction, and the first direction and the second direction are perpendicular to each other.

3. The aging testing device of claim 2, wherein the aging testing device comprises a bracket, the bracket is suspended on the bearing table, the testing plate is placed on the bracket, a matching portion is arranged on the bracket, a material taking portion is arranged on the material taking member, and when the material taking portion is connected with the matching portion, the material taking member can pull the bracket to move.

4. The aging testing device of claim 1, wherein the aging testing device comprises a cart, a plurality of bearing tables are arranged on the cart, a plurality of material hooking mechanisms are arranged in the aging cabinet, and the bearing tables and the material hooking mechanisms are arranged in a one-to-one correspondence manner.

5. The burn-in test apparatus of claim 4, wherein the burn-in cabinet and the cart are respectively provided with magnetic attraction members, and the magnetic attraction members are used for generating attraction force to fix the cart and the burn-in cabinet.

6. The burn-in apparatus of claim 1, wherein a testing table is disposed in the burn-in cabinet, the hooking mechanism places the testing board on the testing table, and the burn-in apparatus includes a positioning mechanism for positioning the testing board placed on the testing table.

7. The weathering test apparatus of claim 6 wherein the positioning mechanism includes a positioning cylinder and a baffle plate, the baffle plate being disposed on one side of the test station and the positioning cylinder being disposed on the opposite side of the test station.

8. The weathering test apparatus of claim 6, wherein the positioning mechanism includes at least two positioning cylinders, the at least two positioning cylinders being spaced opposite to each other two by two on opposite sides of the inspection station.

9. The device of claim 6, comprising a lift mechanism disposed under the test stage, the lift mechanism being configured to lift the test board to a predetermined position and reset the test board after the testing of the dut is completed.

10. The burn-in test apparatus of claim 9, wherein the test platform comprises two loading plates, the two loading plates are arranged in parallel and spaced apart from each other, and the lifting mechanism comprises at least two lifting cylinders, the at least two lifting cylinders are arranged below the two loading plates and used for pushing the loading plates to ascend or descend.

11. The burn-in apparatus of claim 5, wherein the burn-in apparatus comprises a plurality of temperature probes, the temperature probes are disposed above the test stage, and each temperature probe is abutted against one of the devices under test when the test board is located at the predetermined position.

12. The burn-in apparatus of claim 1, wherein the test board has a burn-in test circuit, the device under test is electrically connected to the burn-in test circuit, the burn-in test apparatus comprises a control board, the control board has a control circuit, the control board is in contact with the test board when the test board is at the predetermined position, and the control circuit is electrically connected to the burn-in test circuit.

13. The burn-in apparatus of claim 12, comprising a translation assembly, wherein the translation assembly is connected to the control board, and when the test board is at the predetermined position, the translation assembly drives the control board to move toward the test board and to be in contact with the control board, and after the device under test is detected, the translation assembly drives the control board to move away from the test board.

14. An aging detection method, characterized by comprising:

providing a test board, wherein a component to be tested is arranged on the test board, and the test board is placed on a bearing platform;

controlling a material hooking mechanism to pull the test board into an aging cabinet; and

and the control board is in butt joint with the test board and controls the aging cabinet to carry out aging detection on the element to be detected.

15. The burn-in detection method of claim 14, wherein said step of controlling said hook mechanism to pull said test board into said burn-in cabinet comprises:

controlling the trolley provided with the bearing table to be in butt joint with the aging cabinet;

controlling the material hooking mechanism to extend out of the aging cabinet and hook the test board;

and controlling the hooking mechanism to reset and placing the test board on the detection platform.

16. The method of claim 14, further comprising, prior to interfacing the control board with the test board: the test plate is positioned.

17. The method of claim 16, wherein said step of positioning said test board comprises:

controlling a positioning mechanism to position the test board along two opposite sides of the test board;

and controlling a pushing mechanism to push the test board to move so as to enable the test board to move to a preset position, wherein when the test board is located at the preset position, a temperature probe is in contact with the element to be tested on the test board.

18. The method of claim 17, wherein the step of interfacing the control board with the test board comprises:

and controlling a translation assembly to drive the control board to move so as to enable the control board to be in butt joint with the test board, and enabling a control circuit arranged on the control board to be electrically connected with an aging test circuit arranged on the test board.

Technical Field

The invention relates to the technical field of high and low temperature aging tests, in particular to an aging test device and an aging test method thereof.

Background

At present, electronic products, whether original components, parts, complete machines and equipment, need to be aged and tested. After the electronic product is manufactured, a complete product is formed, and the electronic product can already exert use value, but the electronic product can have faults after being used. According to the statistical result, the distribution of the faults in the life cycle of the electronic product can be represented by a bathtub curve, namely, the faults of the electronic product mostly appear in a period of initial work. Burn-in testing is an important means of accelerating electronic products over this period of time. The principle of the method is that a certain overstress (high temperature or high voltage) is applied to an electronic product, so that some early faults of an integrated circuit in the electronic product, such as electron migration, hot carrier degradation, oxide layer weak points and the like, can be shown as soon as possible, and effective screening of the product is achieved.

Disclosure of Invention

The invention provides aging test equipment and an aging detection method thereof aiming at the problems, so as to solve the technical problem that the aging test equipment is inconvenient to feed.

In order to solve the technical problems, the invention adopts a technical scheme that: there is provided a burn-in test apparatus including: the testing board, the component to be measured locates on said testing board; the aging cabinet is used for carrying out aging detection on the element to be detected; the bearing table is arranged outside the aging cabinet; and the hooking mechanism is arranged in the aging cabinet and is used for pulling the test board on the bearing platform into the aging cabinet or pushing the test board of the element to be tested out of the aging cabinet after the detection is finished so as to automatically feed and discharge the aging test equipment.

According to a specific embodiment of the present invention, the hooking mechanism includes a first driving member, a second driving member and a material taking member, the first driving member is configured to drive the material taking member to approach or leave the test board along a first direction, the second driving member is configured to drive the material taking member to hook or release the test board along a second direction, and the first direction and the second direction are perpendicular to each other.

According to a specific embodiment of the invention, the aging test equipment comprises a bracket, the bracket is suspended on the bearing table, the test board is placed on the bracket, a matching part is arranged on the bracket, a material taking part is arranged on the material taking part, and when the material taking part is connected with the matching part, the material taking part can pull the bracket to move.

According to a specific embodiment of the invention, the aging test equipment comprises a cart, a plurality of bearing tables are arranged on the cart, a plurality of material hooking mechanisms are arranged in the aging cabinet, and the bearing tables and the material hooking mechanisms are arranged in a one-to-one correspondence manner.

According to a specific embodiment of the present invention, the aging cabinet and the cart are respectively provided with magnetic attraction members, and the magnetic attraction members are used for generating attraction force to fix the cart and the aging cabinet.

According to a specific embodiment of the present invention, a detection table is disposed in the burn-in cabinet, the material hooking mechanism places the test board on the detection table, and the burn-in test apparatus includes a positioning mechanism for positioning the test board placed on the detection table.

According to a specific embodiment of the present invention, the positioning mechanism includes a positioning cylinder and a baffle, the baffle is disposed on one side of the inspection table, and the positioning cylinder is disposed on the other opposite side of the inspection table.

According to a specific embodiment of the invention, the positioning mechanism comprises at least two positioning cylinders, and the at least two positioning cylinders are arranged on two opposite sides of the detection table at intervals in a pairwise opposite manner.

According to an embodiment of the present invention, the burn-in test apparatus includes a pushing mechanism, the pushing mechanism is disposed below the test platform, and the pushing mechanism is configured to push the test board to ascend to a preset position and reset the test board after the testing of the device under test is completed.

According to an embodiment of the present invention, the detection platform includes two bearing plates, the two bearing plates are arranged in parallel at an interval, the lifting mechanism includes at least two lifting cylinders, and the at least two lifting cylinders are arranged below the two bearing plates and used for pushing the bearing plates to ascend or descend.

According to an embodiment of the present invention, the burn-in test apparatus includes a plurality of temperature probes, the temperature probes are disposed above the test platform, and when the test board is located at the predetermined position, each of the temperature probes is correspondingly abutted to one of the devices to be tested.

According to a specific embodiment of the present invention, the test board is provided with an aging test circuit, the device to be tested is electrically connected to the aging test circuit, the aging test apparatus includes a control board, the control board is provided with a control circuit, when the test board is located at the preset position, the control board is in butt joint with the test board, and the control circuit is electrically connected to the aging test circuit.

According to a specific embodiment of the present invention, the burn-in test apparatus includes a translation module, the translation module is connected to the control board, when the test board is located at a predetermined position, the translation module drives the control board to move in a direction close to the test board and to be abutted against the control board, and after the detection of the device under test is completed, the translation module drives the control board to move in a direction away from the test board.

In order to solve the technical problem, the invention adopts another technical scheme that: there is provided an aging detection method including: providing a test board, wherein a component to be tested is arranged on the test board, and the test board is placed on a bearing platform; controlling a material hooking mechanism to pull the test board into an aging cabinet; and the control board is in butt joint with the test board and controls the aging cabinet to carry out aging detection on the element to be detected.

According to an embodiment of the present invention, the step of controlling the hooking mechanism to pull the test board into the burn-in cabinet includes: controlling the trolley provided with the bearing table to be in butt joint with the aging cabinet; controlling the material hooking mechanism to extend out of the aging cabinet and hook the test board; and controlling the hooking mechanism to reset and placing the test board on the detection platform.

According to a specific embodiment of the present invention, before the control board is docked with the test board, the method further comprises: the test plate is positioned.

According to a specific embodiment of the present invention, the step of positioning the test board comprises: controlling a positioning mechanism to position the test board along two opposite sides of the test board; and controlling a pushing mechanism to push the test board to move so as to enable the test board to move to a preset position, wherein when the test board is located at the preset position, a temperature probe is in contact with the element to be tested on the test board.

According to an embodiment of the present invention, the step of interfacing the control board with the test board comprises: and controlling a translation assembly to drive the control board to move so as to enable the control board to be in butt joint with the test board, and enabling a control circuit arranged on the control board to be electrically connected with an aging test circuit arranged on the test board.

The invention has the beneficial effects that: different from the prior art, the embodiment of the invention arranges the bearing platform outside the aging cabinet, places the test board provided with the element to be tested on the bearing platform, and arranges the hooking mechanism in the aging cabinet, when the aging cabinet starts to detect, the hooking mechanism extends out of the aging cabinet and automatically pulls the test board placed on the bearing platform into the aging cabinet, the aging cabinet starts to carry out aging test on the element to be tested, after the aging cabinet finishes detecting the element to be tested, the hooking mechanism pushes the detected test board out of the aging cabinet so as to facilitate the next detection, thus, the automatic feeding and discharging of the aging cabinet can be realized, compared with the manual transportation of the test board and the element to be tested, the detection efficiency of aging test equipment can be improved, and the safety accidents that the test board and the element to be tested are damaged or the detection personnel is accidentally injured due to the falling of the test board can be avoided, thereby improving the production safety.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:

FIG. 1 is a schematic perspective view of a burn-in test apparatus according to an embodiment of the present invention;

FIG. 2 is an exploded view of the burn-in apparatus of FIG. 1;

FIG. 3 is a schematic perspective view of a part of the components of the burn-in apparatus according to an embodiment of the present invention;

FIG. 4 is an exploded view of a portion of the components of the burn-in apparatus of FIG. 3;

FIG. 5 is an exploded schematic view of the cart of FIG. 2 and some of the components disposed thereon;

FIG. 6 is a schematic plan view of a part of the components in the burn-in apparatus according to an embodiment of the present invention;

FIG. 7 is a perspective view of a portion of the components of FIG. 6;

FIG. 8 is a schematic top view of a portion of the components of the burn-in apparatus of FIG. 6;

FIG. 9 is a schematic flow chart of a degradation detection method in another embodiment of the present invention;

fig. 10 is a flowchart of step S102 in fig. 9;

FIG. 11 is a schematic flow chart of a degradation detection method in another embodiment of the present invention;

fig. 12 is a flowchart illustrating step S303 in fig. 11.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The terms "first", "second" and "third" in the present invention are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," or "third" may explicitly or implicitly include at least one of the feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise. All directional indications (such as up, down, left, right, front, and rear … …) in the embodiments of the present application are only used to explain the relative positional relationship between the components, the movement, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indication is changed accordingly. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

Referring to fig. 1 and fig. 2, fig. 1 is a schematic perspective view of a burn-in test apparatus according to an embodiment of the invention, and fig. 2 is a schematic exploded view of the burn-in test apparatus shown in fig. 1. The invention provides a burn-in test device 100, wherein the burn-in test device 100 comprises a test board 10, a burn-in cabinet 20, a bearing table 30 and a hooking mechanism 40 (shown in figure 3). The element 12 to be tested is arranged on the test board 10; the aging cabinet 20 is used for aging detection of the element 12 to be detected; the bearing table 30 is arranged outside the aging cabinet 20; the material hooking mechanism 40 is disposed in the burn-in cabinet 20, and is configured to pull the test board 10 disposed on the carrier 30 into the burn-in cabinet 20, or push the test board 10 with the device 12 to be tested out of the burn-in cabinet 20 after the test is completed, so as to automatically load and unload the burn-in test apparatus 100.

In the embodiment of the invention, the carrying platform 30 is arranged outside the aging cabinet 20, the test board 10 provided with the elements 12 to be tested is placed on the carrying platform 30, the hooking mechanism 40 is arranged in the aging cabinet 20, when the detection is started, the hooking mechanism 40 extends out of the aging cabinet 20 and automatically pulls the test board 10 placed on the carrying platform 30 into the aging cabinet 20, the aging cabinet 20 starts to carry out the aging test on the elements 12 to be tested, and after the aging cabinet 20 finishes detecting the elements 12 to be tested, the hooking mechanism 40 pushes the test board 10 out of the aging cabinet 20 after the detection is finished so as to facilitate the next detection, so that the automatic loading and unloading of the aging cabinet 20 can be realized, compared with the manual conveying of the test board 10 and the elements 12 to be tested, the detection efficiency of the aging test equipment 100 can be improved, and the damage to the test board 10 and the elements 12 to be tested caused by the falling of the test board 10 can be avoided, or the detection personnel are accidentally injured, and the like, so that the production safety is improved.

Alternatively, in an embodiment, the carrier table 30 may be separately disposed from the aging cabinet 20, that is, the carrier table 30 may be detachably connected to the aging cabinet 20, so as to load the carrier table 30 and transport away the tested device 12 after the testing is completed.

Specifically, in the present embodiment, as shown in fig. 2, the burn-in test apparatus 100 includes a cart 50, and the cart 50 is separated from the burn-in cabinet 20. Before the detection is started, the cart 50 may be pushed to the loading position of the burn-in cabinet 20, then the hooking mechanism 40 starts loading, after the detection of the component 12 to be detected is completed, the hooking mechanism 40 unloads the detected test board 10, and then the cart 50 is pushed to transport the detected test board 10 away. By separating the cart 50 from the burn-in cabinet 20, it is convenient to place the test board 10 on the cart 50, and also to push the cart 50 to carry away the test board 10 after the test is completed, so as to replace the new device under test 12 and the new test board 10.

Further, the number of the bearing platforms 30 arranged on the cart 50 is multiple, the aging cabinet 20 is internally provided with a plurality of material hooking mechanisms 40, and the bearing platforms 30 and the material hooking mechanisms 40 are arranged in a one-to-one correspondence manner. Through set up a plurality of plummer 30 on shallow 50 to with each plummer 30 correspond one and collude material mechanism 40 and set up, can make a plurality of colluding material mechanism 40 simultaneous workings carry out material loading or unloading simultaneously in order to place a plurality of survey test panel 10 on a plurality of plummers 30, and then promote the efficiency of going up unloading, and, ageing cabinet 20 also can detect the component 12 that awaits measuring on a plurality of survey test panel 10 simultaneously, can promote the detection efficiency of ageing tests equipment 100 from this.

For example, in the present embodiment, there are 8 loading platforms 30 disposed on the cart 50, and 8 loading platforms 30 are disposed in parallel along the vertical direction at intervals to reduce the floor area of the aging cabinet 20. Alternatively, in other alternative embodiments, the number of the loading platforms 30 disposed on the cart 50 may also be 2, 3, 4, 5, 6, 7, 9, or 10, and the like, and a plurality of the loading platforms 30 may also be disposed in parallel along the horizontal direction at intervals. The number and arrangement of the loading platforms 30 may be flexibly set according to the size of the aging cabinet 20, and the embodiment of the present invention is not limited specifically.

Alternatively, in other alternative embodiments, the carrier 30 may be fixedly connected to the aging cabinet 20. That is, the bearing table 30 is fixedly connected to the outer shell of the aging cabinet 20 and is arranged corresponding to the material hooking mechanisms 40 one by one, and the connection mode between the bearing table 30 and the aging cabinet 20 is not limited in the embodiment of the present invention.

Further, in the embodiment, the aging cabinet 20 and the cart 50 are respectively provided with magnetic attraction pieces, and the magnetic attraction pieces are used for generating attraction force to fix the cart 50 and the aging cabinet 20.

Specifically, as shown in fig. 2, an electromagnet 60 is disposed on the aging cabinet 20 at a position close to the cart 50, and the cart 50 may be made of a metal or an alloy material. When the push cart 50 is close to the aging cabinet 20, the electromagnet 60 on the aging cabinet 20 is powered on, the magnetic attraction acting force generated by the electromagnet 60 attracts the cart 50 so as to fix the cart 50 on the aging cabinet 20, the hooking mechanism 40 is prevented from carrying out loading and unloading, and the cart 50 moves relative to the aging cabinet 20 so as to improve the stability of the loading and unloading process. After the aging cabinet 20 is detected, the electromagnet 60 can be powered off, and the magnetic attraction acting force of the electromagnet 60 disappears, so that the cart 50 can be easily separated from the aging cabinet 20, and the cart 50 can be conveniently pushed to move.

Alternatively, a position sensor 62 may be provided on the aging cabinet 20, the position sensor 62 being used to detect whether the cart 50 is at a preset relative position to the aging cabinet 20. When the position sensor 62 detects that the cart 50 moves to the designated position of the aging cabinet 20, the electromagnet 60 may be controlled to be powered on, so that the aging cabinet 20 is automatically and fixedly connected with the cart 50, thereby increasing the intelligentization degree of the aging test apparatus 100 and increasing the detection efficiency of the aging test apparatus 100.

In another embodiment, a permanent magnet may be further disposed on the burn-in cabinet 20 or the cart 50 to fix the cart 50 to the outside of the burn-in cabinet 20.

In another embodiment, another locking structure may be further provided on the aging cabinet 20 or the cart 50 to lock the cart 50 with the aging cabinet 20 when the cart 50 moves to a specified position of the aging cabinet 20, and to unlock the cart 50 with the aging cabinet 20 when the cart 50 needs to be pushed away, and the specific arrangement form of the locking structure is not particularly limited in the embodiment of the present invention.

Further, as shown in fig. 3 and fig. 4, fig. 3 is a schematic perspective view of a part of elements of the burn-in test apparatus in an embodiment of the present invention, and fig. 4 is a schematic exploded view of the part of elements of the burn-in test apparatus in fig. 3. In the present embodiment, the hooking mechanism 40 includes a first driving member 41, a second driving member 42, and a taking member 43. The first driving member 41 is used for driving the material taking member 43 to approach or depart from the test board 10 along a first direction, and the second driving member 42 is used for driving the material taking member 43 to hook or release the test board 10 along a second direction, wherein the first direction and the second direction are perpendicular to each other.

Specifically, referring to fig. 2 to 4, in the present embodiment, the first direction is an X direction shown in fig. 3, and the second direction is a Z direction shown in fig. 3, and the material fetching member 43 cooperates with the test board 10 at the bottom of the test board 10 to implement hooking. The first driving member 41 is connected to the second driving member 42 for driving the second driving member 42 to move along the X direction shown in fig. 3, and the second driving member 42 is connected to the material taking member 43 for driving the material taking member 43 to move along the Z direction shown in fig. 3. When the material needs to be taken, the first driving member 41 first drives the second driving member 42 to move along the X direction to extend out of the burn-in board 20 and move to the position of the carrier 30, then the second driving member 42 drives the material taking member 43 to move along the Z direction shown in fig. 3 to contact with the test board 10 on the carrier 30 to hook the test board 10, and finally, the first driving member 41 drives the second driving member 42 to move along the opposite direction of the X direction to pull the hooked test board 10 into the burn-in board 20. After the test is completed, the first driving member 41 first drives the second driving member 42 to move along the X direction to push the test board 10 out of the burn-in board 20 and place the test board on the carrier 30, then the second driving member 42 drives the material taking member 43 to move along the direction opposite to the Z direction shown in fig. 3 to unlock the test board 10 on the carrier 30, so as to release the test board 10, and finally, the first driving member 41 drives the second driving member 42 to move along the direction opposite to the X direction to reset.

Alternatively, in another embodiment, the first direction is the X direction shown in fig. 3, and the second direction is the Z direction shown in fig. 3, and the material fetching member 43 cooperates with the test board 10 at the top of the test board 10 to realize hooking. At this time, the movement manners of the first driving member 41 and the second driving member 42 are substantially the same as those in the above embodiment, and please refer to the description of the above embodiment. By setting the second direction to be a vertical direction, the hooking mechanism 40 can be disposed above or below the test board 10, so that the structure of the burn-in test apparatus 100 is more compact, and the floor area of the burn-in test apparatus 100 is reduced.

Alternatively, in another embodiment, the first driving element 41 and the second driving element 42 may be reversed, that is, the second driving element 42 may be connected to the first driving element 41 and configured to drive the first driving element 41 to move closer to or away from the test board 10 along the first direction, and the first driving element 41 is connected to the material taking element 43 and configured to drive the material taking element 43 to hook or release the test board 10 along the second direction.

Alternatively, in this embodiment, the first driving member 41 may be configured as a motor module, and the second driving member 42 may be configured as an air cylinder, so that the movement of the material taking member 43 is more precise. Alternatively, in other alternative embodiments, the first driving element 41 and the second driving element 42 may also be configured as a linear motion module such as a motor, and the specific structures of the first driving element 41 and the second driving element 42 are not limited in the embodiments of the present invention.

Further, in the present embodiment, as shown in fig. 3 to 5, fig. 5 is an exploded structural schematic view of the cart in fig. 2 and a part of elements disposed thereon. The burn-in test apparatus 100 includes a bracket 70, the bracket 70 is suspended on the carrier 30, the test board 10 is placed on the bracket 70, and the bracket 70 is provided with a fitting portion 72. Get and be equipped with on the material piece 43 and get material portion 432, get material portion 432 and cooperation portion 72 when being connected, get material piece 43 and can pull bracket 70 and remove.

Specifically, in the present embodiment, the cart 50 includes a main body frame 52 and L-shaped profiles 54 provided on opposite sides of the main body frame 52. The L-shaped profile 54 comprises a first plate 542 and a second plate 544 which are connected perpendicularly. The first plate 542 is connected to the main frame 52, and the second plate 544 extends in a direction close to each other and is located on the same horizontal plane, so as to form the hollow-bottom carrier 30. Opposite side edges of the carriage 70 are placed on the two second plates 544, and the test board 10 is placed on the side of the carriage 70 facing away from the second plates 544. Adopt L shape section bar 54 preparation bottom fretwork's plummer 30, not only can dodge and get material 43, be convenient for get material 43 and bracket 70 cooperation and be connected, plummer 30 has the effect of direction to bracket 70's removal in addition, can make bracket 70's moving direction more accurate, takes place to deflect when avoiding getting material 43 pulling bracket 70 motion.

In this embodiment, as shown in fig. 3 and 4, the material taking member 43 includes a connecting portion 434 and a material taking portion 432 disposed on the connecting portion 434. The connecting portion 434 is used for connecting with the second driving member 42, and the material taking portion 432 is disposed on the top surface of the connecting portion 434 in a protruding manner. As shown in fig. 5, a plurality of through holes penetrating through the bracket 70 are formed in the bracket 70, the shape of each through hole is matched with the shape of the material taking part 432, and when the material taking part 432 moves along the Z direction shown in fig. 5 to be inserted into the through holes, the material taking part 43 can be locked with the bracket 70, so that the material taking part 43 can drag the bracket 70 and the test board 10 to move. When the take-out section 432 moves in the direction opposite to the Z direction shown in fig. 5 to move out of the through hole, unlocking of the take-out member 43 from the carriage 70 can be achieved.

Optionally, in this embodiment, the shape of through-hole can be the rectangle, and the cross section of getting material portion 432 also is the rectangle, and the shape of the cross section of getting material portion 432 is the same with the shape of through-hole, and gets the cross sectional dimension of material portion 432 and slightly be less than the area of through-hole, so, can make the connection of getting material portion 432 and bracket 70 more stable, avoid getting the in-process that material piece 43 dragged bracket 70, get material piece 43 and rock relative bracket 70. Alternatively, the engaging portion 72 may be provided only on the bottom surface of the bracket 70 without penetrating the bracket 70. The through holes are formed in the bracket 70, so that the heat dissipation of the test board 10 can be facilitated, and the weight of the bracket 70 can be reduced, thereby saving the cost.

Alternatively, in other embodiments, other types of matching structures may be disposed on the bracket 70 and the material taking member 43 to achieve matching connection between the bracket 70 and the material taking member 43, and the embodiments of the present invention are not limited in particular. For example, electromagnets 60 may be provided on the carriage 70 and the picking member 43, respectively, to lock or unlock the carriage 70 and the picking member 43 by energizing and de-energizing the electromagnets 60.

In another embodiment, the first direction may be an X direction shown in fig. 3, and the second direction is a Y direction shown in fig. 3, and the material fetching member 43 cooperates with the test board 10 at the side of the test board 10 to implement hooking.

Specifically, the first driving member 41 is connected to the second driving member 42 for driving the second driving member 42 to move in the X direction shown in fig. 3, and the second driving member 42 is connected to the material taking member 43 for driving the material taking member 43 to move in the Y direction shown in fig. 3. When the material needs to be taken, the first driving member 41 first drives the second driving member 42 to move along the X direction to extend out of the burn-in board 20 and move to the position of the carrier 30, then the second driving member 42 drives the material taking member 43 to move along the Y direction shown in fig. 3 to contact with the test board 10 on the carrier 30 to hook the test board 10, and finally, the first driving member 41 drives the second driving member 42 to move along the reverse direction of the X direction to pull the hooked test board 10 into the burn-in board 20. After the test is completed, the first driving unit 41 first drives the second driving unit 42 to move along the X direction to push the test board 10 out of the burn-in board 20 and place the test board on the carrier 30, then the second driving unit 42 drives the material fetching member 43 to move along the direction opposite to the Y direction shown in fig. 3 to unlock the test board 10 on the carrier 30, so as to release the test board 10, and finally, the first driving unit 41 drives the second driving unit 42 to move along the direction opposite to the X direction to reset.

Further, as shown in fig. 3 and 4, a testing table 80 is disposed in the burn-in cabinet 20, and the hook mechanism 40 places the testing board 10 on the testing table 80.

Specifically, the hooking mechanism 40 moves the bracket 70 to the burn-in board 20 and then places the bracket on the detection table 80, so that the burn-in board 20 can detect the device 12 to be tested on the test board 10.

Alternatively, as shown in fig. 3 and 4, the detecting table 80 includes two carrier plates 82, the extending direction of the carrier plates 82 is the X direction shown in fig. 4, and the two carrier plates 82 are arranged in parallel and at intervals along the Y direction shown in the figure, so that the material taking member 43 can smoothly pull the bracket 70 onto the detecting table 80.

Alternatively, in this embodiment, as shown in fig. 6 and 7, fig. 6 is a schematic plan structure diagram of a part of elements in the burn-in test apparatus in an embodiment of the present invention, and fig. 7 is a schematic perspective structure diagram of a part of elements in fig. 6. In the present embodiment, the burn-in apparatus 100 includes a positioning mechanism 90, and the positioning mechanism 90 is used for positioning the test board 10 placed on the test stage 80. By arranging the positioning mechanism 90 in the burn-in cabinet 20, the position of the device 12 to be tested on each test board 10 can be fixed, which facilitates the testing.

In the present embodiment, as shown in fig. 6 and 7, the positioning mechanism 90 includes a positioning cylinder 92 and a baffle 94, the baffle 94 is disposed on one side of the inspection table 80, and the positioning cylinder 92 is disposed on the other opposite side of the inspection table 80.

Specifically, in the present embodiment, the blocking plate 94 and the positioning cylinder 92 are disposed on two opposite sides of the detection table 80 along the Y direction, and when the material-taking member 43 drags the carriage 70 to move onto the detection table 80 along the X direction, the positioning cylinder 92 extends to push the carriage 70 to move toward the blocking plate 94 and finally abut against the blocking plate 94, so as to position the carriage 70 in the Y direction, and the carriage 70 is located at the preset position.

Alternatively, the number of the positioning cylinders 92 may be one, two, three, or the like. For example, in one embodiment, the number of the positioning cylinders 92 may be one, and one positioning cylinder 92 is disposed at the center of the bracket 70 to prevent the bracket 70 from being tilted during the pushing of the bracket 70 by the positioning cylinders 92. In the present embodiment, the number of the positioning cylinders 92 may be two, and the two positioning cylinders 92 are disposed at intervals on one side of the bracket 70 along the X direction shown in fig. 7, so that opposite ends of the bracket 70 along the X direction are uniformly stressed. Or, in another embodiment, the number of the positioning cylinders 92 may be three, and the three positioning cylinders 92 are disposed at intervals on one side of the bracket 70 along the X direction shown in fig. 7, so that not only the force applied to the bracket 70 is uniform, but also the acting force of each positioning cylinder 92 is reduced, and the positioning cylinders 92 are protected.

Alternatively, in another embodiment, the positioning mechanism 90 may include at least two positioning cylinders 92, and the at least two positioning cylinders 92 are disposed on two opposite sides of the detecting table 80 along the Y direction at intervals. Specifically, in the present embodiment, when the material taking member 43 pulls the carriage 70 to move onto the detection table 80 along the X direction, the positioning cylinders 92 located at two opposite sides of the detection table 80 extend to push the carriage 70 to move toward the direction approaching each other, so as to position the carriage 70 in the Y direction, so that the carriage 70 is located at the preset position. By arranging the positioning cylinders 92 for abutting on the two opposite sides of the bracket 70, the positioning time of the positioning mechanism 90 can be shortened, and the detection efficiency of the element to be detected 12 is improved.

In this embodiment, the positioning cylinders 92 on each side of the detection table 80 may be arranged as described in the above embodiments, and are not described herein again.

Further, as shown in fig. 3 and 4, in the present embodiment, two stoppers 84 may be disposed at intervals on the surface of the carrier plate 82 facing the bracket 70, a clamping gap is formed between the two stoppers 84, and the bracket 70 is located between the two stoppers 84. By providing the stopper portion 84 on the carrier plate 82, the bracket 70 can be positioned in the X direction on the one hand, and the bracket 70 can be prevented from being tilted and rotated in the process of positioning the bracket 70 in the Y direction by the positioning mechanism 90 on the other hand.

Further, as shown in fig. 6 and 7, the burn-in test apparatus 100 further includes a pushing mechanism 110, the pushing mechanism 110 is disposed below the test stage 80, and the pushing mechanism 110 is configured to push the test board 10 to ascend to a predetermined position along the Z direction shown in the figure and reset the test board 10 after the testing of the device 12 to be tested is completed.

The lifting mechanism 110 includes at least two lifting cylinders 112, and the at least two lifting cylinders 112 are disposed below the two bearing plates 82 and used for pushing the bearing plates 82 to ascend or descend. By setting the lifting mechanism 110 to push the carrier plate 82 to ascend or descend, the stability of the test board 10 disposed on the carrier plate 82 can be improved.

Specifically, in the present embodiment, the number of the lifting cylinders 112 is four, wherein two lifting cylinders 112 are disposed at two opposite ends of one of the bearing plates 82 for jointly lifting one of the bearing plates 82 to perform the lifting movement. Two other lifting cylinders 112 are disposed at opposite ends of the other carrier plate 82 for jointly lifting the other carrier plate 82 for lifting movement. By arranging two lifting cylinders 112 below each bearing plate 82, the stress on the two opposite ends of the bearing plate 82 is uniform, and the lifting process of the bracket 70 and the test plate 10 is more stable.

Alternatively, in another embodiment, the number of the lifting cylinders 112 may also be two, and each lifting cylinder 112 is used for pushing one of the bearing plates 82 to ascend or descend.

In other alternative embodiments, the number of the lifting cylinders 112 may also be six, eight, or ten, and the like, and the number may be specifically set according to the sizes of the bearing plate 82 and the bracket 70, and the embodiment of the invention is not particularly limited.

Alternatively, in another embodiment, the lifting mechanism 110 may be reused with the second driving member 42 to directly lift the carriage 70 and the testing board 10 up or down by using the second driving member 42, thereby simplifying the structure of the burn-in testing apparatus 100 and reducing the volume of the burn-in testing apparatus 100. Alternatively, the lift mechanism 110 may be separate from the second actuator 42 to simplify the control of the burn-in test apparatus 100. The lifting mechanism 110 may be an air cylinder, a motor, etc., and the embodiment of the present invention is not limited in particular.

Further, as shown in fig. 6 and 7, the burn-in test apparatus 100 includes a plurality of temperature probes 120, the plurality of temperature probes 120 are disposed above the test stage 80, and when the test board 10 is located at the predetermined position, each temperature probe 120 is correspondingly abutted to one device under test 12.

Specifically, in the present embodiment, the device under test 12 is subjected to aging detection by using a single-point contact measurement method. Through adopting single-point contact measurement mode to detect, can detect a plurality of elements 12 that await measuring simultaneously, and the testing result of a plurality of elements 12 that await measuring does not influence each other, so, can promote detection efficiency.

Further, as shown in fig. 7 and 8, fig. 8 is a schematic top view of a part of the elements of the burn-in test apparatus in fig. 6. The test board 10 is provided with an burn-in test circuit, and the device 12 to be tested is electrically connected to the burn-in test circuit. The burn-in test apparatus 100 includes a control board 130, a control circuit is disposed on the control board 130, when the test board 10 is located at a predetermined position, the control board 130 is in butt joint with the test board 10, and the control circuit is electrically connected to the burn-in test circuit.

Specifically, the control board 130 is used for supplying power to the test board 10 and for burn-in testing the device 12 to be tested. When the control board 130 receives the test signal, the test signal is simultaneously input to the plurality of devices under test 12 to cause the plurality of devices under test 12 to generate power consumption, so as to form a test temperature required by the testing of the devices under test 12, thereby performing high-temperature and low-temperature aging test on the devices under test 12. Therefore, only the high and low temperature control can be performed on the device 12 to be tested, and the other working circuits disposed on the test board 10 are not affected, so as to avoid the other working circuits from malfunctioning in the high and low temperature environments and affecting the test result.

In one embodiment, the control board 130 may be fixedly disposed in the burn-in board 20, and the test board 10 contacts the plurality of temperature probes 120 and is abutted against the control board 130 when it is lifted to a predetermined position by the lifting mechanism 110.

In the present embodiment, as shown in fig. 7 and 8, the burn-in apparatus 100 includes a translation assembly 140, the translation assembly 140 is connected to the control board 130, when the test board 10 is located at the predetermined position, the translation assembly 140 drives the control board 130 to move toward the test board 10 and to be abutted against the control board 130, and after the detection of the dut 12 is completed, the translation assembly 140 drives the control board 130 to move away from the test board 10.

Specifically, in the present embodiment, the control board 130 is located in the burn-in board 20 and disposed on a side of the test board 10 facing away from the cart 50. The translation assembly 140 is connected to the control board 130, and when the device 12 to be tested needs to be tested, the translation assembly 140 is used to push the control board 130 to move along the X direction shown in the figure so as to approach the test board 10 and to be abutted against the test board 10. After the detection is completed, the translation assembly 140 is used to push the control board 130 to move in the opposite direction of the X direction shown in the figure so as to be away from the test board 10. Through setting up translation subassembly 140 and control panel 130 in the one side that deviates from shallow 50 of testing panel 10, can avoid translation subassembly 140 or control panel 130 to produce with colluding material mechanism 40 and positioning mechanism 90 and interfere, can remove relatively testing panel 10 through setting up control panel 130, can avoid lifting mechanism 110 to promote the in-process that tests panel 10 rises, produce with testing panel 10 and interfere, and then reduce the frequency that ageing testing equipment 100 broke down, make ageing testing equipment 100 operation more stable.

Further, another aspect of the present invention further provides an aging detection method, as shown in fig. 9, where fig. 9 is a schematic flow chart of the aging detection method in another embodiment of the present invention. The aging detection method in the present embodiment will be described in detail below with reference to fig. 1 to 8. Specifically, the aging detection method comprises the following steps:

step S101: a test board 10 is provided, a device 12 to be tested is disposed on the test board 10, and the test board 10 is placed on a carrier 30.

The test board 10 is provided with an aging test circuit, and the device 12 to be tested is disposed on the test board 10 and electrically connected to the aging test circuit.

Step S102: the hook mechanism 40 is controlled to pull the test board 10 into the burn-in cabinet 20.

The aging test equipment 100 controls the hooking mechanism 40 to extend out of the aging cabinet 20, hooks the test board 10 arranged on the bearing table 30, and then drags the test board 10 to move in the aging cabinet 20, so as to realize automatic feeding of the aging cabinet 20.

Step S103: the control board 130 is connected to the testing board 10, and controls the burn-in cabinet 20 to perform burn-in test on the device 12.

Specifically, the burn-in test apparatus 100 controls the translation member 140 to drive the control board 130 to move in a direction close to the test board 10, so that the control board 130 is in contact with the test board 10, and the control circuit disposed on the control board 130 is electrically connected to the burn-in test circuit disposed on the test board 10. After the control board 130 receives the test signal from the burn-in cabinet 20, the test signal is simultaneously input to the multiple devices to be tested 12 to cause the multiple devices to be tested 12 to generate power consumption, so as to form the test temperature required by the testing of the devices to be tested 12, thereby performing high-low temperature burn-in testing on the devices to be tested 12.

Further, as shown in fig. 10, fig. 10 is a flowchart of step S102 in fig. 9. In this embodiment, the step of controlling the hooking mechanism 40 to pull the test board 10 into the burn-in board 20 specifically includes:

step S201: the trolley 50 provided with the bearing table 30 is controlled to be in butt joint with the aging cabinet 20.

Specifically, the cart 50 may be pushed to move toward the aging cabinet 20, so that the cart 50 is fixed on the aging cabinet 20 by the magnetic attraction members disposed on the aging cabinet 20 and the cart 50, and the cart 50 is prevented from moving relative to the aging cabinet 20 during the feeding and discharging processes of the hooking mechanism 40.

Step S202: the hooking mechanism 40 is controlled to extend out of the burn-in cabinet 20 and hook the test board 10.

Specifically, when taking the material, the first driving component 41 first drives the second driving component 42 to move along the X direction to extend out of the burn-in cabinet 20 and move to the position of the carrier 30, and then the second driving component 42 drives the material taking component 43 to move along the Z direction shown in fig. 3 to contact with the test board 10 on the carrier 30, so that the material taking part 432 arranged on the material taking component 43 is connected with the matching part 72 arranged on the bracket 70 in a matching manner to hook the test board 10.

Step S203: the hook mechanism 40 is controlled to reset and the test board 10 is placed on the test stage 80.

Specifically, after the material taking member 43 is coupled to the bracket 70, the first driving member 41 drives the second driving member 42 to move in the direction opposite to the X direction to pull the hooked test board 10 into the burn-in board 20, and place the test board 10 on the testing table 80.

Further, as shown in fig. 11, fig. 11 is a schematic flow chart of an aging detection method in another embodiment of the present invention. The aging detection method in the embodiment includes the following steps:

step S301: a test board 10 is provided, a device 12 to be tested is disposed on the test board 10, and the test board 10 is placed on a carrier 30.

Step S302: the hook mechanism 40 is controlled to pull the test board 10 into the burn-in cabinet 20.

Steps S301 and S302 in this embodiment are the same as steps S101 and S102 in the above embodiment, respectively, please refer to the description in the above embodiment, and are not repeated here.

Step S303: test plate 10 is positioned.

Specifically, the positioning mechanism 90 positions the test board 10 disposed on the inspection stage 80. Referring to fig. 12, fig. 12 is a schematic flowchart of step S303 in fig. 11. Positioning the test plate 10 includes the steps of:

step S401: positioning mechanism 90 is controlled to position test plate 10 along opposite sides of test plate 10.

Specifically, the positioning mechanisms 90 are disposed on two opposite sides of the inspection station 80 along the Y direction, and when the hooking mechanism 40 moves the carriage 70 onto the inspection station 80, the positioning mechanisms 90 move to position the carriage 70 and the test board 10 on the carriage 70 in the Y direction, so that the test board 10 is disposed corresponding to the thermal probe 120.

Step S402: the pushing mechanism 110 is controlled to push the testing board 10 to move so as to move the testing board 10 to a predetermined position, wherein when the testing board 10 is located at the predetermined position, the thermal probe 120 contacts with the device 12 to be tested disposed on the testing board 10.

Specifically, the burn-in test apparatus 100 controls the pushing mechanism 110 to push the test board 10 to ascend along the Z direction shown in the figure, so that the device 12 under test on the test board 10 abuts against the temperature probe 120, wherein the temperature probe 120 is used for detecting the temperature of the device 12 under test.

Step S304: the control board 130 is connected to the testing board 10, and controls the burn-in cabinet 20 to perform burn-in test on the device 12.

Step S304 in this embodiment is the same as step S303 in the above embodiment, please refer to the description in the above embodiment, and details are not repeated here.

In summary, as will be readily understood by those skilled in the art, in the embodiment of the invention, the carrier 30 is disposed outside the burn-in board 20, the test board 10 with the device 12 to be tested is placed on the carrier 30, and the hook mechanism 40 is disposed inside the burn-in board 20, when the test is started, the hook mechanism 40 extends out of the burn-in board 20 and automatically pulls the test board 10 placed on the carrier 30 into the burn-in board 20, the burn-in board 20 starts to perform the burn-in test on the device 12 to be tested, and when the burn-in board 20 completes the test on the device 12 to be tested, the hook mechanism 40 pushes the test board 10 out of the burn-in board 20 after the test is completed, so as to facilitate the next test, thereby achieving the automatic loading and unloading of the burn-in board 20, compared with the manual transportation of the test board 10 and the device 12 to be tested, not only improving the test efficiency of the burn-in test apparatus 100, but also preventing the test board 10 and the device 12 to be tested from being damaged due to the drop of the test board 10, or the detection personnel are accidentally injured, and the like, so that the production safety is improved.

The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.