Substrate processing apparatus and method
阅读说明:本技术 衬底处理装置和方法 (Substrate processing apparatus and method ) 是由 T·马利南 V·基尔皮 M·普达斯 于 2017-06-21 设计创作,主要内容包括:一种衬底处理装置,包括密封压力容器,诸如原子层沉积ALD装置;流体入口组件,被附接到密封压力容器的壁,该流体入口组件具有穿过壁的流体入口管;以及弹性元件,在流体入口组件中的流体入口管周围,从而将入口管耦合到壁,其中弹性元件的内部表面和外部表面中的一个表面受到在压力容器内主导的压力并且另一表面受到环境压力,以及其中流体入口管防止被携带到内部的流体与所述弹性元件接触;以及一种相关方法。(A substrate processing apparatus comprising a sealed pressure vessel, such as an atomic layer deposition, ALD, apparatus; a fluid inlet assembly attached to a wall of the sealed pressure vessel, the fluid inlet assembly having a fluid inlet tube passing through the wall; and a resilient element around the fluid inlet tube in the fluid inlet assembly, thereby coupling the inlet tube to the wall, wherein one of the inner and outer surfaces of the resilient element is subjected to a pressure prevailing within the pressure vessel and the other surface is subjected to an ambient pressure, and wherein the fluid inlet tube prevents fluid carried to the interior from contacting the resilient element; and an associated method.)
1. A substrate processing apparatus, comprising:
sealing the pressure vessel;
a fluid inlet assembly attached to a wall of the sealed pressure vessel, the fluid inlet assembly having a fluid inlet tube passing through the wall, the apparatus further comprising:
a resilient element around the fluid inlet tube in the fluid inlet assembly, thereby coupling the inlet tube to the wall, wherein one of an inner surface and an outer surface of the resilient element is subjected to a pressure prevailing within the pressure vessel and the other surface is subjected to an ambient pressure, and wherein the fluid inlet tube prevents fluid carried to the interior from contacting the resilient element.
2. The apparatus of claim 1, wherein the resilient element is configured to deform under displacement between fixed parts of an apparatus or assembly.
3. The apparatus of claim 1 or 2, wherein the sealed pressure vessel forms an outer chamber surrounding an inner chamber, the inner chamber being a sealed reaction chamber.
4. The apparatus according to any one of the preceding claims, wherein the resilient element is configured to induce a mechanical pressure on the inlet tube.
5. The apparatus of claim 4, wherein the mechanical pressure is directed inward toward the reaction chamber.
6. The device according to any one of the preceding claims, wherein the inlet tube is formed by two tubes arranged to slide inside each other.
7. The apparatus of claim 6, wherein the reaction chamber comprises a collar that locks the inlet tube in its position.
8. The device of any one of the preceding claims, wherein the inlet tube is arranged to be detached by removing at least a portion of the inlet tube inwardly through the interior of the device.
9. The device of any one of the preceding claims 1 to 7, wherein the inlet tube is arranged to be disassembled by removing at least a portion of the inlet tube outwardly in a direction away from the device.
10. The apparatus according to any one of the preceding claims, wherein the inlet tube is arranged in a fixed position relative to a reaction chamber wall.
11. The apparatus according to any one of the preceding claims, wherein the inlet tube is arranged in a rotatable position with respect to the reaction chamber wall.
12. The device according to any one of the preceding claims, wherein the inlet tube is equipped with a heat distribution element to distribute heat along the inlet tube.
13. The apparatus of claim 12, wherein the heat distribution element extends over a feed-through point of the wall of the sealed pressure vessel.
14. The apparatus of claim 3, wherein the point of contact at which the inlet tube meets the reaction chamber is a non-permanent fixed point.
15. The device of claim 14, wherein the contact points are sealed and/or reinforced.
16. A method in a substrate processing apparatus, comprising:
providing to the sealed pressure vessel: a fluid inlet assembly attached to a wall of the sealed pressure vessel, the fluid inlet assembly having a fluid inlet tube passing through the wall; and a resilient element around the fluid inlet tube in the fluid inlet assembly, thereby coupling the inlet tube to the wall, wherein one of an inner surface and an outer surface of the resilient element is subjected to a pressure prevailing within the pressure vessel and the other surface is subjected to an ambient pressure, and wherein the fluid inlet tube prevents fluid carried to the interior from contacting the resilient element, the method further comprising:
-inducing a mechanical pressure on the inlet pipe via the contraction of the elastic element, the mechanical pressure being directed towards the interior of the pressure vessel.
17. The method of claim 16, wherein the mechanical pressure is caused by a pressure differential between the pressure prevailing within the pressure vessel and the ambient pressure.
Technical Field
The present invention generally relates to substrate processing reactors and methods of operating the same. More particularly, but not exclusively, the invention relates to an Atomic Layer Deposition (ALD) reactor.
Background
This section illustrates useful background information and is not an admission that any of the technology described herein represents prior art.
Various substrate processing apparatuses, such as deposition reactors, typically have components that are in different pressure zones (from ambient pressure to vacuum pressure). The vacuum components are usually adapted to the magnitude of the ambient pressure, and differences in temperature and pressure will cause deformations in undesired locations. Chemical inlet pipes, in particular to chambers (chambers) that are under reduced pressure, are usually led from or via an ambient pressure area and in most cases via an area with a set of different temperatures, which will cause significant stress to the chemical inlet pipe, which may be a critical location for failure. An example of the entry of chemicals into the chamber is shown in US 8,741,062B 1.
Disclosure of Invention
It is an aim of certain embodiments of the present invention to provide an improved apparatus having a fluid inlet assembly, or at least to provide an alternative to the prior art.
According to a first exemplary aspect of the present invention, there is provided a substrate processing apparatus comprising:
sealing the pressure vessel;
a fluid inlet assembly attached to a wall of the sealed pressure vessel, the fluid inlet assembly having a fluid inlet tube passing through the wall, the apparatus further comprising:
a resilient element around a fluid inlet tube in the fluid inlet assembly, thereby coupling the inlet tube to the wall, wherein one of an inner surface and an outer surface of the resilient element is subjected to a pressure prevailing within the pressure vessel and the other surface is subjected to an ambient pressure, and wherein the fluid inlet tube prevents fluid carried to the interior from contacting the resilient element.
In certain example embodiments, the devices of the present disclosure provide pressure-regulated inlet clamping. In certain example embodiments, the resilient element is configured to: is pressed against the pressure vessel due to the pressure difference between the ambient pressure and the pressure prevailing inside the interior of the pressure vessel.
In certain example embodiments, the pressure vessel is sealed meaning that the reaction vessel is a closed or closable chamber.
In certain example embodiments, the resilient element is configured to deform under displacement between fixed parts of the device or assembly. In certain example embodiments, the resilient element is airtight or mostly airtight. When the elastic element is only largely airtight, the gas leakage through the element is preferably only a small leakage to maintain separate pressure areas.
In certain example embodiments, the sealed pressure vessel forms an outer chamber surrounding an inner chamber, which is a sealed reaction chamber.
In certain example embodiments, the fluid inlet assembly is attached to the reaction chamber wall. In certain example embodiments, the fluid inlet assembly is attached to an outer chamber surrounding the reaction chamber. Thus, depending on the implementation, the sealed pressure vessel described above may refer to an outer chamber or to a reaction chamber (with or without an outer chamber surrounding it).
In certain example embodiments, the inlet tube is arranged to be disassembled by removing at least a portion of the inlet tube inwardly through the interior (or reaction chamber) of the apparatus.
In certain example embodiments, the inlet tube is arranged to be disassembled by removing at least a portion of the inlet tube outwardly in a direction away from the apparatus (or reaction chamber).
In certain example embodiments, the inlet tube is arranged in a fixed position relative to the reaction chamber wall. In such embodiments, the inlet tube may be arranged to deform or bend at other points or joints.
In certain example embodiments, the inlet tube is arranged in a rotatable position relative to the reaction chamber wall. In such embodiments, the inlet tube may be arranged to deform or bend at other points or joints.
In certain example embodiments, the resilient element is configured to induce a mechanical pressure on the inlet tube.
In certain example embodiments, the mechanical pressure is directed inward toward the reaction chamber.
In certain example embodiments, the inlet tube is formed by two tubes arranged to slide inside each other.
In certain exemplary embodiments, the reaction chamber comprises a collar that locks the inlet tube in its position.
In certain example embodiments, the inlet tube is equipped with a heat distribution element to distribute heat along the inlet tube. In certain example embodiments, the heat distribution element extends over the entire longitudinal distance of the inlet tube. In certain example embodiments, the heat distribution element extends over only a portion of the entire longitudinal distance of the inlet tube. In certain example embodiments, the heat distribution element is formed from a single component. In certain example embodiments, the heat distribution element is formed from multiple components. In certain example embodiments, the heat distribution element is or includes an active heater element. In certain example embodiments, the heat distribution element is positioned in an ambient pressure condition. In certain example embodiments, the heat distribution element is positioned on the vacuum side (of the pressure vessel).
In certain example embodiments, the heat distribution element extends above a feed-through point of the wall of the sealed pressure vessel.
In certain exemplary embodiments, the contact point where the inlet tube meets the reaction chamber is a non-permanent fixation point.
In certain example embodiments, the contact points are sealed and/or reinforced.
According to a second example aspect of the invention, there is provided a method comprising:
providing to the sealed pressure vessel: a fluid inlet assembly attached to a wall of the sealed pressure vessel, the fluid inlet assembly having a fluid inlet tube passing through the wall; and a resilient element around the fluid inlet tube in the fluid inlet assembly, thereby coupling the inlet tube to the wall, wherein one of an inner surface and an outer surface of the resilient element is subjected to a pressure prevailing within the pressure vessel and the other surface is subjected to an ambient pressure, and wherein the fluid inlet tube prevents fluid carried to the interior from contacting the resilient element, the method further comprising:
the mechanical pressure on the inlet pipe is caused via the contraction of the elastic element, which is directed towards the interior of the pressure vessel.
In certain example embodiments, the mechanical pressure is caused by a pressure difference between a pressure prevailing within the pressure vessel and an ambient pressure.
The foregoing has described various non-limiting exemplary aspects and embodiments of the present invention. The above embodiments are merely illustrative of selected aspects or steps that may be used to implement the present invention. Some embodiments are presented with reference to only some example aspects of the invention. It should be appreciated that corresponding embodiments may also be applied to other example aspects. Any suitable combination of the embodiments may be formed.
Drawings
The invention will now be described, by way of example only, with reference to the accompanying drawings, in which:
FIG. 1 illustrates components of a substrate processing apparatus according to certain example embodiments of the invention;
FIG. 2 shows an enlarged cross-sectional view of the fluid inlet assembly of FIG. 1;
FIG. 3 illustrates a cross-sectional view of a fluid inlet assembly according to another example embodiment of the invention;
FIG. 4 illustrates certain components disclosed in the foregoing embodiments;
FIGS. 5a and 5b illustrate the operation of a mechanical limiter according to certain example embodiments of the invention;
FIG. 6 illustrates a cross-sectional view of a fluid inlet assembly according to yet another example embodiment of the invention;
FIG. 7 illustrates a cross-sectional view of a fluid inlet assembly according to yet another example embodiment of the invention;
FIG. 8 illustrates a cross-sectional view of a fluid inlet assembly according to yet another example embodiment of the invention; and
FIG. 9 illustrates another cross-sectional view of a point of contact between an inlet tube and a reaction chamber wall, according to certain example embodiments.
Detailed Description
In the following description, an Atomic Layer Deposition (ALD) technique is used as an example. However, the present invention is not intended to be limited to ALD techniques, but may be employed in a variety of substrate processing apparatus employing different temperature and/or pressure ranges, for example, in a Chemical Vapor Deposition (CVD) reactor. The substrate processing apparatus may be a vacuum deposition apparatus. Alternatively, the invention may be applied to devices that perform non-deposition processes, such as sintering or etching, e.g. Atomic Layer Etching (ALE).
The basis of the ALD growth mechanism is known to the person skilled in the art. ALD is a special chemical deposition method based on the sequential introduction of at least two reactive precursor species to at least one substrate. However, it should be understood that when using, for example, photon enhanced ALD or plasma assisted ALD (e.g., PEALD), one of these reactive precursors may be replaced by energy, resulting in a single precursor ALD process. For example, deposition of a pure element such as a metal requires only one precursor. When the precursor chemistry contains two elements of a binary material to be deposited, a binary compound (such as an oxide) can be generated with one precursor. Thin films grown by ALD are dense, non-porous and of uniform thickness.
Fig. 1 illustrates components of a
The reaction chamber is a pressure vessel defined by reaction chamber wall(s) 130. In certain example embodiments, as shown in fig. 1, the
During processing, the
The ambient conditions (temperature, pressure) are generally dominant outside of the
The
Fig. 2 shows an enlarged cross-sectional view of the
As mentioned above, during operation of the
When the
In certain example embodiments, such as shown in fig. 2, the
In certain example embodiments, the
In certain example embodiments, the
The depicted
Depending on the implementation, the
Fig. 3 illustrates a cross-sectional view of a
Fig. 4 illustrates the junction of
Fig. 5a and 5b are cross-sectional views illustrating the operation of the mechanical limiter(s) 208. Fig. 5a shows the situation where the outer surface of the
The example of the
In the situation of fig. 5a, the
Fig. 6 shows a cross-sectional view of a
Fig. 7 shows a cross-sectional view of a
Fig. 8 shows a cross-sectional view of a
Fig. 9 shows an implementation in which the contact point (or junction) 901 between the
In yet another alternative embodiment, the
In certain alternative embodiments,
In certain example embodiments, the mechanical pressure placed on the
In certain other alternative embodiments, the substrate processing apparatus includes more than two walls, and the inlet assembly operates on each of the walls.
The description relating to any particular preceding embodiment may be directly applicable to the other disclosed embodiments. This applies both with respect to the structure and operation of the disclosed apparatus.
Without limiting the scope and definition of the patent claims, certain technical effects of one or more of the example embodiments disclosed herein are listed below. One technical effect is to provide a reduction in undesirable stresses in chemical inlet tubes and related structures. Another technical effect is inlet tube pinch, which is adjustable by pressure or other means. Another technical effect is that cold spots are avoided and heat distribution at the chamber feed-throughs is improved. Another technical effect is improved maintainability.
It should be noted that some of the functions or method steps discussed above could be performed in a different order and/or concurrently with each other. Furthermore, one or more of the above-described functions or method steps may be optional or may be combined.
The foregoing description provides a full and informative description of the best mode presently contemplated by the inventors for carrying out the invention, by way of non-limiting examples of specific embodiments and examples thereof. It is obvious to a person skilled in the art, however, that the invention is not restricted to details of the embodiments presented above, but that it can be implemented in other embodiments using equivalent means without deviating from the characteristics of the invention.
Furthermore, some of the features of the above-disclosed embodiments of this invention could be used to advantage without the corresponding use of other features. Accordingly, the foregoing description should be considered as merely illustrative of the principles of the present invention, and not in limitation thereof. The scope of the invention is therefore intended to be limited solely by the appended patent claims.
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