阅读说明：本技术 位移编码器 (Displacement encoder ) 是由 木村彰秀 J.D.托比亚森 于 2018-06-26 设计创作，主要内容包括：本发明公开了一种位移编码器。相对于标尺可移动的检测头检测衍射光并输出检测结果。衍射光被增量图案衍射。信号处理单元计算标尺与检测头之间的相对位移。检测头包括：向标尺发射光的光源；以及检测单元,其包括通过光学元件接收衍射光的光接收单元,其中输出检测信号的光接收元件以预定周期周期性布置。多个光接收元件的数量是偶数。预定周期是通过将基本周期乘以奇数而获得的值。基本周期是由+1级和-1级衍射光在光接收单元上形成的干涉条纹的周期。光接收元件的宽度不等于基本周期的整数倍。(The invention discloses a displacement encoder. A detection head movable relative to the scale detects the diffracted light and outputs a detection result. The diffracted light is diffracted by the incremental pattern. The signal processing unit calculates a relative displacement between the scale and the detection head. The detection head includes: a light source that emits light to the scale; and a detection unit including a light receiving unit that receives the diffracted light by the optical element, wherein the light receiving elements that output detection signals are periodically arranged at a predetermined period. The number of the plurality of light receiving elements is an even number. The predetermined period is a value obtained by multiplying the basic period by an odd number. The fundamental period is a period of interference fringes formed by +1 order and-1 order diffracted lights on the light receiving unit. The width of the light receiving element is not equal to an integral multiple of the fundamental period.)

1. A displacement encoder, comprising:

a scale having an incremental pattern formed therein;

a detection head movable in a measurement direction with respect to the scale, the detection head configured to detect diffracted light obtained by diffraction of light emitted to the scale by the incremental pattern and output a detection result; and

a signal processing unit configured to calculate a relative displacement between the scale and the detection head based on a detection result obtained by the detection head, wherein,

the detection head includes:

a light source configured to emit light to the scale;

a detection unit including a light receiving unit including a plurality of light receiving elements arranged periodically in the measurement direction at a predetermined period, the plurality of light receiving elements being configured to output detection signals of diffracted light from the scale; and

an optical element configured to guide diffracted light to the detection unit,

the number of the plurality of light receiving elements arranged in the measurement direction is an even number,

the predetermined period is a value obtained by multiplying a basic period, which is a period of interference fringes formed on the light receiving unit by +1 st order diffracted light and-1 st order diffracted light of the diffracted lights, by an odd number, and

the width of the light receiving element in the measurement direction is not equal to an integer multiple of the fundamental period.

2. A displacement encoder according to claim 1, wherein +1 st order diffracted light, -1 st order diffracted light, and 0 th order diffracted light from the scale are incident on the detection unit.

3. The displacement encoder of claim 1,

the light receiving unit includes a plurality of detection areas arranged along a measurement direction,

each detection unit includes an even number of light receiving elements arranged in the measurement direction; and is

Of the plurality of detection areas, two detection areas adjacent to each other are offset from each other by a distance equivalent to a quarter of the fundamental period so as to be separated from each other in the measurement direction.

4. The displacement encoder of claim 3,

the first and second detection areas are arranged in sequence along the measuring direction, and

the detection unit outputs the detection signal output from the first detection region as an a-phase signal to the signal processing unit, and outputs the detection signal output from the second detection region as a B-phase signal to the signal processing unit.

5. The displacement encoder of claim 3,

the first, second, third and fourth detection areas are arranged in sequence along the measuring direction, and

the detection unit outputs, to the signal processing unit, a difference a phase signal that is a difference signal between an a phase signal and an a-phase signal, and a difference B phase signal that is a difference signal between a B phase signal that is a detection signal output from the first detection area and a B-phase signal that is a detection signal output from the third detection area, to the detection unit, and the B-phase signal that is a detection signal output from the fourth detection area.

6. The displacement encoder of claim 1,

the light receiving unit includes a plurality of detection areas arranged along a measurement direction,

each detection unit includes an even number of light receiving elements arranged in the measurement direction; and is

Of the plurality of detection areas, two detection areas adjacent to each other are offset from each other by a distance equivalent to one third of the fundamental period so as to be separated from each other in the measurement direction.

7. The displacement encoder of claim 6,

first, second and third detection areas are arranged in the detection unit in the measuring direction in this order, and

the detection unit outputs, to the signal processing unit, a difference a phase signal and a difference B phase signal, which are generated by combining an a phase signal, which is a detection signal output from the first detection area, a B phase signal, which is a detection signal output from the second detection area, and a C phase signal, which is a detection signal output from the third detection area, and which have a phase difference of 90 ° from each other.

8. The displacement encoder of claim 1,

the optical element converges the +1 st order diffracted light and the-1 st order diffracted light to form interference fringes on the detection unit.

9. The displacement encoder of claim 8,

the optical element includes one of a diffraction grating and an optical system including one or more lenses.

10. The displacement encoder of claim 8,

the optical element comprises two mirrors which are arranged in a plane,

a mirror reflects the +1 st order diffracted light to the detection unit, and

the other mirror reflects the-1 st order diffracted light to the detection unit.

11. The displacement encoder of claim 2,

k is an integer equal to or greater than 2,

the basic period is P and the basic period is,

k detection regions arranged in a direction transverse to the measurement direction constitute a detection sequence,

the detection areas are offset with respect to each other by a pitch of P/k.

12. The displacement encoder of claim 11,

n is an integer equal to or greater than 1,

the k detection sequences are arranged periodically along the measurement direction at a pitch of nP + P/k.

Technical Field

The present invention relates to a displacement encoder.

Background

Currently, as one of devices for measuring displacement, an optical displacement encoder is known. An optical displacement encoder includes a scale and a detection head that moves along the scale. For example, the scale is provided with an absolute pattern for detecting a reference position and an incremental pattern for detecting a relative displacement between the scale and the detection head. The optical displacement encoder determines a reference position by using a reference signal that is a detection result of an absolute pattern on a scale. In addition, by taking into account the displacement from the reference position obtained from the detection result of the incremental pattern, the positional relationship between the scale and the detection head can be detected (i.e., can be detected based on the displacement).

Generally, the incremental pattern is formed as a diffraction grating in which a plurality of grating patterns are arranged in the measurement direction. Light is applied (i.e., emitted) to the diffraction grating, and the light intensity of interference fringes formed by interference between +1 order diffracted light and-1 order diffracted light diffracted by the diffraction grating is detected. In such an optical displacement encoder, in order to accurately detect interference fringes between +1 order diffracted light and-1 order diffracted light, it is necessary to prevent or minimize the influence on interference fringes caused by diffracted light having other orders, such as 0 order diffracted light.

For example, a displacement encoder (japanese patent No. 2619566) has been proposed in which 0 th order diffracted light is removed by providing an optical block between a light source and a scale. In this displacement encoder, an index grating (index grating) is inserted between a light source and a scale, and light is applied from the light source to the index grating. A shield for blocking the 0 < th > order diffracted light is disposed between the index grating and the scale. The mask is disposed at such a position as to block the 0 < th > order diffractive light, and not to block the +1 < th > order diffractive light and the-1 < st > order diffractive light. Therefore, the 0 th order diffracted light does not reach the scale while the +1 st and-1 st order diffracted lights reach the scale. As a result, only +1 st order and-1 st order diffracted lights propagate from the scale to the detection unit, so that the influence of the 0 th order diffracted light can be prevented.

Further, another example of a displacement encoder using an index grating has been proposed (japanese patent No. 4856844). In the displacement encoder, light is applied from a light source to a scale, and diffracted light that has passed through the scale is detected. The index grating is interposed between the scale and the detection unit. Further, the diffraction grating is formed (i.e., disposed) only at the position where the +1 st order and-1 st order diffracted lights of the diffracted lights from the scale are incident, so that the other orders diffracted lights including the 0 th order diffracted light are blocked. The +1 st order and-1 st order diffracted lights incident on the index grating are diffracted by the diffraction grating, and form interference fringes on the detection unit. Thus, only +1 st order and-1 st order diffracted lights propagate from the scale to the detection unit, so that the influence of the 0 th order diffracted light can be prevented.

Further, there has been proposed a displacement encoder for removing 0 < th > order diffracted light by using a spatial filter (Kazuhiro Hane et al: 2, "optical encoder using metal surface grating", the Japan Society for precision engineering, Vol.64, No. 10 of 1998). In the displacement encoder, laser light is applied to a scale, and the resulting diffracted light is collimated by a collimator lens. Then, a spatial filter is used in which a slit is provided in a position such that only +1 order and-1 order diffracted lights of the collimated diffracted lights having respective orders from the collimator lens pass therethrough, thereby blocking other orders of diffracted lights including the 0 order diffracted light. Thereafter, the +1 st order and-1 st order diffracted lights are condensed on the detecting unit by the condensing lens, and an interference fringe can be formed on the detecting unit.

In addition, as a solution to the 0 < th > order diffractive light, a configuration capable of preventing the 0 < th > order diffractive light from being generated by optimizing the fine structure of the grating has been proposed (japanese unexamined patent application publication No. h 8-219812).

Disclosure of Invention

However, the following problems exist in the above-described displacement encoders disclosed in japanese patent No. 2619566, japanese patent No. 4856844, and "optical encoder using metal surface grating". As described above, in order to eliminate the influence of the 0 th order diffracted light, it is necessary to add optical elements such as an index grating, a lens, and a spatial filter. As a result, the size of the displacement encoder may increase, and the structure thereof may become complicated.

Further, in these examples, the +1 st order and-1 st order diffracted lights are separated from the diffracted lights of other orders by using the difference in diffraction angle. However, when it is necessary to completely separate diffracted light orders, since the distance by which diffracted lights of different orders are separated from each other cannot be increased, it is necessary to increase the distance between the optical elements. Therefore, the size of the displacement encoder can be further increased.

In japanese unexamined patent application publication No. h8-219812, since only a grating whose structure is optimized can be used, the optical design of the entire encoder is limited.

The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a displacement encoder capable of improving position detection accuracy by removing adverse effects of diffracted light.

A first exemplary aspect of the present invention is a displacement encoder including:

a scale having an incremental pattern formed therein;

a detection head movable in a measurement direction with respect to the scale, the detection head configured to detect diffracted light obtained by diffraction of light emitted to the scale by the incremental pattern and output a detection result; and

a signal processing unit configured to calculate a relative displacement between the scale and the detection head based on a detection result obtained by the detection head, wherein,

the detection head includes:

a light source configured to emit light to the scale;

a detection unit including a light receiving unit including a plurality of light receiving elements arranged periodically in the measurement direction at a predetermined period, the plurality of light receiving elements being configured to output detection signals of diffracted light from the scale; and

an optical element configured to guide diffracted light to the detection unit,

the number of the plurality of light receiving elements arranged in the measurement direction is an even number,

the predetermined period is a value obtained by multiplying a basic period, which is a period of interference fringes formed on the light receiving unit by +1 st order diffracted light and-1 st order diffracted light of the diffracted lights, by an odd number, and

the width of the light receiving element in the measurement direction is not equal to an integer multiple of the fundamental period.

A second exemplary aspect of the present invention is the above displacement encoder, wherein the +1 st order diffracted light, -1 st order diffracted light, and 0 th order diffracted light from the scale are incident on the detection unit.

A third exemplary aspect of the present invention is the above-described displacement encoder, wherein,

the light receiving unit includes a plurality of detection areas arranged along a measurement direction,

each detection unit includes an even number of light receiving elements arranged in the measurement direction; and is

Of the plurality of detection areas, two detection areas adjacent to each other are offset from each other by a distance equivalent to a quarter of the fundamental period so as to be separated from each other in the measurement direction.

A fourth exemplary aspect of the present invention is the above-described displacement encoder, wherein,

the first and second detection areas are arranged in sequence along the measuring direction, and

the detection unit outputs the detection signal output from the first detection region as an a-phase signal to the signal processing unit, and outputs the detection signal output from the second detection region as a B-phase signal to the signal processing unit.

A fifth exemplary aspect of the present invention is the above-described displacement encoder, wherein,

the first, second, third and fourth detection areas are arranged in sequence along the measuring direction, and

the detection unit outputs, to the signal processing unit, a difference a phase signal that is a difference signal between an a phase signal and an a-phase signal, and a difference B phase signal that is a difference signal between a B phase signal that is a detection signal output from the first detection area and a B-phase signal that is a detection signal output from the third detection area, to the detection unit, and the B-phase signal that is a detection signal output from the fourth detection area.

A sixth exemplary aspect of the invention is the above-described displacement encoder, wherein,

the light receiving unit includes a plurality of detection areas arranged along a measurement direction,

each detection unit includes an even number of light receiving elements arranged in the measurement direction; and is

Of the plurality of detection areas, two detection areas adjacent to each other are offset from each other by a distance equivalent to one third of the fundamental period so as to be separated from each other in the measurement direction.

A seventh exemplary aspect of the invention is the above-described displacement encoder, wherein,

first, second and third detection areas are arranged in the detection unit in the measuring direction in this order, and

the detection unit outputs, to the signal processing unit, a difference a phase signal and a difference B phase signal, which are generated by combining an a phase signal, which is a detection signal output from the first detection area, a B phase signal, which is a detection signal output from the second detection area, and a C phase signal, which is a detection signal output from the third detection area, and which have a phase difference of 90 ° from each other.

An eighth exemplary aspect of the invention is the above-described displacement encoder, wherein,

the optical element converges the +1 st order diffracted light and the-1 st order diffracted light to form interference fringes on the detection unit.

A ninth exemplary aspect of the present invention is the above-described displacement encoder, wherein,

the optical element includes one of a diffraction grating and a lens.

A tenth exemplary aspect of the invention is the above-described displacement encoder, wherein,

the optical element comprises two mirrors which are arranged in a plane,

a mirror reflects the +1 st order diffracted light to the detection unit, and

the other mirror reflects the-1 st order diffracted light to the detection unit.

An eleventh exemplary aspect of the invention is the above-described displacement encoder, wherein,

k is an integer equal to or greater than 2,

the basic period is P and the basic period is,

k detection regions arranged in a direction transverse to the measurement direction constitute a detection sequence,

the detection areas are offset with respect to each other by a pitch of P/k.

A twelfth exemplary aspect of the invention is the displacement encoder described above, wherein,

n is an integer equal to or greater than 1,

the k detection sequences are arranged periodically along the measurement direction at a pitch of nP + P/k.

According to the present invention, it is possible to provide a displacement encoder capable of improving the position detection accuracy by removing the adverse effect of unnecessary diffracted light.

The above and other objects, features and advantages of the present invention will be more fully understood from the detailed description given below and the accompanying drawings, which are given by way of illustration only, and thus should not be taken as limiting the present invention.

Drawings

Fig. 1 is a perspective view showing the general configuration of an optical displacement encoder 100 according to a first exemplary embodiment;

fig. 2 is a perspective view showing the configuration of an optical displacement encoder 100 according to the first exemplary embodiment;

FIG. 3 shows interference fringes formed on the detection unit by +1 st order diffracted light and-1 st order diffracted light;

FIG. 4 shows interference fringes formed on the detection unit by +1 st order diffracted light, -1 st order diffracted light, and 0 th order diffracted light;

fig. 5 shows a relationship between interference fringes and a light receiving element according to example 1;

fig. 6 shows a relationship between interference fringes and a light receiving element according to example 2;

fig. 7 shows a relationship between interference fringes and a light receiving element according to example 3;

fig. 8 shows a relationship between interference fringes and a light receiving element according to example 4;

fig. 9 shows a relationship between interference fringes and a light receiving element according to example 5;

fig. 10 shows a relationship between interference fringes and a light receiving element according to comparative example 1;

fig. 11 shows a relationship between interference fringes and a light receiving element according to comparative example 2;

fig. 12 shows a relationship between interference fringes and a light receiving element according to comparative example 3;

fig. 13 shows a relationship between interference fringes and a light receiving element according to comparative example 4;

fig. 14 schematically shows the configuration of a light receiving unit according to a second exemplary embodiment;

fig. 15 schematically shows another configuration of a light receiving unit according to the second exemplary embodiment;

fig. 16 schematically shows another configuration of a light receiving unit according to the second exemplary embodiment;

fig. 17 is a perspective view showing the configuration of an optical displacement encoder according to the third exemplary embodiment.

Fig. 18 shows an example of an optical element according to a third embodiment;

fig. 19 shows another example of an optical element according to the third embodiment;

fig. 20 shows another example of an optical element according to the third embodiment;

FIG. 21 is a perspective view showing the configuration of an optical displacement encoder according to the fourth exemplary embodiment;

FIG. 22 is a top view showing the configuration of an optical displacement encoder according to the fourth exemplary embodiment;

fig. 23 is a side view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment when viewed in the X-axis direction;

fig. 24 is a side view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment when viewed in the Y-axis direction;

fig. 25 schematically shows the configuration of a light-receiving unit LRU1 according to a fifth exemplary embodiment;

fig. 26 schematically shows another configuration of the light-receiving unit LRU2 according to the fifth exemplary embodiment;

fig. 27 schematically shows the configuration of a light-receiving unit LRU3 according to a sixth exemplary embodiment; and

fig. 28 schematically shows another configuration of the light-receiving unit LRU4 according to the sixth exemplary embodiment.

Detailed Description

Exemplary embodiments according to the present invention are explained below with reference to the drawings. Throughout the drawings, the same symbols are assigned to the same components, and their repetitive description is appropriately omitted.

First exemplary embodiment

An optical displacement encoder according to a first exemplary embodiment of the present invention will be explained. Fig. 1 is a perspective view showing the general configuration of an optical displacement encoder 100 according to a first exemplary embodiment. An example case where the optical displacement encoder 100 is configured as a transmission type displacement encoder is explained below. As shown in fig. 1, the optical displacement encoder 100 includes a scale 1, a detection head 2, and a signal processing unit 3. The scale 1 and the detection head 2 are configured such that they can move relative to each other along a measurement direction (X-axis direction in fig. 1) parallel to the longitudinal direction of the scale 1. A pattern for position detection is formed in the scale 1. When light is applied (i.e., emitted) to the pattern, interference light is generated. The detection head 2 detects a change in the measurement direction of the interference light, and outputs a detection signal DET as an electrical signal indicating the detection result to the signal processing unit 3. The signal processing unit 3 performs signal processing on the received detection signal DET, thereby calculating the positional relationship of the scale 1 and the detection head 2.

Note that, in the following description, a direction perpendicular to the measurement direction (X-axis direction in fig. 1) and parallel to the width direction of the scale 1 is defined as a Y-axis direction. That is, the major surface of the scale 1 is the X-Y plane (i.e., parallel to the X-Y plane). Further, a direction perpendicular to the main surface (X-Y plane) of the scale 1, i.e., a direction perpendicular to both the X axis and the Y axis, is defined as a Z-axis direction. In addition, in the perspective view explained below, a direction from the lower left corner toward the upper right corner in the drawing is defined as a positive direction on the X-axis. The direction from the lower right corner toward the upper left corner in the figure is defined as the positive direction on the Y-axis. Further, a direction from the bottom toward the top in the drawing is defined as a positive direction on the Z-axis.

The optical displacement encoder 100 will be explained in more detail below. Fig. 2 is a perspective view showing the configuration of the optical displacement encoder 100 according to the first exemplary embodiment. As shown in fig. 2, the detection head 2 includes a light source 4 and a detection unit 5. As described above, the scale 1 and the detection head 2 are configured such that they can move relative to each other in the measurement direction (X-axis direction in fig. 2).

The light source 4 is a light source that outputs collimated light 4A. The light source 4 includes, for example, a light source element and a collimator. The light output from the light source is collimated by the collimator, thereby becoming collimated light 4A. Examples of useful light sources include LEDs (light emitting diodes), semiconductor lasers, SLEDs (super luminescent diodes) and OLEDs (organic light emitting diodes). Further, as for the collimator, various collimating means such as a lens optical system may be used.

The scale 1 is formed as a plate member whose main surface (X-Y plane) is perpendicular to the Z axis and whose longitudinal direction is parallel to the X axis direction in fig. 2. The scale 1 is disposed at a position where collimated light 4A from the light source 4 is incident on its main surface (X-Y plane) at a right angle. In fig. 2, the scale 1 is disposed on the negative direction side of the Z-axis direction with respect to the light source 4.

The reference pattern 6 and the incremental pattern 7 are formed in a plate member constituting the scale 1.

As a typical example of the reference pattern 6, one light-transmitting portion 6A having a lattice shape (or an elongated rectangular shape) whose longitudinal direction is parallel to the Y direction in fig. 2 is formed. However, the pattern of the reference pattern 6 is not limited to this example. That is, other patterns such as those composed of a plurality of grid patterns may also be used as appropriate.

In the incremental pattern 7, a plurality of lattice-shaped light transmission portions whose longitudinal direction is parallel to the Y direction in fig. 2 are aligned in a line in the X axis direction. That is, the light-transmitting portions 7A and the non-light-transmitting portions 7B are alternately repeatedly arranged in the X-axis direction at the pitch g in the incremental pattern 7.

The scale 1 is preferably formed of glass. In this case, the non-light-transmitting portion is formed of a metal film vapor-deposited on glass, and a region where the metal film is not formed serves as the light-transmitting portion. However, any material capable of forming a lattice-shaped light-transmitting portion through which light passes and a non-light-transmitting portion through which light does not pass may be used as the material of the scale 1.

The detection unit 5 is configured such that it can detect light that has passed through the scale 1. The detection unit 5 includes light receiving units 8 and 9. The light receiving units 8 and 9 are arranged side by side in the Y-axis direction. The detection unit 5 outputs the signals output by the light receiving units 8 and 9 as a detection signal DET.

The light receiving unit 8 is configured such that it can detect light that has passed through the reference pattern 6. In addition, the light receiving unit 8 outputs the detection result to the signal processing unit 3. In the present example, the light receiving element 10 is provided to detect light that has passed through the light transmitting portion 6A of the reference pattern 6. In this way, the light receiving unit 8 outputs an electric signal obtained by converting light having passed through the light transmitting portion 6A of the reference pattern 6 into an electric signal (optical/electrical conversion) to the signal processing unit 3.

The light receiving unit 9 is configured such that it can detect light that has passed through the incremental pattern 7. In addition, the light receiving unit 9 outputs the detection result to the signal processing unit 3. For example, the light receiving unit 9 outputs an electric signal obtained by converting the light having passed through the incremental pattern 7 into an electric signal (optical/electrical conversion) to the signal processing unit 3. The light receiving unit 9 is formed as a light receiving element array in which an even number of light receiving elements 11 (e.g., photodiodes) are arranged at a pitch suitable for detecting interference fringes formed by light diffracted by the incremental pattern 7.

Alternatively, the light receiving unit 9 may have a configuration in which a diffraction grating including an even number of light transmitting portions arranged therein is disposed above a photodiode having a large light receiving area. In this case, each portion in which the respective light receiving elements are disposed substantially functions as the above-described light receiving element.

Next, the interference fringes formed on the light receiving unit 9 will be explained. The light having passed through the incremental pattern 7 is diffracted therein, and the diffracted light forms interference fringes on the light receiving unit 9. First, the interference fringes 20 formed on the light receiving unit 9 by the +1 st order diffracted light and the-1 st order diffracted light are explained below. Fig. 3 shows interference fringes 20 formed on the light receiving unit 9 by +1 order and-1 order diffracted lights. As shown in fig. 3, the interference fringes 20 having the period P are formed by +1 order and-1 order diffracted lights on the light receiving unit 9. Hereinafter, the period of the interference fringes 20 formed on the light receiving unit 9 by the +1 st order and-1 st order diffracted lights will be referred to as "fundamental period P".

However, diffracted light of other orders, that is, diffracted light having orders other than +1 order and-1 order that has passed through the incremental pattern 7 is also incident on the light receiving unit 9. Among the diffracted lights of other orders, the light intensity of the 0 th order diffracted light is large. Therefore, the interference fringes formed on the light receiving unit 9 are affected by the 0 th order diffracted light.

Fig. 4 shows interference fringes 30 formed on the light receiving unit 9 by +1 st order diffracted light, -1 st order diffracted light, and 0 th order diffracted light. As shown in fig. 4, a peak 31 and a low peak 32 alternately appear in the interference fringe 30 formed on the light receiving unit 9 by the +1 st order diffracted light, the-1 st order diffracted light, and the 0 th order diffracted light. Since the high peak 31 and the low peak 32 are separated from each other by a distance corresponding to the fundamental period P, the interference fringe 30 has a waveform in which the high peak 31 and the low peak 32 repeatedly (and alternately) appear at a period 2P, that is, twice the fundamental period P. Therefore, when simply converting the light intensity of the interference fringe 30 into an electric signal (optical/electrical conversion), the output signal OUT indicating the conversion result also has a waveform in which a high peak and a low peak occur at the period 2P, that is, twice the basic period P.

To solve this problem, in the optical displacement encoder 100, by configuring and arranging the light receiving elements of the light receiving unit 9 in conformity with the design conditions shown below, it is possible to reduce or prevent the influence of unnecessary interference items such as the above-described 0 th order diffracted light. The configuration and arrangement of the light receiving element 11 of the light receiving unit 9 in the present exemplary embodiment will be explained in detail below. In the light receiving unit 9, a plurality of light receiving elements 11 are arranged in the X direction so as to satisfy the following design conditions 1 to 3.

[ design Condition 1]

In this exemplary embodiment, the light receiving elements 11 of the light receiving unit 9 are arranged such that the number of the light receiving elements 11 arranged in the X direction becomes an even number. Hereinafter, this condition is referred to as "design condition 1".

[ design Condition 2]

Further, in this exemplary embodiment, the light receiving elements 11 of the light receiving unit 9 are arranged such that the period (or cycle) in which the light receiving elements 11 are arranged in the X direction becomes an odd multiple of the fundamental period P of the interference fringes (i.e., a number obtained by multiplying the fundamental period P by an odd number). Hereinafter, this condition is referred to as "design condition 2".

[ design Condition 3]

Further, in this exemplary embodiment, the light receiving elements 11 of the light receiving unit 9 are formed such that the width W of each light receiving element 11 in the X direction is not equal to an integral multiple of the fundamental period P of the interference fringes (i.e., the number obtained by multiplying the fundamental period P by an integer). Hereinafter, this condition is referred to as "design condition 3".

By satisfying the above-described design conditions 1 to 3, the light receiving unit 9 can eliminate the influence of the periodicity twice the fundamental period P of the interference fringes 30 caused by the 0 th order diffracted light, so that an output signal varying with the fundamental period P can be obtained. The mechanism of this feature is illustrated below by using an example.

[ example 1]

Fig. 5 shows a relationship between interference fringes and a light receiving element according to example 1. In example 1, the number of arranged light receiving elements is ten, and the period (i.e., period) in which the light receiving elements are arranged (hereinafter referred to as "arrangement period") is equal to the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 0.5 times (i.e., half of) the fundamental period P of the interference fringe. Note that, in the present example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged.

As for the light receiving elements 11A, they are arranged with a period 2P, that is, twice the basic period P as shown in fig. 5. As for the light receiving elements 11B, they are also arranged with the period 2P, that is, twice the basic period P. That is, the light receiving element 11A detects the light intensity at the phase θ in the interference fringe, which varies with the period 2P, that is, twice the fundamental period P. Meanwhile, the light receiving element 11B detects the light intensity at the phase (θ +2 π) in the interference fringe, which varies with the period 2P, that is, twice the fundamental period P.

Hereinafter, half of the number of arranged light receiving elements is denoted by n, and the intensity of light at the phase θ detected by each of the light receiving elements 11A and 11B is denoted by I (θ). The phase θ is defined for the fundamental period P. The interference fringes move by a distance equal to the fundamental period P each time the phase θ changes by 2 π. Further, since the interference fringe 30 has a period twice the fundamental period P as described above, the light intensity I (θ) detected by each of the light receiving elements 11A and 11B at the phase θ has the same value every time the phase θ is changed by 4 π. That is, the relationship of "I (θ) ≠ I (θ +2 pi)" and "I (θ) ═ I (θ +4 pi)" holds. These relationships are also established in the following examples and comparative examples. Here, under the above conditions, the following expression [1] is established.

I_{Total of}＝nI(θ)+nI(θ+2π) [1]

Wherein, I_{Total of}Is the intensity of light detected by the light receiving unit 9.

As the following expression [2]As shown, expression [1] whenever the phase changes by 2 π]Have the same value. Thus, at intensity I_{Total of}Peaks having the same height appear with a period equal to the basic period P.

I_{Total of}＝nI(θ+2π)+nI(θ+2π+2π)

＝nI(θ+2π)+nI(θ)

＝nI(θ)+nI(θ+2π) [2]

As understood from the above description, the output signal OUT rising and falling with the basic period P can be obtained.

[ example 2]

Fig. 6 shows a relationship between interference fringes and a light receiving element according to example 2. In example 2, the number of arranged light receiving elements is four, and the arrangement period of the light receiving elements is three times the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 0.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged.

As for the light receiving elements 11A, they are arranged with a period 6P, that is, six times as long as the basic period P as shown in fig. 6. As for the light receiving elements 11B, they are also arranged with the period 6P, that is, six times the fundamental period P. That is, the light receiving element 11A detects the light intensity at the phase θ in the interference fringe, which varies with the period 2P, that is, twice the fundamental period P. Meanwhile, the light receiving element 11B detects the light intensity at the phase (θ +6 π) in the interference fringe, which varies with the period 2P, that is, twice the fundamental period P.

The following expression [3] holds.

I_{Total of}＝nI(θ)+nI(θ+6π)

＝nI(θ)+nI(θ+2π+4π)

＝nI(θ)+nI(θ+2π) [3]

Wherein: n is half the number of arranged light receiving elements; i (θ) is the intensity of light at the phase θ detected by each of the light receiving elements 11A and 11B; i is_{Total of}Is the intensity of light detected by the light receiving unit 9.

That is, expression [3]]Expression [1] from example 1]The same is true. Thus, similar to example 1, at intensity I_{Total of}Peaks having the same height appear with a period equal to the basic period P. As understood from the above, the output signal OUT rising and falling with the basic period P can be obtained.

[ example 3]

Fig. 7 shows a relationship between interference fringes and a light receiving element according to example 3. In example 3, the number of arranged light receiving elements is four, and the arrangement period of the light receiving elements is three times the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 1.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged.

In this structure, although the width of each light receiving element is different from examples 1 and 2, the light receiving element 11A detects the same waveform as in examples 1 and 2, and the light receiving element 11B also detects the same waveform as in examples 1 and 2. Further, the number of light receiving elements 11A is equal to the number of light receiving elements 11B. Therefore, as in the case of example 1, expressions [1] and [2] are established. As a result, similarly to example 2, the output signal OUT rising and falling with the basic period P can be obtained.

[ example 4]

Fig. 8 shows a relationship between interference fringes and a light receiving element according to example 4. In example 4, the number of arranged light receiving elements is two, and the arrangement period of the light receiving elements is five times the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 1.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged.

In this structure, although the number of light receiving elements and the width of each light receiving element are different from those of example 3, the light receiving element 11A and the light receiving element 11B are separated by a distance of five times the basic period P. Therefore, the above expressions [1] and [2] hold. As a result, similarly to example 3, the output signal OUT rising and falling at the basic period P can be obtained.

[ example 5]

Example 5 is a modified example of example 2, and is an example of obtaining a four-phase signal. Fig. 9 shows a relationship between interference fringes and a light receiving element according to example 5. In example 5, the number of arranged light receiving elements for each phase is an even number, and the arrangement period of the light receiving elements for each phase is three times the fundamental period P of the interference fringes. Further, the width W of each light receiving element for each phase is 0.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements for the a phase, the B phase, the a-phase, and the B-phase are denoted by symbols A, B, A "and B", respectively.

As shown in fig. 9, each of the light receiving elements 12 to 15 for A, B, A-and B-phases, respectively, is arranged in a similar manner to the light receiving element 11 (light receiving elements 11A and 11B) according to fig. 2. In other words, although the arrangement period of the light receiving elements adjacent to each other is 0.75 times the fundamental period P, the arrangement of the light receiving elements for each phase is the same as that of example 2 when focusing on the light receiving elements for each phase, due to the fact that example 5 is configured to be able to obtain a four-phase signal. That is, according to example 5, as in the case of example 2, the output signal OUT which rises and falls with the basic period P can be obtained without being affected by unnecessary interference light.

Further, for comparison with the above-described examples, a comparative example that does not satisfy at least one of the above-described design conditions 1 to 3 was studied.

[ comparative example 1]

Fig. 10 shows a relationship between interference fringes and a light receiving element according to comparative example 1. In comparative example 1, the number of arranged light receiving elements is three, and the arrangement period of the light receiving elements is three times the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 0.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged. That is, comparative example 1 does not satisfy design condition 1 described above.

The following expression [4] holds.

I_{Total of}＝(m+1)I(θ)+mI(θ+2π) [4]

Wherein: m is a value obtained by dividing the number of arranged light receiving elements by 2; i (θ) is the intensity of light at the phase θ detected by each of the light receiving elements 11A and 11B; and I_{Total of}Is the intensity of light detected by the light receiving unit 9.

In the expression [4], when the phase is changed by 2 π, i.e., the fundamental period P, the expression [5] shown below is obtained.

I_{Total of}＝(m+1)I(θ+2π)+mI(θ+2π+2π)

＝(m+1)I(θ+2π)+mI(θ) [5]

Since the interference fringes vary with a period 2P, which is twice the fundamental period P as described above, the stems at positions separated from each other by the fundamental period PThe light intensities involved in the fringes are not equal to each other. Thus, expression [3]Intensity of (1)_{Total of}Is different from the expression [4]]A value of (1).

In the expression [4], when the phase is changed by 4 π, that is, twice the fundamental period P, the expression [6] shown below is obtained.

I_{Total of}＝(m+1)I(θ+4π)+mI(θ+2π+4π)

＝(m+1)I(θ)+mI(θ+2π) [6]

Thus, expression [5]]Becomes equal to expression [3]]The same is true. That is, at intensity I_{Total of}Peaks having the same height appear with a period equal to twice the basic period P. As a result, the output signal OUT becomes a signal varying with a period equal to twice the fundamental period P as in the case of the interference fringe 30, and has a waveform in which highly different peaks exist mixedly. As a result, the accuracy of position detection deteriorates.

[ comparative example 2]

Fig. 11 shows a relationship between interference fringes and a light receiving element according to comparative example 2. In comparative example 2, the number of arranged light receiving elements is four, and the arrangement period of the light receiving elements is twice the fundamental period P of the interference fringes. Further, the width W of each light receiving element is 0.5 times the fundamental period P of the interference fringe. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged. That is, comparative example 2 does not satisfy design condition 2 described above.

As for the light receiving elements 11A, they are arranged with a period 4P, which is four times the basic period P as shown in fig. 11. As for the light receiving elements 11B, they are also arranged at four times the period 4P, i.e., the basic period P.

The following expression [7] holds.

I_{Total of}＝nI(θ)+nI(θ+4π)

＝2nI(θ) [7]

Wherein: n is half the number of arranged light receiving elements; i (θ) is the intensity of light at the phase θ detected by each of the light receiving elements 11A and 11B; and I_{Total of}Is the intensity of light detected by the light receiving unit 9.

That is, as expressed in [6]]Shown, due to the strength I_{Total of}The light intensity of the interference fringe at the phase θ is directly reflected, so it varies with the period 2P, that is, twice the fundamental period P, as in the case of the interference fringe. As a result, the output signal OUT becomes a signal varying with a period equal to twice the fundamental period P as in the case of the interference fringe 30, and has a waveform in which highly different peaks exist mixedly. As a result, the accuracy of position detection deteriorates.

[ comparative example 3]

Fig. 12 shows a relationship between interference fringes and a light receiving element according to comparative example 3. In comparative example 3, the number of arranged light receiving elements is four, and the arrangement period of the light receiving elements is three times the fundamental period P of the interference fringes. Further, the width W of each light receiving element is equal to the fundamental period P of the interference fringes. In this example, the light receiving elements 11A and the light receiving elements 11B are alternately arranged. That is, comparative example 3 does not satisfy design condition 3 described above.

In this example, the waveform of the interference fringes detected by the light receiving element 11A is the same as that in example 2. Further, the waveform of the interference fringes detected by the light receiving element 11B is also the same as that in example 2. However, since the width W of each light receiving element is equal to the fundamental period P, the output signal OUT from 9 is flattened. As a result, the period of the output signal OUT is twice the basic period P. That is, since the period of the output signal OUT becomes longer than the basic period P, the position detection accuracy deteriorates accordingly.

In this example, a case where the width W of each light receiving element is equal to the fundamental period P is explained. However, the above is also true when the width W of each light receiving element is an odd multiple of the fundamental period P.

[ comparative example 4]

Fig. 13 shows a relationship between interference fringes and a light receiving element according to comparative example 4. In comparative example 4, the number of arranged light receiving elements was four, and the arrangement period of the light receiving elements was three times the fundamental period P. Further, the width W of each light receiving element is twice the fundamental period P of the interference fringe. That is, comparative example 4 does not satisfy design condition 3 described above.

In this example, the waveform of the interference fringes detected by the light receiving element 11A is the same as that in example 2. Further, the waveform of the interference fringes detected by the light receiving element 11B is also the same as that in example 2. However, since the width W of each light receiving element is twice the fundamental period P and is equal to the period of the interference fringes 30, the intensity of light detected by the light receiving unit 9 becomes constant. As a result, the output signal OUT becomes a signal having no periodicity, and therefore position detection cannot be performed.

In this example, a case where the width W of each light receiving element is twice the fundamental period P is explained. However, the above is also true when the width W of each light receiving element is an even number times the fundamental period P.

In the above description, attention is paid to the 0 < th > order diffractive light having the largest influence among the unnecessary diffractive lights. However, the configuration according to this exemplary embodiment can also reduce the influence by unnecessary diffracted light having other orders. Hereinafter, a mechanism regarding this feature will be explained by using an example of reducing or preventing the influence of +2 order diffracted light and-2 order diffracted light.

When the complex amplitudes of the +2 order diffracted light, +1 order diffracted light, 0 order diffracted light, -1 order diffracted light, and-2 order diffracted light are denoted by u +2, u +1, u0, u-1, and u-2, respectively, the interference fringes formed at the light receiving unit 9 can be expressed as a sum I of the products of these five complex amplitudes and their conjugated five complex amplitudes. Note that the conjugate of the complex amplitude of the diffracted light of a given order is represented by adding a bar above its sign.

The period of the interference fringes expressed by each term of the above expression can be calculated from the traveling directions of the two diffracted lights. Since the period of the interference fringes formed by the +1 order and-1 order diffracted lights is the fundamental period P, the period of the interference fringes of each item is as shown in the following table.

As described above, the period of the interference fringes formed by the 0 th order diffracted light and the +1 st order diffracted light and the period of the interference fringes formed by the 0 th order diffracted light and the-1 st order diffracted light are twice the fundamental period P. Therefore, the influence thereof can be eliminated by the above configuration.

The period of interference fringes formed by +1 order diffracted light and +2 order diffracted light and the period of interference fringes formed by-1 order diffracted light and-2 order diffracted light are twice the fundamental period P. Therefore, the influence thereof can be eliminated by the above configuration.

The period of the interference fringes formed by the-1 st order diffracted light and the +2 nd order diffracted light and the period of the interference fringes formed by the +1 st order diffracted light and the-2 nd order diffracted light are two thirds of the fundamental period P. In this case, by arranging the light receiving elements 11A and 11B, the influence of unnecessary interference light is finally eliminated.

Therefore, according to this structure, it is possible to remove a part of the influence of the interference fringes formed by the +2 order and-2 order diffracted lights, that is, the influence of the interference fringes having a period twice the fundamental period P and a period two-thirds of the fundamental period P.

Meanwhile, interference fringes formed by the-2 order and +2 order diffracted lights have a period half of the fundamental period P, and the influence of the interference fringes remains without being removed. However, since the light intensities of the-2 nd and +2 nd order diffracted lights are much smaller than those of the 0 th order diffracted light, the-1 st order diffracted light, and the +1 st order diffracted light, their effects are relatively small (or negligible). Therefore, as described above, by eliminating the influence caused by unnecessary diffracted light having other orders, the position detection accuracy can be sufficiently improved without eliminating the influence of interference fringes formed by +2 order diffracted light and-2 order diffracted light.

Furthermore, it has been explained that the interference component having a period of two-thirds of the basic period and a period of twice the basic period can be removed in the above description. However, considering the case where diffracted lights of 3 orders or more are mixed, interference components having a period 2/(2 × n +1) times the fundamental period P, where n is an integer not less than zero, among all the formed interference fringes can be removed. That is, according to this structure, it can be understood that an interference component having a specific period among unnecessary interference components caused by mixed diffracted light having an order higher than 1 order can be removed.

As described above, according to this structure, the influence of unnecessary diffracted light can be reduced or prevented without adding an optical element or the like for removing unnecessary diffracted light. Therefore, since the physical size of the displacement encoder is not increased, it is advantageous to reduce the size of the displacement encoder.

Second exemplary embodiment

An optical displacement encoder according to a second exemplary embodiment of the present invention is explained below. In this exemplary embodiment, a modified example of the light receiving unit 9 is explained. Fig. 14 schematically shows the configuration of a light receiving unit according to the second exemplary embodiment. In the light receiving unit 40, two detection regions 41 and 42 are arranged in the X direction. Note that the detection regions 41 and 42 are also referred to as first and second light receiving units, respectively.

Each of the detection regions 41 and 42 has a configuration similar to that of the light receiving unit 9 according to the first exemplary embodiment. However, the light receiving elements of the detection area 42 are shifted from the light receiving elements of the detection area 41 by a distance equivalent to a quarter of the basic period P in the X direction. That is, the detection regions 41 and 42 are shifted from each other in the X direction by a distance equivalent to a quarter of the fundamental period P so as to be separated from each other in the X direction. In this case, the distance between the nearest light receiving elements in the connecting portion between the detection regions 41 and 42 is 1.25C.

With this configuration, the detection region 41 can output an a-phase signal (0 °), and the detection region 42 can output a B-phase signal (90 °). By generating the phase difference signal as described above, more accurate position detection can be achieved.

Further, another example of the configuration of the light receiving unit is explained. Fig. 15 schematically shows another configuration of a light receiving unit according to the second exemplary embodiment. In the light receiving unit 50, four detection regions 51 to 54 are arranged in this order in the X direction. Each of the detection regions 51 to 54 has a configuration similar to that of the light receiving unit 9 according to the first exemplary embodiment. Note that the detection regions 51 to 54 are also referred to as first to fourth light receiving units, respectively.

The light receiving elements of the detection area 52 are shifted from the light receiving elements of the detection area 51 in the X direction by a distance equivalent to a quarter of the basic period P. The light receiving elements of the detection area 53 are shifted from the light receiving elements of the detection area 52 by a distance equivalent to a quarter of the basic period P in the X direction. The light receiving elements of the detection area 54 are shifted from the light receiving elements of the detection area 53 by a distance equivalent to a quarter of the basic period P in the X direction. That is, the detection regions 51 to 54 are arranged such that two adjacent light receiving units are shifted from each other in the X direction by a distance equivalent to a quarter of the fundamental period P so as to be separated from each other in the X direction. In this case, the distance between the nearest light receiving elements in the connecting portion between two adjacent light receiving units is 1.25C.

According to this configuration, the detection regions 51, 52, 53, and 54 can output an a-phase signal (0 °), a B-phase signal (90 °), an a-phase signal (180 °), and a B-phase signal (270 °), respectively. In this manner, a difference a phase signal may be generated from the a phase signal (0 °) and the a-phase signal (180 °), and a difference B phase signal may be generated from the B phase signal (90 °) and the B-phase signal (270 °). By generating the phase difference signal as described above, more accurate position detection can be achieved.

Further, another example of the configuration of the light receiving unit is explained. Fig. 16 schematically shows another configuration of the light receiving unit according to the second exemplary embodiment. In the light receiving unit 60, three detection regions 61 to 63 are arranged in this order in the X direction. Each of the detection regions 61 to 63 has a configuration similar to that of the light receiving unit 9 according to the first exemplary embodiment. In addition, the detection regions 61 to 63 are also referred to as 1 st to 3 rd light receiving units, respectively.

The light receiving elements of the detection region 62 are shifted from the light receiving elements of the detection region 61 in the X direction by a distance equivalent to one third of the basic period P. The light receiving elements of the detection region 63 are shifted from the light receiving elements of the detection region 62 by a distance equivalent to one third of the basic period P in the X direction. That is, the detection regions 61 to 64 are arranged such that two adjacent light receiving units are shifted from each other in the X direction by a distance equivalent to one third of the basic period P so as to be separated from each other in the X direction. In this case, the distance between the nearest light receiving elements in the connecting portion between two adjacent light receiving units is 4/3C (i.e., 1.3333.. C).

With this configuration, the detection regions 61, 62, and 63 can output an a-phase signal (0 °), a B-phase signal (120 °), and a C-phase signal (240 °), respectively. In this way, the difference a phase signal (0 °) and the difference B phase signal (90 °) can be generated by combining the three phase signals, thereby achieving more accurate position detection.

Third exemplary embodiment

Next, an optical displacement encoder according to a third exemplary embodiment will be described. Fig. 17 is a perspective view showing the configuration of an optical displacement encoder 300 according to the third exemplary embodiment. Here, the optical displacement encoder 300 is configured as a transmission type displacement encoder.

As shown in fig. 17, the optical displacement encoder 300 has a configuration in which an optical element 70 is added to the optical displacement encoder 100 according to the first exemplary embodiment. The optical element 70 is configured to receive diffracted light including at least +1 st order diffracted light, -1 st order diffracted light, and 0 th order diffracted light, and guide the received diffracted light to the light receiving unit 9 of the detection unit 5. In other words, the optical element 70 is configured to converge the received diffracted light on the detection unit 5 so that the +1 st order diffracted light and the-1 st order diffracted light form the interference fringes 20 on the light receiving unit 9. In fig. 17, the optical element 70 is represented as a diffraction grating, as an example. In the optical element 70, light-transmitting portions 70A elongated in the Y-axis direction are periodically arranged in the X-axis direction on a plate-like member 70B having a principal plane parallel to the X-Y plane. However, it is to be understood that various optical elements capable of condensing diffracted light on the light receiving unit 9 may be used as the optical element 70.

Fig. 18 shows an example of an optical element according to the third embodiment. As shown in fig. 18, a diffraction grating 71 is provided as an optical element. The diffraction grating 71 has the same configuration as the optical element 70 configured as a diffraction grating. The diffraction grating 71 further diffracts the +1 st order diffracted light L +1 and the-1 st order diffracted light L-1 to the detection unit 5 to form the interference fringes 20. As the diffraction grating 71, various gratings including an amplitude grating and a phase grating may be used.

Fig. 19 shows another example of the optical element according to the third embodiment. As shown in fig. 19, the lens 72 is provided as an optical element. The lens 72 converges the +1 st order diffracted light L +1 and the-1 st order diffracted light L-1 on the detection unit 5 to form the interference fringes 20. Various lenses such as a ball lens may be used as the lens 72. Note that the lens 72 is merely an example of an optical element. An optical system including two or more lenses may also be employed as long as the +1 st order diffracted light L +1 and the-1 st order diffracted light L-1 can be converged on the detection unit 5. For example, a double telecentric lens system (double lens, 4f design) or a double telecentric lens system may be employed.

Fig. 20 shows another example of the optical element according to the third embodiment. As shown in fig. 20, mirrors 73 and 74 are provided as optical elements. The mirrors 73 and 74 are desirably disposed symmetrically with respect to the optical axis of the optical displacement encoder 300, the optical axis of the optical displacement encoder 300 passing through the centers of the light source and the detection unit 5 and being parallel to the Z direction so as to face each other. The mirror 73 reflects the +1 st order diffracted light L +1 transmitted from the scale 1 to the detection unit 5, and the mirror 74 reflects the-1 st order diffracted light L-1 transmitted from the scale 1 to the detection unit 5. Therefore, the reflected diffracted light can form interference fringes 20 on the detection unit 5. The arrangement of the mirrors may not be limited to the current arrangement. Other arrangements may also be employed as long as the diffracted light is appropriately guided to the detection unit 5.

In the examples shown in fig. 18 to 20, the 0 th order diffracted light L0 also reaches the detection unit 5 through the optical element. However, it is to be understood that the effect of the 0 th order diffracted light L0 can be appropriately suppressed or eliminated based on the principle explained in the above exemplary embodiment. Thus, a more compact design can be achieved, since the blocking is not a desired function for suppressing errors, as described above.

As described above, according to this configuration, the influence of unnecessary diffracted light can be reduced or prevented without adding an optical element or the like for removing unnecessary diffracted light, as in the above-described exemplary embodiments.

Fourth exemplary embodiment

Next, an optical displacement encoder according to a fourth exemplary embodiment will be described. Fig. 21 is a perspective view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment. Fig. 22 is a plan view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment. Fig. 23 is a side view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment when viewed in the X-axis direction. Fig. 24 is a side view showing the configuration of an optical displacement encoder 400 according to the fourth exemplary embodiment when viewed in the Y-axis direction.

In contrast to the optical displacement encoder 300, the optical displacement encoder 400 has a configuration in which the scale 1 and the optical element 70 are replaced with the scale 90 and the optical element 80, respectively, and the arrangement of the components therein is changed.

In the present configuration, the optical displacement encoder 400 is configured as a reflection type displacement encoder. The light source 4 and the detection unit 5 are disposed to face one surface (top surface in fig. 21) of the optical element 80, and the scale 90 is disposed to face the other surface (bottom surface in fig. 21) of the optical element 80.

In fig. 21 to 24, collimated light 4A, laser light 4D, and +1 st order diffracted light L are used to show the optical paths₊₁And-1 st order diffracted light L_-1Represented by three lines. Here, three lines in fig. 21, 22, and 24 are shown as being separated in the X-axis direction, and three lines in fig. 23 are shown as being separated in the Y-axis direction. Note that, when viewed in the X direction,₊1 st order diffracted light L₊₁And-1 st order diffracted lightL_-1And (4) overlapping. Therefore, for simplicity, only the illustration in FIG. 23 is provided₊1 st order diffracted light L₊₁。

In the present exemplary embodiment, collimated light 4A output from the light source 4 is incident on the scale 90. In the present exemplary embodiment, the light source 4 includes a semiconductor laser 4B and a collimator lens 4C. The semiconductor laser 4B outputs laser light 4D to the collimator lens 4C. In fig. 21, the semiconductor laser 4B is represented as a CAN package in which a semiconductor laser diode that outputs laser light 4D is mounted. The wavelength of the laser light 4D may be, for example, 660 nm. The collimator lens 4C collimates the laser light 4D and outputs the collimated light 4A to the scale 90.

Since the optical displacement encoder 400 is configured as a reflection type displacement encoder, the light source 4 is disposed such that collimated light 4A is incident on the scale 90 in a direction inclined with respect to the surface of the scale 90. In the examples of fig. 21 to 24, collimated light 4A is incident on the scale 90 in directions inclined at a predetermined angle with respect to the surface of the scale 90 in the YZ plane. Note that the incidence direction of the collimated light 4A in fig. 21 to 24 is merely an example, and another direction may be selected as the incidence direction. Therefore, the temperature of the molten metal is controlled,₊1 st order diffracted light L₊₁And-1 st order diffracted light L_-1Does not overlap with the path of the collimated light 4A, and the detection unit 5 can appropriately receive the diffracted light without interfering with the light source 4.

The scale 90 is configured as a reflective grating. Pitch P of incremental pattern of scale 90_sMay be, for example, 2_μm. The collimated light 4A incident on the scale 90 is diffracted and reflected by the scale 90.

The optical element 80 is configured and arranged to receive light including at least₊Diffracted light of the 1 st order diffracted light, and the 0 th order diffracted light, and guides the received diffracted light to the light receiving unit 9 of the detecting unit 5. In other words, the optical element 80 is configured to converge the received diffracted light on the detection unit 5 so that₊The 1 st order diffracted light and the-1 st order diffracted light form interference fringes 20 on the detection unit 5.

The configuration of the optical element 80 will be described. The optical element 80 is configured as a transmission type grating. The optical element 80 includes a periodic pattern 81 and a transparent substrate 82. The transparent substrate 82 is a plate-like member formed of a transparent material such as glass or synthetic quartz, and has a principal plane parallel to the XY plane. In addition, the transparent substrate 82 is omitted in fig. 22 for the sake of simplicity.

The distance D1 in the Z-axis direction between the top surface of the scale 90 and the bottom surface of the transparent substrate 82 may be, for example, 2.5 mm. The thickness T1 of the transparent substrate 82 in the Z direction may be, for example, 2.286mm (or 0.09 inches). The distance D2 in the Z-axis direction between the top surface of the scale 90 and the light receiving surface of the detection unit 5 may be, for example, 13.28 mm.

The periodic pattern 81 is formed on the top surface of the transparent substrate 82 facing the light source 4 and the detection unit 5. The periodic pattern 81 may be formed as a phase grating. In this case, the grooves extending in the Y-axis direction and arranged periodically in the X-axis direction constitute the periodic pattern 81. The periodic grooves may be formed by general photolithography and etching (e.g., dry etching such as RIE reactive ion etching]) And (4) forming. Pitch P of periodic grooves_iMay be, for example, 4/3 μm (1.333 … μm).

Pitch P of interference fringes 20_fMay be defined by the following expression.

When P is present_sIs 2 μm and P_iAt 4/3 μm (1.333 … μm), the pitch P_fIs 2 μm.

As described above, according to this configuration, the influence of unnecessary diffracted light can be reduced or prevented without adding an optical element or the like for removing unnecessary diffracted light, as in the above-described exemplary embodiments.

The optical element 80 may not be limited to a diffraction grating. Various optical elements such as lenses and mirrors described in the third exemplary embodiment may be used as the optical element 80.

Fifth exemplary embodiment

In this exemplary embodiment, a modified example of the light receiving unit 9 according to the above-described exemplary embodiment will be described. Fig. 25 schematically shows the configuration of a light-receiving unit LRU1 according to the fifth exemplary embodiment. The light-receiving unit LRU1 includes a plurality of detection sequences DS arranged in the Y direction. In this example, for the sake of simplicity, a light-receiving unit LRU1 including two detection sequences DS arranged in the Y direction will be described. In fig. 25, DS11 denotes one of the two detection sequences DS, and DS12 denotes the other of the two detection sequences DS. It should be understood that three or more detection areas may be arranged in the Y direction in the light-receiving unit LRU 1.

Each detection sequence DS comprises a plurality of detection areas. In this exemplary embodiment, a four-phase configuration in which four detection regions DA11 to DA14 are provided will be described. The detection areas DA11 to DA14 are configured to provide A, B, A-and B-phase signals, respectively. It should be understood that two (two-phase configuration), three (three-phase configuration), five or more detection regions may be provided in each detection region.

Each of the detection areas DA11 through DA14 has a configuration similar to that of the light receiving unit 9 according to the first exemplary embodiment. When the detection regions DA11 to DA14 are arranged in the Y direction, the detection regions DA11 to DA14 are respectively shifted by one quarter (i.e., P/4) of the fundamental period P to provide a four-phase configuration.

Specifically, the light receiving elements 11 in the detection area DA12 are shifted by P/4 in the X direction with respect to the light receiving elements 11 in the detection area DA 11. The light receiving elements 11 in the detection area DA13 are shifted by P/4 in the X direction with respect to the light receiving elements 11 in the detection area DA 12. The light receiving elements 11 in the detection area DA14 are shifted by P/4 in the X direction with respect to the light receiving elements 11 in the detection area DA 13.

The light receiving elements 11 in the detection area DA11 are connected to each other to combine the output signals, and the combined signal is output as an a-phase signal. The light receiving elements 11 in the detection area DA12 are connected to each other to combine the output signals, and the combined signal is output as a B-phase signal. The light receiving elements 11 in the detection area DA13 are connected to each other to combine the output signals, and the combined signal is output as an a-phase signal. The light receiving elements 11 in the detection area DA14 are connected to each other to combine the output signals, and the combined signal is output as a B-phase signal.

The same phase signals output from the detection sequences DS11 and DS12 are combined, and the combined phase signal is output to the signal processing unit 3. Specifically, the a-phase signals output from the detection sequences DS11 and DS12 are combined and the combined a-phase signal is output to the signal processing unit 3. The B-phase signals output from the detection sequences DS11 and DS12 are combined and the combined B-phase signal is output to the signal processing unit 3. The a-phase signals output from the detection sequences DS11 and DS12 are combined and the combined a-phase signal is output to the signal processing unit 3. The B-phase signals output from the detection sequences DS11 and DS12 are combined and the combined B-phase signal is output to the signal processing unit 3.

According to this configuration, the detection regions DA11 to DA14 can output an a-phase signal (0 °), a B-phase signal (90 °), an a-phase signal (180 °), and a B-phase signal (270 °), respectively. Therefore, as in the second exemplary embodiment, it is possible to generate a phase difference signal and achieve more accurate position detection.

In addition, since the inspection regions are arranged transversely to the measurement direction (i.e., the X direction) in the Y direction, even when there is any contaminated or defective inspection region, other inspection regions that are not contaminated or defective can compensate for adverse effects due to contamination or defects. Therefore, the accuracy of the output signal of the light receiving unit can be appropriately maintained.

Next, another configuration of the light receiving unit will be described. Fig. 26 schematically shows another configuration of the light-receiving unit LRU2 according to the fifth exemplary embodiment. In this example, the light-receiving unit LRU2 has a three-phase configuration.

The light-receiving unit LRU2 has a configuration in which the detection sequences DS11 and DS12 of the light-receiving unit LRU1 are replaced by detection sequences DS21 and DS22, respectively.

Each of the detection sequences DS21 and DS22 includes three detection regions DA21 to DA 23. The detection regions DA21 to DA23 are configured to provide A, B and C-phase signals, respectively.

Each of the detection regions DA21 to DA23 has a similar configuration to each of the detection regions DA11 to DA14 except for the arrangement pitch of the light receiving elements 11. Although the detection regions DA21 to DA23 are arranged in the Y direction, the detection regions DA21 to DA23 are respectively shifted by one third (P/3) of the basic period P to provide a three-phase configuration.

Therefore, the light receiving elements 11 in the detection area DA22 are shifted by P/3 in the X direction with respect to the light receiving elements 11 in the detection area DA 21. The light receiving elements 11 in the detection area DA23 are shifted by P/3 in the X direction with respect to the light receiving elements 11 in the detection area DA 22.

The light receiving elements 11 in the detection area DA21 are connected to each other to combine the output signals, and the combined signal is output as an a-phase signal. The light receiving elements 11 in the detection area DA22 are connected to each other to combine the output signals, and the combined signal is output as a B-phase signal. The light receiving elements 11 in the detection area DA23 are connected to each other to combine the output signals, and the combined signal is output as a C-phase signal.

The same phase signals output from the detection sequences DS21 and DS22 are combined and the combined phase signal is output to the signal processing unit 3. Specifically, the a-phase signals output from the detection sequences DS21 and DS22 are combined and the combined a-phase signal is output to the signal processing unit 3. The B-phase signals output from the detection sequences DS21 and DS22 are combined and the combined B-phase signal is output to the signal processing unit 3. The C-phase signals output from the detection sequences DS21 and DS22 are combined and the combined C-phase signal is output to the signal processing unit 3.

According to this configuration, the detection regions DA21 to DA23 can output an a phase signal (0 °), a B phase signal (120 °), and a C phase signal (240 °), respectively. Therefore, as in the case of the light-receiving unit LRU1, it is possible to generate a phase difference signal and achieve more accurate position detection.

In addition, as in the case of the light receiving unit LRU1, the accuracy of the output signal of the light receiving unit can be appropriately maintained.

Note that by modifying the light receiving unit described in the present exemplary embodiment, a light receiving unit corresponding to a multiphase signal can be realized. Specifically, a light receiving unit capable of obtaining a k-phase signal, where k is an integer equal to or greater than 2, can be realized. In this case, in one detection region, k detection regions in which light receiving elements are arranged in the measurement direction (X direction) at a pitch P may be arranged along a direction (Y direction) transverse to the measurement direction (X direction), and the k detection regions are shifted from each other in the measurement direction (X direction) by a pitch of P/k.

Sixth exemplary embodiment

In this exemplary embodiment, a modified example of the light-receiving units LRU1 and LRU2 according to the fifth exemplary embodiment will be described.

Fig. 27 schematically shows the configuration of a light-receiving unit LRU3 according to the sixth exemplary embodiment. The light-receiving unit LRU3 is a modified example of the LRU 1. Therefore, the light-receiving unit LRU3 is configured to have a four-phase configuration.

In the light receiving unit LRU3, four detection sequences DS11 are arranged in the X direction at a pitch nP + P/4, where n is an integer equal to or greater than 1, and four detection sequences DS12 are arranged in the X direction at a pitch nP + P/4. In this example, DS11_1 to DS11_4 respectively represent four detection sequences DS11 arranged from the left side to the right side in the X direction in the drawing. DS12_1 to DS12_4 respectively represent four detection sequences DS12 arranged from the left side to the right side in the X direction in the figure.

The detection sequence DS11_1 outputs A, B, A-and B-phase signals in the same manner as the detection sequence DS11 in the light-receiving unit LRU 1.

In this configuration, since two adjacent detection regions are shifted substantially by nP + P/4 in the X direction, the phase corresponding to the light receiving element 11 in one of the adjacent two detection regions is shifted substantially by 90 ° from the phase corresponding to the light receiving element 11 in the other of the two adjacent detection regions.

Therefore, the detection regions DA11 in the detection sequences DS11_1 through DS11_4 output A, B, A-and B-phase signals, respectively. The detection areas DA12 in the detection sequences DS11_1 to DS11_4 output B, A-, B-, and a-phase signals, respectively. The detection areas DA13 in the detection sequences DS11_1 to DS11_4 output a-, B-, a-, and B-phase signals, respectively. The detection areas DA14 in the detection sequences DS11_1 to DS11_4 output B-, A, B, and a-phase signals, respectively. The same phase signals output from the detection sequences DS11_1 to DS11_4 are combined, and the combined signal is output to the signal processing unit 3.

Since the principle of the detection sequences DS11_1 to DS11_4 can also be applied to the detection sequences DS12_1 to DS12_4, the description of the detection sequences DS12_1 to DS12_4 will be omitted.

According to this configuration, since the detection areas are further arranged in the measurement direction (i.e., the X direction) than the light receiving units LRU1, even when there is any contaminated or defective detection area, other uncontaminated or non-defective detection areas can compensate for the adverse effects of contamination or X-direction defects. Therefore, the adverse effect of contamination or defects can be further suppressed. Therefore, the accuracy of the output signal of the light receiving unit can be appropriately maintained.

A further improved configuration can be achieved by modifying the light-receiving unit LRU 3. In this configuration, the detection sequences DS11_1 to DS11_4 constitute groups for supplying four phase signals, and the detection sequences DS12_1 to DS12_4 also constitute groups for supplying four phase signals. Therefore, by arranging two or more sets including these four detection regions in the measurement direction (i.e., X direction), it is possible to further suppress the adverse effect of contamination or defects in the measurement direction (i.e., X direction).

Next, another configuration of the light receiving unit will be described. Fig. 28 schematically shows another configuration of the light-receiving unit LRU4 according to the sixth exemplary embodiment. The light-receiving unit LRU4 is a modified example of the light-receiving unit LRU2 having a three-phase configuration.

In the light receiving unit LRU4, three detection sequences DS21 are arranged in the X direction at a pitch of nP + P/3, and three detection sequences DS22 are arranged at a pitch of nP₊P/3 is arranged in the X direction. In this example, DS21_1 to DS21_3 respectively represent three detection sequences DS21 arranged from the left side to the right side in the X direction in the drawing. DS22_1 to DS22_3 respectively represent three detection sequences DS22 arranged from the left side to the right side in the X direction in the figure.

The detection sequence DS21_1 outputs A, B and C-phase signals in the same manner as the detection sequence DS21 in the light-receiving unit LRU 2.

In this configuration, since two adjacent detection regions are shifted by nP + P/3 in the X direction, the phase corresponding to the light receiving element 11 in one of the adjacent two detection regions is shifted by substantially 120 ° from the phase corresponding to the light receiving element 11 in the other of the two adjacent detection regions.

Therefore, the detection regions DA21 in the detection sequences DS21_1 to DS21_3 output A, B and C-phase signals, respectively. The detection regions DA22 in the detection sequences DS21_1 to DS21_3 output B, C and a phase signals, respectively. The detection regions DA23 in the detection sequences DS21_1 to DS21_3 output C, A and B phase signals, respectively. The same phase signals output from the detection sequences DS21_1 to DS21_3 are combined and the combined signal is output to the signal processing unit 3.

Since the principle of the detection sequences DS21_1 to DS21_3 can also be applied to the detection sequences DS22_1 to DS22_3, the description of the detection sequences DS22_1 to DS22_3 will be omitted.

According to this configuration, since the detection areas are further arranged in the measurement direction (i.e., the X direction) than the light receiving units LRU2, even when there is any contaminated or defective detection area, other uncontaminated or non-defective detection areas can compensate for the adverse effects of contamination or X-direction defects. Therefore, the adverse effect of contamination or defects can be further suppressed. Therefore, the accuracy of the output signal of the light receiving unit can be appropriately maintained.

A further improved configuration can be achieved by modifying the light-receiving unit LRU 4. In this configuration, the detection sequences DS21_1 to DS21_3 constitute groups for supplying four phase signals, and the detection sequences DS22_1 to DS22_3 also constitute groups for supplying four phase signals. Therefore, by arranging two or more sets including these four detection regions in the measurement direction (i.e., X direction), it is possible to further suppress the adverse effect of contamination or defects in the measurement direction (i.e., X direction).

Note that by modifying the light receiving unit described in the present exemplary embodiment, a light receiving unit corresponding to a multiphase signal can be realized. Specifically, a light receiving unit capable of obtaining a k-phase signal, where k is an integer equal to or greater than 2, can be realized. In this case, in one detection region, k detection regions in which light receiving elements are arranged in the measurement direction (X direction) at a pitch P may be arranged along a direction (Y direction) transverse to the measurement direction (X direction), and the k detection regions arranged in the Y direction are shifted from each other in the measurement direction (X direction) by a pitch of P/k, as in the fifth exemplary embodiment.

Furthermore, the k detection regions are arranged on the same line in the measurement direction (X direction) at a pitch of nP + P/k. In this case, the j-th detection region arranged in the X direction may output a signal having 2 π (j-1)/k + θ_intWherein j is equal to or greater than 2 and equal to or less than k (2)<＝j<K) and θ) and_intis the initial phase at the first detection region (j ═ 1).

Other exemplary embodiments

Note that the present invention is not limited to the above-described exemplary embodiments, and may be appropriately changed without departing from the spirit of the present invention. Although the optical displacement encoder 100 is illustrated as a transmission type displacement encoder in the above exemplary embodiment, this is merely an example. That is, the optical displacement encoder 100 may be a reflection type displacement encoder.

Further, in the above-described displacement encoder, an index grating for selecting the order of propagating diffracted light may be provided between the light source and the scale and/or between the scale and the detection unit. Further, optical devices such as a diffraction grating and a lens for forming an image from diffracted light from the scale may also be provided between the scale and the detection unit.

In the above-described exemplary embodiments, the configuration of generating the a-phase signal (0 °), the B-phase signal (90 °), the a-phase signal (180 °), and the B-phase signal (270 °) has been described. However, the order of the phases (channels) may change, so some offsets are +1/4, others are +1/2 or-1/2, and others are-1/4. For example, the sequence (A, A-, B, B-) will have steps (1/2, -1/4, 1/2, -1/4).

A configuration may be adopted which has at least three different phases of the fundamental fringe period and includes an element shift corresponding to each of the three phases by an appropriate amount corresponding to the phase thereof. Elements corresponding to each of the at least three phases may be grouped into one or more detection regions for each phase.

The detection regions corresponding to three phases or more are not necessarily arranged in a given order along the X direction. The detector areas may also be arranged in a given order along the Y-direction within substantially the same range of the X-direction. The detector areas corresponding to three or more phases may also be arranged in a two-dimensional pattern in the X and Y directions.

In the above-described displacement encoder, there is no particular limitation on the distance between the scale and the detection unit. However, when optical devices such as a diffraction grating and a lens for converging diffracted light from the scale to form an image are not provided between the scale and the detection unit, the distance between the scale and the detection unit is preferably a distance at which interference fringes are appropriately formed on the detection unit.