阅读说明：本技术 测试控制装置、芯片及方法 (test control device, chip and method ) 是由 卢新元 陈华军 许超 于 2019-09-09 设计创作，主要内容包括：本发明实施例提供一种测试控制装置、芯片及方法,该装置包括权限分析单元、测试控制单元、第一屏蔽单元、加密单元；所述权限分析单元,用于对待验证的权限信息进行验证,并在验证通过时向所述测试控制单元发送第一触发信号；所述测试控制单元,用于在接收到所述第一触发信号、以及第一测试控制信号时,向所述第一屏蔽单元发送第一指示信号,其中,所述第一测试控制信号用于指示进入测试模式,所述第一指示信号用于指示所述第一屏蔽单元将密钥信息传输至所述加密单元。本发明实施例能够在保证密钥安全性的前提下实现对密钥故障的测试,提高基于扫描链的扫描测试的测试覆盖率。(the embodiment of the invention provides a test control device, a chip and a method, wherein the device comprises an authority analysis unit, a test control unit, a first shielding unit and an encryption unit; the permission analysis unit is used for verifying the permission information to be verified and sending a first trigger signal to the test control unit when the permission information passes verification; the test control unit is configured to send a first indication signal to the first shielding unit when receiving the first trigger signal and the first test control signal, where the first test control signal is used to indicate that a test mode is entered, and the first indication signal is used to indicate that the first shielding unit transmits key information to the encryption unit. The embodiment of the invention can realize the test of the key fault on the premise of ensuring the security of the key and improve the test coverage rate of the scan test based on the scan chain.)

1. A test control apparatus, comprising: the device comprises an authority analysis unit, a test control unit, a first shielding unit and an encryption unit;

The permission analysis unit is connected with the test control unit, and the test control unit is connected with the first shielding unit;

The permission analysis unit is used for verifying the permission information to be verified and sending a first trigger signal to the test control unit when the permission information passes verification;

The test control unit is configured to send a first indication signal to the first shielding unit when receiving the first trigger signal and the first test control signal, where the first test control signal is used to indicate that a test mode is entered, and the first indication signal is used to indicate that the first shielding unit transmits key information to the encryption unit.

2. The test control device according to claim 1, wherein the permission analysis unit is further configured to send a second trigger signal to the test control unit when the permission information is not verified;

The test control unit is further configured to send a second indication signal to the first shielding unit when receiving the second trigger signal and the first test control signal, where the second indication signal is used to indicate the first shielding unit to shield key information.

3. the apparatus according to claim 2, wherein the test control unit is further configured to send the first indication signal to the first masking unit when receiving a second test control signal, wherein the second test control signal is used to indicate entering a functional mode.

4. The test control apparatus of claim 1, wherein the encryption unit comprises a flip-flop unit, a second masking unit, wherein the flip-flop unit comprises a plurality of flip-flops, the plurality of flip-flops forming at least one scan chain in a test mode;

the test control unit is connected with the second shielding unit, and the second shielding unit is connected with the trigger unit;

The test control unit is further configured to send the first indication signal to the second shielding unit, where the first indication signal is further configured to indicate the second shielding unit to stop shielding the at least one scan chain, so that the at least one scan chain outputs data stored in each flip-flop when receiving the output indication signal.

5. The test control device of claim 1, wherein the authority analysis unit comprises a controller, a state machine, a trigger generator;

The controller is connected with the state machine, the state machine is connected with the trigger generator, and the trigger generator is connected with the test control unit;

The controller is used for generating a plurality of state switching signals according to the authority information and sequentially sending each state switching signal to the state machine;

The state machine is used for switching states according to the state switching signals and sending a third indication signal to the trigger generator when the state machine is switched to a target state, wherein the target state is the state to which the state machine is finally switched when the authority information is correct;

and the trigger generator is used for generating the first trigger signal and sending the first trigger signal to the test control unit when the third indication signal is received.

6. The test control device of claim 5, wherein the trigger generator is further configured to generate a second trigger signal and send the second trigger signal to the test control unit when the third indication signal is not received.

7. The test control device of claim 1, wherein the permission information is information generated by a processor executing a sequence of functional instructions input by a user and sent to the permission analysis unit.

8. The test control device of any one of claims 1-7, wherein the test control unit comprises an exclusive-or gate, a clock gating unit, a first flip-flop, an inverter;

A first input end of the exclusive-or gate is connected with the permission analysis unit, a second input end of the exclusive-or gate is connected with a test control signal, and an output end of the exclusive-or gate is connected with a signal input end of the first trigger;

The enable end of the clock gating unit is connected with a test control signal, the clock input end of the clock gating unit is connected with a clock signal, and the output end of the clock gating unit is connected with the clock input end of the first trigger;

the reset input end of the first trigger is connected with a reset signal, and the output end of the first trigger is connected with the input end of the phase inverter;

The output end of the phase inverter is respectively connected with the first shielding unit and the encryption unit.

9. The test control device of any one of claims 1-7, wherein the first trigger signal is high and the first indicator signal is high.

10. A chip, comprising: a test control apparatus as claimed in any one of claims 1 to 9.

11. A test control method, comprising:

The authority analysis unit verifies the authority information to be verified and sends a first trigger signal to the test control unit when the authority information passes the verification;

When receiving the first trigger signal and a first test control signal, the test control unit sends a first indication signal to the first shielding unit, wherein the first test control signal is used for indicating to enter a test mode, and the first indication signal is used for indicating the first shielding unit to transmit key information to the encryption unit.

12. The test control method of claim 11, further comprising:

the permission analysis unit sends a second trigger signal to the test control unit when the permission information is not verified;

And the test control unit sends a second indication signal to the first shielding unit when receiving the second trigger signal and the first test control signal, wherein the second indication signal is used for indicating the first shielding unit to shield key information.

13. the test control method of claim 12, further comprising:

and the test control unit sends the first indication signal to the first shielding unit when receiving a second test control signal, wherein the second test control signal is used for indicating to enter a functional mode.

14. the test control method according to any one of claims 11 to 13, wherein the authority information is information generated by a processor executing a sequence of functional instructions input by a user and sent to the authority analysis unit.