阅读说明：本技术 一种轴角类芯片自动测试系统的实现方法 (Method for realizing automatic testing system of shaft angle type chip ) 是由 颜玲龙 李康 吴文韬 王柳 梁龙营 张明 孟猛 于 2021-08-23 设计创作，主要内容包括：本发明是一种轴角类芯片自动测试系统的实现方法,于芯片自动测试领域。该方法是基于LabView平台开发的界面控制软件,配合基于Keil平台开发的嵌入式控制软件,对测试、测量用设备和仪器完成参数设置、操纵控制以及数据采集,实现计算机与主控板的通信、数据交换、指令控制,完成自动测试流程,实现对轴角类芯片电压电流,角度转换精度和积分非线性误差,速度精度和最大跟踪速度,参考信号频率,参考中心电压和直流失配,参考电压和交流失配,基准电压和基准电压抑制,以及逻辑输出高电平和低电平功能的测试。本发明方法可以有效替代芯片相应参数的人工测试,同时提高单片芯片的测试效率,提高测试数据的可靠性。(The invention discloses a method for realizing an automatic testing system of an axial angle chip, and belongs to the field of automatic testing of chips. The method is based on interface control software developed by a LabView platform and matched with embedded control software developed by a Keil platform, parameter setting, operation control and data acquisition of equipment and instruments for testing and measurement are completed, communication, data exchange and instruction control of a computer and a main control board are realized, an automatic test process is completed, and the test of axial angle chip voltage and current, angle conversion precision and integral nonlinear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and direct current mismatch, reference voltage and alternating current mismatch, reference voltage and reference voltage suppression and the function of logically outputting high level and low level is realized. The method can effectively replace manual testing of corresponding parameters of the chip, and simultaneously improves the testing efficiency of the single chip and the reliability of testing data.)

1. An implementation method of an automatic test system of an axial angle chip is characterized in that: the implementation method is based on interface control software developed by a LabView platform, and is matched with embedded control software developed by a Keil platform, parameter setting, operation control and data acquisition are completed on equipment and instruments for testing and measurement, communication, data exchange and instruction control between a computer and a main control board are realized, an automatic test process is completed, voltage and current of an axial angle chip, angle conversion precision and integral nonlinear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and direct current mismatch, reference voltage and alternating current mismatch, reference voltage and reference voltage suppression, and the test of logic output high level and low level functions are realized, and all data are automatically recorded and stored in the test process;

the hardware equipment tested mainly comprises: the system comprises an axial angle signal source, a digital multimeter, a program control power supply and a main control board; the hardware equipment has data communication capacity with the computer, and the main control board has data acquisition and processing capacity besides the communication capacity with the computer;

the software tested is interface control software and embedded control software, the interface control software has the capabilities of man-machine interaction, state display control and data processing, and the embedded control software has the capabilities of data acquisition, analysis and control.

2. The method for implementing the automatic test system of the shaft-angle chips according to claim 1, wherein the method comprises the following steps: the interface control software completes various configuration settings and equipment control through man-machine interaction, and the process comprises the following steps: determining the model of a tested chip, matching test cases, configuring case parameters, controlling a test instrument, establishing communication with a main control board, sending instructions, analyzing and storing data, giving a test result, and generating a test report according to a preset format; the testing process of the embedded control software comprises the following steps: and the computer is communicated with the computer, analyzes instructions, controls the state of the chip, collects and analyzes data and uploads the data to the computer according to a preset format.

3. The method for implementing the automatic test system of the shaft-angle chips according to claim 1, wherein the automatic test method of the voltage and the current of the shaft-angle chips comprises the following steps: the method comprises the steps of realizing control over a programmable power supply through interface control software, configuring voltage values and maximum output currents of two channels of the programmable power supply, controlling on-off of a switch, starting to read real-time output voltage and output current values of the programmable power supply at regular time when the switch is turned on, synchronously displaying the real-time output voltage and output current values in a voltage and current display area of the interface control software, judging whether the difference between current voltage and current and preset voltage and current indexes meets a test qualified standard or not, controlling the on-off state of the programmable power supply, completing automatic test of chip voltage and current, and finally recording test data and results.

4. The method for implementing the automatic test system of the shaft angle chip according to claim 1, wherein the test method of the angle conversion precision and the integral nonlinear error of the shaft angle chip comprises the following steps: the interface control software carries out parameter configuration on a signal source according to a preset parameter group, controls the signal source to receive reference voltage output by a chip to be tested, enables the signal source to provide a standard test angle to the chip to be tested according to requirements, simultaneously sends a parallel port acquisition or serial port acquisition instruction to a main control board, selects a corresponding acquisition mode by the main control board, rapidly and repeatedly acquires a current measured angle value under the same angle value, carries out analysis processing on data according to a certain algorithm, respectively obtains an integral nonlinear error value and a calculation precision value, uploads the processed data quantity to a computer in real time, and completes data statistics, judgment, storage and test result recording by the interface control software.

5. The method for implementing the automatic test system of the shaft-angle chips according to claim 1, wherein the test method of the speed precision and the maximum tracking speed of the shaft-angle chips comprises the following steps: the interface control software is used for controlling a signal source to output an angle at a certain rotating speed according to the requirements of the test parameter group, the main control board receives a control instruction of the interface control software, configures the working state of the chip to be tested, selects a corresponding serial port or parallel port mode to acquire speed conversion data, then uploads the data to the interface control software, and the interface control software is used for finishing data judgment, analysis and storage and finishing test result recording.

6. The method for implementing the automatic test system of the shaft-angle chip according to claim 1, wherein the test method of the frequency of the reference signal of the shaft-angle chip is as follows: the interface control software is used for controlling the digital multimeter to be switched to a frequency measurement gear, meanwhile, a control instruction of a reference signal frequency test is sent to the main control board, the main control board configures excitation output of a chip to be tested according to the received instruction, and controls the relay to complete switching of the digital universal test point, the interface control software is used for collecting data on the digital multimeter, judging and storing the data, and recording the test result.

7. The method for implementing the automatic test system of the shaft-angle chip according to claim 1, wherein the test method for mismatching of the reference center voltage and the reference direct current of the shaft-angle chip is as follows: the digital multimeter is controlled by interface control software to be switched to a direct-current voltage test gear, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and an analog ground, direct-current voltage data on the digital multimeter are read by the interface control software, a central voltage value is directly read, the central voltage is calculated to obtain a direct-current mismatch value, and finally judgment, storage and test result recording are completed.

8. The method for implementing the automatic test system of the shaft-angle chip according to claim 1, wherein the test method for mismatching of the reference voltage and the reference alternating current of the shaft-angle chip is as follows: the digital multimeter is controlled to be switched to an alternating voltage gear by interface control software, meanwhile, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and a simulation ground, the interface control software reads alternating voltage data on the digital multimeter, the voltage value of the reference signal is directly read, the reference voltage is calculated to obtain an alternating mismatch value, and finally, judgment, storage and test result recording are completed.

9. The method for implementing the automatic test system of the shaft angle type chip according to claim 1, wherein the test method for the reference voltage and the reference voltage suppression of the shaft angle type chip is as follows: the method comprises the steps of controlling the digital multimeter to be switched to a direct-current voltage gear through interface control software, sending a control instruction of a reference voltage test to a main control board, configuring excitation output of a tested chip by the main control board according to the received instruction, controlling a relay to complete switching of a digital universal test point to a reference voltage output pin, collecting direct-current voltage data on the digital multimeter by the interface control software, wherein the direct-current voltage data are a measured reference voltage value, controlling a program control power supply by the interface software to change power supply voltage of the tested chip, testing output values of the reference voltage pin at an upper limit and a lower limit of the power supply voltage respectively, obtaining a reference voltage inhibition value through calculation, comparing, judging and storing the measured reference voltage and the calculated inhibition value with standard data respectively, and completing test result recording.

10. The method for implementing the automatic test system of the shaft angle type chip according to claim 1, wherein the test method of the logic output high level and the low level of the shaft angle type chip is as follows: the interface control software is used for controlling the digital multimeter to be switched to an AC/DC voltage gear, controlling a signal source to output an angle of 181 degrees when testing a high level, the main control board configures excitation output of a chip to be tested according to a received instruction, controlling a relay to complete switching of a digital universal test point to a pin at the highest position of a parallel port output data line of the chip, then the interface control software is used for collecting DC voltage data on the digital multimeter, controlling the signal source to output an angle of 1 degree when testing a low level, completing DC voltage data collection at the highest position of the parallel port output data line according to the same method of testing the high level, finally comparing the test data with a standard value by the interface control software, completing judgment and storage, and completing test result recording.

Technical Field

The invention belongs to the technical field of automatic testing of axial angle chips, and is used for automatically measuring a chip with an axial angle resolving function.

Background

Under the tendency of chip localization, the independent research and development is rapid, the independent research and development of the shaft angle chip can greatly promote the development of the related technical field of shaft angle conversion, because the functions and characteristics of the shaft angle chip are greatly different from those of other conventional chips, more difficulties and problems are faced in research, development and test to batch production, the thorough verification in the research and development stage can only be met by depending on manual test, and in order to improve the productivity of the chip, and quickly and reliably test and measure the core functions and performances of the chips such as angle conversion precision, speed precision, maximum tracking speed, output excitation performance and the like, a test system combined by software and hardware is required to realize automatic test.

Disclosure of Invention

The technical problem to be solved by the invention is to provide a system for automatically testing the core function of a specific type of chip by matching hardware and software, so that the system can effectively replace manual testing of corresponding parameters of the chip, improve the testing efficiency of a single chip and improve the reliability of testing data.

The technical problem to be solved by the present invention is achieved by the following technical means. The invention relates to a method for realizing an automatic testing system of an axial angle chip, which is characterized by comprising the following steps: the implementation method is based on interface control software developed by a LabView platform, and is matched with embedded control software developed by a Keil platform, parameter setting, operation control and data acquisition are completed on equipment and instruments for testing and measurement, communication, data exchange and instruction control between a computer and a main control board are realized, an automatic test process is completed, voltage and current of an axial angle chip, angle conversion precision and integral nonlinear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and direct current mismatch, reference voltage and alternating current mismatch, reference voltage and reference voltage suppression, and the test of logic output high level and low level functions are realized, and all data are automatically recorded and stored in the test process;

the hardware equipment tested mainly comprises: the system comprises an axial angle signal source, a digital multimeter, a program control power supply and a main control board; the hardware equipment has data communication capacity with the computer, and the main control board has data acquisition and processing capacity besides the communication capacity with the computer;

the software tested is interface control software and embedded control software, the interface control software has the capabilities of man-machine interaction, state display control and data processing, and the embedded control software has the capabilities of data acquisition, analysis and control.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the interface control software completes various configuration settings and equipment control through man-machine interaction, and the process comprises the following steps: determining the model of a tested chip, matching test cases, configuring case parameters, controlling a test instrument, establishing communication with a main control board, sending instructions, analyzing and storing data, giving a test result, and generating a test report according to a preset format; the testing process of the embedded control software comprises the following steps: and the computer is communicated with the computer, analyzes instructions, controls the state of the chip, collects and analyzes data and uploads the data to the computer according to a preset format.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the automatic test method for the voltage and the current of the axial angle type chip comprises the following steps: the method comprises the steps of realizing control over a programmable power supply through interface control software, configuring voltage values and maximum output currents of two channels of the programmable power supply, controlling on-off of a switch, starting to read real-time output voltage and output current values of the programmable power supply at regular time when the switch is turned on, synchronously displaying the real-time output voltage and output current values in a voltage and current display area of the interface control software, judging whether the difference between current voltage and current and preset voltage and current indexes meets a test qualified standard or not, controlling the on-off state of the programmable power supply, completing automatic test of chip voltage and current, and finally recording test data and results.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the method for testing the angle conversion precision and the integral nonlinear error of the axial angle chip comprises the following steps: the interface control software carries out parameter configuration on a signal source according to a preset parameter group, controls the signal source to receive reference voltage output by a chip to be tested, enables the signal source to provide a standard test angle to the chip to be tested according to requirements, simultaneously sends a parallel port acquisition or serial port acquisition instruction to a main control board, selects a corresponding acquisition mode by the main control board, rapidly and repeatedly acquires a current measured angle value under the same angle value, carries out analysis processing on data according to a certain algorithm, respectively obtains an integral nonlinear error value and a calculation precision value, uploads the processed data quantity to a computer in real time, and completes data statistics, judgment, storage and test result recording by the interface control software.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the method for testing the speed precision and the maximum tracking speed of the axial angle type chip comprises the following steps: the interface control software is used for controlling a signal source to output an angle at a certain rotating speed according to the requirements of the test parameter group, the main control board receives a control instruction of the interface control software, configures the working state of the chip to be tested, selects a corresponding serial port or parallel port mode to acquire speed conversion data, then uploads the data to the interface control software, and the interface control software is used for finishing data judgment, analysis and storage and finishing test result recording.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the method for testing the frequency of the reference signal of the axial angle type chip comprises the following steps: the interface control software is used for controlling the digital multimeter to be switched to a frequency measurement gear, meanwhile, a control instruction of a reference signal frequency test is sent to the main control board, the main control board configures excitation output of a chip to be tested according to the received instruction, and controls the relay to complete switching of the digital universal test point, the interface control software is used for collecting data on the digital multimeter, judging and storing the data, and recording the test result.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the method for testing the mismatching of the reference center voltage and the reference direct current of the axial angle type chip comprises the following steps: the digital multimeter is controlled by interface control software to be switched to a direct-current voltage test gear, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and an analog ground, direct-current voltage data on the digital multimeter are read by the interface control software, a central voltage value is directly read, the central voltage is calculated to obtain a direct-current mismatch value, and finally judgment, storage and test result recording are completed.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the testing method for mismatching of the reference voltage and the reference alternating current of the axial angle type chip comprises the following steps: the digital multimeter is controlled to be switched to an alternating voltage gear by interface control software, meanwhile, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and a simulation ground, the interface control software reads alternating voltage data on the digital multimeter, the voltage value of the reference signal is directly read, the reference voltage is calculated to obtain an alternating mismatch value, and finally, judgment, storage and test result recording are completed.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the test method for the reference voltage and the reference voltage suppression of the shaft angle type chip comprises the following steps: the method comprises the steps of controlling the digital multimeter to be switched to a direct-current voltage gear through interface control software, sending a control instruction of a reference voltage test to a main control board, configuring excitation output of a tested chip by the main control board according to the received instruction, controlling a relay to complete switching of a digital universal test point to a reference voltage output pin, collecting direct-current voltage data on the digital multimeter by the interface control software, wherein the direct-current voltage data are a measured reference voltage value, controlling a program control power supply by the interface software to change power supply voltage of the tested chip, testing output values of the reference voltage pin at an upper limit and a lower limit of the power supply voltage respectively, obtaining a reference voltage inhibition value through calculation, comparing, judging and storing the measured reference voltage and the calculated inhibition value with standard data respectively, and completing test result recording.

The invention relates to a method for realizing an automatic testing system of an axis angle chip, which further adopts the preferable technical scheme that: the testing method of the logic output high level and the low level of the shaft angle type chip comprises the following steps: the interface control software is used for controlling the digital multimeter to be switched to an AC/DC voltage gear, controlling a signal source to output an angle of 181 degrees when testing a high level, the main control board configures excitation output of a chip to be tested according to a received instruction, controlling a relay to complete switching of a digital universal test point to a pin at the highest position of a parallel port output data line of the chip, then the interface control software is used for collecting DC voltage data on the digital multimeter, controlling the signal source to output an angle of 1 degree when testing a low level, completing DC voltage data collection at the highest position of the parallel port output data line according to the same method of testing the high level, finally comparing the test data with a standard value by the interface control software, completing judgment and storage, and completing test result recording.

Compared with the prior art, the method has the following beneficial effects: the invention is a system for automatically testing the core function of a specific type of chip by matching hardware and software, which can effectively replace the manual test of corresponding parameters of the chip, and simultaneously improve the test efficiency of a single chip and the reliability of test data.

Drawings

FIG. 1 is a block diagram of an automatic test system for an axial angle chip;

FIG. 2 is an automatic test flow diagram;

FIG. 3 is a voltage and current test flow diagram;

FIG. 4 is a flow chart of an angle transformation accuracy and integral non-linear error test;

FIG. 5 is a velocity accuracy and maximum tracking velocity test flow chart;

FIG. 6 is a reference signal frequency test flow chart;

FIG. 7 is a reference center voltage and DC mismatch test flow diagram;

FIG. 8 is a reference voltage and AC mismatch test flow diagram;

FIG. 9 is a reference voltage and reference voltage inhibit test flow diagram;

FIG. 10 is a logic output high and low test flow diagram.

Detailed Description

The technical solutions of the present invention are further explained below with reference to the accompanying drawings so that those skilled in the art can further understand the present invention, but do not constitute a limitation on the rights of the present invention.

Embodiment 1, an implementation method of an automatic testing system for an axial angle chip is based on an interface control software developed by a LabView platform, and is matched with an embedded control software developed by a Keil platform, so as to complete parameter setting, operation control and data acquisition for equipment and instruments for testing and measurement, realize communication, data exchange and instruction control between a computer and a main control board, complete an automatic testing process, and realize the tests of voltage and current, angle conversion precision and integral nonlinear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and direct current mismatch, reference voltage and alternating current mismatch, reference voltage and reference voltage suppression, and logic output high-level and low-level functions of the axial angle chip, and complete automatic recording and storing of all data in the testing process;

the hardware equipment tested mainly comprises: the system comprises an axial angle signal source, a digital multimeter, a program control power supply and a main control board; the hardware equipment has data communication capacity with the computer, and the main control board has data acquisition and processing capacity besides the communication capacity with the computer;

the software tested is interface control software and embedded control software, the interface control software has the capabilities of man-machine interaction, state display control and data processing, and the embedded control software has the capabilities of data acquisition, analysis and control.

The interface control software completes various configuration settings and equipment control through man-machine interaction, and the process comprises the following steps: determining the model of a tested chip, matching test cases, configuring case parameters, controlling a test instrument, establishing communication with a main control board, sending instructions, analyzing and storing data, giving a test result, and generating a test report according to a preset format; the testing process of the embedded control software comprises the following steps: and the computer is communicated with the computer, analyzes instructions, controls the state of the chip, collects and analyzes data and uploads the data to the computer according to a preset format.

The automatic test method for the voltage and the current of the axial angle type chip comprises the following steps: the method comprises the steps of realizing control over a programmable power supply through interface control software, configuring voltage values and maximum output currents of two channels of the programmable power supply, controlling on-off of a switch, starting to read real-time output voltage and output current values of the programmable power supply at regular time when the switch is turned on, synchronously displaying the real-time output voltage and output current values in a voltage and current display area of the interface control software, judging whether the difference between current voltage and current and preset voltage and current indexes meets a test qualified standard or not, controlling the on-off state of the programmable power supply, completing automatic test of chip voltage and current, and finally recording test data and results.

The method for testing the angle conversion precision and the integral nonlinear error of the axial angle chip comprises the following steps: the interface control software carries out parameter configuration on a signal source according to a preset parameter group, controls the signal source to receive reference voltage output by a chip to be tested, enables the signal source to provide a standard test angle to the chip to be tested according to requirements, simultaneously sends a parallel port acquisition or serial port acquisition instruction to a main control board, selects a corresponding acquisition mode by the main control board, rapidly and repeatedly acquires a current measured angle value under the same angle value, carries out analysis processing on data according to a certain algorithm, respectively obtains an integral nonlinear error value and a calculation precision value, uploads the processed data quantity to a computer in real time, and completes data statistics, judgment, storage and test result recording by the interface control software.

The method for testing the speed precision and the maximum tracking speed of the axial angle type chip comprises the following steps: the interface control software is used for controlling a signal source to output an angle at a certain rotating speed according to the requirements of the test parameter group, the main control board receives a control instruction of the interface control software, configures the working state of the chip to be tested, selects a corresponding serial port or parallel port mode to acquire speed conversion data, then uploads the data to the interface control software, and the interface control software is used for finishing data judgment, analysis and storage and finishing test result recording.

The method for testing the frequency of the reference signal of the axial angle type chip comprises the following steps: the interface control software is used for controlling the digital multimeter to be switched to a frequency measurement gear, meanwhile, a control instruction of a reference signal frequency test is sent to the main control board, the main control board configures excitation output of a chip to be tested according to the received instruction, and controls the relay to complete switching of the digital universal test point, the interface control software is used for collecting data on the digital multimeter, judging and storing the data, and recording the test result.

The method for testing the mismatching of the reference center voltage and the reference direct current of the axial angle type chip comprises the following steps: the digital multimeter is controlled by interface control software to be switched to a direct-current voltage test gear, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and an analog ground, direct-current voltage data on the digital multimeter are read by the interface control software, a central voltage value is directly read, the central voltage is calculated to obtain a direct-current mismatch value, and finally judgment, storage and test result recording are completed.

The testing method for mismatching of the reference voltage and the reference alternating current of the axial angle type chip comprises the following steps: the digital multimeter is controlled to be switched to an alternating voltage gear by interface control software, meanwhile, a test instruction is sent to a main control board, the main control board configures a reference signal of a tested chip according to the instruction, the test point is controlled to be switched between a tested pin and a simulation ground, the interface control software reads alternating voltage data on the digital multimeter, the voltage value of the reference signal is directly read, the reference voltage is calculated to obtain an alternating mismatch value, and finally, judgment, storage and test result recording are completed.

The test method for the reference voltage and the reference voltage suppression of the shaft angle type chip comprises the following steps: the method comprises the steps of controlling the digital multimeter to be switched to a direct-current voltage gear through interface control software, sending a control instruction of a reference voltage test to a main control board, configuring excitation output of a tested chip by the main control board according to the received instruction, controlling a relay to complete switching of a digital universal test point to a reference voltage output pin, collecting direct-current voltage data on the digital multimeter by the interface control software, wherein the direct-current voltage data are a measured reference voltage value, controlling a program control power supply by the interface software to change power supply voltage of the tested chip, testing output values of the reference voltage pin at an upper limit and a lower limit of the power supply voltage respectively, obtaining a reference voltage inhibition value through calculation, comparing, judging and storing the measured reference voltage and the calculated inhibition value with standard data respectively, and completing test result recording.

The testing method of the logic output high level and the low level of the shaft angle type chip comprises the following steps: the interface control software is used for controlling the digital multimeter to be switched to an AC/DC voltage gear, controlling a signal source to output an angle of 181 degrees when testing a high level, the main control board configures excitation output of a chip to be tested according to a received instruction, controlling a relay to complete switching of a digital universal test point to a pin at the highest position of a parallel port output data line of the chip, then the interface control software is used for collecting DC voltage data on the digital multimeter, controlling the signal source to output an angle of 1 degree when testing a low level, completing DC voltage data collection at the highest position of the parallel port output data line according to the same method of testing the high level, finally comparing the test data with a standard value by the interface control software, completing judgment and storage, and completing test result recording.

Embodiment 2, an implementation method experiment of an automatic test system for an axial angle chip:

the test equipment matched with the test system comprises: the device comprises a computer, an integrated cabinet, a high-precision shaft angle signal source, a digital multimeter, a multi-path program control power supply, a main control board, a cable, a chip positioning clamp and the like, wherein the equipped hardware is in rigid connection through the cable and is controlled, communicated and combined through software, man-machine interaction and operation control are completed through interface control software, communication of the computer, a test instrument and the main control board is realized, a test parameter group is matched according to a preset flow, a test case is invoked, and functional indexes of a chip to be tested are tested, analyzed and judged and a report is generated. Refer to fig. 1.

Specific test items include: voltage and current, angle conversion precision and integral non-linear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and direct current mismatch, reference voltage and alternating current mismatch, reference voltage and reference voltage suppression, and logic output high level and low level test. The method comprises the following specific steps:

1) automatic testing:

the automatic test is a full-automatic test flow in a certain sequence for chips of one model, all items capable of being tested or part of selected test items which can be provided on the current interface control software, and the implementation flow is as follows:

a) starting interface control software to confirm the model of the chip to be tested;

b) selecting items to be tested, or defaulting that all items are to be tested;

c) configuring a test case library and a parameter group;

d) starting a power supply, and confirming the working state of voltage and current, or starting by one key;

e) if all the items are executed by default, sequentially testing according to the sequence of testing voltage and current, angle conversion precision and integral nonlinear error, speed precision and maximum tracking speed, reference signal frequency, reference center voltage and reference direct current mismatch, reference voltage and reference alternating current mismatch, reference voltage and reference voltage suppression, logic output high level and low level, and simultaneously monitoring the parameter change of the voltage and the current in the whole process;

f) if part of items are selected for testing, in the default test item sequence, the unselected items are directly skipped to be not executed, but the items are automatically tested and monitored in the whole process no matter whether the voltage and current items are selected or not;

g) after each single test is finished, storing the test data and entering the next test;

h) after all tests are finished, cutting off the output of a signal source, cutting off the power supply of a chip power supply, reminding the completion of the single chip test, and displaying whether the current chip passes the test or not;

i) and outputting a test report in an Excel form, and generating a table file named by the chip model and the serial number after all the test items selected to be executed are completed, and automatically storing the table file in a set path.

In the automatic test process, the voltage and current state is monitored in the whole process, if the voltage and current data change is found to exceed the parameter error range of the chip, the current test is immediately stopped, pop-up window early warning is carried out on interface software to remind that the test system state is checked, if the numerical deviation is large, the fault state of the chip is fed back, the failure of the chip or the existence of high hidden danger is directly judged, if the power current is not abnormal in the whole process, but in the tests of other items, the parameter super error is found, the test is still executed, after the single test is finished, the data value of the current test is recorded, the test is judged not to pass, the next test is entered, and finally, the record and the notification are carried out in a test report. The interface control software of the automatic test system is shown in fig. 1, and the software logic control flow is shown in fig. 2.

2) Voltage and current testing process

The voltage and current test is realized by controlling a program-controlled power supply by interface software, the program-controlled power supply selects three paths of synchronous output power supplies of an ITECH company, and the communication is kept between a serial port and a computer, and the specific realization process is as follows:

a) starting a test, controlling the output voltage parameter of each channel of the programmable power supply to be matched with the current limiting parameter by interface control software according to the configuration parameters of the test case, and acquiring the current state of the programmable power supply to confirm that the power supply works normally;

b) the interface software executes a power supply starting instruction, commands the programmable power supply to output according to configuration parameters, supplies power to a chip to be tested, and simultaneously monitors an implementation state value fed back by the current programmable power supply;

c) and reading the actual voltage value and current value of the three power supplies, comparing the actual voltage value and current value with the test standard, judging whether the test passes or not, and recording.

The logic control flow of the specific implementation is shown in fig. 3.

3) Angle conversion precision and integral nonlinear error testing process

The test is mainly implemented by controlling a program control power supply and a high-precision shaft angle signal source through interface software to complete parameter configuration and output control of a test case, transmitting a chip parameter configuration command to a main control board through the interface software, completing control of a chip to be tested through the main control board, and collecting an angle digital quantity output by the chip, wherein the specific implementation process is as follows:

a) starting a test, configuring a program-controlled power supply by interface control software according to a parameter group in a use case library, supplying power to a chip to be tested, monitoring the voltage and current value states of the chip, and sending an instruction to a main control board;

b) the main control board configures hardware pins of a tested chip according to instructions, completes read-write mode configuration on pins A1 and A2, completes resolution configuration on pins RES0 and RES1, completes serial port or parallel port selection configuration on SOE pins, and simultaneously writes a reference output register according to the instructions to control the tested chip to output reference signals;

c) interface control software carries out parameter configuration on the signal source according to a preset parameter group, switches the signal source into an external excitation state, receives a reference signal state fed back by the signal source, and provides a standard test angle by the interface control signal source according to requirements when judging that the signal source is in a normal state;

d) the data volume resolved by the chip is quantitatively collected by the main control board and uploaded to a computer in real time;

e) and the interface control software completes data statistics, judgment, storage and test result recording.

The method of collecting the same angle value for multiple times is adopted for testing, the interface control software is used for calculating and processing data, the error between the collected single angle value and the standard value is the integral nonlinear error of the current angle value, the statistical average value of the integral nonlinear error is the precision value of the current angle, and the logic control flow of the specific implementation is shown in figure 4.

4) Speed precision and maximum tracking speed testing process

The test aims at the core index of a chip, the speed precision function test and the extreme tracking speed test are required to be completed, a program-controlled power supply and a high-precision axial angle signal source are mainly controlled by interface software, and a main control board is matched to carry out hardware configuration and software register configuration on chip pins, so that the chip pins can carry out speed conversion under the condition of different parameters such as data output resolution, reference signal output frequency and the like, and meanwhile, a serial port or parallel port mode is selected to collect speed values according to an instruction sent by the interface software, and the specific realization process is as follows:

a) starting a test, wherein interface control software supplies power to a chip to be tested according to the configuration of a program-controlled power supply, monitors the voltage and current value states of the chip and sends an instruction to a main control board;

b) the main control board configures hardware pins of a tested chip according to instructions, completes read-write mode configuration and switching of speed values and angle values for pins A1 and A2, completes resolution configuration for pins RES0 and RES1, completes serial port and parallel port selection configuration for SOE pins, and simultaneously writes a reference output register according to the instructions to control the tested chip to output reference signals;

c) interface control software controls the signal source to be in an external excitation state and controls the signal source to output analog signals in a constant speed mode according to preset different speeds;

d) the main control board collects data of the chip to be tested at a certain frequency and uploads the data to interface control software in real time;

e) and the interface control software completes data statistics, judgment, storage and test result recording.

Under different parameter sets, the chip speed conversion design limit is different, the test needs proven functionality and indexes, the parameter set is selected as conversion data of four speed values tested under each resolution under the limit condition that the reference signal frequency is 20MHz, the four speed values comprise the maximum limit and the minimum limit of the speed, and the specific implementation logic control flow is shown in FIG. 5.

5) Reference signal frequency test flow

The reference signal frequency test needs to control a power supply and a digital multimeter by interface control software, and simultaneously, a reference signal frequency register of a chip to be tested is subjected to write operation by matching with a main control board, and the control flow is as follows:

a) starting a test, wherein an interface control process power supply provides power for a chip to be tested, monitors the change conditions of voltage and current parameters in the whole process and sends instructions to a main control board;

b) the main control board configures hardware pins of a tested chip according to instructions, completes read-write mode configuration and switching of speed values and angle values for pins A1 and A2, completes resolution configuration for pins RES0 and RES1, completes serial port and parallel port selection configuration for SOE pins, and simultaneously writes a reference output register according to the instructions to control the tested chip to output reference signals;

c) interface control software controls the digital multimeter to switch to a frequency gear;

d) the main control board selects a parallel port common mode to carry out register write operation on the chip to be tested according to the instruction requirement, and writes a frequency value to be tested;

e) the main control board switches the pins EXC + and EXC-of the chip to be tested to the test points of the digital multimeter by controlling the relay;

f) and the interface control software reads the data volume measured by the current digital multimeter and finishes judgment, storage and test result recording.

The frequency range of the chip reference signal is 2 KHz-20 KHz, four different frequency values including the maximum frequency and the minimum frequency are selected and tested by the parameter group, and the logic control flow of the specific implementation is shown in FIG. 6.

6) Reference center voltage and direct current mismatch test flow

The test needs to control the power supply and the digital multimeter by interface control software, and simultaneously, the reference signal pin is switched to a test point by the main control board, and the control flow is as follows:

a) starting a test, wherein an interface control process power supply provides power for a chip to be tested, monitors the change conditions of voltage and current parameters in the whole process and sends instructions to a main control board;

b) the main control board reads a state register of the tested chip in a serial port configuration mode, confirms that the tested chip operates in a default state, and outputs a 10MHz reference signal;

c) interface control software controls the digital multimeter to switch to a direct-current voltage gear;

d) the main control board switches the EXC + pin of the tested chip and the analog ground pin to the test point of the digital multimeter by controlling the relay;

e) the interface control software reads direct-current voltage data on the digital multimeter, wherein the data is the center voltage between the EXC + and the ground, and data judgment, recording and storage are completed;

f) repeating the steps d) and e), testing the direct-current voltage value between the EXC-pin and the ground, wherein the direct-current voltage value is the central voltage between the EXC-pin and the ground, and finishing data judgment, recording and storing;

g) and calculating the difference between the two central voltages by interface control software, wherein the absolute value of the difference is the direct-current mismatch value of the reference signal, and finishing data judgment, recording and storing.

The logic control flow of the specific implementation is shown in fig. 7.

7) Reference voltage and alternating current mismatch test flow

The test needs to control the power supply and the digital multimeter by interface control software, and simultaneously, the reference signal pin is switched to a test point by the main control board, and the control flow is as follows:

a) starting a test, wherein an interface control process power supply provides power for a chip to be tested, monitors the change conditions of voltage and current parameters in the whole process and sends instructions to a main control board;

a) the main control board configures hardware pins of a chip to be tested according to instructions, completes read-write mode configuration on pins A1 and A2, completes serial port communication configuration on an SOE pin, writes numerical values into a reference signal frequency register, and enables the chip to be tested to output a reference signal of 20 MHz;

b) interface control software controls the digital multimeter to switch to an alternating voltage gear;

c) the main control board switches the EXC + pin and the EXC-pin of the tested chip to the test point of the digital multimeter by controlling the relay;

d) interface control software reads alternating voltage data on the digital multimeter, and the data refers to signal voltage to finish data judgment, record and storage;

e) the method comprises the following steps that a main control board switches an EXC + pin and a ground pin of a chip to be tested to a test point of a digital multimeter, interface control software reads alternating voltage data on the digital multimeter and records the data as single-side voltage to ground of the EXC +;

f) repeating the step f), testing the alternating voltage value between the EXC-pin and the ground, and recording the unilateral voltage to the ground which is the EXC-pin;

g) and the interface control software calculates the difference between the two unilateral voltages, the absolute value of the difference is the AC mismatch value of the reference signal, and data judgment, recording and storage are completed.

The logic control flow of the specific implementation is shown in fig. 8.

8) Reference voltage and reference voltage suppression test flow

The test needs to control the power supply and the digital multimeter by interface control software, and simultaneously, a main control board switches a reference voltage output pin to a test point, and the control flow is as follows:

a) starting a test, wherein an interface control process power supply provides a nominal power supply for a tested chip, monitors the change conditions of voltage and current parameters in the whole process and sends an instruction to a main control board;

b) the main control board reads a state register of the tested chip by adopting a parallel port common mode, confirms that the tested chip operates in a default state and outputs a 10MHz reference signal;

c) interface control software controls the digital multimeter to switch to an alternating voltage gear;

d) the main control board switches a tested chip REFOUT pin and an analog ground pin to a test point of the digital multimeter by controlling a relay;

e) interface control software reads alternating voltage data on the digital multimeter, the data reference voltage, and data judgment, record and storage are completed;

f) interface control software controls the power supply to provide nominal voltage (1+ 5%) to the tested chip and reads AC voltage data V on the digital multimeter_Rout|_+5％Then controlling the programmable power supply to provide a voltage value of a nominal value (1-5%), and recording the voltage data V on the digital multimeter again_Rout|_-5％；

g) Calculating data under non-nominal value according to the inhibition value calculation method to obtain the reference voltage inhibition valueAnd records the data.

The logic control flow of the specific implementation is shown in fig. 9.

9) Logic output high and low level testing

The test is implemented by controlling a program-controlled power supply and a high-precision shaft angle signal source by interface software, performing hardware configuration and software register configuration on chip pins through a main control board, and finally controlling a digital multimeter to test the DC voltage of the highest-order digit of a parallel port data line through the interface software, wherein the specific implementation process comprises the following steps:

a) starting a test, wherein an interface control process power supply provides power for a chip to be tested, monitors the change conditions of voltage and current parameters in the whole process and sends instructions to a main control board;

b) the main control board configures hardware pins of a chip to be tested according to instructions, completes common angle data output mode configuration for pins A1 and A2, completes 16-bit resolution configuration for pins RES0 and RES1, completes parallel port configuration for SOE pins, and simultaneously writes a reference output register according to the instructions to control the chip to be tested to output 20MHz reference signals;

c) interface control software controls the digital multimeter to switch to a direct-current voltage gear;

d) the main control board switches the tested chip DB15 pin and the digital ground pin to the test point of the digital multimeter by controlling the relay;

e) interface control software controls the signal source to output an angle of 181 degrees, reads the direct current voltage value of the current digital multimeter, and finally finishes data judgment and storage, wherein the value is an output high level;

f) interface control software controls a signal source to output an angle of 1 degree, reads a direct current voltage value of the current digital multimeter, and finally finishes data judgment and storage, wherein the value is an output low level;

the logic control flow of the specific implementation is shown in fig. 10.