阅读说明：本技术 非易失性存储器件及其制造方法 (Nonvolatile memory device and method of manufacturing the same ) 是由 吴振勇 于 2019-08-23 设计创作，主要内容包括：一种非易失性存储器件包括第一衬底、第二衬底、存储阵列、电路结构、接合结构和屏蔽结构。第二衬底的第二正面面对第一衬底的第一正面。所述存储阵列布置在第一衬底上并且布置在第一衬底的第一正面处。所述电路结构布置在第二衬底上并且布置在第二衬底的第二正面处。所述接合结构布置在所述存储阵列与所述电路结构之间。所述电路结构通所述接合结构与所述存储阵列电连接。所述屏蔽结构布置在所述存储阵列与所述电路结构之间,并且围绕所述接合结构。所述屏蔽结构电连接至电压源。(A non-volatile memory device includes a first substrate, a second substrate, a memory array, a circuit structure, a bonding structure, and a shielding structure. The second front surface of the second substrate faces the first front surface of the first substrate. The memory array is disposed on the first substrate and at a first front side of the first substrate. The circuit structure is arranged on the second substrate and at the second front side of the second substrate. The bonding structure is disposed between the memory array and the circuit structure. The circuit structure is electrically connected with the storage array through the bonding structure. The shielding structure is disposed between the memory array and the circuit structure and surrounds the bonding structure. The shielding structure is electrically connected to a voltage source.)

1. A non-volatile memory device, comprising:

a storage array;

a circuit structure;

a bonding structure disposed between the memory array and the circuit structure, wherein the circuit structure is electrically connected to the memory array through the bonding structure; and

a shielding structure disposed between the memory array and the circuit structure and including a plurality of segments surrounding the bonding structure.

2. The non-volatile memory device of claim 1, wherein the shielding structure is electrically isolated from the bonding structure.

3. The non-volatile memory device of claim 1, wherein the shielding structure is biasable by a voltage source.

4. The non-volatile memory device of claim 3, wherein the plurality of segments of the shielding structure are electrically isolated from each other.

5. The non-volatile memory device of claim 4, wherein the plurality of segments of the shielding structure are individually biasable by different voltage sources.

6. The non-volatile memory device of claim 3 or 5, wherein the voltage source comprises a ground voltage source or a supply voltage source.

7. The non-volatile storage device of claim 1, further comprising:

a first interconnect structure disposed between the memory array and the bonding structure, wherein the bonding structure is electrically connected to the memory array through the first interconnect structure; and

a second interconnect structure disposed between the circuit structure and the bonding structure, wherein the bonding structure is electrically connected to the circuit structure through the second interconnect structure.

8. The non-volatile storage device of claim 7, further comprising:

a first interlayer dielectric covering the memory array, wherein the first interconnect structure is disposed in the first interlayer dielectric; and

a second interlayer dielectric covering the circuit structure, wherein the second interconnect structure is disposed in the second interlayer dielectric, and the bonding structure includes:

a first bonding pattern electrically connected to the first interconnection structure; and

a second bonding pattern electrically connected with the second interconnection structure, wherein the first bonding pattern contacts the second bonding pattern and is electrically connected with the second bonding pattern.

9. The non-volatile storage device of claim 8, wherein the shielding structure comprises:

a third bonding pattern; and

a fourth bonding pattern, wherein the third bonding pattern contacts the fourth bonding pattern and is electrically connected with the fourth bonding pattern.

10. The non-volatile memory device of claim 9, wherein the first and third bond patterns are at least partially disposed in the first interlayer dielectric, and the second and fourth bond patterns are at least partially disposed in the second interlayer dielectric.

11. The non-volatile memory device of claim 10, wherein an interface between the first and second bonding patterns is coplanar with an interface between the third and fourth bonding patterns.

12. The non-volatile memory device of claim 7, wherein the first interconnect structure comprises a grid of source lines, and the bonding structure is electrically connected with the grid of source lines.

13. The non-volatile storage device of claim 1, further comprising:

a connection structure disposed between the memory array and the circuit structure, wherein the connection structure is electrically connected with the circuit structure, and the shielding structure further surrounds the connection structure.

14. The non-volatile storage device of claim 13, further comprising:

a contact pad disposed at the first backside of the first substrate; and

a contact structure penetrating the memory array and electrically connected with the contact pad, wherein the circuit structure is electrically connected with the contact pad through the connection structure and the contact structure.

15. The non-volatile storage device of claim 1, wherein the storage array comprises:

a memory stack; and

a memory string, wherein each of the memory strings penetrates the memory stacks.

16. A method of manufacturing a non-volatile memory device, comprising:

forming a memory array;

forming a circuit structure; and

performing a bonding process for bonding the memory array to the circuit structure,

wherein a bonding structure is located between the memory array and the circuit structure, the circuit structure is electrically connected with the memory array through the bonding structure, and a shielding structure is located between the memory array and the circuit structure and includes a plurality of segments surrounding the bonding structure.

17. The method of manufacturing a nonvolatile memory device according to claim 16, wherein the method of forming the junction structure includes:

forming a first portion of the bonding structure prior to the bonding process, wherein the first portion of the bonding structure is electrically connected to the memory array; and

forming a second portion of the bonding structure prior to the bonding process, wherein the second portion of the bonding structure is electrically connected to the circuit structure, and the first portion of the bonding structure contacts and is electrically connected with the second portion of the bonding structure after the bonding process.

18. The method of manufacturing a non-volatile memory device according to claim 16, wherein the method of forming the shielding structure comprises:

forming a first portion of the shielding structure prior to the bonding process; and

forming a second portion of the shielding structure prior to the bonding process, wherein the first portion of the shielding structure contacts and is electrically connected with the second portion of the shielding structure after the bonding process.

19. The method of manufacturing a non-volatile memory device of claim 16, wherein the shielding structure is electrically isolated from the bonding structure.

20. The method of manufacturing a non-volatile memory device of claim 16, wherein the shielding structure is biasable by a voltage source.

21. The method of manufacturing a non-volatile memory device of claim 20, wherein the plurality of segments of the shielding structure are electrically isolated from each other.

22. The method of manufacturing a non-volatile memory device of claim 21, wherein the plurality of segments of the shielding structure are individually biasable by different voltage sources.

23. The method of manufacturing a non-volatile memory device according to claim 20 or 22, wherein the voltage source comprises a ground voltage source or a supply voltage source.

24. The method of manufacturing a non-volatile memory device of claim 16, further comprising:

forming a first interconnect structure on the memory array prior to the bonding process, wherein the bonding structure is electrically connected to the memory array through the first interconnect structure; and

forming a second interconnect structure on the circuit structure prior to the bonding process, wherein the bonding structure is electrically connected to the circuit structure through the second interconnect structure.

25. The method of manufacturing a non-volatile memory device of claim 24, wherein the first interconnect structure comprises a source line grid, and the bonding structure is electrically connected with the source line grid.

26. The method of manufacturing a non-volatile memory device of claim 16, further comprising:

forming a connection structure between the memory array and the circuit structure, wherein the connection structure is electrically connected to the circuit structure, and the shielding structure further surrounds the connection structure;

forming a contact structure penetrating through the memory array; and

forming a contact pad at a backside of the first substrate, wherein the circuit structure is electrically connected with the contact pad through the connection structure and the contact structure.

Technical Field

The present disclosure relates to a memory device and a method of manufacturing the same, and more particularly, to a nonvolatile memory device and a method of manufacturing the same.

Background

Planar memory cells are scaled to smaller sizes by improving process technology, circuit design, programming algorithms, and manufacturing processes. However, as the feature size of the memory cell approaches the lower limit, the planar processes and fabrication techniques become challenging and expensive. Therefore, the storage density of the planar memory cell approaches the upper limit.

Three-dimensional (3D) memory architectures can address density limitations in planar memory cells. The 3D memory architecture includes a memory array and peripheral devices for controlling signals to and from the memory array. As the size of memory devices becomes smaller, electrical interference between the memory array and peripheral devices becomes more critical in affecting the operation of the memory devices.

Disclosure of Invention

In the present disclosure, a nonvolatile memory device and a method of manufacturing the same are provided. The memory array disposed on the first substrate is electrically connected to the circuit structure disposed on the second substrate through the bonding structure. The shielding structure is disposed between the memory array and the circuit structure and surrounds the bonding structure. The shielding structure is electrically connected to a voltage source to reduce coupling effects between the bonding structure and the circuit structure and/or between the circuit structure and the memory array. Accordingly, the operation and/or electrical performance of the nonvolatile memory device may be improved.

According to an embodiment of the present disclosure, a nonvolatile memory device is provided. The nonvolatile memory device includes a first substrate, a second substrate, a memory array, a circuit structure, a bonding structure, and a shielding structure. The second front surface of the second substrate faces the first front surface of the first substrate. The memory array is disposed on the first substrate and at a first front side of the first substrate. The circuit structure is arranged on the second substrate and at the second front side of the second substrate. The bonding structure is disposed between the memory array and the circuit structure. The circuit structure is electrically connected to the memory array through the bonding structure. The shielding structure is disposed between the memory array and the circuit structure and surrounds the bonding structure. The shielding structure is electrically connected to a voltage source.

In some embodiments, the shielding structure is electrically isolated from the bonding structure.

In some embodiments, the voltage source comprises a ground voltage source or a supply voltage source.

In some embodiments, the non-volatile memory device further includes a first interconnect structure and a second interconnect structure. The first interconnect structure is disposed between the memory array and the circuit structure. The bonding structure is electrically connected to the memory array through the first interconnect structure. The second interconnect structure is disposed between the circuit structure and the bonding structure. The bonding structure is electrically connected to the circuit structure through the second interconnect structure.

In some embodiments, the non-volatile memory device further includes a first interlayer dielectric and a second interlayer dielectric. A first interlayer dielectric covers the memory array, and a first interconnect structure is disposed in the first interlayer dielectric. A second interlayer dielectric covers the circuit structure, and a second interconnect structure is disposed in the second interlayer dielectric. The bonding structure includes a first bonding pattern and a second bonding pattern. The first bonding pattern is electrically connected to the first interconnection structure. The second bonding pattern is electrically connected to the second interconnection structure. The first bonding pattern contacts the second bonding pattern and is electrically connected with the second bonding pattern.

In some embodiments, the shielding structure includes a third bonding pattern and a fourth bonding pattern. The third bonding pattern contacts the fourth bonding pattern and is electrically connected to the fourth bonding pattern.

In some embodiments, the first and third bonding patterns are at least partially disposed in the first interlayer dielectric, and the second and fourth bonding patterns are at least partially disposed in the second interlayer dielectric.

In some embodiments, an interface between the first and second bonding patterns is coplanar with an interface between the third and fourth bonding patterns.

In some embodiments, the first interconnect structure includes a grid of source lines, and the bonding structure is electrically connected with the grid of source lines.

In some embodiments, the non-volatile memory device further includes a connection structure disposed between the memory array and the circuit structure. The connection structure is electrically connected with the circuit structure, and the shielding structure further surrounds the connection structure.

In some embodiments, the non-volatile memory device further comprises a contact pad and a contact structure. The contact pads are arranged at the first backside of the first substrate. The contact structure penetrates the memory array and is electrically connected with the contact pad. The circuit structure is electrically connected to the contact pads through the connection structure and the contact structure.

In some embodiments, a memory array includes a memory stack and a memory string. Each of the memory strings penetrates the memory stacks.

According to an embodiment of the present disclosure, there is provided a method of manufacturing a nonvolatile memory device. The manufacturing method includes the following steps. A memory array is formed on a first substrate, and the memory array is formed at a first front side of the first substrate. A circuit structure is formed on the second substrate, and the circuit structure is formed at the second front surface of the second substrate. A bonding process is performed to bond a first substrate having a memory array formed thereon to a second substrate having a circuit structure formed thereon. The second front side of the second substrate may face the first front side of the first substrate after the bonding process. The bonding structure is located between the memory array and the circuit structure, the circuit structure is electrically connected with the memory array through the bonding structure, and the shielding structure is located between the memory array and the circuit structure and surrounds the bonding structure. The shielding structure is electrically connected to a voltage source.

In some embodiments, the method of forming the joint structure includes the following steps. A first portion of a bonding structure is formed on the first substrate prior to the bonding process, and the first portion of the bonding structure is electrically connected to the memory array. A second portion of the bonding structure is formed on the second substrate prior to the bonding process, and the second portion of the bonding structure is electrically connected to the circuit structure. The first portion of the bonding structure contacts and is electrically connected with the second portion of the bonding structure after the bonding process.

In some embodiments, the method of forming the shielding structure includes the following steps. A first portion of the shielding structure is formed on the first substrate prior to the bonding process. A second portion of the shielding structure is formed on the second substrate prior to the bonding process. The first portion of the shielding structure contacts and is electrically connected with the second portion of the shielding structure after the bonding process.

In some embodiments, the shielding structure is electrically isolated from the bonding structure.

In some embodiments, the voltage source comprises a ground voltage source or a supply voltage source.

In some embodiments, the method of manufacturing a nonvolatile memory device further includes the following steps. A first interconnect structure is formed over the memory array prior to the bonding process, and the bonding structure is electrically connected to the memory array through the first interconnect structure. A second interconnect structure is formed over the circuit structure prior to the bonding process, and the bonding structure is electrically connected to the circuit structure through the second interconnect structure.

In some embodiments, the first interconnect structure includes a grid of source lines, and the bonding structure is electrically connected with the grid of source lines.

In some embodiments, the method of manufacturing a nonvolatile memory device further includes the following steps. A connection structure is formed between the memory array and the circuit structure. The connection structure is electrically connected with the circuit structure, and the shielding structure further surrounds the connection structure. Contact structures are formed through the memory array. Contact pads are formed at the first back side of the first substrate. The circuit structure is electrically connected to the contact pads through the connection structure and the contact structure.

Other aspects of the disclosure will be apparent to those skilled in the art from the description, claims, and drawings of the disclosure.

These and other objects of the present invention will no doubt become obvious to those of ordinary skill in the art after having read the following detailed description of the preferred embodiments, which are illustrated by the various drawing figures.

Drawings

The accompanying drawings, which are incorporated herein and form a part of the specification, illustrate embodiments of the present disclosure and, together with the description, further serve to explain the principles of the disclosure and to enable a person skilled in the pertinent art to make and use the disclosure.

Fig. 1 is a schematic diagram illustrating a nonvolatile memory device according to a first embodiment of the present disclosure.

Fig. 2 is a schematic diagram illustrating a bonding structure and a shielding structure in a nonvolatile memory device according to a first embodiment of the present disclosure.

Fig. 3 is a schematic diagram illustrating a nonvolatile memory device according to a second embodiment of the present disclosure.

Fig. 4 is a schematic diagram illustrating a nonvolatile memory device according to a third embodiment of the present disclosure.

Fig. 5 is a schematic diagram illustrating a nonvolatile memory device according to a fourth embodiment of the present disclosure.

Fig. 6 is a schematic diagram illustrating a nonvolatile memory device according to a fifth embodiment of the present disclosure.

Fig. 7 is a flowchart illustrating a method of manufacturing a nonvolatile memory device according to an embodiment of the present disclosure.

Fig. 8 is a schematic view illustrating a bonding process in a method of manufacturing a nonvolatile memory device according to an embodiment of the present disclosure.

Detailed Description

While specific configurations and arrangements are discussed, it should be understood that this is done for illustrative purposes only. A person skilled in the relevant art will recognize that other configurations and arrangements can be used without parting from the spirit and scope of the disclosure. It will be apparent to those skilled in the relevant art that the present disclosure may also be employed in a variety of other applications.

It is noted that references in the specification to "one embodiment," "an embodiment," "some embodiments," etc., indicate that the embodiment described may include a particular feature, structure, or characteristic, but every embodiment may not necessarily include the particular feature, structure, or characteristic. Moreover, such phrases are not necessarily referring to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with an embodiment, it will be within the knowledge of one skilled in the relevant art to affect such feature, structure, or characteristic in connection with other embodiments whether or not explicitly described.

In general, terms may be understood, at least in part, from their usage in context. For example, the term "one or more" as used herein may be used to describe any feature, structure, or characteristic in the singular or may be used to describe a combination of features, structures, or characteristics in the plural, depending, at least in part, on the context. Similarly, terms such as "a," "an," and "the" may again be understood to convey singular usage or to convey plural usage, depending at least in part on the context. Further, again depending at least in part on the context, the term "based on" may be understood as not necessarily intended to convey an exclusive set of factors, and may instead allow for the presence of additional factors not necessarily explicitly described.

It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, components, regions, layers and/or sections, these elements, components, regions, layers and/or sections should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer and/or section from another element, component, region, layer and/or section. Thus, a first element, component, region, layer or section discussed below could be termed a second element, component, region, layer or section without departing from the teachings of the present disclosure.

It should be readily understood that the meaning of "on …", "above …" and "above …" in this disclosure should be interpreted in the broadest way such that "on …" means not only "directly on something", but also includes the meaning of "on something" with intervening features or layers therebetween. Further, "above …" or "above …" not only means "above something" or "above something", but may also include its meaning of "above something" or "above something" (i.e., directly on something) without intervening features or layers therebetween.

Furthermore, spatially relative terms such as "below …," "below …," "lower," "above …," "upper," and the like may be used herein for ease of description to describe one element or feature's relationship to another element or feature as illustrated in the figures. Spatially relative terms are intended to encompass different orientations of the device in use or process steps in addition to the orientation depicted in the figures. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly as well.

The term "forming" or the term "arranging" is used hereinafter to describe the act of applying a layer of material to an object. Such terms are intended to describe any possible layer formation technique including, but not limited to, thermal growth, sputtering, evaporation, chemical vapor deposition, epitaxial growth, electroplating, and the like.

Please refer to fig. 1 and fig. 2. Fig. 1 is a schematic diagram showing a nonvolatile memory device according to a first embodiment of the present disclosure, and fig. 2 is a schematic diagram showing a bonding structure and a shielding structure in the nonvolatile memory of this embodiment. As shown in fig. 1 and 2, a nonvolatile memory device 301 is provided in this embodiment. The nonvolatile memory device 301 includes a first substrate 100, a second substrate 200, a memory array 110, a circuit structure 210, a bonding structure P1, and a shielding structure P2. The first substrate 100 may have a first front side FS1 and a first back side BS1, and the second substrate 200 may have a second front side FS2 and a second back side BS 2. The first front side FS1 and the first back side BS1 may be front and back sides of the first substrate 100 in a vertical direction (such as the first direction D1 shown in fig. 1), and the second front side FS2 and the second back side BS2 may be front and back sides of the second substrate 200 in the vertical direction. In some embodiments, the first direction D1 may be considered as a thickness direction of the first substrate 100 and a thickness direction of the second substrate 200, but is not limited thereto. In the nonvolatile memory device 301, the second front side FS2 of the second substrate 200 faces the first front side FS1 of the first substrate 100. The memory array 110 is disposed on the first substrate 100 and at a first front side FS1 of the first substrate 100. The circuit structure 210 is disposed on the second substrate 200 and at the second front side FS2 of the second substrate 200. Thus, the memory array 110 and the circuit structure 210 may be disposed between the first substrate 100 and the second substrate 200. The bonding structure P1 is disposed between the memory array 110 and the circuit structure 210. The circuit structure 210 is electrically connected to the memory array 110 through a bonding structure P1. The shielding structure P2 is disposed between the memory array 110 and the circuit structure 210, and the shielding structure P2 surrounds the bonding structure P1. The shielding structure P2 is electrically connected to the voltage source VS. In other words, the shielding structure P2 is not electrically floating, and the shielding structure P2 may be biased by the voltage source VS to reduce the coupling effect between the junction structure P1 and the circuit structure 210 and/or between the circuit structure 210 and the memory array 110. Accordingly, the operation and/or electrical performance of the nonvolatile memory device 301 may be improved.

In the nonvolatile memory device 301, the shielding structure P2 is physically separated from the bonding structure P1, and the shielding structure P2 may be electrically isolated from the bonding structure P1 so as to provide a shielding effect. In some embodiments, the voltage source VS may comprise a ground voltage source (such as VSs), a supply voltage source (such as Vcc), or other suitable type of voltage source. Accordingly, the shielding structure P2 may be biased to ground or the shielding structure P2 may be biased by an external power supply or an internal power supply. In some embodiments, the shielding structure P2 may include a plurality of segments surrounding the engagement structure P1 in a horizontal direction (such as the second direction D2 or the third direction D3 shown in fig. 3). The horizontal direction may be parallel to the surface of the first substrate 100 and/or the surface of the second substrate 200, but is not limited thereto. In some embodiments, the segments of the shielding structure P2 may be electrically connected to different voltage sources VS, respectively. For example, some of the segments may be electrically connected to a first voltage source VS1, and some of the segments may be electrically connected to a second voltage source VS2 different from the first voltage source VS 1. The first voltage source VS1 may be a ground voltage source, and the second voltage source VS may be a power supply voltage source, but is not limited thereto. In some embodiments, all segments of the shielding structure P2 may also be electrically connected to the same voltage source VS. Additionally, the shielding structure P2 may also function like a pool cap (pool cap) when the shielding structure P2 is biased with ground and/or power to enhance power stability in the non-volatile memory device.

In some embodiments, the first substrate 100 and the second substrate 200 may each include silicon (e.g., single crystal silicon, polycrystalline silicon), silicon germanium (SiGe), silicon nitride (SiC), gallium nitride (GaN), indium phosphide (InP), gallium arsenide (GaAs), germanium (Ge), silicon-on-insulator (SOI), germanium-on-insulator (GOI), or any suitable combination thereof. In some embodiments, the memory array 110 may include a memory stack MS, a plurality of memory strings 120, and a plurality of slot structures 130. The memory stack MS may include, but is not limited to, an alternating conductive/dielectric stack of dielectric layers 112 and conductive layers 114 alternately stacked in the first direction D1. The dielectric layer 112 may comprise silicon oxide or other suitable dielectric material, and the conductive layer 114 may comprise a conductive material including, but not limited to, tungsten, cobalt, copper, aluminum, doped silicon, polysilicon, silicide, or any combination thereof. Each of the memory strings 120 and each of the slot structures 130 may penetrate the memory stacks MS in the first direction D1, and the memory array 110 may be regarded as a three-dimensional memory structure, but is not limited thereto. In some embodiments, other suitable storage architectures may be applied to form the storage array 110 of the present disclosure.

In some embodiments, each of the memory strings 120 may comprise a NAND string or other suitable vertical memory structure. For example, each of the memory strings 120 may include an epitaxial structure 122, a memory layer 124, a channel layer 126, and a conductive structure 128. Epitaxial structure 122 may include a semiconductor material, such as, but not limited to, silicon. The storage layer 124 may be a composite layer including, but not limited to, a tunneling layer, a storage layer (also referred to as a "charge trapping/storage layer"), and a blocking layer. Conductive structure 128 may comprise polysilicon or other suitable conductive material. Each of the memory strings 120 may have a cylindrical shape (e.g., a pillar shape) penetrating the memory stack MS in the first direction D1, and the channel layer 126, the tunneling layer, the storage layer, and the barrier layer in the memory string 120 may be arranged in this order from the center of the pillar toward the outer surface in the radial direction. The tunneling layer in the memory layer 124 may include silicon oxide, silicon oxynitride, or any combination thereof. The storage layer in the storage layer 124 may include silicon nitride, silicon oxynitride, silicon, or any combination thereof. The barrier layer in the storage layer 124 may include silicon oxide, silicon oxynitride, a high dielectric constant (high-k) dielectric, or any combination thereof. For example, the memory layers 124 in the memory string 120 may be an oxide-nitride-oxide (ONO) structure, but are not limited thereto. Each of the slot structures 130 may include a conductive material and a dielectric layer disposed between the conductive material and the memory stack layer MS, and the conductive material in the slot structures 130 may be electrically connected to the doped region 132 disposed in the first substrate 100. In some embodiments, when the first substrate 100 is a P-type semiconductor substrate, the doped region 132 may be an N-type doped region, the doped region 132 may be regarded as a common source region, and the slit structure 130 may be regarded as a source contact structure, but is not limited thereto. In some embodiments, the slot structure 130 may extend laterally (such as in a horizontal direction), thereby dividing the memory stack MS into several memory blocks, but is not limited thereto. In some embodiments, the memory array 110 may further include a cladding layer 116 disposed on the memory stack layer MS, and each of the memory strings 120 and each of the slot structures 130 may further penetrate the capping layer 116, but is not limited thereto. Cladding layer 116 may comprise an oxide layer, such as a silicon oxide layer or other suitable insulating material. It is worth noting that the memory array 110 of the present disclosure is not limited to the structure shown in fig. 1 and/or the structure described above, and other suitable memory array architectures may be applied within the present disclosure.

In some embodiments, the circuit structure 210 may include one or more of page buffers, decoders (e.g., row and column decoders), drivers, charge pumps, current or voltage references, or any active or passive components (e.g., transistors, diodes, resistors, or capacitors) required in the circuit. In some embodiments, the circuit structure 210 may be formed by CMOS technology, but is not limited thereto. For example, the circuit structure 210 may include a plurality of transistors (such as the first transistor 212 and the second transistor 214 shown in fig. 1), some of which may be disposed on the second substrate 200, and some of which (such as the second transistor 214) may be disposed on the doped region 202 in the second substrate. In some embodiments, the doped region 202 may include a doped well, but is not limited thereto. Isolation structures 204 (such as shallow trench isolations) may be disposed in the second substrate 200 to define active regions corresponding to transistors. An insulating layer 220 may be disposed on the second substrate 200 and cover the transistors, and contact structures 230 may be disposed in the insulating layer 220 and electrically connected to the transistors, respectively. It is worth noting that the circuit structure 210 in the present disclosure is not limited to the structure shown in fig. 1 and/or the structure described above, and other suitable components required in the circuit structure may also be applied in the present disclosure.

In some embodiments, the non-volatile memory device 301 may further include a first interlayer dielectric 140, a first interconnect structure 150, a second interlayer dielectric 240, and a second interconnect structure 250. The first interlayer dielectric 140 may be disposed on the first front side FS1 of the first substrate 100 and cover the memory array 110, and the second interlayer dielectric 240 may be disposed on the second front side FS2 of the second substrate 200 and cover the circuit structure 210. The first interconnect structure 150 may be at least partially disposed in the first interlayer dielectric 140, and the second interconnect structure 250 may be at least partially disposed in the second interlayer dielectric 240. In some embodiments, the first interlayer dielectric 140 and the second interlayer dielectric 240 may respectively include a plurality of dielectric layers stacked in the first direction D1, and the material of the dielectric layers may include silicon oxide, silicon nitride, silicon oxynitride, a low dielectric constant (low-k) dielectric material, any suitable combination thereof, or other suitable dielectric material. In some embodiments, the first interconnect structure 150 may include conductive layers (such as the conductive layer M11 and the conductive layer M12 shown in fig. 1) and connection plugs (such as the connection plug V11, the connection plug V13, and the connection plug V14 shown in fig. 1) alternately arranged in the first direction D1, and the second interconnect structure 250 may also include conductive layers (such as the conductive layer M21, the conductive layer M22, and the conductive layer M23 shown in fig. 1) and connection plugs (such as the connection plug V21, the connection plug V22, and the connection plug V23 shown in fig. 1) alternately arranged in the first direction D1, but is not limited thereto. The conductive layers and the connection plugs in the first and second interconnect structures 150 and 250 may include, but are not limited to, a low-resistivity material and a barrier layer surrounding the low-resistivity material, respectively. The above-mentioned low resistivity material may include a material having a relatively low resistivity, such as copper, aluminum, and tungsten, and the above-mentioned barrier layer may include titanium nitride, tantalum nitride, or other suitable barrier materials, but is not limited thereto. The first interconnect structure 150 may be disposed between the memory array 110 and the bonding structure P1, and the bonding structure P1 may be electrically connected with the memory array 110 through the first interconnect structure 150. The second interconnect structure 250 may be disposed between the circuit structure 210 and the bonding structure P1, and the bonding structure P1 may be electrically connected with the circuit structure 210 through the second interconnect structure 250.

In some embodiments, the first substrate 100 having the memory array 110 formed thereon and the second substrate 200 having the circuit structure 210 formed thereon may be bonded to each other through the first bonding layer 160 disposed on the first substrate 100 and the second bonding layer disposed on the second substrate 200. The first bonding layer 160 may include a plurality of bonding patterns (such as the first and third bonding patterns 162 and 164 shown in fig. 1) and a dielectric material disposed therebetween for electrically isolating the bonding patterns from each other, and the second bonding layer 260 may include a dielectric material disposed between a plurality of bonding patterns (such as the second and fourth bonding patterns 262 and 264 shown in fig. 1) for electrically isolating the bonding patterns from each other. In some embodiments, the dielectric material in the first bonding layer 160 may be considered the topmost portion of the first interlayer dielectric 140, and the dielectric material in the second bonding layer 260 may be considered the topmost portion of the second interlayer dielectric 240, but is not limited thereto. The dielectric material in the first bonding layer 160 and the second bonding layer 260 may include silicon oxide, silicon nitride, silicon oxynitride, a low-k dielectric material, any combination thereof, or other suitable dielectric material. The bonding patterns in the first bonding layer 160 and the second bonding layer 260 may include a conductive material, such as tungsten, cobalt, copper, aluminum, silicide, any combination thereof, or other suitable conductive material.

In some embodiments, the first substrate 100 having the memory array 110 formed thereon and the second substrate 200 having the circuit structure 210 formed thereon may be bonded to each other by a direct bonding method such as a metal/dielectric hybrid bonding method, but is not limited thereto. In the metal/dielectric hybrid bonding method, the bonding pattern in the first bonding layer 160 may directly contact the bonding pattern in the second bonding layer 260, and the dielectric material in the first bonding layer 160 may directly contact the dielectric material in the second bonding layer 260 without using an additional adhesive layer. However, in some embodiments, the first bonding layer 160 may be bonded to the second bonding layer 260 by an adhesive layer (not shown), or the dielectric material in the first bonding layer 160 and the dielectric material in the second bonding layer 260 may be adhesives. In some embodiments, the bonding structure P1 may include a portion of the first bonding layer 160 and/or a portion of the second bonding layer 260, and the shielding structure P2 may include another portion of the first bonding layer 160 and/or another portion of the second bonding layer 260.

For example, in some embodiments, the bonding structure P1 may include the first bonding pattern 162 in the first bonding layer 160 and the second bonding pattern 262 in the second bonding layer 260, and the shielding structure P2 may include the third bonding pattern 164 in the first bonding layer 160 and the fourth bonding pattern 264 in the second bonding layer 260, but is not limited thereto. The first bonding pattern 162 may be electrically connected with the first interconnection structure 150, and the second bonding pattern 262 may be electrically connected with the second interconnection structure 250. The first bonding patterns 162 may directly contact and be electrically connected to the second bonding patterns 262, and the circuit structure 210 may be electrically connected to the memory array 110 through the second interconnection structure 250, the bonding structure P1, and the first interconnection structure 150, respectively. The third bonding patterns 164 may directly contact and electrically connect with the fourth bonding patterns 264. In some embodiments, the third bonding pattern 164 may be electrically connected to an internal power source in the circuit structure 210 through the second interconnection structure 250, and/or may be electrically connected to an external power source through the first interconnection structure 150 and other connection structures, but is not limited thereto. In some embodiments, the first and third bonding patterns 162 and 164 may be at least partially disposed in the first interlayer dielectric 140, and the second and fourth bonding patterns 262 and 264 may be at least partially disposed in the second interlayer dielectric 240, but are not limited thereto. When the first and second substrates 100 and 200 are bonded to each other by the direct bonding method described above, an interface between the first and second bonding patterns 162 and 262 may be substantially coplanar with an interface between the third and fourth bonding patterns 164 and 264, but is not limited thereto. In some embodiments, the shielding structure P2 may further include portions of the first interconnect structure 150 (such as the connection plug V13) and/or portions of the second interconnect structure 250 (such as the connection plug V23).

In some embodiments, the first interconnect structure 150 may include, but is not limited to, bit lines BL electrically connected to at least some of the above-described memory strings 120 and a grid of source lines SL electrically connected to at least some of the above-described slot structures 130. In some embodiments, the junction structure P1 may be electrically connected with the source line grid SL, and the circuit structure 210 may transmit a common source voltage to the doped region 132 via the second interconnect structure 250, the junction structure P1, the source line grid SL, and the slit structure 130, respectively. Shielding structure P2 may be used to reduce the effect of coupling between source line grid SL and circuit structure 210 when a higher voltage is applied to source line grid SL and/or when the voltage applied to source line grid SL varies. However, the present disclosure is not limited to the conditions described above. In some embodiments, the circuit structure 210 may be electrically connected to other portions of the memory array 110 through the bonding structure P1, and the shielding structure P2 may surround the bonding structure P1 to reduce the coupling effect.

The following description sets forth in detail various embodiments of the disclosure. For simplicity of description, equivalent components in each of the following embodiments are labeled with equivalent symbols. In order that the differences between the embodiments may be more readily understood, the following description will set forth in detail the differences between the different embodiments, and the description of equivalent features will not be repeated.

Please refer to fig. 3. Fig. 3 is a schematic diagram illustrating a non-volatile memory device 302 according to a second embodiment of the present disclosure. As shown in fig. 3, in the memory device 302, the junction structure P1 may be electrically connected with the bit line BL, and the circuit structure 210 may be electrically connected to the memory string 120 via the second interconnect structure 250, the junction structure P1, and the first interconnect structure 150 (such as the connection plug V13, the conductive layer M12, the connection plug V12, the bit line BL, and the connection plug V11 shown in fig. 3), respectively. In some embodiments, the nonvolatile memory device may include a plurality of bonding structures P1 electrically connected to different portions of the memory array 110, respectively, and spaced apart from each other, and the shielding structure P2 may surround each of the bonding structures P1 in a horizontal direction. For example, some of the bonding structures P1, P1, may be electrically connected with a word line (not shown), and the circuit structure 210 may be electrically connected to a conductive layer in the memory stack MS via the bonding structure P1 and the word line.

Please refer to fig. 4. Fig. 4 is a schematic diagram illustrating a nonvolatile memory device 303 according to a third embodiment of the present disclosure. As shown in fig. 4, the nonvolatile memory device 303 may include a connection structure P3 disposed between the memory array 110 and the circuit structure 210. The connection structure P3 may be electrically connected with the circuit structure 210, and the shielding structure P2 may surround the connection structure P3 and the bonding structure P1 in the horizontal direction. In some embodiments, the connection structure P3 may include, but is not limited to, the fifth bonding pattern 166 in the first bonding layer 160 and the sixth bonding pattern 266 in the second bonding layer 260. The fifth bonding pattern 266 may be electrically connected with the first interconnection structure 150, and the sixth bonding pattern 266 may be electrically connected with the second interconnection structure 250. The fifth bonding pattern 166 may directly contact and electrically connect with the sixth bonding pattern 266. In some embodiments, the nonvolatile memory device 303 may further include a contact pad (such as the first contact pad 174 shown in fig. 4), a contact structure (such as the first contact structure T1 shown in fig. 4), the insulating region 105, an insulating layer (such as the insulating layer 182 and the insulating layer 184 shown in fig. 4), the over-substrate contact structure 172, and an opening 186. The insulating layer 182, the insulating layer 184, and the first contact pads 174 may be disposed at the first backside BS1 of the first substrate 100, and the first contact pads 174 may be disposed in the insulating layer 182, but are not limited thereto. The insulating region 105 may be disposed within the first substrate 100, and the through-substrate contact structure 172 may penetrate the insulating region 105 and the insulating layer 182 between the first contact pad 174 and the first substrate 100, thereby connecting with the first contact pad 174. The first contact structure T1 may penetrate the memory array 110 and be electrically connected to the first contact pad through the through-substrate contact structure 172. The opening 186 may penetrate the insulating layer 184 and the insulating layer 182 over the first contact pad 174, thereby exposing a portion of the first contact pad 174. Thus, the circuit structure 210 may be electrically connected with the first contact pad 174 through the second interconnect structure 250, the connection structure P3, the first interconnect structure 150, the first contact structure T1, and the through-substrate contact structure 172, but is not limited thereto. In some embodiments, the first contact structure T1 may include a conductive material 136, and an insulating layer 134 may be disposed between the conductive material 136 and the storage stack layer MS, thereby insulating the first contact structure T1 from the storage stack layer MS, but is not limited thereto. Insulating layer 134, insulating layer 182, insulating layer 184, and insulating region 105 may comprise silicon oxide, silicon nitride, silicon oxynitride, or other suitable insulating material. In some embodiments, the material composition of the insulating layer 184 may be different from the material composition of the insulating layer 182, and the insulating layer 184 may be regarded as a hard mask layer in the process of forming the opening 186, but is not limited thereto. The conductive material 136, the over-substrate contact structure 172, and the first contact pad 174 may comprise a conductive material, such as tungsten, cobalt, copper, aluminum, any combination thereof, or other suitable conductive material. It is noted that the first contact structure T1 and the first contact pad 174 arranged at the first backside BS1 of the first substrate 100 may also be applied to other embodiments of the present disclosure.

Please refer to fig. 5. Fig. 5 is a schematic diagram illustrating a nonvolatile memory device 304 according to a fourth embodiment of the present disclosure. As shown in fig. 5, the nonvolatile memory device 304 may further include a first contact structure T1, an insulating region 205, a second contact pad 274, an insulating layer 282, an insulating layer 284, and an opening 286. The insulating layer 282, the insulating layer 284, and the second contact pad 274 may be disposed at the second backside BS2 of the second substrate 200, and the second contact pad 274 may be disposed in the insulating layer 282, but is not limited thereto. The insulating layer 205 may be disposed in the second substrate 200, and the opening 286 may penetrate the insulating layer 284 and the insulating layer 282 over the second contact pad 274, thereby exposing a portion of the second contact pad 274. The first contact structure T1 in this embodiment may penetrate through portions of the second interlayer dielectric 240, the insulating layer 220, the insulating region 205, and portions of the insulating layer 282 disposed between the second contact pad 274 and the second substrate 200, thereby electrically connecting the second contact pad 274 and portions of the second interconnect structure 250, such as the conductive layer M22. Accordingly, the circuit structure 210 may be electrically connected with the second contact pad 274 through the second interconnect structure 250 and the first contact structure T1, but is not limited thereto. In some embodiments, the insulating layer 282, insulating layer 284, and insulating region 205 may comprise silicon oxide, silicon nitride, silicon oxynitride, or other suitable insulating material. In some embodiments, the material composition of the insulating layer 284 may be different from the material composition of the insulating layer 282, and the insulating layer 284 may be considered as a hard mask layer in forming the opening 286, but is not limited thereto. The second contact pad 274 may include a conductive material, such as tungsten, cobalt, copper, aluminum, any combination thereof, or other suitable conductive material. It is noted that the first contact structure T1 and the second contact pad 274 disposed at the second backside BS2 of the second substrate 200 may also be applied to other embodiments of the present disclosure.

Please refer to fig. 6 and fig. 4. Fig. 6 is a schematic diagram illustrating a nonvolatile memory device 305 according to a fifth embodiment of the present disclosure. In some embodiments, fig. 6 and 4 may be viewed as schematic diagrams illustrating different portions of the same non-volatile memory device, but are not so limited. As shown in fig. 6, the nonvolatile memory device 305 may further include a second first contact structure T2 penetrating the memory stack MS, and the shielding structure P2 may be electrically connected with the first contact pad 174 through the first interconnect structure 150, the second first contact structure T2, and the through-substrate contact structure 172, but is not limited thereto. In other words, the shielding structure P2 may be electrically connected with an external power source through the first contact pads 174 disposed at the first rear side BS1 of the first substrate 100.

Please refer to fig. 7, fig. 8, fig. 1 and fig. 2. Fig. 7 is a flowchart illustrating a method of manufacturing a nonvolatile memory device according to an embodiment of the present disclosure. Fig. 8 is a schematic diagram showing a bonding process in the manufacturing method of the nonvolatile memory device in this embodiment, and fig. 1 is regarded as a schematic diagram in a step subsequent to fig. 8. As shown in fig. 7, 8, 1 and 2, the method of manufacturing the nonvolatile memory device in this embodiment may include, but is not limited to, the following steps. In step 410, memory array 110 may be formed on first substrate 100, and memory array 110 may be formed at first front side FS1 of first substrate 100. In step 420, the circuit structure 210 may be formed on the second substrate 200, and the circuit structure 210 may be formed at the second front side FS2 of the second substrate 200. In step 430, a bonding process is performed to bond the first substrate 100 having the memory array 110 formed thereon with the second substrate 200 having the circuit structure 210 formed thereon. The second front side FS2 of the second substrate 200 may face the first front side FS1 of the first substrate 100 during and after the bonding process. The bonding structure P1 may be located between the memory array 110 and the circuit structure 210 in the first direction D1, the circuit structure 210 may be electrically connected with the memory array 110 through the bonding structure P1, and the shielding structure P2 may be located between the memory array 110 and the circuit structure 210 and surround the bonding structure P1. The shielding structure may be electrically connected to a voltage source VS. In some embodiments, other desired components may be formed on the first substrate 100 and the second substrate 200 prior to the bonding process. For example, step 412 and step 422 may be performed before step 430, but are not limited thereto. In step 412, a first interconnect structure 150 may be formed on the memory array 110 prior to the bonding process, and the bonding structure P1 may be electrically connected with the memory array 110 through the first interconnect structure 150. In step 422, a second interconnect structure 250 may be formed on the circuit structure 210 prior to the bonding process, and the bonding structure P1 may be electrically connected with the circuit structure 210 through the second interconnect structure 250.

As shown in fig. 7, 8 and 1, the forming method of the bonding structure P1 may include, but is not limited to, the following steps. A first portion of the bonding structure P1 (such as the first bonding pattern 162) may be formed on the first substrate 100 before the bonding process, and the first portion of the bonding structure P1 may be electrically connected to the memory array 110 through the first interconnect structure 150. A second portion of the bonding structure P1 (such as the second bonding pattern 262) may be formed on the second substrate 200 before the bonding process, and the second portion of the bonding structure P1 may be electrically connected to the circuit structure 210 through the second interconnect structure 250. When the bonding process is a direct bonding process, such as a metal/dielectric hybrid bonding process, the first portion of the bonding structure P1 (such as the first bonding pattern 162) may contact and be electrically connected with the second portion of the bonding structure P1 (such as the second bonding pattern 162) after the bonding process.

As shown in fig. 7, 8 and 1, the forming method of the shielding structure P2 may include, but is not limited to, the following steps. The first portion of the shielding structure P2 (such as the third bonding pattern 164) may be formed on the first substrate 100 before the bonding process. A second portion of the shielding structure P2 (such as the fourth bonding pattern 264) may be formed on the second substrate 200 before the bonding process. When the bonding process is a direct bonding process, such as a metal/dielectric hybrid bonding process, the first portion of the shield structure P2 (such as the third bonding pattern 164) may contact and be electrically connected with the second portion of the shield structure P2 (such as the fourth bonding pattern 264) after the bonding process. In other words, the first interlayer dielectric 140, the first interconnect structure 150, the first bonding layer 160, the second interlayer dielectric 240, the second interconnect structure 250, and the second bonding layer 260 may be formed after the bonding process described above.

Please refer to fig. 7 and fig. 4. As shown in fig. 7 and 4, in some embodiments, step 440 may be performed after the bonding process. In step 440, contact pads (such as first contact pads 174) may be formed at the first backside BS1 of the first substrate 100 after the bonding process. In some embodiments, a thinning process may be performed on the first substrate 100 from the first backside BS1 of the first substrate 100 to reduce the thickness of the first substrate 100 before the step of forming the insulating layer 182, but is not limited thereto. In some embodiments, the insulation region 105 and the first contact structure T1 may be formed before the bonding process, and the substrate contact structure 172, the first contact pad 174, the insulation layer 182, the insulation layer 184, and the opening 186 may be formed after the bonding process, but are not limited thereto. In addition, a connection structure P3 may be formed between memory array 110 and circuit structure 210. The connection structure P3 may be electrically connected with the circuit structure 210, and the shielding structure P2 may surround the connection structure P3 and the bonding structure P1 in the horizontal direction. The first contact structure T1 may be formed to penetrate the memory array 110. The first contact pads 174 may be formed at the first backside BS1 of the first substrate 100. The circuit structure 210 may be electrically connected with the first contact pad 174 through the second interconnect structure 250, the connection structure P3, the first contact structure T1, and the through-substrate contact structure 172, but is not limited thereto.

Please refer to fig. 7 and 5. As shown in fig. 7 and 5, in some embodiments, step 440 may be performed after the bonding process. In step 440, contact pads (such as second contact pad 274) may be formed at the second backside BS2 of the second substrate 200 after the bonding process. In some embodiments, a thinning process may be performed on the second substrate 200 from the second backside BS2 of the second substrate 200 before the step of forming the insulating layer 282 to reduce the thickness of the second substrate 100, but is not limited thereto. In some embodiments, the insulation region 205 may be formed before the bonding process, and the first contact structure T1, the second contact pad 274, the insulation layer 282, the insulation layer 284, and the opening 286 may be formed after the bonding process, but are not limited thereto.

To summarize the above description, in a nonvolatile memory device and a method of manufacturing the same according to the present disclosure, a memory array disposed on a first substrate may be electrically connected to a circuit structure disposed on a second substrate through a bonding structure. The shielding structure may be disposed between the memory array and the circuit structure and around the bonding structure. The shielding structure may be electrically connected to a voltage source to reduce coupling effects between the bonding structure and the circuit structure, coupling effects between the circuit structure and the memory array, and/or other coupling effects within the non-volatile memory device. Accordingly, the operation and/or electrical performance of the nonvolatile memory device may be improved. Further, by arranging the shielding structure in the present disclosure, the thickness of the interlayer dielectric can be relatively reduced, and this will facilitate the manufacturing process of the nonvolatile memory device.

Those skilled in the art will readily recognize many modifications and variations that may be made to the devices and methods while following the teachings of the present invention. Accordingly, the above disclosure should be considered limited only by the metes and bounds of the appended claims.