阅读说明：本技术 用于原子力显微镜的二维材料探针及其制备方法和应用 (Two-dimensional material probe for atomic force microscope and preparation method and application thereof ) 是由 李津津 李鉴峰 刘大猛 于 2019-10-12 设计创作，主要内容包括：本发明公开了用于原子力显微镜的二维材料探针及其制备方法和应用。其中,该二维材料探针包括：悬臂梁、硬质小球和二维材料层,所述硬质小球的上部与所述悬臂梁的尖端固定相连；所述二维材料层粘附在所述硬质小球的底部。该二维材料探针结构简单、稳固,制备速度快且成本低,非常适用于与某种特定二维材料有关的摩擦实验。(The invention discloses a two-dimensional material probe for an atomic force microscope and a preparation method and application thereof. Wherein, this two-dimensional material probe includes: the cantilever beam, the hard ball and the two-dimensional material layer are fixedly connected with the tip end of the cantilever beam; the two-dimensional material layer is adhered to the bottom of the hard small ball. The two-dimensional material probe is simple and stable in structure, high in preparation speed and low in cost, and is very suitable for friction experiments related to a certain specific two-dimensional material.)

1. A two-dimensional material probe for an atomic force microscope, comprising:

a cantilever beam;

the upper part of the hard small ball is fixedly connected with the tip end of the cantilever beam;

a two-dimensional material layer adhered to the bottom of the hard pellets.

2. A two-dimensional material probe according to claim 1, wherein the ratio of the sheet diameter of the two-dimensional material layer to the outer diameter of the hard bead is 0.2 to 1, preferably 0.3 to 0.8.

3. A two-dimensional material probe according to claim 1 or 2, wherein the thickness of the two-dimensional material layer is in the micro-nanometer range, preferably not more than 5 μm, more preferably not more than 100 nm;

optionally, the sheet diameter of the two-dimensional material layer is 4-100 μm, preferably 5-50 μm;

optionally, the two-dimensional material is graphene, molybdenum disulfide, tungsten disulfide, or boron nitride;

optionally, the two-dimensional material is graphene, the thickness of the two-dimensional material layer is 1-100 nm, and the sheet diameter is 4-100 μm.

4. A two-dimensional material probe according to claim 3, wherein the rigid sphere is a regular sphere or an ellipsoid;

optionally, the outer diameter of the hard small ball is 20-100 μm;

optionally, the hard pellets are made of silicon dioxide, polystyrene, glass or ceramic.

5. A two-dimensional material probe according to claim 1 or 4, wherein the hard ball and the cantilever are fixedly connected through a first adhesive layer, and the two-dimensional material layer is adhered to the bottom of the hard ball through a second adhesive layer.

6. A method of making the two-dimensional material probe of any one of claims 1-5, comprising:

(1) contacting the hard ball with the tip of the cantilever by an adhesive so as to fix the upper part of the hard ball with the tip of the cantilever;

(2) and enabling the two-dimensional material layer to be in contact with the bottom of the hard ball fixed at the tip of the cantilever beam through an adhesive so as to enable the two-dimensional material layer to be adhered to the bottom of the hard ball, and obtaining the two-dimensional material probe.

7. The method of claim 6, wherein step (2) further comprises: placing the obtained two-dimensional material probe in a clean environment for 16-24 hours so as to fully cure the adhesive;

optionally, in the step (1), the hard ball is contacted with the tip of the cantilever beam through an adhesive and is kept for 15-30 seconds; in the step (2), the two-dimensional material layer is contacted with the bottom of the hard small ball fixed at the tip of the cantilever beam through an adhesive and kept for 15-30 seconds.

8. The method according to claim 6 or 7, wherein the two-dimensional material layer is a graphene layer, and the graphene layer is prepared by the following method:

(2-1) repeatedly peeling off the flake graphite with an adhesive tape, and pressing the adhesive tape adhered with the thin-layer graphene against a glass slide so as to adhere the thin-layer graphene to the glass slide;

(2-2) overturning the thin graphene adhered to the glass slide by using an atomic force microscope needle tip so as to obtain the graphene layer tiled on the glass slide.

9. The method of claim 8, wherein step (2-2) further comprises:

and pressing the atomic force microscope needle tip downwards to enable the atomic force microscope needle tip to be in contact with the glass slide, sliding the atomic force microscope needle tip from one end of the edge of the thin graphene layer to the other end of the edge of the thin graphene layer, enabling the thin graphene layer to be partially separated from the glass slide under the extrusion action of the atomic force microscope needle tip, and operating the motion track of the atomic force microscope needle tip to enable the thin graphene layer to be overturned and tiled on the glass slide.

10. An atomic force microscope having the two-dimensional material probe according to any one of claims 1 to 5 or the two-dimensional material probe prepared by the method according to any one of claims 6 to 9.

Technical Field

The invention belongs to the field of atomic force microscopes, and particularly relates to a two-dimensional material probe for an atomic force microscope and a preparation method and application thereof.

Background

Friction and wear are two major obstacles to improving the efficiency of mechanical systems, resulting in a large amount of unnecessary energy dissipation and damage failure of parts, and therefore, in the design of high-performance micro-or nano-electromechanical systems, near-zero friction and extremely low wear between friction pairs are required. Ultra-lubricity refers to a lubrication state where the coefficient of friction falls to the order of 0.001 or even lower, and is an effective method for achieving near-zero friction. Since the interlayer van der waals interaction of two-dimensional layered materials such as graphene is weak, ultra-slip can be achieved under certain conditions, and the ultra-slip characteristics thereof have been widely studied in recent years. At present, an atomic force microscope is mainly adopted to research the microscopic mechanism of ultra-smoothness of graphene under the nanoscale, so that a graphene probe for the atomic force microscope needs to be prepared.

At present, there are three methods for preparing a graphene probe for an atomic force microscope, the first method is to directly grow graphene on a tip of the atomic force microscope by using chemical vapor deposition and the like, and the second method is to transfer the graphene to the tip of the atomic force microscope by using a wet transfer method, a thermal transfer method or a photo-etching method. However, the preparation processes of the two methods are complex and have higher cost. The third method is to directly adsorb graphene on the atomic force microscope tip through a friction transfer technology, but the method is relatively large in contingency, the graphene is easy to fall off in the needle tip movement process, the stability is poor, and the method is difficult to be used for related friction experiments.

Disclosure of Invention

The present invention is directed to solving, at least to some extent, one of the technical problems in the related art. To this end, an object of the present invention is to provide a two-dimensional material probe for atomic force microscopy, a method for preparing the same, and applications thereof. The two-dimensional material probe is simple and stable in structure, high in preparation speed and low in cost, and is very suitable for friction experiments related to a certain specific two-dimensional material.

According to a first aspect of the invention, the invention proposes a two-dimensional material probe for an atomic force microscope. According to an embodiment of the present invention, the two-dimensional material probe includes:

a cantilever beam;

the upper part of the hard small ball is fixedly connected with the tip end of the cantilever beam;

a two-dimensional material layer adhered to the bottom of the hard pellets.

The two-dimensional material probe for the atomic force microscope in the embodiment of the invention has the advantages of simple and stable structure, high preparation speed and low cost, and the two-dimensional material layer can be effectively prevented from falling off in the needle tip movement process by fixing the hard ball and the cantilever beam tip and adhering the two-dimensional material layer to the bottom of the hard ball, so that the two-dimensional material probe is very suitable for friction experiments related to a certain specific two-dimensional material (such as graphene).

In addition, the two-dimensional material probe for an atomic force microscope according to the above embodiment of the present invention may further have the following additional technical features:

in some embodiments of the present invention, the ratio of the sheet diameter of the two-dimensional material layer to the outer diameter of the hard pellet is 0.2 to 1, preferably 0.3 to 0.8. Therefore, the preparation of the two-dimensional material probe is facilitated, and the accuracy and the stability of a detection result can be ensured.

In some embodiments of the invention, the thickness of the two-dimensional material layer is on the micro-nanometer scale, preferably no greater than 5 μm, more preferably no greater than 100 nm.

In some embodiments of the present invention, the two-dimensional material layer has a sheet diameter of 4 to 100 μm, preferably 5 to 50 μm.

In some embodiments of the invention, the two-dimensional material is graphene, molybdenum disulfide, tungsten disulfide, or boron nitride.

In some embodiments of the invention, the two-dimensional material is graphene, and the thickness of the two-dimensional material layer is 1-100 nm and the sheet diameter is 4-100 μm.

In some embodiments of the invention, the hard pellets are regular spherical or ellipsoidal.

In some embodiments of the present invention, the hard pellets have an outer diameter of 20 to 100 μm.

In some embodiments of the present invention, the material of the hard pellet is silicon dioxide, polystyrene, glass or ceramic.

In some embodiments of the present invention, the hard ball and the cantilever beam are fixedly connected by a first adhesive layer, and the two-dimensional material layer is adhered to the bottom of the hard ball by a second adhesive layer.

According to a second aspect of the present invention, there is provided a method of preparing the above-described two-dimensional material probe for an atomic force microscope. According to an embodiment of the invention, the method comprises:

(1) contacting the hard ball with the tip of the cantilever by an adhesive so as to fix the upper part of the hard ball with the tip of the cantilever;

(2) and enabling the two-dimensional material layer to be in contact with the bottom of the hard ball fixed at the tip of the cantilever beam through an adhesive so as to enable the two-dimensional material layer to be adhered to the bottom of the hard ball, and obtaining the two-dimensional material probe.

The preparation method of the embodiment of the invention has the advantages of simple process, low cost and high preparation speed, the prepared two-dimensional material probe has a simple and stable structure, the two-dimensional material layer adhered to the bottom of the hard ball is not easy to fall off in the needle tip movement process, and the preparation method is very suitable for friction experiments related to a certain specific two-dimensional material (such as graphene).

In some embodiments of the invention, step (2) further comprises: and placing the obtained two-dimensional material probe in a clean environment for 16-24 hours so as to fully cure the adhesive.

In some embodiments of the invention, in the step (1), the hard ball is contacted with the tip of the cantilever beam through an adhesive and kept for 15-30 seconds; in the step (2), the two-dimensional material layer is contacted with the bottom of the hard small ball fixed at the tip of the cantilever beam through an adhesive and kept for 15-30 seconds.

In some embodiments of the present invention, the two-dimensional material layer is a graphene layer, and the graphene layer is prepared by the following steps: (2-1) repeatedly peeling off the flake graphite with an adhesive tape, and pressing the adhesive tape adhered with the thin-layer graphene against a glass slide so as to adhere the thin-layer graphene to the glass slide; (2-2) overturning the thin graphene adhered to the glass slide by using an atomic force microscope needle tip so as to obtain the graphene layer tiled on the glass slide.

In some embodiments of the invention, step (2-2) further comprises: and pressing the atomic force microscope needle tip downwards to enable the atomic force microscope needle tip to be in contact with the glass slide, sliding the atomic force microscope needle tip from one end of the edge of the thin graphene layer to the other end of the edge of the thin graphene layer, enabling the thin graphene layer to be partially separated from the glass slide under the extrusion action of the atomic force microscope needle tip, and operating the motion track of the atomic force microscope needle tip to enable the thin graphene layer to be overturned and tiled on the glass slide.

According to a third aspect of the invention, an atomic force microscope is presented. According to an embodiment of the present invention, the atomic force microscope has the two-dimensional material probe for atomic force microscope described above or a two-dimensional material probe adapted by the method of preparing a two-dimensional material probe for atomic force microscope described above. The atomic force microscope can be used for researching the ultra-smooth microscopic mechanism of a certain specific material such as graphene under the micro-nano scale.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:

fig. 1 is a schematic structural diagram of a two-dimensional material probe for an atomic force microscope according to an embodiment of the present invention.

Fig. 2 is a flow chart of a method of preparing a two-dimensional material probe for an atomic force microscope, according to one embodiment of the invention.

Fig. 3 is a flowchart of a method of preparing a two-dimensional material probe for an atomic force microscope, according to yet another embodiment of the invention.

Fig. 4 is a scanning electron microscope image of a graphene probe for an atomic force microscope according to an embodiment of the present invention.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.

According to a first aspect of the invention, the invention proposes a two-dimensional material probe for an atomic force microscope. According to an embodiment of the present invention, as shown in fig. 1, the two-dimensional material probe includes: cantilever beam 10, rigid bead 30, and two-dimensional material layer 40. Wherein, the upper part of the hard small ball 30 is fixedly connected with the tip end of the cantilever beam 10; a two-dimensional layer of material 40 is adhered to the bottom of the hard pellets 30. The two-dimensional material probe for the atomic force microscope is simple and stable in structure, high in preparation speed and low in cost, the hard ball is fixed with the tip of the cantilever beam, the two-dimensional material layer is adhered to the bottom of the hard ball, the two-dimensional material layer can be effectively prevented from falling off in the needle tip movement process, and the two-dimensional material probe is very suitable for friction experiments related to a certain specific two-dimensional material (such as graphene).

The two-dimensional material probe for an atomic force microscope according to the above-described embodiment of the present invention will be described in detail below.

In the two-dimensional material probe for an atomic force microscope according to an embodiment of the present invention, the materials of the hard ball 30 and the two-dimensional material layer 40 are not particularly limited, and may be selected by those skilled in the art according to actual needs, for example, the hard ball 30 may be silicon dioxide, polystyrene, glass, or ceramic; the two-dimensional material layer 40 may be a graphene layer, a molybdenum disulfide layer, a tungsten disulfide layer, a boron nitride layer, or the like, and thus, the properties such as interaction force or frictional force between two-dimensional materials such as graphene, molybdenum disulfide, tungsten disulfide, or boron nitride, and the like, and a substrate sample can be effectively measured.

In accordance with yet another embodiment of the present invention, the hard ball 30 may be in the shape of a regular sphere or an ellipsoid, wherein the "upper" portion of the hard ball as used herein refers to the side of the hard ball closer to the tip of the cantilever beam and the "bottom" portion of the hard ball refers to the side of the hard ball further from the tip of the cantilever beam.

According to another embodiment of the present invention, the ratio of the sheet diameter of the two-dimensional material layer 40 to the outer diameter of the hard ball 30 may be 0.2 to 1. The inventor finds that, compared with the outer diameter of the hard small ball, if the sheet diameter of the two-dimensional material layer is too small, the two-dimensional material layer is not enough to coat the bottom of the hard small ball, the hard small ball may contact with the substrate sample in the needle tip movement process, and the accuracy of measuring the performance such as the interaction force or the friction force between the two-dimensional material layer and the substrate sample cannot be ensured; if the sheet diameter of the two-dimensional material layer is too large, on one hand, the two-dimensional material layer with the too large sheet diameter cannot be completely coated at the bottom of the hard small ball in the adhesion process, and the part exceeding the area of the hard small ball is bent downwards under the action of gravity due to the fact that the part is not in contact with the adhesive, so that the accuracy of a measuring result is influenced. According to the invention, the ratio of the sheet diameter of the two-dimensional material layer to the outer diameter of the hard small ball is controlled to be 0.2-1, so that the preparation of a two-dimensional material probe is facilitated, and the accuracy and stability of a detection result can be ensured. Preferably, the ratio of the sheet diameter of the two-dimensional material layer 40 to the outer diameter of the hard bead 30 may be 0.3 to 0.8, thereby further improving the accuracy and stability of the inspection result. The "sheet diameter" of the two-dimensional material layer refers to the distance of a line segment passing through the center point of the two-dimensional material layer and having two ends on the edge of the two-dimensional material.

According to another embodiment of the present invention, the outer diameter of the hard pellets 30 may be 20 to 100 μm, for example, 20 μm, 30 μm, 40 μm, 50 μm, 60 μm, 70 μm, 80 μm, 90 μm, or 100 μm; the two-dimensional material layer 40 may have a sheet diameter of 4 to 100 μm, for example, 5 μm, 15 μm, 25 μm, 35 μm, 45 μm, 55 μm, 65 μm, 75 μm, 85 μm, or 95 μm, preferably 5 to 50 μm. For another example, when the outer diameter of the hard bead 30 is 20 μm, the sheet diameter of the two-dimensional material layer 40 may be 5 to 12 μm, and when the outer diameter of the hard bead 30 is 100 μm, the sheet diameter of the two-dimensional material layer 40 may be 40 to 65 μm. Therefore, the requirements of the atomic force microscope on the size of the probe can be met, the preparation of the probe is facilitated, and the accuracy of a detection result is ensured.

According to another embodiment of the present invention, the two-dimensional material probe for an atomic force microscope according to the above embodiment of the present invention can be used for measurement and study of a micro mechanism of a two-dimensional material in a micro-nanometer scale, wherein the thickness of the two-dimensional material layer 40 may be in a micro-nanometer scale, for example, the thickness of the two-dimensional material layer may be not greater than 1 μm, or 1 to 100nm, and the like, preferably not greater than 5 μm, and more preferably not greater than 100nm, so as to further ensure accuracy and stability of a measurement result.

According to another embodiment of the invention, in the two-dimensional material probe for the atomic force microscope, the two-dimensional material may be graphene, the thickness of the graphene layer may be 1 to 100nm, and the sheet diameter of the graphene layer may be 4 to 100 μm, so that a microscopic mechanism of ultra-smoothness of the graphene can be studied on a nanoscale, so as to better measure the performances such as interaction force or friction force between the graphene and a substrate sample made of the same material or different materials.

According to another embodiment of the present invention, the hard small ball 30 and the cantilever 10 may be fixedly connected by the first adhesive layer 20, and the two-dimensional material layer 40 is adhered to the bottom of the hard small ball 30 by the second adhesive layer 21, so as to further improve the stability and reliability of the two-dimensional material probe, ensure that the two-dimensional material layer does not fall off during the measurement process, and ensure the accuracy of the measurement result.

According to a further embodiment of the present invention, the center of the two-dimensional material layer 40 is as close as possible to the center of the hard bead 30 in a horizontal projection, and the center of the hard bead 30 deviates from the center of the two-dimensional material layer 40 by no more than 10%, preferably no more than 5%, of the outer diameter of the hard bead. Therefore, the two-dimensional material layer can be further ensured to be uniformly adhered to the bottom of the hard small ball, the hard small ball is prevented from contacting with a substrate sample in the needle tip movement process, and the accuracy of the measurement result is ensured.

According to a second aspect of the present invention, there is provided a method of preparing the above-described two-dimensional material probe for an atomic force microscope. According to an embodiment of the invention, as shown in fig. 2, the method comprises: (1) the hard small ball is contacted with the tip of the cantilever beam through an adhesive so as to fix the upper part of the hard small ball and the tip of the cantilever beam; (2) and enabling the two-dimensional material layer to be in contact with the bottom of the hard ball fixed at the tip of the cantilever beam through the adhesive so as to enable the two-dimensional material layer to be adhered to the bottom of the hard ball, and obtaining the two-dimensional material probe. The method has the advantages of simple process, low cost and high preparation speed, the prepared two-dimensional material probe has a simple and stable structure, the two-dimensional material layer adhered to the bottom of the hard ball is not easy to fall off in the needle tip movement process, and the method is very suitable for friction experiments related to a certain specific two-dimensional material (such as graphene).

According to a specific embodiment of the present invention, the step (2) may further include: the obtained two-dimensional material probe is placed in a clean environment and kept for 16-24 hours, so that the adhesive is fully cured, the bonding strength between the hard ball and the tip of the cantilever beam and the bonding strength between the two-dimensional material layer and the bottom of the hard ball can be further ensured, and the stability and the reliability of the two-dimensional material probe are obviously improved.

According to another specific embodiment of the invention, in the step (1), the hard small ball can be contacted with the tip of the cantilever beam through an adhesive and kept for 15-30 seconds, so that the upper part of the hard small ball can be adhered to the tip of the cantilever beam; in the step (2), the two-dimensional material layer can be in contact with the bottom of the hard small ball fixed at the tip of the cantilever beam through the adhesive and kept for 15-30 seconds, so that the two-dimensional material layer can be adhered to the bottom of the hard small ball.

According to another specific embodiment of the present invention, the two-dimensional material layer may be a graphene layer, and the preparation method of the graphene layer may be: (2-1) repeatedly peeling off the flake graphite by using an adhesive tape, and pressing the adhesive tape adhered with the thin-layer graphene on a glass slide so as to adhere the thin-layer graphene on the glass slide; (2-2) inverting the thin graphene layer adhered to the slide glass by using the atomic force microscope tip to obtain the graphene layer which is laid on the slide glass and has low adhesion with the slide glass. Wherein, the step (2-2) may further include: the atomic force microscope needle point is pressed downwards to be in contact with the glass slide, the atomic force microscope needle point is stroked from one end of the edge of the thin graphene layer to the other end of the edge of the thin graphene layer, the thin graphene layer is partially separated from the glass slide under the extrusion action of the atomic force microscope needle point, the motion track of the atomic force microscope needle point is operated to enable the thin graphene layer to be overturned and tiled on the glass slide, and at the moment, the adhesion force of the thin graphene layer and the glass slide is weak, and the thin graphene layer is easy to separate from the glass slide. Therefore, the graphene probe for the atomic force microscope can be effectively prepared.

According to yet another embodiment of the present invention, referring to fig. 3, the graphene probe for atomic force microscope may be performed according to the following 8 steps:

s1: dipping a proper amount of epoxy resin adhesive, coating the epoxy resin adhesive on a clean glass slide 50, and repeatedly blowing air by using an ear washing bulb aiming at the adhesive to enable the adhesive to be flatly laid on the glass slide 50 to form a thinner adhesive layer 20;

s2: as shown in fig. 3(a), the cantilever 10 is lowered to make the tip of the cantilever contact the glue layer 20, and then the cantilever 10 is slowly lifted to make the tip of the cantilever 10 leave a proper amount of glue;

s3: as shown in fig. 3(b), the hard ball 30 is placed on another clean glass slide 51, the position of the cantilever beam 10 is adjusted so that the hard ball 30 is located right below the tip of the cantilever beam 10, the cantilever beam 10 is pressed down to be in full contact with the hard ball 30 and kept for 15 to 30 seconds, then the cantilever beam 10 is slowly lifted up, and the hard ball 30 is adhered to the tip of the cantilever beam 10 under the action of the adhesive layer 20;

s4: as shown in fig. 3(c), another clean glass slide 52 is taken, a thinner adhesive layer 21 is prepared according to the method of step S1, the cantilever beam 10 adhered with the hard bead 30 is pressed downward, and the cantilever beam 10 is lifted up after the bottom of the hard bead 30 contacts with the adhesive layer, it is noted that at this time, the adhesive remaining at the bottom of the hard bead 30 needs to be less, too much results in the thin graphene 40 being polluted by the adhesive, but too little results in the hard bead 30 not being adhered with the thin graphene 40;

s5: repeatedly stripping the flake graphite by using an adhesive tape, pressing the adhesive tape with a large amount of residual thin-layer graphene on another clean glass slide 53, then placing the glass slide 53 on a hot table, heating for 20 minutes at the temperature of 120 ℃, then slowly removing the adhesive tape, and finding out fresh to-be-bonded thin-layer graphene 40 with the thickness of several nanometers to dozens of nanometers and the sheet diameter of several micrometers to dozens of micrometers on the glass slide 53 through an optical microscope;

s6: as shown in fig. 3(d), since the adhesion force is large due to the close adhesion of the fresh thin-layer graphene 40 and the slide glass 53, the atomic force microscope tip 60 needs to be separated from the slide glass 53, specifically, the atomic force microscope tip 60 is pressed down to make contact with the slide glass 53 with as large a pressure as possible, the atomic force microscope tip 60 is slowly stroked from left to right from the edge of the thin-layer graphene 40, the thin-layer graphene 40 is partially separated from the slide glass 53 under the squeezing action of the atomic force microscope tip 60, the moving track of the atomic force microscope tip 60 is operated to completely turn over the thin-layer graphene 40 and lay the thin-layer graphene on the slide glass 53 again, and at this time, the adhesion degree of the thin-layer graphene 40 and the slide glass 53 is low, and the thin-layer graphene 40 is easy to separate;

s7: as shown in fig. 3(e), the position of the cantilever beam 10 is adjusted, so that the center of the hard bead 20 adhered to the tip of the cantilever beam 10 approximately coincides with the center of the graphene thin layer 40, the cantilever beam 10 is pressed down to make the hard bead 30 and the graphene thin layer 40 fully contact, and is kept for 15 to 30 seconds, then the cantilever beam 10 is slowly lifted up, and the graphene thin layer 40 is separated from the glass slide 53 and adhered to the bottom of the hard bead 30 under the action of the adhesive layer 21. Note that steps S2 to S7 are all performed with the aid of an optical microscope;

s8: and (3) placing the cantilever beam 10 under a clean condition for 16-24 hours, and curing the adhesive to obtain the graphene probe for the atomic force microscope. The scanning electron microscope image of the prepared graphene probe for the atomic force microscope is shown in fig. 4.

It should be noted that the technical features and effects described above for the two-dimensional material probe for an atomic force microscope are also applicable to the method for preparing a two-dimensional material probe for an atomic force microscope, and are not described herein again.

According to a third aspect of the invention, an atomic force microscope is presented. According to an embodiment of the present invention, the atomic force microscope has the two-dimensional material probe for atomic force microscope described above or a two-dimensional material probe adapted by the method of preparing a two-dimensional material probe for atomic force microscope described above. The atomic force microscope can be used for researching the ultra-smooth microscopic mechanism of a certain specific material such as graphene under the micro-nano scale. It should be noted that the technical features and effects described above for the two-dimensional material probe for atomic force microscope and the method for preparing the two-dimensional material probe for atomic force microscope are also applicable to the atomic force microscope, and are not described herein again.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.