System and method for three-dimensional fluorescence polarization via multi-view imaging
阅读说明:本技术 用于经由多视图成像的三维荧光偏振的系统和方法 (System and method for three-dimensional fluorescence polarization via multi-view imaging ) 是由 H.施罗夫 A.库马尔 S.B.梅塔 P.J.拉里维尔 R.奥尔登伯格 Y.吴 T.钱德 于 2018-05-31 设计创作,主要内容包括:公开了用于三维荧光偏振激发的系统和方法,该系统和方法生成三维或更多维度的荧光分子的位置和取向的图。(Systems and methods for three-dimensional fluorescence polarization excitation are disclosed that generate maps of the position and orientation of fluorescent molecules in three or more dimensions.)
1. A fluorescence microscope system, comprising:
a light source for emitting a light beam;
first polarizing optics for converting the light beam into a polarized light beam;
a beam splitter for splitting the polarized beam into a first polarized beam and a second polarized beam;
a first objective lens oriented along a first axis such that the first polarized light beam illuminates the sample along a first angle to produce a first fluorescent emission; and
a second objective lens oriented along a second axis such that the second polarized beam illuminates the sample at a second angle that is non-parallel with respect to the first angle to produce a second fluorescent emission,
wherein the first objective lens is oriented to detect the second fluorescent emission and the second objective lens is oriented to detect the first fluorescent emission.
2. The fluorescence microscope system of claim 1, further comprising:
a first detector in communication with the first objective lens for receiving an image from the second fluorescent emission; and
a second detector in communication with the second objective lens for receiving an image from the first fluorescent emission.
3. The fluorescence microscope system of claim 1, further comprising:
a third objective lens oriented along a third axis in a non-parallel relationship with respect to the first axis of the first objective lens and the second axis of the second objective lens, wherein the third detector detects a third fluorescence emission from the sample.
4. The fluorescence microscope system of claim 2, wherein the third objective lens is in communication with a third detector for receiving images from the third fluorescence emission.
5. The fluorescence microscope system of claim 2, wherein the first detector and the second detector are each in communication with a processor for receiving images of the second fluorescence emissions from the first objective lens and the first fluorescence emissions from the second objective lens.
6. The fluorescence microscope system of claim 4, wherein the third detector is in communication with a processor for receiving an image of a third fluorescence emission from the third objective lens.
7. The fluorescence microscope system of claim 1, further comprising:
second polarizing optics associated with the first objective lens for further altering the polarization of the first polarized beam prior to illuminating the sample; and
second polarizing optics associated with the second objective for further altering the polarization of the second polarized beam prior to illuminating the sample.
8. The fluorescence microscope system of claim 1, wherein the first polarizing optics comprise a wave plate, a polarizer, and a liquid crystal.
9. The fluorescence microscope system of claim 1, further comprising:
a first dichroic mirror in communication with the beam splitter for redirecting the first polarized light beam to the first objective lens; and
a second dichroic mirror in communication with the beam splitter for redirecting the second polarized light beam to the second objective lens.
10. The fluorescence microscope system of claim 1, wherein the first objective lens and the second objective lens illuminate the sample with the first polarized light beam and the second objective lens, respectively, in an alternating sequence.
11. The fluorescence microscope system of claim 1, wherein the first objective lens and the second objective lens detect the first fluorescence emission and the second fluorescence emission, respectively, in an alternating sequence.
12. The fluorescence microscope system of claim 1, wherein the first fluorescent emissions detected by the second objective lens are oriented along a first plane in a non-parallel relationship relative to a second axis of the second objective lens, and wherein the second fluorescent emissions detected by the first objective lens are oriented along a second plane in a non-parallel relationship relative to the first axis of the first objective lens.
13. The fluorescence microscope system of claim 5, wherein the processor generates an orientation distribution of excited dipoles associated with one or more three-dimensional structures based on the first and second fluorescent emissions detected by the first and second objective lenses, respectively.
14. A fluorescence microscope system, comprising:
a laser source for emitting a laser beam;
first polarizing optics for converting the laser beam into a polarized beam;
a beam splitter for splitting the polarized beam into a first polarized beam and a second polarized beam;
a first objective lens oriented along a first axis such that the first polarized light beam illuminates the sample along a first angle to produce a first fluorescent emission from the first plurality of excited dipoles; and
a second objective lens oriented along a second axis such that the second polarized beam illuminates the sample at a second angle that is non-parallel with respect to the first angle to produce a second fluorescent emission from a second plurality of excited dipoles,
wherein the first objective lens is oriented to detect the first plurality of excited dipoles oriented at an angle perpendicular to the first axis and the second objective lens is oriented to detect the second plurality of excited dipoles oriented at an angle perpendicular to the second axis.
15. The fluorescence microscope system of claim 14, wherein the first objective lens is oriented to not detect the first plurality of excited dipoles oriented at an angle parallel to the first axis, and the second objective lens is oriented to not detect the second plurality of excited dipoles oriented at an angle parallel to the second axis.
16. A method for determining the position and orientation of an excited dipole generated by fluorescent emissions from a sample, comprising:
generating a laser beam;
converting the laser beam into a polarized beam;
separating the polarized beam into a first polarized beam and a second polarized beam;
illuminating the sample through a first objective lens oriented along a first angle to produce a first fluorescent emission; and
generating a second fluorescent emission by illuminating the sample with a second objective lens oriented at a second angle that is non-parallel with respect to the first angle,
detecting a first plurality of excited dipoles in the second fluorescent emission through the second objective lens oriented along a plane in non-parallel relationship with the first axis, and detecting a second plurality of excited dipoles in the first fluorescent emission through the first objective lens oriented along a second plane in non-parallel relationship with the second axis.
17. The method of claim 16, wherein the polarization state of the laser beam is arbitrarily changed.
18. The method of claim 17, further comprising:
for each polarization state, a series of images of the first and second fluorescent emissions are collected by one or more detectors.
19. The method of claim 17, further comprising:
processing a series of images of the collected first and second fluorescent emissions to determine a location and orientation of each of the first and second pluralities of excited dipoles.
20. The method of claim 17, wherein a reconstruction algorithm is applied in processing the collected series of images of the first and second fluorescence emissions.
Technical Field
The present disclosure relates to systems and methods for three-dimensional fluorescence polarization excitation, and in particular to fluorescence microscopy that generates maps of the position and orientation of fluorescent molecules in three or more dimensions.
Background
Most fluorophores, including fluorescent proteins, absorb and emit light as dipoles (dipoles). This creates the opportunity to reveal not only the position of the fluorophore and its associated molecular assembly, but also their orientation. Polarized light microscopes that are equipped to excite and/or detect polarized fluorescence have taken advantage of this opportunity. The orientation and dynamics of the molecular assembly determine the directionality of cellular function or disease. For example, directed cell migration during wound healing or metastasis relies on the flow of a patterned actin network that generates a net force towards the direction of migration.
Molecular orientation is revealed by using polarized light for dipole excitation or polarization analysis of dipole emission, or both. However, current microscopes illuminate and image a sample from a single view direction. Accordingly, the polarization of the excitation light and the emitted fluorescence light is mainly defined in the plane perpendicular to the illumination/view direction, as shown in fig. 2A and 2B. Dipoles parallel to the direction of the illumination/view cannot be excited nor effectively detected, thus making it difficult or even impossible to determine the complete orientation distribution of the fluorophore in combination with the three-dimensional structure.
It is based upon these observations that the various aspects of the present disclosure have been conceived and developed.
Drawings
FIG. 1 is a simplified diagram illustrating one embodiment of a fluorescence microscope system according to one aspect of the present disclosure;
fig. 2A shows a schematic diagram of a conventional epi-fluorescence microscope according to an aspect of the present disclosure, and fig. 2B shows a schematic diagram of a conventional dual view selective plane illumination microscope system according to an aspect of the present disclosure;
fig. 3A and 3B illustrate measurement schemes for obtaining three-dimensional dipole orientation using epi-detection of fluorescence intensity produced by polarization-resolved excitation, according to an aspect of the present disclosure;
FIGS. 4A and 4B illustrate another measurement scheme for obtaining three-dimensional dipole orientation using orthogonal detection of fluorescence intensity produced by polarization-resolved excitation, according to an aspect of the present disclosure; and
fig. 5A is an image showing maximum intensity projection images corresponding to an imaging volume obtained with different polarizations of illumination light according to an aspect of the present disclosure, and fig. 5B shows a resulting reconstruction according to an aspect of the present disclosure.
Corresponding reference characters indicate corresponding elements throughout the several views of the drawings. The headings used in the figures do not limit the scope of the claims.
Detailed Description
As described herein, systems and methods for extending fluorescence polarization imaging so that the dipole moment of a fluorescent dye emitted by a sample can be excited regardless of the three-dimensional orientation of the dipoles. In one aspect, the dipoles are excited from multiple directions, ensuring that excitation of the sample occurs along multiple orientations even if the dipoles are disadvantageously oriented along the axial (propagation) axis of the detection objective. In one embodiment, a dual-view inverted selective-plane illumination microscope (bispim) is used to illuminate a sample and detect the resulting polarized fluorescence emissions of the sample emitted from two different directions in a non-parallel relationship to each other. In one embodiment, polarization-resolved excitation of the sample and epi-detection of the emitted polarized fluorescence capture the three-dimensional orientation of the excited dipoles along the focal plane of the same excitation/detection objective used to excite the sample and detect the emitted fluorescence. In one embodiment, polarization-resolved excitation of the sample and non-parallel detection of fluorescence emitted by the sample in an alternating excitation sequence captures a substantial portion of the projection of the three-dimensional orientation of the excited dipoles onto the axial or meridional plane of the respective detection target. In one embodiment, the system includes a processor in operative communication with one or more detectors for capturing data regarding the position and three-dimensional orientation of each excited dipole detected in polarized fluorescence emissions emitted by the sample detected by the one or more objective lenses. The processor is operable to calculate the three-dimensional orientation and position of the excited dipole in each voxel detected in the fluorescent emissions emitted by the illuminated sample. In some embodiments, the system captures multiple images with different induced polarizations so that the processor can determine the position and three-dimensional orientation of each excited dipole detected by the one or more detectors. Referring to the drawings, an embodiment of a system for determining the three-dimensional dipole orientation and position for each voxel of an illuminated sample is shown in fig. 1-4 and is generally indicated at 100.
Referring to FIG. 1, one embodiment of a fluorescence microscope system is shown generally at 100. In one aspect, the
In some embodiments, the
In some embodiments, polarized
When the
In one arrangement, polarized
In some embodiments, third objective 112 may be located below
In some embodiments, the first detector 116, the second detector 118, and the
In some embodiments, the first
In some embodiments, the
As shown in fig. 3A and 3B, in an epi-detection mode of operation of
In the quadrature detection mode of operation shown in FIG. 2B, the two objective lens arrangement alternately illuminates and detects the resulting polarized fluorescence emission along a plane perpendicular to the axis of the respective detection objective lens. Specifically, the first
As shown in fig. 4A and B, in the orthogonal detection mode of operation,
In some embodiments,
In addition, the polarization state of the
In some embodiments,
Testing
A prototype microscope system was constructed so that the method could be simplified for practice. The prototype microscope system included a disprim (1.1NA, Nikon; 0.71NA, special optics, corresponding to the first
Next, reconstruction is performed on the processor using an algorithm that predicts the average orientation in each voxel. The algorithm uses a model of the excitation and radiation process to predict the relationship between the average dipole orientation and the intensity measured by the instrument. To recover the average dipole orientation from the measured intensities, the object is extended to spherical harmonics and the linearized reconstruction problem is solved in angular frequency space. As shown in fig. 5A, example raw data (Alexa Fluor phalloidin labeled actin in fixed U2OS cells) shows maximum intensity projection images corresponding to the imaging volume obtained with differently polarized illumination light (introduced through the 0.71NA objective lens (first objective lens 108)) and collected through the 1.1NA objective lens (second objective lens 110). The orientation of the input illumination is indicated in the inset of each image. This data plus an additional set of 4 volumes (acquired by the first
It should be understood from the foregoing that, while particular embodiments have been illustrated and described, various modifications can be made thereto without departing from the spirit and scope of the invention, as will be apparent to those skilled in the art. Such changes and modifications are within the scope and teachings of the present invention as defined by the appended claims.
- 上一篇:一种医用注射器针头装配设备
- 下一篇:用于生成和分析概览对比度图像的方法