阅读说明：本技术 小角度x射线散射测量 (Small angle X-ray scattering measurements ) 是由 亚历克斯·迪科波尔特塞夫 马修·沃明顿 尤里·文施泰因 亚历山大·克罗赫马尔 于 2019-07-04 设计创作，主要内容包括：一种x射线装置,该x射线装置可以包括被配置为保持样品的底座；x射线源,该x射线源被配置为将x射线束引向样品的第一侧；检测器,该检测器位于样品的第二侧的下游,该检测器被配置为在样品测量时段期间检测已经透射通过样品的x射线的至少一部分；以及x射线强度检测器,该x射线强度检测器在射束强度监控时段期间定位在位于x射线源与样品的第一侧之间的测量位置处,以便检测x射线束到达样品之前的x射线束的至少一部分。(An x-ray device may include a base configured to hold a sample; an x-ray source configured to direct an x-ray beam toward a first side of a sample; a detector located downstream of the second side of the sample, the detector configured to detect at least a portion of the x-rays that have been transmitted through the sample during a sample measurement period; and an x-ray intensity detector positioned at a measurement location between the x-ray source and the first side of the sample during the beam intensity monitoring period so as to detect at least a portion of the x-ray beam before the x-ray beam reaches the sample.)