阅读说明：本技术 具有电容耦合到浮栅的栅极的存储器单元的编程 (Programming of memory cells having gates capacitively coupled to floating gates ) 是由 V·马克夫 A·柯多夫 于 2019-07-10 设计创作，主要内容包括：一种存储器设备,该存储器设备具有存储器单元,每个存储器单元包括：源极区和漏极区,该源极区和漏极区之间具有沟道区；浮栅,该浮栅处于第一沟道区部分上方；选择栅,该选择栅处于第二沟道区部分上方；控制栅,该控制栅处于浮栅上方；和擦除栅,该擦除栅处于源极区上方。控制电路被配置为针对存储器单元中的一个存储器单元：施加第一编程电压脉冲,该第一编程电压脉冲包括施加到控制栅的第一电压；执行读取操作,该读取操作包括针对不同的控制栅电压检测通过沟道区的电流,以使用对应于通过沟道区的目标电流的所检测到的电流来确定目标控制栅电压；以及施加第二编程电压脉冲,该第二编程电压脉冲包括施加到控制栅的第二电压,该第二电压由第一电压、标称电压和目标电压确定。(A memory device having memory cells, each memory cell comprising: a source region and a drain region having a channel region therebetween; a floating gate over a portion of the first channel region; a select gate over the second channel region portion; a control gate over the floating gate; and an erase gate over the source region. The control circuit is configured to, for one of the memory cells: applying a first programming voltage pulse comprising a first voltage applied to the control gate; performing a read operation including detecting a current through the channel region for different control gate voltages to determine a target control gate voltage using the detected current corresponding to a target current through the channel region; and applying a second programming voltage pulse comprising a second voltage applied to the control gate, the second voltage determined by the first voltage, the nominal voltage, and the target voltage.)

1. A memory device, comprising:

memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate; and

a control circuit configured to, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the control gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and determining a target voltage of the control gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the control gate, the second voltage determined by the first voltage, a nominal voltage and the target voltage, an

After applying the first and second programming voltage pulses, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate and the control gate while detecting any current in the channel region, wherein the read voltages include the nominal voltage applied to the control gate.

2. The memory device of claim 1, wherein, for the one memory cell, the second voltage applied to the control gate is determined by the first voltage plus the nominal voltage minus the target voltage.

3. The memory device of claim 1, wherein the control circuit is further configured to perform an erase operation for the one memory cell after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

4. The memory device of claim 1, wherein the control circuitry is further configured to, for the one memory cell:

performing a second read operation after applying the first and second programming voltage pulses, the second read operation including detecting a second current through the channel region for different voltages applied to the control gates, and determining a second target voltage of the control gates using the detected second current corresponding to the target current through the channel region; and

applying a third programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the third programming voltage pulse comprises a third voltage applied to the control gate determined by the second voltage plus the nominal voltage minus the second target voltage.

5. The memory device of claim 4, wherein the control circuitry is further configured to perform an erase operation for the one memory cell after the second read operation and before applying the third programming voltage pulse, the erase operation comprising applying a positive voltage to the erase gate.

6. The memory device of claim 1, wherein the control circuitry is further configured to:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

7. A memory device, comprising:

memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate; and

a control circuit configured to, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the erase gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the erase gate, and determining a target voltage of the erase gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the erase gate, the second voltage determined by the first voltage, a nominal voltage and the target voltage, an

After applying the first programming voltage pulse and the second programming voltage pulse, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region, wherein the read voltages include the nominal voltage applied to the erase gate.

8. The memory device of claim 7, wherein, for the one memory cell, the second voltage applied to the erase gate is determined by the first voltage plus the nominal voltage minus the target voltage.

9. The memory device of claim 7, wherein the control circuit is further configured to perform an erase operation for the one memory cell after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

10. The memory device of claim 7, wherein the control circuitry is further configured to, for the one memory cell:

performing a second read operation after applying the first programming voltage pulse and the second programming voltage pulse, the second read operation including detecting a second current through the channel region for different voltages applied to the erase gate, and determining a second target voltage of the erase gate using the detected second current corresponding to the target current through the channel region; and

applying a third program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the third program voltage pulse comprises a third voltage applied to the erase gate, the third voltage determined by the second voltage plus the nominal voltage minus the second target voltage.

11. The memory device of claim 10, wherein the control circuitry is further configured to perform an erase operation for the one memory cell after the second read operation and before applying the third programming voltage pulse, the erase operation comprising applying a positive voltage to the erase gate.

12. The memory device of claim 7, wherein the control circuitry is further configured to:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

13. A memory device, comprising:

memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate; and

a control circuit configured to, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the control gate and a second voltage applied to the erase gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and the erase gate, and determining a first target voltage of the control gate and a second target voltage of the erase gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the second programming voltage pulse comprises:

a third voltage applied to the control gate, the third voltage being determined by the first voltage, a first nominal voltage and the first target voltage, and

a fourth voltage applied to the erase gate, the fourth voltage determined by the second voltage, a second nominal voltage, and the second target voltage, an

After applying the first and second programming voltage pulses, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region, wherein the read voltages include the first nominal voltage applied to the control gate and the second nominal voltage applied to the erase gate.

14. The memory device of claim 13, wherein for the one memory cell:

the third voltage applied to the control gate is determined by the first voltage plus the first nominal voltage minus the first target voltage; and is

The fourth voltage applied to the erase gate is determined by the second voltage plus the second nominal voltage minus the second target voltage.

15. The memory device of claim 13, wherein the control circuit is further configured to perform an erase operation for the one memory cell after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

16. The memory device of claim 13, wherein the control circuitry is further configured to:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

17. A method of operating a memory device comprising memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate;

the method includes, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the control gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and determining a target voltage of the control gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the control gate, the second voltage determined by the first voltage, a nominal voltage and the target voltage, an

After applying the first and second programming voltage pulses, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate and the control gate while detecting any current in the channel region, wherein the read voltages include the nominal voltage applied to the control gate.

18. The method of claim 17, wherein for the one memory cell, the second voltage applied to the control gate is determined by the first voltage plus the nominal voltage minus the target voltage.

19. The method of claim 17, further comprising, for the one memory cell:

performing an erase operation after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

20. The method of claim 17, further comprising, for the one memory cell:

performing a second read operation after applying the first and second programming voltage pulses, the second read operation including detecting a second current through the channel region for different voltages applied to the control gates, and determining a second target voltage of the control gates using the detected second current corresponding to the target current through the channel region; and

applying a third programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the third programming voltage pulse comprises a third voltage applied to the control gate determined by the second voltage plus the nominal voltage minus the second target voltage.

21. The method of claim 20, further comprising, for the one memory cell:

performing an erase operation after the second read operation and before applying the third programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

22. The method of claim 17, further comprising:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

23. A method of operating a memory device comprising memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate;

the method includes, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the erase gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the erase gate, and determining a target voltage of the erase gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the erase gate, the second voltage determined by the first voltage, a nominal voltage and the target voltage, an

After applying the first programming voltage pulse and the second programming voltage pulse, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region, wherein the read voltages include the nominal voltage applied to the erase gate.

24. The method of claim 23, wherein the second voltage applied to the erase gate is determined by the first voltage plus the nominal voltage minus the target voltage for the one memory cell.

25. The method of claim 23, further comprising, for the one memory cell:

performing an erase operation after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

26. The method of claim 23, further comprising, for the one memory cell:

performing a second read operation after applying the first programming voltage pulse and the second programming voltage pulse, the second read operation including detecting a second current through the channel region for different voltages applied to the erase gate, and determining a second target voltage of the erase gate using the detected second current corresponding to the target current through the channel region; and

applying a third program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the third program voltage pulse comprises a third voltage applied to the erase gate, the third voltage determined by the second voltage plus the nominal voltage minus the second target voltage.

27. The method of claim 26, further comprising, for the one memory cell:

performing an erase operation after the second read operation and before applying the third programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

28. The method of claim 23, further comprising:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

29. A method of operating a memory device comprising memory cells arranged in rows and columns, wherein each of the memory cells comprises:

a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region,

a floating gate disposed over and insulated from a first portion of the channel region for controlling conductivity of the first portion of the channel region,

a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region,

a control gate disposed over and insulated from the floating gate, an

An erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate;

the method includes, for one of the memory cells:

applying a first programming voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first programming voltage pulse comprises a first voltage applied to the control gate and a second voltage applied to the erase gate,

performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and the erase gate, and determining a first target voltage of the control gate and a second target voltage of the erase gate using the detected current corresponding to a target current through the channel region,

applying a second programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the second programming voltage pulse comprises:

a third voltage applied to the control gate, the third voltage being determined by the first voltage, a first nominal voltage and the first target voltage, and

a fourth voltage applied to the erase gate, the fourth voltage determined by the second voltage, a second nominal voltage, and the second target voltage, an

After applying the first and second programming voltage pulses, determining a program state of the one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region, wherein the read voltages include the first nominal voltage applied to the control gate and the second nominal voltage applied to the erase gate.

30. The method of claim 29, wherein for the one memory cell:

the third voltage applied to the control gate is determined by the first voltage plus the first nominal voltage minus the first target voltage, and

the fourth voltage applied to the erase gate is determined by the second voltage plus the second nominal voltage minus the second target voltage.

31. The method of claim 29, further comprising, for the one memory cell: performing an erase operation after the read operation and before applying the second programming voltage pulse, the erase operation including applying a positive voltage to the erase gate.

32. The method of claim 29, further comprising:

simultaneously applying the first programming voltage pulse to a first plurality of the memory cells, wherein the first plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and two or more of the columns of the memory cells; and

simultaneously applying the second programming voltage pulse to a second plurality of the memory cells, wherein the second plurality of memory cells includes memory cells located in two or more of the rows of the memory cells and located in only one of the columns of the memory cells.

Technical Field

The invention relates to a non-volatile memory array.

Background

Split gate non-volatile memory cells and arrays of such cells are well known. For example, a conventional split-gate memory cell 10 having four gates is shown in FIG. 1. Each memory cell 10 includes a source region 14 and a drain region 16 formed in a semiconductor substrate 12 with a channel region 18 extending therebetween. A floating gate 20 is formed over and insulated from (and controls the conductivity of) a first portion of the channel region 18 and is preferably formed over a portion of the source region 14. A select gate 22 (also referred to as a word line gate) is disposed over and insulated from (and controls the conductivity of) the second portion of the channel region 18 and is also laterally adjacent to the floating gate 20. A control gate 28 is disposed over and insulated from the floating gate 20. An erase gate 30 is disposed over and insulated from the source region 14. Preferably, the memory cells 10 are formed in pairs, with each pair sharing a common erase gate 30 and a common source region 14, and the pairs are arranged end-to-end such that each drain region 16 is shared by two adjacent pairs of memory cells.

The memory cell 10 is erased by placing a high positive voltage on the erase gate 30 (where electrons are removed from the floating gate 20), which causes electrons on the floating gate 20 to tunnel from the floating gate 20 to the erase gate 30 via fowler-nordheim tunneling through an intermediate insulator (shown graphically in fig. 1 by the arrow extending from the floating gate 20 to the erase gate 30). The erase efficiency is improved by having a recess in the erase gate 30 wrap around the upper edge of the floating gate 20.

The memory cell 10 is programmed (where electrons are placed on the floating gate 20) by applying appropriate positive voltages on the select gate 22, the control gate 28, the erase gate 30 and the source region 14, and a current source on the drain 16. Electrons will flow along the channel region 18 from the drain 16 to the source 14. When the electrons reach the gap between the select gate 22 and the floating gate 20, the electrons will accelerate and heat up. Some of the heated electrons will be injected through the gate oxide insulator under the floating gate and onto the floating gate 20 due to the attractive electrostatic forces from the floating gate 20 (which are caused by the positive voltage on the control gate 28 capacitively coupling to the floating gate 20), as shown in fig. 1. This programming technique is known as hot electron injection and is illustrated graphically in fig. 1 by the arrows extending along the channel region 18 and into the floating gate 20.

The memory cell 10 is read by applying a positive read voltage across the drain region 16, the select gate 22 (which turns on the portion of the channel region under the select gate 22), and the control gate 28 (which is capacitively coupled to the floating gate 20). If the floating gate 20 is positively charged (i.e., electrons are erased and capacitively coupled to a positive voltage on the control gate 28), the portion of the channel region under the floating gate 20 is also turned on by the capacitively coupled voltage and current will flow through the channel region 18, which is sensed as an erased or "1" state. If the floating gate 20 is negatively charged (i.e., programmed by electrons), the portion of the channel region under the floating gate 20 is mostly or completely turned off (i.e., the capacitive coupling voltage from the control gate 28 is insufficient to overcome the negative charge stored on the floating gate 20) and no (or little) current will flow through the channel region 18, which is sensed as a programmed or "0" state.

The memory cell 10 can also be operated such that it has multiple program states (referred to as a multi-level cell (MLC), where the memory cell 10 has more than two different program states, such as four states 11, 10, 01, and 00 storing two bits of information). The memory cell 10 can also be operated in an analog manner (i.e., without discrete programmed states to produce a series of analog read signal values). In both cases, it is important not to over program the memory cell (i.e., place too many electrons on the floating gate) because the memory cell will not later produce a read operation result that properly reflects the intended program state. However, it is also important to ensure that the memory cell 10 is sufficiently programmed so that its program state can be reliably detected later during a read operation. Also, for multi-level cell or analog cell applications, under-programming the memory cell does not produce the desired read operation result. Thus, conventionally, it is known to apply the programming voltage in discrete pulses with intervening read operations between the programming pulses. In particular, a programming pulse of voltage is applied to the memory cell, and then a read operation is performed to determine whether the read current on the channel is below a desired threshold. If not, another programming voltage pulse is applied and another read operation is performed to see if the read current on the channel is below the threshold. This process continues until the read current on the channel is below the threshold. To prevent over-programming, the pulses are relatively short and many pulses are required to fully program the memory cell without over-programming. In fact, a typical memory cell may require between 10 and 30 or even more programming voltage pulses to properly program the memory cell to its desired "0" state. This is so because each programming pulse cannot incrementally change the programmed state of the memory cell in increments that exceed the target window (i.e., target range) for the desired programmed state (otherwise an undesired level of over-programming may occur). An advantage of this technique is that the memory cell is incrementally programmed until it achieves the desired program state quite accurately (which will provide the desired read current during a read operation so that the program state can be reliably detected). A drawback of this technique is that it takes a relatively long time (e.g., tens of microseconds) to perform so many programming voltage pulses separated by multiple read operations.

There is a need for a memory cell programming technique that is capable of accurately and reliably programming memory cells in a reduced amount of time without over-programming the memory cells.

Disclosure of Invention

The foregoing problems and needs are solved by a memory device that includes memory cells arranged in rows and columns and control circuitry. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The control circuit is configured to, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the first program voltage pulse comprises a first voltage applied to the control gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate, and determining a target voltage of the control gate using the detected current corresponding to a target current through the channel region; applying a second programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the control gate, the second voltage determined by the first voltage, the nominal voltage, and the target voltage; and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a nominal voltage applied to the control gate.

The memory device may include memory cells arranged in rows and columns and control circuitry. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The control circuit is configured to, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first program voltage pulse comprises a first voltage applied to the erase gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the erase gate, and determining a target voltage of the erase gate using the detected current corresponding to a target current through the channel region; applying a second program voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second program voltage pulse comprises a second voltage applied to the erase gate, the second voltage determined by the first voltage, the nominal voltage and the target voltage; and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a nominal voltage applied to the erase gate.

The memory device may include memory cells arranged in rows and columns and control circuitry. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The control circuit is configured to, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the first program voltage pulse includes a first voltage applied to the control gate and a second voltage applied to the erase gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and the erase gate, and determining a first target voltage of the control gate and a second target voltage of the erase gate using the detected current corresponding to a target current through the channel region; applying a second program voltage pulse to the source region, the select gate, the erase gate and the control gate (wherein the second program voltage pulse includes a third voltage applied to the control gate determined by the first voltage, the first nominal voltage and the first target voltage and a fourth voltage applied to the erase gate determined by the second voltage, the second nominal voltage and the second target voltage); and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a first nominal voltage applied to the control gate and a second nominal voltage applied to the erase gate.

A method of operating a memory device that includes memory cells arranged in rows and columns. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The method includes, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the first program voltage pulse comprises a first voltage applied to the control gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate, and determining a target voltage of the control gate using the detected current corresponding to a target current through the channel region; applying a second programming voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the second programming voltage pulse comprises a second voltage applied to the control gate, the second voltage determined by the first voltage, the nominal voltage, and the target voltage; and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a nominal voltage applied to the control gate.

A method of operating a memory device that includes memory cells arranged in rows and columns. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The method includes, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the first program voltage pulse comprises a first voltage applied to the erase gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the erase gate, and determining a target voltage of the erase gate using the detected current corresponding to a target current through the channel region; applying a second program voltage pulse to the source region, the select gate, the erase gate and the control gate, wherein the second program voltage pulse comprises a second voltage applied to the erase gate, the second voltage determined by the first voltage, the nominal voltage and the target voltage; and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a nominal voltage applied to the erase gate.

A method of operating a memory device that includes memory cells arranged in rows and columns. Each of the memory cells includes: a source region and a drain region formed in a semiconductor substrate, wherein a channel region of the substrate extends between the source region and the drain region; a floating gate disposed over and insulated from the first portion of the channel region for controlling conductivity of the first portion of the channel region; a select gate disposed over and insulated from the second portion of the channel region for controlling conductivity of the second portion of the channel region; a control gate disposed over and insulated from the floating gate; and an erase gate disposed over and insulated from the source region and disposed adjacent to and insulated from the floating gate. The method includes, for one of the memory cells: applying a first program voltage pulse to the source region, the select gate, the erase gate, and the control gate, wherein the first program voltage pulse includes a first voltage applied to the control gate and a second voltage applied to the erase gate; performing a read operation after applying the first programming voltage pulse, the read operation including detecting a current through the channel region for different voltages applied to the control gate and the erase gate, and determining a first target voltage of the control gate and a second target voltage of the erase gate using the detected current corresponding to a target current through the channel region; applying a second program voltage pulse to the source region, the select gate, the erase gate and the control gate (wherein the second program voltage pulse includes a third voltage applied to the control gate determined by the first voltage, the first nominal voltage and the first target voltage and a fourth voltage applied to the erase gate determined by the second voltage, the second nominal voltage and the second target voltage); and determining a program state of one memory cell by applying respective read voltages to the drain region, the select gate, the erase gate and the control gate while detecting any current in the channel region after applying the first programming voltage pulse and the second programming voltage pulse, wherein the read voltages include a first nominal voltage applied to the control gate and a second nominal voltage applied to the erase gate.

Other objects and features of the present invention will become apparent by a review of the specification, claims and appended figures.

Drawings

FIG. 1 is a side cross-sectional view of a 4-gate non-volatile memory cell.

FIG. 2 is a plan view of a memory device architecture.

Fig. 3 is a schematic/layout diagram of a memory cell array (with floating gates not shown for simplicity).

Detailed Description

The present invention relates to a new programming technique that involves as few as two programming voltage pulses to accurately program a memory cell without the undue risk of over programming. This programming technique takes advantage of the fact that: the magnitude of the voltage applied to the control gate 28 during programming strongly determines the extent to which the programming pulse ultimately programs the memory cell.

The programming technique begins with applying a first programming voltage pulse to the memory cell being programmed, wherein the voltage applied to the control gate 28 during this first pulse is an initial value V_cg1. The first programming voltage pulse programs the memory cell to a first program state. A first scan read operation is then performed in which the read voltage on the control gate 28 is swept through a range of values while measuring or detecting the read current through the channel region 18. The purpose of this read operation is to determine the target voltage V on the control gate 28_tcgThe target voltage produces a target read current I through the channel region 18_t. Once V is determined by the read operation_tcgThe memory cell is erased by an erase operation. Then, a second programming voltage pulse is applied to the memory cell, wherein the voltage V applied to the control gate 28 during this second programming voltage pulse_cg2Determined by the following equation:

V_cg2＝V_cg1+V_cgn–V_tcgequation 1

Wherein V_cgnIs the nominal read bias of the control gate 28 that will be used to read the programmed state of the memory cell during a normal read operation. V_cgnA non-limiting example of (2) is 2.5V. The inventors have found that this second programming voltage pulse is very likely to place the memory cell in the desired programmed state. A second read operation may be performed to confirm this. If desiredThe programmed state is verified, it will be achieved by only two programming pulses.

It has also been found that in some cases, the erase operation between the first program pulse and the second program pulse may be omitted. Specifically, if V is determined as determined by equation 1_cg2Greater than V_cg1+V_dIn which V is_dIs a delta voltage value that varies based on memory cell characteristics and processing technology (e.g., about 0.8V to 1.0V for a typical memory cell), the intervening erase operation between the first program pulse and the second program pulse may be omitted. V_dIs a V_cg2And V_cg1The minimum difference between which results in the programmed state of memory cell 10 as two programming pulses (one using V)_cg1And the other uses V_cg2) As a result of and as only one programming pulse (using only V)_cg2) Substantially the same change occurs as a result of (a). The programmed state refers to the number of electrons on the floating gate.

Non-limiting exemplary voltages and currents for the first programming pulse and the second programming pulse are provided in the following table:

TABLE 1

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						First program pulse	4.5V	1μA	1V	4.5V	Vcg1＝8V
Second program pulse	4.5V	1μA	1V	4.5V	Vcg2

Non-limiting exemplary voltages for reading and erasing memory cells are provided in the following table:

TABLE 2

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						Reading	0V	0.8V	2.5V	0V	Vcgn＝2.5V
Erasing	0V	0V	0V	11.5V	0V

In the two-pulse programming technique described above, there are several options if the desired program state is not achieved as determined by the second read operation. First, if the second programming voltage pulse is determined by the second read operation to under-program the memory cell, the memory cell can be incrementally continued to be programmed using prior art techniques of small incremental programming pulses separated by verify read operations until the desired programmed state is achieved. However, even in this case, the overall number of programming pulses is greatly reduced compared to using only the prior art incremental programming technique. Second, if it is determined by the second read operation that the desired program state is not achieved, the erase operation may be repeated and a third program pulse may be applied according to the following formula:

V_cg3＝V_cg2+V_cgn–V_tcg2equation 2

In particular, after applying the second programming pulse and determining whether the memory cell is over-programmed or under-programmed, a first scan read is performedIn operation, a read voltage on the control gate 28 is swept through a range of values while measuring or detecting a read current through the channel region 18. The purpose of the second sweep operation is to determine a second target voltage V on the control gate_tcg2The second target voltage produces a target read current I through the channel region 18_t. Then, the memory cell is erased and a third programming voltage pulse is applied to the memory cell, where the voltage V_cg3During this third programming voltage pulse is applied to the control gate according to equation 2. It has been found that this second program iteration (sweep, erase, third program pulse) can compensate for secondary effects in the memory cells. Can use V_cgnPerforming an initial read operation after the second programming pulse to determine if the cell is properly programmed, and if not, performing a sweep read operation to determine V_tcg2. Alternatively, the initial read operation after the second programming pulse may be a sweep operation, where I need only be reached on the control gate_tVoltage and V of_cgnThe second program iteration is triggered differently (exactly or within a predetermined range). If, after the third programming pulse, a read operation is performed and it is determined that the desired program state is not achieved, the process described above with respect to equation 2 may be iteratively repeated until the desired program state is achieved (i.e., using equation V)_cg(k)＝V_cg(k-1)+V_cgn–V_tcg(k-1)Where k is 4 for the first iteration repeat, k is 5 for the second iteration repeat, etc.).

The voltage coupled to the floating gate during programming occurs not only between the control gate and the floating gate, but also between the erase gate and the floating gate. Thus, in a first alternative embodiment, the voltage on the erase gate, rather than the control gate, can be varied in a two-pulse programming technique. In particular, the first programming voltage pulse to the memory cell being programmed will include an initial voltage V applied to the erase gate 30_e1. Then, a first scan read operation is performed in which the read voltage on the erase gate 30 is swept through a range of values while measuring or detecting the read current through the channel region 18. The purpose of this read operation is to determine the target voltage V on the erase gate_teThe target voltage produces a target read current I through the channel region 18_t. Once the target voltage V is determined by the read operation_teThe memory cell is erased by an erase operation. Then, a second programming voltage pulse is applied to the memory cell, wherein the voltage V applied to the erase gate during the second programming voltage pulse_e2Determined by the following equation:

V_e2＝V_e1+V_en–V_teequation 3

Wherein V_enIs the nominal read offset of the erase gate that will be used to read the programmed state of the memory cell during a normal read operation. V_enA non-limiting example of (2) is 2.5V. Non-limiting exemplary voltages and currents for the first and second programming pulses of this first alternative embodiment are provided in the following table:

TABLE 3

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						First program pulse	4.5V	1μA	1V	Ve1＝4.5V	8V
Second program pulse	4.5V	1μA	1V	Ve2	8V

Non-limiting exemplary voltages for reading and erasing the memory cells for this first alternative embodiment are provided in the following table:

TABLE 4

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						Reading	0V	0.8V	2.5V	Ven＝2.5V	2.5V
Erasing	0V	0V	0V	11.5V	0V

It has also been found that in some cases, the erase operation between the first and second program pulses can be omitted for this first alternative embodiment. In particular, if it is true V_e2Greater than V_e1+V_edIn which V is_edIs a delta voltage value that varies based on memory cell characteristics and processing technology (e.g., about 1V to 2V for a typical memory cell), the intervening erase operation between the first program pulse and the second program pulse may be omitted. V_edIs a V_e2And V_e1The minimum difference between them, which results in the programmed state of the memory cell as two programming pulses (one using V)_e1And the other uses V_e2) As a result of and as only one programming pulse (using only V)_e2) Substantially the same change occurs as a result of (a).

In a second alternative embodiment, both the control gate voltage and the erase gate voltage are changed in a two-pulse programming technique. In particular, the first programming voltage pulse to the memory cell being programmed will include an initial voltage V applied to the erase gate 30_e1And an initial voltage V applied to the control gate 28_cg1. Then, a read operation is performed, whereinThe read voltage on the control gate 28 and the erase gate 30 is swept through a range of values while measuring or detecting the read current through the channel region 18. The purpose of this read operation is to determine the target voltages V on the erase gate 30 and the control gate 28, respectively_teAnd V_tcgThe target voltage produces a target read current I through the channel region 18_t. Once V is determined by the read operation_teAnd V_tcgThe memory cell 10 is erased by an erase operation. Then, a second programming voltage pulse is applied to the memory cell, wherein the voltage V applied to the erase gate during the second programming voltage pulse_e2And a voltage V applied to the control gate_cg2Determined by the following equation:

V_e2＝V_e1+V_en–V_teequation 4

V_cg2＝V_cg1+V_cgn–V_tcgEquation 5

Non-limiting exemplary voltages and currents for the first and second programming pulses of this second alternative embodiment are provided in the following table:

TABLE 5

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						First program pulse	4.5V	1μA	1V	Ve1＝4.5V	Vcg1＝8V
Second program pulse	4.5V	1μA	1V	Ve2	Vcg2

Non-limiting exemplary voltages for reading and erasing memory cells for this second alternative embodiment are provided in the following table:

TABLE 6

	Source electrode 14	Drain electrode 16	Selection grid 22	Erase gate 30	Control gate 28
						Reading	0V	0.8V	2.5V	Ven＝2.5V	Vcgn＝2.5V
Erasing	0V	0V	0V	11.5V	0V

It has also been found that in some cases, the erase operation between the first program pulse and the second program pulse can be omitted for this second alternative embodiment. Specifically, if V is determined_e2Greater than V_e1+V_edAnd V is_cg2Greater than V_cg1+V_dThe intervening erase operation between the first program pulse and the second program pulse may be omitted.

FIG. 2 illustrates an architecture of an exemplary memory device. The memory device includes an array 60 of non-volatile memory cells that can be partitioned into two separate planes (plane a 62a and plane B62B). The memory cells may be of the type shown in fig. 1 (i.e., memory cell 10), may be formed on a single chip, and may be arranged in multiple rows and columns in semiconductor substrate 12. Adjacent to the array 60 of non-volatile memory cells are address decoders (e.g., XDEC 64 (row decoder driving word lines), SLDRV 66 (source line driver driving source lines), YMUX 68 (column decoder driving bit lines), HVDEC 70 (high voltage decoder), and bit line controller (BLINHCTL 72), the controller 76 (including control circuitry) controls various device elements to achieve each operation (program, erase, read) on the target memory cell (i.e., directly or indirectly providing voltages and currents to operate the memory cell as discussed herein). the charge pump CHRGPMP 74 provides various voltages for reading, programming, and erasing the memory cell under the control of the controller 76.

A significant advantage of the present invention is that programming of multiple cells can occur simultaneously and at different granularities (i.e., involving different numbers of memory cells) relative to the first and second programming pulses. This is illustrated with respect to fig. 3, which shows the architecture of the memory array (floating gates not shown for simplicity). In particular, each horizontal select gate line 22a electrically connects all of the select gates 22 of the row of memory cells 10 together. Each horizontal control gate line 28a electrically connects all the control gates 28 of the row of memory cells 10 together. Each horizontal source line 14a electrically connects together all the source regions 14 of two rows of memory cells 10 that share source regions 14. Each bit line 16a electrically connects all of the drain regions 16 of the column of memory cells 10 together. Each erase gate line 30a electrically connects together all erase gates 30 of two rows of memory cells 10 that share an erase gate 30. Accordingly, all the gate lines and the source lines run in the horizontal (row) direction, and the bit lines run in the vertical (column) direction.

With the above memory array architecture, programming of multiple cells can be performed simultaneously. In particular, both the first programming pulse and the second programming pulse can be applied to multiple memory cells simultaneously as described below. First, because each memory cell being programmed is preferably initially programmed using the same value of the first programming pulse, memory cells in different rows and different columns can be simultaneously programmed with the first programming pulse. Example (b)For example, a first program pulse may be applied to a plurality of memory cells 10 on the same bit line 16a, including V via control gate line 28a_cg1Applied to the control gate 28. Programming of non-target cells on the same bit line may be prevented by removing one or more of the programming voltages for those rows of memory cells, and programming of non-target cells on other bit lines may be prevented by applying a program inhibit voltage on those bit lines. Depending on which cells are to be programmed, a plurality of cells in a plurality of rows and a plurality of columns can be programmed simultaneously with a first program pulse. It should be noted, however, that there may be practical limits to the number of one-time programmable cells, as the peripheral circuitry may not be able to supply sufficient voltage and/or current to program all or even most of the memory cells at once (i.e., in most cases, to include peripheral circuitry that can supply sufficient voltage/current to program all of the memory cells at once, would be too costly and would use too much space). However, for most array designs, the peripheral circuitry can program two or more memory cells simultaneously with the first program pulse.

The second program pulse may also be applied to a plurality of memory cells 10 simultaneously. Specifically, V is determined for a plurality of memory cells 10_cg2Thereafter, a second program pulse may be applied to multiple memory cells 10 in the same row, so long as their respective V' s_cg2The values are the same (since they share the same control gate line 28 a). Furthermore, the second program pulse may be applied simultaneously to multiple memory cells 10 in different rows on the same bit line 16a, since different V's may be applied_cg2Values are applied to separate control gate lines 28a in different rows. As is apparent from the above, a plurality of pairs of memory cell rows can be simultaneously erased by simultaneously supplying an erase voltage to a plurality of erase gate lines 30 a.

The simultaneous programming of a plurality of memory cells using a first programming pulse and/or a second programming pulse is described with respect to the first embodiment, where reading is performed by scanning the control gate voltage and based on determining the appropriate control gate voltage V_cg2To customize the second program pulse for each cell. However, the same asSimultaneous programming may also be performed for the first alternative embodiment described above, where reading is performed by scanning the erase gate voltage, and based on determining the appropriate erase gate voltage V_e2To customize the second program pulse for each cell.

It is to be understood that the present invention is not limited to the embodiments described above and shown herein, but encompasses any and all variations within the scope of any claims. For example, reference herein to the invention is not intended to limit the scope of any claims or claim terms, but rather only to one or more features that may be encompassed by one or more of these claims. The above-described examples of materials, processes, and values are illustrative only and should not be construed as limiting the claims. A single layer of material may be formed as multiple layers of such or similar materials, and vice versa. Finally, the present invention is ideal for different memory cell applications, i.e., multi-level cell (where the memory cell has two or more different program states in addition to an unprogrammed state) and analog (where the program states are not limited to discrete steps).

It should be noted that as used herein, the terms "above …" and "above …" both inclusively include "directly on …" (with no intervening material, element, or space disposed therebetween) and "indirectly on …" (with intervening material, element, or space disposed therebetween). Similarly, the term "adjacent" includes "directly adjacent" (no intermediate material, element, or space disposed therebetween) and "indirectly adjacent" (intermediate material, element, or space disposed therebetween), "mounted to" includes "directly mounted to" (no intermediate material, element, or space disposed therebetween) and "indirectly mounted to" (intermediate material, element, or space disposed therebetween), and "electrically coupled" includes "directly electrically coupled to" (no intermediate material or element therebetween that electrically connects the elements together) and "indirectly electrically coupled to" (intermediate material or element therebetween that electrically connects the elements together). For example, forming an element "over a substrate" can include forming the element directly on the substrate with no intervening materials/elements therebetween, as well as forming the element indirectly on the substrate with one or more intervening materials/elements therebetween.