阅读说明：本技术 薄膜晶体管基板和显示装置 (Thin film transistor substrate and display device ) 是由 朴世熙 赵寅晫 金大焕 白朱爀 卢智龙 于 2019-08-12 设计创作，主要内容包括：公开了一种薄膜晶体管基板和显示装置，包括能够防止漏电流的薄膜晶体管。该薄膜晶体管基板包括：基板、在基板上的第一缓冲层、在第一缓冲层上的第二缓冲层、在第二缓冲层上的半导体层、以及与半导体层分隔开的栅极电极，栅极电极的至少一部分与半导体层交叠，其中第一缓冲层的表面氧浓度高于第二缓冲层的表面氧浓度。(A thin film transistor substrate and a display device including a thin film transistor capable of preventing a leakage current are disclosed. The thin film transistor substrate includes: the semiconductor device includes a substrate, a first buffer layer on the substrate, a second buffer layer on the first buffer layer, a semiconductor layer on the second buffer layer, and a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer, wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.)

1. A thin film transistor substrate comprising:

a substrate;

a first buffer layer on the substrate;

a second buffer layer on the first buffer layer;

a semiconductor layer on the second buffer layer; and

a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer,

wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

2. The thin film transistor substrate of claim 1, wherein a dipole moment is formed between the first buffer layer and the second buffer layer.

3. The thin film transistor substrate of claim 1, wherein the first buffer layer comprises ionic bonds, the second buffer layer comprises covalent bonds, and

wherein the ionic bond comprises a metal.

4. The thin film transistor substrate of claim 1, wherein the semiconductor layer comprises an oxide semiconductor material.

5. The thin film transistor substrate according to claim 1, wherein the semiconductor layer comprises a first semiconductor layer on the buffer layer and a second semiconductor layer on the first semiconductor layer.

6. The thin film transistor substrate of claim 1, further comprising:

a first gate insulating film on the semiconductor layer; and

a second gate insulating film on the first gate insulating film,

wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

7. The thin film transistor substrate according to claim 6, wherein a dipole moment is formed between the first gate insulating film and the second gate insulating film.

8. The thin film transistor substrate according to claim 6, wherein the first gate insulating film includes a covalent bond, the second gate insulating film includes an ionic bond, and

wherein the ionic bond comprises a metal.

9. The thin film transistor substrate according to claim 1, further comprising a light-shielding layer between the substrate and the first buffer layer.

10. A thin film transistor substrate comprising:

a semiconductor layer on the substrate;

a first gate insulating film on the semiconductor layer;

a second gate insulating film on the first gate insulating film; and

a gate electrode on the second gate insulating film,

wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

11. The thin film transistor substrate of claim 10, wherein a dipole moment is formed between the first gate insulating film and the second gate insulating film.

12. A display device, comprising:

a substrate;

a shift register on the substrate; and

a pixel connected to the shift register, and a pixel,

wherein the shift register includes a stage connected to the pixels through a gate line,

wherein the stage comprises at least one thin film transistor,

wherein the thin film transistor includes:

a first buffer layer on the substrate;

a second buffer layer on the first buffer layer;

a semiconductor layer on the second buffer layer; and

a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer,

wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

13. The display device according to claim 12, wherein a dipole moment is formed between the first buffer layer and the second buffer layer.

14. The display device according to claim 12, wherein the first buffer layer comprises an ionic bond, the second buffer layer comprises a covalent bond, and

wherein the ionic bond comprises a metal.

15. The display device according to claim 12, wherein the semiconductor layer comprises an oxide semiconductor material.

16. The display device according to claim 12, wherein the thin film transistor further comprises:

a first gate insulating film on the semiconductor layer; and

a second gate insulating film on the first gate insulating film,

wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

17. The display device according to claim 16, wherein a dipole moment is formed between the first gate insulating film and the second gate insulating film.

18. A display device, comprising:

a substrate; and

a plurality of pixels on the substrate,

wherein the pixel includes:

a pixel driver on the substrate; and

a display element connected to the pixel driver,

wherein the pixel driver comprises at least one thin film transistor,

wherein the thin film transistor includes:

a first buffer layer on the substrate;

a second buffer layer on the first buffer layer;

a semiconductor layer on the second buffer layer; and

a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer,

wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

19. The display device according to claim 18, wherein a dipole moment is formed between the first buffer layer and the second buffer layer.

20. The display device according to claim 18, wherein the thin film transistor further comprises:

a first gate insulating film on the semiconductor layer; and

a second gate insulating film on the first gate insulating film,

wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

21. The display device according to claim 20, wherein a dipole moment is formed between the first gate insulating film and the second gate insulating film.

22. A thin film transistor substrate comprising:

a substrate;

a semiconductor layer on the substrate; and

a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer,

wherein two layers different in surface oxygen concentration are sequentially stacked on at least one side of an upper side and a lower side of the semiconductor layer, and of the two layers located on the same side of the semiconductor layer, a layer farther from the semiconductor layer has a surface oxygen concentration higher than a layer closer to the semiconductor layer.

23. The thin film transistor substrate of claim 22, wherein a dipole moment is formed between two layers located on the same side of the semiconductor layer.

Technical Field

The present invention relates to a thin film transistor substrate including a thin film transistor capable of preventing a leakage current, a shift register, and a display device.

Background

With the development of multimedia, the importance of display devices increases. Recently, flat panel display devices such as liquid crystal display devices, plasma display devices, and organic light emitting display devices have been widely used.

The gate driver of the flat panel display device includes a shift register configured to sequentially supply a gate pulse to a plurality of gate lines. The shift register includes a plurality of stages having a plurality of transistors, wherein the stages are cascade-connected to sequentially output gate pulses.

In the case of a liquid crystal display device or an organic light emitting display device, transistors included in a shift register of a gate driver are provided as a thin film transistor type in a substrate of a display panel, which is called a gate-in-panel (GIP) structure.

The thin film transistor included in the shift register of the GIP structure supplies a gate pulse to the thin film transistor of each pixel disposed in the active region. Thus, in addition to basic transistor characteristics such as mobility and leakage current, the thin film transistor must have electrical reliability and durability capable of maintaining a long life.

The semiconductor layer of the thin film transistor included in the shift register of the GIP structure may be formed of amorphous silicon or polycrystalline silicon (polysilicon). When amorphous silicon is used, it has advantages of simplification of a film formation process and reduction in manufacturing cost, but it is difficult to ensure electrical reliability. When polycrystalline silicon is used, it is difficult to apply to a large-sized display device due to a high process temperature, and it is difficult to ensure uniformity according to a crystallization method. In order to overcome these problems, a method of using an oxide semiconductor for a semiconductor layer of a transistor is studied.

The oxide semiconductor is considered to be a stable material of a non-crystal form. When an oxide semiconductor is used for a semiconductor layer of a thin film transistor, the transistor can be manufactured at a low temperature by using related art equipment without additional equipment, and an ion implantation process can be omitted.

However, the oxide semiconductor transistor generally has a negative threshold voltage, thereby generating a leakage current when the gate voltage (Vg) is 0 (zero). Due to the leakage current, a normal gate pulse cannot be supplied from the shift register. Therefore, a method of preventing a leakage current in an oxide semiconductor transistor of a shift register is required.

Disclosure of Invention

The present invention has been made in view of the above problems, and it is an object of the present invention to provide a thin film transistor substrate including a thin film transistor capable of preventing a leakage current.

Another object of the present invention is to provide a shift register including a thin film transistor capable of preventing a leakage current.

It is still another object of the present invention to provide a display device including a thin film transistor capable of preventing a leakage current.

In accordance with one aspect of the present invention, the above and other objects can be accomplished by the provision of a thin film transistor substrate comprising: the method comprises the following steps: a substrate; a first buffer layer on the substrate; a second buffer layer on the first buffer layer; a semiconductor layer on the second buffer layer; and a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer, wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

According to one or more embodiments of the present invention, a dipole moment is formed between the first buffer layer and the second buffer layer.

According to one or more embodiments of the present invention, the first buffer layer includes an ionic bond and the second buffer layer includes a covalent bond, and wherein the ionic bond includes a metal.

According to one or more embodiments of the present invention, the semiconductor layer includes an oxide semiconductor material.

According to one or more embodiments of the present invention, the semiconductor layer includes a first semiconductor layer on the buffer layer and a second semiconductor layer on the first semiconductor layer.

According to one or more embodiments of the present invention, the thin film transistor substrate further includes: a first gate insulating film on the semiconductor layer; and a second gate insulating film on the first gate insulating film, wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

According to one or more embodiments of the present invention, a dipole moment is formed between the first gate insulating film and the second gate insulating film.

According to one or more embodiments of the present invention, the first gate insulating film includes a covalent bond, the second gate insulating film includes an ionic bond, and wherein the ionic bond includes a metal.

According to another aspect of the present invention, there is provided a thin film transistor substrate including: a semiconductor layer on the substrate; a first gate insulating film on the semiconductor layer; a second gate insulating film on the first gate insulating film; and a gate electrode on the second gate insulating film, wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

According to one or more embodiments of the present invention, a dipole moment is formed between the first gate insulating film and the second gate insulating film.

According to another aspect of the present invention, there is provided a display device including: a substrate; a shift register on the substrate; and a pixel connected to the shift register, wherein the shift register includes a stage connected to the pixel through a gate line, wherein the stage includes at least one thin film transistor, wherein the thin film transistor includes: a first buffer layer on the substrate; a second buffer layer on the first buffer layer; a semiconductor layer on the second buffer layer; and a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer, wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

According to one or more embodiments of the present invention, a dipole moment is formed between the first buffer layer and the second buffer layer.

According to one or more embodiments of the present invention, the first buffer layer includes an ionic bond and the second buffer layer includes a covalent bond, and wherein the ionic bond includes a metal.

According to one or more embodiments of the present invention, the semiconductor layer includes an oxide semiconductor material.

According to one or more embodiments of the present invention, the thin film transistor further includes: a first gate insulating film on the semiconductor layer; and a second gate insulating film on the first gate insulating film, wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

According to one or more embodiments of the present invention, a dipole moment is formed between the first gate insulating film and the second gate insulating film.

According to still another aspect of the present invention, there is provided a display device including: a substrate; and a plurality of pixels on the substrate, wherein the pixels include: a pixel driver on the substrate; and a display element connected to the pixel driver, wherein the pixel driver includes at least one thin film transistor, wherein the thin film transistor includes: a first buffer layer on the substrate; a second buffer layer on the first buffer layer; a semiconductor layer on the second buffer layer; and a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer, wherein a surface oxygen concentration of the first buffer layer is higher than a surface oxygen concentration of the second buffer layer.

According to one or more embodiments of the present invention, a dipole moment is formed between the first buffer layer and the second buffer layer.

According to one or more embodiments of the present invention, wherein the thin film transistor further includes: a first gate insulating film on the semiconductor layer; and a second gate insulating film on the first gate insulating film, wherein a surface oxygen concentration of the second gate insulating film is higher than a surface oxygen concentration of the first gate insulating film.

According to one or more embodiments of the present invention, a dipole moment is formed between the first gate insulating film and the second gate insulating film.

According to still another aspect of the present invention, there is provided a thin film transistor substrate comprising: a substrate; a semiconductor layer on the substrate; and a gate electrode spaced apart from the semiconductor layer, at least a portion of the gate electrode overlapping the semiconductor layer, wherein two layers different in surface oxygen concentration are sequentially stacked on at least one side of upper and lower sides of the semiconductor layer, and of the two layers located on the same side of the semiconductor layer, a layer farther from the semiconductor layer has a surface oxygen concentration higher than a layer closer to the semiconductor layer.

According to one embodiment of the present invention, a multi-layered buffer layer or a multi-layered gate insulating film is provided so that a semiconductor layer, which may include an oxide semiconductor material, may have a positive threshold voltage and may also prevent a leakage current in an off state.

According to another embodiment of the present invention, the thin film transistor is configured to be capable of preventing a leakage current, thereby making it unnecessary to additionally provide a thin film transistor capable of preventing a leakage current. Thus, the number of thin film transistors included in the shift register can be reduced, and the area of the shift register can be reduced. As a result, the area of the gate driver can be reduced.

According to another embodiment of the present invention, a display device includes a thin film transistor capable of preventing a leakage current. Accordingly, leakage of light emission due to a leakage current can be prevented, thereby improving the light emission efficiency of the display device.

In addition to the effects of the present invention as described above, other advantages and features of the present invention will be clearly understood from the description of the present invention by those skilled in the art.

Drawings

The above and other objects, features and other advantages of the present invention will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings, in which:

fig. 1 is a schematic view illustrating a display device according to an embodiment of the present invention;

FIG. 2 is a schematic diagram showing a shift register;

fig. 3 is a circuit diagram illustrating stages included in the shift register of fig. 2;

fig. 4 is a sectional view showing a thin film transistor substrate according to another embodiment of the present invention;

fig. 5 is a sectional view showing a thin film transistor substrate according to another embodiment of the present invention;

fig. 6 is a sectional view showing a thin film transistor substrate according to another embodiment of the present invention;

fig. 7 is a sectional view showing a thin film transistor substrate according to another embodiment of the present invention;

fig. 8 is a sectional view showing a thin film transistor substrate according to another embodiment of the present invention;

fig. 9A is a sectional view showing a thin film transistor substrate according to a comparative example;

fig. 9B is an energy band diagram showing a thin film transistor according to a comparative example;

fig. 9C is a graph showing a drain current according to a gate voltage in the thin film transistor according to the comparative example;

fig. 9D is a circuit diagram showing a stage according to a comparative example;

fig. 10 is a schematic diagram illustrating a principle of generation of dipole moment according to another embodiment of the present invention;

fig. 11A is a band diagram showing a thin film transistor according to another embodiment of the present invention;

fig. 11B is a band diagram showing a thin film transistor according to another embodiment of the present invention;

fig. 12 is a graph showing drain currents according to gate voltages in a thin film transistor according to a comparative example and a thin film transistor according to an embodiment of the present invention;

fig. 13 to 16 are circuit diagrams illustrating each pixel applied to a display device according to other embodiments of the present invention.

Detailed Description

Advantages and features of the present invention and methods of accomplishing the same will be set forth in the following embodiments which are described with reference to the accompanying drawings. This invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Furthermore, the invention is limited only by the scope of the claims.

The shapes, sizes, proportions, angles and numbers disclosed in the drawings for the purpose of describing embodiments of the invention are by way of example only, and are not intended to be limiting of the invention to the details shown. Like reference numerals refer to like elements throughout. In the following description, a detailed description of related known functions or configurations will be omitted when it is determined that the detailed description may unnecessarily obscure the present invention.

Where the description in this application uses "including", "having" and "including", additional components may also be present, unless "only" is used.

In explaining an element, although not explicitly stated, the element should be construed as including an error range.

In describing the positional relationship, for example, when the positional relationship is described as "on … …", "above … …", "below … …", "below … …", and "after … …", the case where there is no contact therebetween may be included unless "just" or "directly" is used. When a first element is referred to as being "on" a second element, it does not mean that the first element must be above the second element in the figures. The upper and lower parts of the object concerned may vary depending on the positioning of the object. Thus, a situation in which a first element is "on" a second element includes both a situation in which the first element is "below" the second element and a situation in which the first element is "above" the second element, whether in the figures or in actual configuration.

In describing temporal relationships, for example, when the temporal sequence is described as "after … …", "subsequently", "next", and "before … …", a discontinuous condition may be included unless "exactly" or "directly" is used.

It will be understood that, although the terms first, second, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of the present invention.

The terms "first horizontal axis direction", "second horizontal axis direction" and "vertical axis direction" should not be interpreted based only on a geometric relationship in which the respective directions are strictly perpendicular to each other, and may refer to a direction having a wider directivity within a range in which the member of the present invention can be functionally operated.

It is to be understood that the term "at least one" includes all combinations that relate to any one item. For example, "at least one of the first element, the second element, and the third element" may include all combinations of two or more elements selected from the first element, the second element, and the third element, and each of the first element, the second element, and the third element.

As can be well understood by those skilled in the art, the features of the embodiments of the present invention can be partially or integrally combined or combined with each other, and can be technically variously interoperated and driven with each other. Embodiments of the invention may be implemented independently of each other or jointly in an interdependent relationship.

In the drawings, the same or similar elements are denoted by the same reference numerals even though they are depicted in different drawings.

In the embodiment of the invention, the source electrode and the drain electrode are distinguished from each other for convenience of explanation. However, the source electrode and the drain electrode may be used interchangeably. Thus, the source electrode may be a drain electrode, and the drain electrode may be a source electrode. In addition, the source electrode in any one embodiment of the present invention may be a drain electrode in another embodiment of the present invention, and the drain electrode in any one embodiment of the present invention may be a source electrode in another embodiment of the present invention.

In one or more embodiments of the present invention, for convenience of explanation, the source region is separated from the source electrode region, and the drain region is separated from the drain electrode region. However, the embodiments of the present invention are not limited to this structure. For example, the source region may be a source electrode and the drain region may be a drain electrode. Further, the source region may be a drain electrode, and the drain region may be a source electrode.

Fig. 1 is a schematic view illustrating a display device 100 according to an embodiment of the present invention.

As shown in fig. 1, a display device 100 according to an embodiment of the present invention includes a display panel 110, a gate driver 120, a data driver 130, and a controller 140.

The display panel 110 includes gate lines GL and data lines DL, and pixels P arranged at crossing portions of the gate lines GL and the data lines DL.

The gate driver 120 includes a shift register 150. The shift register 150 sequentially supplies a scan pulse to the gate lines GL of the display panel 110.

The data driver 130 supplies a data voltage to the data lines DL of the display panel 110.

The controller 140 controls the gate driver 120 and the data driver 130.

The pixel P includes a display element and at least one thin film transistor for driving the display element. An image is displayed on the display panel 110 by driving the pixels P.

The controller 140 outputs a gate control signal GCS for controlling the gate driver 120 and a data control signal DCS for controlling the data driver 130 by using vertical/horizontal synchronization signals (V, H) and a clock signal (CLK) supplied from an external system (not shown).

The gate control signal GCS includes a Gate Start Pulse (GSP), a Gate Shift Clock (GSC), a gate output enable signal (GOE), a start signal (Vst), and a Gate Clock (GCLK). In addition, various control signals for controlling the shift register 150 may be included in the gate control signal GCS.

The data control signal DCS includes a Source Start Pulse (SSP), a source shift clock signal (SSC), a source output enable Signal (SOE), and a polarity control signal (POL).

The controller 140 samples input video data supplied from an external system, then rearranges the sampled video data and supplies the rearranged digital video data RGB to the data driver 130. In addition, the controller 140 generates a gate control signal GCS for controlling the gate driver 120 and a data control signal DCS for controlling the data driver 130 by using a clock signal (CLK), a horizontal synchronization signal (Hsync), a vertical synchronization signal (Vsync) (these signals are simply referred to as "timing signals") and a data enable signal (DE) supplied from an external system, and then transfers the gate control signal GCS and the data control signal DCS to the gate driver 120 and the data driver 130, respectively.

The data driver 130 converts the video data RGB supplied from the controller 140 into analog data voltages, and supplies the analog data voltages of 1 horizontal line to the data lines DL every one horizontal period in which the gate pulses are supplied to the gate lines GL.

According to an embodiment of the present invention, the gate driver 120 is disposed in the display panel 110. A structure in which the gate driver 120 is directly disposed in the display panel 110 is referred to as a gate-in-panel (GIP) structure. In this case, the gate control signal GCS for controlling the gate driver 120 may include a start signal (Vst) and a Gate Clock (GCLK).

The gate driver 120 sequentially supplies a Gate Pulse (GP) to the gate lines GL of the display panel 110 in response to the gate control signal GCS supplied from the controller 140. Accordingly, the thin film transistor formed in each pixel P of the corresponding gate line GL to which the Gate Pulse (GP) is supplied is turned on, so that an image can be supplied to each pixel P.

The gate driver 120 includes a shift register 150, wherein the shift register 150 generates and supplies a Gate Pulse (GP).

In detail, the shift register 150 sequentially supplies the Gate Pulse (GP) to the gate line GL during 1 frame by using the start signal (Vst) and the Gate Clock (GCLK) transmitted from the controller 140. Here, "1 frame" indicates a period in which one image is output through the display panel 110.

The Gate Pulse (GP) has an on voltage capable of turning on a switching element (thin film transistor) formed in the pixel P.

Further, the shift register 150 supplies a gate-off signal capable of turning off the switching element to the gate line GL in the remaining period of 1 frame in which the Gate Pulse (GP) is not supplied. Hereinafter, the Gate Pulse (GP) and the gate off signal (Goff) are collectively referred to as a Scan Signal (SS).

Fig. 2 is a schematic diagram showing the shift register 150. Fig. 3 is a circuit diagram illustrating a stage 151 included in the shift register 150 of fig. 2.

The shift register 150 according to one embodiment of the present invention includes "g" stages 151(ST1 to STg), as shown in fig. 2.

The shift register 150 transmits a scan signal SS to the pixel P connected to one gate line GL through one gate line GL. Each stage 151 is connected to one gate line GL.

Thus, when "g" gate lines GL are provided in the display panel 110, the shift register 150 includes "g" stages (ST1 to STg)151 and generates "g" Scan Signals (SS)₁To SS_g)。

According to one embodiment of the present invention, the thin film transistor of the stage 151 is formed of an oxide semiconductor. In general, a thin film transistor of an oxide semiconductor is an N-type transistor. Thus, for convenience of explanation, an embodiment of the present invention in which the transistors included in the stages are formed of N-type transistors will be described.

In general, each stage 151 outputs a Gate Pulse (GP) once during 1 frame, and the Gate Pulse (GP) is sequentially output from each stage 151.

As shown in fig. 3, each stage 151 sequentially outputting the scan signal SS includes a pull-up transistor Tu, a pull-down transistor Td, a start transistor Tst, a reset transistor Trs, and an inverter I.

The pull-up transistor Tu is turned on or off according to the logic state of the Q node. When the pull-up transistor Tu is turned on, the clock signal CLK is supplied to the pull-up transistor Tu and the pull-up transistor Tu outputs the Gate Pulse (GP).

The pull-down transistor Td is connected between the pull-up transistor Tu and the off-voltage VSS 1. When the pull-up transistor Tu is turned on, the pull-down transistor Td is turned off. When the pull-up transistor Tu is turned off, the pull-down transistor Td is turned on, thereby outputting a gate off signal (Goff).

The output signal Vout of the stage 151 includes a Gate Pulse (GP) and a gate off signal (Goff). The Gate Pulse (GP) has a high level voltage, and the gate off signal (Goff) has a low level voltage.

The start transistor Tst charges the Q node to the high level voltage VD in response to the previous output PRE from the previous stage. When the corresponding stage 151 is the first stage ST1, the start pulse (Vst) may be provided thereto instead of the previous output (PRE).

The reset transistor Trs discharges a low potential voltage VSS corresponding to a reset voltage into a Q node in response to a following output NXT of a following stage. When the corresponding stage 151 is the last stage STg, it may be provided with a reset pulse (Rest) instead of the next output NXT.

In general, when the Q-node is in a high state, the control signal supplied to the gate terminal of the reset transistor Trs maintains a low state.

When a high level signal is supplied to the Q node, the pull-up transistor Tu is turned on, so that the pull-up transistor Tu outputs the Gate Pulse (GP). In this case, when the reset transistor Trs is turned off, the low potential voltage VSS is not supplied to the reset transistor Trs.

When the Gate Pulse (GP) is output, a control signal of a high level is supplied to the gate terminal of the reset transistor Trs, whereby the reset transistor Trs is turned on and the pull-up transistor Tu is turned off. As a result, the Gate Pulse (GP) is not output through the pull-up transistor Tu.

When the Gate Pulse (GP) is not generated, the inverter I transfers a Qb node control signal for generating a gate off signal (Goff) through the Qb node pull-down transistor Td.

In detail, the data voltage is output to the data line DL every one horizontal period by the Gate Pulse (GP) capable of turning on the switching element of each pixel P connected to the gate line GL, and the gate-off signal (Goff) for maintaining the off-state of the switching element is supplied to the gate line GL for the remaining period except for 1 horizontal period in 1 frame.

For this reason, the inverter I transfers the Qb node control signal through the Qb node pull-down transistor Td in the remaining period except for 1 horizontal period in 1 frame.

The pull-down transistor Td is turned on by the Qb node control signal supplied from the inverter I, whereby a gate off signal (Goff) is output to the gate line GL.

When a leakage current is generated in the transistors (Tst, Trs, Tu, Td) included in the stage 151, the Gate Pulse (GP) is not properly generated, which may cause a reduction in reliability of the display device 100.

For example, when the Q-node control signal for outputting the Gate Pulse (GP) is transmitted to the pull-up transistor Tu, the reset transistor Trs prevents the Q-node control signal from leaking to the outside. If a leakage current is generated in the reset transistor Trs, the Q node control signal may leak when the Q node control signal is supplied to the pull-up transistor Tu.

When the shift register 150 is formed of only N-type transistors, the voltage of some nodes is not lower than the discharging voltage VSS. Thus, even if the transistor is logically turned off, the gate-source voltage is greater than 0, whereby a leakage current flows through the transistor. In particular, when the threshold voltage of the transistor is a negative value, the leakage current becomes serious, thereby possibly causing an abnormal operation of the circuit.

In order to prevent a leakage current in the transistors, the shift register 150 of the gate driver 120 according to an embodiment of the present invention uses thin film transistors capable of preventing a leakage current.

In detail, the display device 100 according to one embodiment of the present invention includes a substrate, a shift register 150 on the substrate, and a pixel P connected to the shift register 150. The shift register 150 includes a stage 151 connected to the pixel P through a gate line GL, and the stage 151 includes at least one Thin Film Transistor (TFT). A Thin Film Transistor (TFT) includes a first buffer layer 231 on a substrate, a second buffer layer 232 on the first buffer layer 231, a semiconductor layer 240 on the second buffer layer 232, and a gate electrode 260 spaced apart from the semiconductor layer 240, at least a portion of the gate electrode 260 overlapping the semiconductor layer 240 (see fig. 4). The surface oxygen concentration (surface oxygen concentration) in the first buffer layer 231 is higher than that in the second buffer layer 232.

According to an embodiment of the present invention, a dipole moment (dipole moment) is formed between the first and second buffer layers 231 and 232. The first buffer layer 231 includes an ionic bond including a metal, and the second buffer layer 232 includes a covalent bond. The semiconductor layer 240 includes an oxide semiconductor material.

Further, a Thin Film Transistor (TFT) includes a first gate insulating film 251 on the semiconductor layer 240 and a second gate insulating film 252 on the first gate insulating film 251 (see fig. 7). The surface oxygen concentration in the second gate insulating film 252 is higher than the surface oxygen concentration in the first gate insulating film 251. A dipole moment is formed between the first gate insulating film 251 and the second gate insulating film 252.

Hereinafter, a Thin Film Transistor (TFT) capable of preventing a leakage current and a thin film transistor substrate including such a Thin Film Transistor (TFT) will be described in detail with reference to the accompanying drawings.

Fig. 4 is a cross-sectional view illustrating a thin film transistor substrate 200 according to another embodiment of the present invention. The thin film transistor substrate 200 includes a thin film transistor TFT 1. The thin film transistor TFT1 of fig. 4 may be formed of a Thin Film Transistor (TFT) of the shift register 150 provided in the display device 100 according to an embodiment of the present invention.

The thin film transistor substrate 200 according to another embodiment of the present invention includes a substrate 210, a first buffer layer 231 on the substrate 210, a second buffer layer 232 on the first buffer layer 231, a semiconductor layer 240 on the second buffer layer 232, and a gate electrode 260 spaced apart from the semiconductor layer 240, at least a portion of the gate electrode 260 overlapping the semiconductor layer 240. The surface oxygen concentration in the first buffer layer 231 is higher than that in the second buffer layer 232.

The first buffer layer 231 and the second buffer layer 232 are collectively referred to as a buffer layer 230. Further, referring to fig. 4, the thin film transistor substrate 200 includes a gate insulating film 250 between the semiconductor layer 240 and the gate electrode 260.

According to another embodiment of the present invention, the remaining portion of the thin film transistor substrate 200 other than the substrate 210 may be referred to as a thin film transistor TFT 1. Thus, according to another embodiment of the present invention, the thin film transistor TFT1 includes a buffer layer 230, a semiconductor layer 240, and a gate electrode 260. In addition, the thin film transistor TFT1 may further include a gate insulating film 250, a source electrode 280, and a drain electrode 290 (see fig. 5).

Hereinafter, a detailed structure of each element of the thin film transistor substrate 200 will be described as follows.

The substrate 210 may be formed of glass or plastic. The substrate 210 may be formed of plastic having flexibility, for example, Polyimide (PI). When the substrate 210 of Polyimide (PI) is used, a high temperature deposition process may be performed on the substrate 210. For this reason, the substrate 210 is formed of heat-resistant polyimide capable of enduring high temperature.

The light-shielding layer 220 may be disposed on the substrate 210. The light-shielding layer 220 overlaps the semiconductor layer 240. The light-shielding layer 220 blocks light incident on the semiconductor layer 240, thereby protecting the semiconductor layer 240.

The buffer layer 230 is disposed on the substrate 210. The buffer layer 230 may be disposed on the light-shielding layer 220 of the substrate 210. The buffer layer 230 protects the semiconductor layer 240 and planarizes the upper surface of the substrate 210 by planarization characteristics.

The buffer layer 230 includes a first buffer layer 231 on the substrate 210 and a second buffer layer 232 on the first buffer layer 231. According to another embodiment of the present invention, the surface oxygen concentration in the first buffer layer 231 is higher than that in the second buffer layer 232. In detail, in the interface between the first buffer layer 231 and the second buffer layer 232, the surface oxygen concentration of the first buffer layer 231 is higher than that of the second buffer layer 232.

Due to the difference in the surface oxygen concentration, oxygen transfer (oxygen ions) occurs between the first buffer layer 231 and the second buffer layer 232. In detail, the first buffer layer 231 having a higher oxygen concentrationOxygen (O) contained in^2-) May be transferred to the second buffer layer 232 having a lower oxygen concentration. As a result, a positive (+) polarity may be generated in the surface of the first buffer layer 231, and a negative (-) polarity may be generated in the surface of the second buffer layer 232. Thus, a dipole moment may be formed between the first and second buffer layers 231 and 232

(see FIG. 10).

According to another embodiment of the invention, the dipole moment

May be formed in a direction away from the semiconductor layer 240.

Due to dipole moment

The fermi level Ef of the semiconductor layer 240 may vary.

In more detail, the semiconductor layer 240 of the oxide semiconductor material generally has a fermi level Ef close to the conduction band CB (see fig. 9B). As a result, the thin film transistor TFT0 including the semiconductor layer 240 of the oxide semiconductor material has a negative (-) threshold voltage. Thus, even if the thin film transistor TFT0 is turned off, a leakage current may be generated (see fig. 9C).

Meanwhile, according to another embodiment of the present invention, when a dipole moment is formed between the first buffer layer 231 and the second buffer layer 232

At this time, the fermi level Ef of the semiconductor layer 240 formed of the oxide semiconductor material shifts to the valence band VB, and the threshold voltage of the thin film transistor TFT1 shifts to the positive direction (see fig. 12). As a result, a leak current in the thin film transistor TFT1 can be prevented.

According to another embodiment of the present invention, the first buffer layer 231 includes an ionic bond including a metal, and the second buffer layer 232 includes a covalent bond. The surface oxygen concentration in the first buffer layer 231 having an ionic bond may be higher than that of the second buffer layer 232 having a covalent bondSurface oxygen concentration of (2). Accordingly, oxygen (O) in the interface between the first and second buffer layers 231 and 232 is generated^2-) The positive (+) polarity is generated in the surface of the first buffer layer 231 and the negative (-) polarity is generated in the surface of the second buffer layer 232, thereby a dipole moment may be formed between the first buffer layer 231 and the second buffer layer 232

。

According to another embodiment of the present invention, the first buffer layer 231 may include aluminum oxide (Al)₂O₃) Titanium oxide (TiO)₂) Oxide-doped oxide (HfO)₂) Tantalum oxide (Ta)₂O₅) Zirconium oxide (ZrO)₂) Magnesium oxide (MgO) and scandium oxide (Sc)₂O₃) The second buffer layer 232 may include silicon oxide (SiO)₂)。

According to another embodiment of the present invention, the first buffer layer 231 may include silicon oxide (SiO)₂) The second buffer layer 232 may include strontium oxide (SrO), lanthanum oxide (La)₂O) and yttrium oxide (Y)₂O₃) At least one of them.

The semiconductor layer 240 is disposed on the buffer layer 230. Referring to fig. 4, a semiconductor layer 240 is disposed on the second buffer layer 232.

According to another embodiment of the present invention, the semiconductor layer 240 includes an oxide semiconductor material. For example, the semiconductor layer 240 may include at least one of an izo (inzno) -based oxide semiconductor, an igo (ingao) -based oxide semiconductor, an ito (insno) -based oxide semiconductor, an igzo (ingazno) -based oxide semiconductor, an igzto (ingaznsno) -based oxide semiconductor, a gzto (gaznsno) -based oxide semiconductor, a gzo (gazno) -based oxide semiconductor, and an itzo (insnzno) -based oxide semiconductor. However, one embodiment of the present invention is not limited to the above materials. The semiconductor layer 240 may be formed of other oxide semiconductor materials known to those skilled in the art.

The semiconductor layer 240 has a channel portion 241 and conductive portions 242 and 243. Either one of the conductive portions 242 and 243 corresponds to the source region 242, and the other corresponds to the drain region 243. According to another embodiment of the present invention, the source region 242 serves as a source electrode and the drain region 243 serves as a drain electrode. Thus, the source region 242 may be referred to as a source electrode and the drain region 243 may be referred to as a drain electrode. However, another embodiment of the present invention is not limited to the above. The thin film transistor substrate 200 may further include an additional source electrode 280 connected to the source region 242 and an additional drain electrode 290 connected to the drain region 243 (see fig. 5).

Referring to fig. 4, a gate insulating film 250 is disposed on the semiconductor layer 240. The gate insulating film 250 may include at least one of silicon oxide, silicon nitride, and metal oxide. The gate insulating film 250 may be formed in a single layer structure or a multi-layer structure. The gate insulating film 250 protects the semiconductor layer 240.

The gate electrode 260 is disposed on the gate insulating film 250. The gate electrode 260 overlaps at least the channel portion 241 of the semiconductor layer 240.

The gate electrode 260 may include at least one of an aluminum-based metal such as aluminum (Al) or an aluminum alloy, a silver-based metal such as silver (Ag) or a silver alloy, a copper-based metal such as copper (Cu) or a copper alloy, a molybdenum-based metal such as molybdenum (Mo) or a molybdenum alloy, chromium (Cr), tantalum (Ta), neodymium (Nd), and titanium (Ti). The gate electrode 260 may be formed as a multi-layered structure including at least two conductive films having different physical properties.

An interlayer insulating layer 270 is disposed on the gate electrode 260. The interlayer insulating layer 270 is formed of an insulating material. The interlayer insulating layer 270 may be formed of an organic material, an inorganic material, or a deposited structure including both the organic material and the inorganic material.

Fig. 5 is a sectional view illustrating a thin film transistor substrate 300 according to another embodiment of the present invention. Hereinafter, detailed descriptions of the same parts will be omitted in order to avoid unnecessary repetition.

In comparison with the thin film transistor substrate 200 of fig. 4, the thin film transistor substrate 300 of fig. 5 further includes a source electrode 280 and a drain electrode 290 on the interlayer insulating layer 270.

Referring to fig. 5, the source electrode 280 and the drain electrode 290 are connected to the source region 242 and the drain region 243 of the semiconductor layer 240, respectively, through contact holes provided in the interlayer insulating layer 270. The source electrode 280 is connected to the channel portion 241 of the semiconductor layer 240 through the source region 242, and the drain electrode 290 is connected to the channel portion 241 of the semiconductor layer 240 through the drain region 243.

The source electrode 280 and the drain electrode 290 may include at least one of: molybdenum (Mo), aluminum (Al), chromium (Cr), gold (Au), titanium (Ti), nickel (Ni), neodymium (Nd), copper (Cu), and alloys thereof. Each of the source electrode 280 and the drain electrode 290 may be formed in a single layer structure of any one material selected from among the above-described molybdenum (Mo), aluminum (Al), chromium (Cr), gold (Au), titanium (Ti), nickel (Ni), neodymium (Nd), copper (Cu), and alloys thereof, or may be formed in a multi-layer structure of two or more materials selected from among the above-described molybdenum (Mo), aluminum (Al), chromium (Cr), gold (Au), titanium (Ti), nickel (Ni), neodymium (Nd), copper (Cu), and alloys thereof.

The thin film transistor TFT2 provided in the thin film transistor substrate 300 of fig. 5 may be formed of a Thin Film Transistor (TFT) of the shift register 150 provided in the display device 100 according to an embodiment of the present invention.

Fig. 6 is a sectional view illustrating a thin film transistor substrate 400 according to another embodiment of the present invention.

The thin film transistor substrate 400 of fig. 6 has the semiconductor layer 240 formed in a multi-layer structure, compared to the thin film transistor substrate 200 of fig. 4. In detail, the semiconductor layer 240 of the thin film transistor substrate 400 shown in fig. 6 includes a first semiconductor layer 240a on the buffer layer 210 and a second semiconductor layer 240b on the first semiconductor layer 240 a. The first and second semiconductor layers 240a and 240b may include the same semiconductor material, or may include different semiconductor materials.

The first semiconductor layer 240a supports the second semiconductor layer 240 b. Thus, the first semiconductor layer 240a is referred to as a support layer. A channel portion 241 is formed on the second semiconductor layer 240 b. Thus, the second semiconductor layer 240b is referred to as a channel layer. However, the embodiments of the present invention are not limited to the above. The channel portion 241 may be formed in the first semiconductor layer 240 a.

The first and second semiconductor layers 240a and 240b may be formed through a deposition process. The first semiconductor layer 240a and the second semiconductor layer 240b may be formed through a continuous process. The semiconductor layer 240 may be formed in a double-layer structure including a first semiconductor layer 240a and a second semiconductor layer 240 b.

The thin film transistor TFT3 provided in the thin film transistor substrate 400 of fig. 6 may be formed of a Thin Film Transistor (TFT) of the shift register 150 provided in the display device 100 according to an embodiment of the present invention.

Fig. 7 is a cross-sectional view illustrating a thin film transistor substrate 500 according to another embodiment of the present invention.

In comparison with the thin film transistor substrate 200 of fig. 4, the thin film transistor substrate 500 of fig. 7 includes a gate insulating film 250 formed in a multi-layer structure.

In detail, the thin film transistor substrate 500 of fig. 7 includes a first gate insulating film 251 on the semiconductor layer 240 and a second gate insulating film 252 on the first gate insulating film 251. In the interface between the first gate insulating film 251 and the second gate insulating film 252, the surface oxygen concentration in the second gate insulating film 252 is higher than the surface oxygen concentration in the first gate insulating film 251.

Oxygen (O) due to the difference in surface oxygen concentration^2-) Transfer from the second gate insulating film 252 having a higher oxygen concentration to the first gate insulating film 251 having a lower oxygen concentration, whereby a positive (+) polarity can be generated in the surface of the second gate insulating film 252 and a negative (-) polarity can be generated in the surface of the first gate insulating film 251. Thus, a dipole moment may be formed between the first gate insulating film 251 and the second gate insulating film 252(see FIG. 10). Dipole moment

May be formed in a direction away from the semiconductor layer 240.

As a dipole moment is formed between the first gate insulating film 251 and the second gate insulating film 252

The fermi level Ef in the semiconductor layer 240 of the oxide semiconductor material shifts to the valence band VB, and the threshold voltage of the thin film transistor TFT4 shifts to the positive direction (see fig. 12). As a result, a leak current in the thin film transistor TFT4 can be prevented.

The first gate insulating film 251 includes covalent bonds, and the second gate insulating film 252 includes ionic bonds including a metal. The surface oxygen concentration in the second gate insulating film 252 having an ionic bond may be higher than the surface oxygen concentration in the first gate insulating film 251 having a covalent bond. Accordingly, a dipole moment may be formed between the first gate insulating film 251 and the second gate insulating film 252。

According to another embodiment of the present invention, the first gate insulating film 251 may include silicon oxide (SiO)₂) The second gate insulating film 252 may include aluminum oxide (Al)₂O₃) Titanium oxide (TiO)₂) Oxide-doped oxide (HfO)₂) Tantalum oxide (Ta)₂O₅) Zirconium oxide (ZrO)₂) Magnesium oxide (MgO) and scandium oxide (Sc)₂O₃) At least one of them.

In another mode, the first gate insulating film 251 may include strontium oxide (SrO), lanthanum oxide (La)₂O) and yttrium oxide (Y)₂O₃) The second gate insulating film 252 may include silicon oxide (SiO)₂)。

The thin film transistor TFT4 provided in the thin film transistor substrate 500 of fig. 7 may be formed of a Thin Film Transistor (TFT) of the shift register 150 provided in the display device 100 according to an embodiment of the present invention.

Fig. 8 is a cross-sectional view illustrating a thin film transistor substrate 600 according to another embodiment of the present invention.

The thin film transistor substrate 600 of fig. 8 includes a semiconductor layer 240 on a substrate 210, a first gate insulating film 251 on the semiconductor layer 240, a second gate insulating film 252 on the first gate insulating film 251, and a gate electrode 260 on the second gate insulating film 252. Referring to fig. 8, the buffer layer 230 may be disposed between the substrate 210 and the semiconductor layer 240, and the light-shielding layer 220 may be disposed between the substrate 210 and the buffer layer 230.

The semiconductor layer 240 may include an oxide semiconductor material. Further, in the interface between the first gate insulating film 251 and the second gate insulating film 252, the surface oxygen concentration in the second gate insulating film 252 is higher than the surface oxygen concentration in the first gate insulating film 251.

Oxygen (O) due to the difference in surface oxygen concentration^2-) Transfer from the second gate insulating film 252 having a higher oxygen concentration to the first gate insulating film 251 having a lower oxygen concentration, whereby a positive (+) polarity can be generated in the surface of the second gate insulating film 252 and a negative (-) polarity can be generated in the surface of the first gate insulating film 251. Thus, a dipole moment may be formed between the first gate insulating film 251 and the second gate insulating film 252

(see FIG. 10). Dipole moment

May be formed in a direction away from the semiconductor layer 240.

As a dipole moment is formed between the first gate insulating film 251 and the second gate insulating film 252

The fermi level Ef in the semiconductor layer 240 of the oxide semiconductor material shifts to the valence band VB, and the threshold voltage of the thin film transistor TFT5 shifts to the positive direction (see fig. 12). As a result, a leak current in the thin film transistor TFT5 can be prevented.

The thin film transistor TFT5 provided in the thin film transistor substrate 600 of fig. 8 may be formed of a Thin Film Transistor (TFT) of the shift register 150 provided in the display device 100 according to an embodiment of the present invention.

As can be seen from this, the thin film transistor substrate according to the present invention may include two layers having different surface oxygen concentrations sequentially stacked on at least one side of the upper and lower sides of the semiconductor layer, and among the layers located on the same side of the semiconductor layer, a layer farther from the semiconductor layer may have a higher surface oxygen concentration than a layer closer to the semiconductor layer.

Fig. 9A is a sectional view showing a thin film transistor substrate 701 according to a comparative example, and fig. 9B is an energy band diagram of the thin film transistor substrate 701 according to the comparative example. As shown in fig. 9A, the thin film transistor substrate 701 according to the comparative example has a single layer of the buffer layer 230 and a single layer of the gate insulating film 250. In the case of the thin film transistor substrate 701 shown in fig. 9A, the semiconductor layer 240 is formed of an oxide semiconductor material, and a dipole moment is not formed between the gate insulating film 250 adjacent to the semiconductor layer 240 and the buffer layer 230

。

Referring to fig. 9B, the semiconductor layer 240 of the thin film transistor substrate 701 according to the comparative example is formed of an oxide semiconductor material, and thus has a fermi level Ef close to a conduction band CB. The thin film transistor TFT0 of the thin film transistor substrate 701 including the semiconductor layer 240 having the fermi level Ef close to the conduction band CB according to the comparative example has a negative (-) threshold voltage.

Fig. 9C is a graph showing a drain current according to a gate voltage in the thin film transistor according to the comparative example. Referring to fig. 9C, the thin film transistor TFT0 of the thin film transistor substrate 701 according to the comparative example has a negative (-) threshold voltage. Even if the thin film transistor TFT0 is turned off, a leakage current may be generated.

When the thin film transistor TFT0 having a leakage current is used for the thin film transistor of the shift register 150, an additional transistor for preventing the leakage current has to be provided.

Fig. 9D is a circuit diagram showing the stage 152 provided in the shift register using the thin film transistor TFT0 according to the comparative example.

Compared to the stage 151 of fig. 3, the stage 152 of fig. 9D further includes four transistors (T1, T2, T3, T4).

A T1 transistor is disposed between the start transistor Tst and the Q node, a T2 transistor is disposed between the transistor Tst and the third voltage V3, a T3 transistor is disposed between the reset transistor Trs and the low potential voltage VSS, and a T4 transistor is disposed between the reset transistor Trs and the fourth voltage V4.

When the thin film transistor TFT0 having a leakage current is used for the thin film transistors included in the stage 152 of the shift register 150, transistors (T1, T2, T3, T4) configured to prevent the leakage current have to be additionally provided. In this case, the circuitry of the stage 152 becomes complicated, and the area of the stage 152 increases. As a result, the structures of the shift register 150 and the gate driver 120 are complicated, and the areas of the shift register 150 and the gate driver 120 are increased.

Meanwhile, when the thin film transistors (TFT1, TFT2, TFT3, TFT4) according to the embodiment of the present invention are used for the thin film transistors included in the stage 151 of the shift register 150, it is not necessary to provide additional transistors (T1, T2, T3, T4) configured to prevent a leakage current. Thus, the circuitry of the stage 151 is simplified, and the area of the stage 151 is reduced. As a result, the structures of the shift register 150 and the gate driver 120 may be simplified, and the shift register 150 and the gate driver 120 may be formed on a smaller area of the substrate 100.

Fig. 10 is a schematic view illustrating a principle of generation of dipole moment in a thin film transistor substrate 200 according to another embodiment of the present invention;

as described above, in the interface between the first buffer layer 231 and the second buffer layer 232, the surface oxygen concentration of the first buffer layer 231 is higher than that of the second buffer layer 232. Due to the difference in the surface oxygen concentration, oxygen transfer (including oxygen ions) occurs in the interface between the first buffer layer 231 and the second buffer layer 232. In detail, oxygen (O) contained in the first buffer layer 231 having a higher oxygen concentration^2-) May be transferred to the second buffer layer 232 having a lower oxygen concentration. As a result, a positive (+) polarity may be generated in the surface of the first buffer layer 231, and a negative (-) polarity may be generated in the surface of the second buffer layer 232. Thus, a dipole moment may be formed between the first and second buffer layers 231 and 232

。

As shown in fig. 7 and 8, even though the second gate is insulatedThe surface oxygen concentration of the insulating film 252 is higher than that of the first gate insulating film 251, and a dipole moment may be formed between the first gate insulating film 251 and the second gate insulating film 252

。

Due to dipole moment

The fermi level Ef of the semiconductor layer 240 may vary.

Fig. 11A is a band diagram illustrating a thin film transistor TFT1 according to another embodiment of the present invention. Fig. 11B is a band diagram illustrating a thin film transistor TFT5 according to another embodiment of the present invention. Fig. 12 is a graph showing the drain current Id according to the gate voltage Vg in the thin film transistor (TFT0, TFT1) according to the comparative example and one embodiment of the present invention.

Referring to fig. 11A, a dipole moment is formed between the first and second buffer layers 231 and 232

The fermi level Ef of the semiconductor layer 240 of the oxide semiconductor material is transferred to the valence band VB. As a result, as shown in fig. 12, the threshold voltage of the thin film transistor TFT1 shifts to the positive direction.

Thus, a leak current in the thin film transistor TFT1 can be prevented.

Fig. 11B shows the fermi level Ef of the semiconductor layer 240 when the surface oxygen concentration of the second gate insulating film 252 is higher than the surface oxygen concentration of the first gate insulating film 251 as shown in fig. 8.

Referring to fig. 11B, when a dipole moment is formed between the first gate insulating film 251 and the second gate insulating film 252

When this occurs, the fermi level Ef of the semiconductor layer 240 of the oxide semiconductor material is transferred to the valence band VB. As a result, the threshold voltage of the thin film transistor TFT5 shifts to the positive direction, so that leakage current in the thin film transistor TFT5 can be prevented.

The thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) according to the embodiments of the present invention can be applied to pixels of a display device.

Hereinafter, display devices 800, 900, 1000, and 1100 to which the thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) according to the embodiments of the present invention are applied will be described as follows.

Fig. 13 to 16 are circuit diagrams illustrating each pixel P applied to a display device according to other embodiments of the present invention.

The display devices 800, 900, 1000, and 1100 according to other embodiments of the present invention include a substrate 210 and a plurality of pixels P disposed on the substrate 210. The pixel P includes a pixel driver PDC on the substrate 210 and a display element connected to the pixel driver PDC. The pixel driver PDC includes at least one thin film transistor (TR1c, TR1, TR2, TR3, TR 4). The transistors (TR1c, TR1, TR2, TR3, TR4) may be formed of any one of thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) shown in fig. 4 to 8.

In detail, the thin film transistor (TR1c, TR1, TR2, TR3, TR4) of the pixel P includes a first buffer layer 231 on the substrate 210, a second buffer layer 232 on the first buffer layer 231, a semiconductor layer 240 on the second buffer layer 232, and a gate electrode 260 spaced apart from the semiconductor layer 240, at least a portion of the gate electrode 260 overlapping the semiconductor layer 240. In the interface between the first buffer layer 231 and the second buffer layer 232, the surface oxygen concentration of the first buffer layer 231 is higher than that of the second buffer layer 232. A dipole moment is formed between the first buffer layer 231 and the second buffer layer 232.

In addition, the thin film transistors (TR1c, TR1, TR2, TR3, TR4) of the pixel P may include a first gate insulating film 251 on the semiconductor layer 240 and a second gate insulating film 252 on the first gate insulating film 251. In the interface between the first gate insulating film 251 and the second gate insulating film 252, the surface oxygen concentration of the second gate insulating film 252 is higher than the surface oxygen concentration of the first gate insulating film 251. A dipole moment is formed between the first gate insulating film 251 and the second gate insulating film 252.

The thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) and their components including the first buffer layer 231, the second buffer layer 232, the semiconductor layer 240, the gate electrode 260, the first gate insulating film 251, and the second gate insulating film 252 are as described above, and thus detailed descriptions of the above-described thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) and their components will be omitted.

Fig. 13 is a circuit diagram illustrating a pixel P applied to a display device 800 according to another embodiment of the present invention. In detail, fig. 13 is an equivalent circuit diagram of a pixel of the liquid crystal display device.

Referring to fig. 13, the pixel P of the display device 800 includes a pixel driver PDC and a display element connected to the pixel driver PDC. The display device 800 of fig. 13 includes a liquid crystal capacitor Clc serving as a display element.

The pixel driver PDC includes a thin film transistor TR1c connected to the gate line GL and the data line DL, and a storage capacitor Cst connected between the thin film transistor TR1c and the common electrode. The liquid crystal capacitor Clc and the storage capacitor Cst are connected in parallel between the thin film transistor TR1c and the common electrode.

The liquid crystal capacitor Clc corresponding to the display element is charged with a differential voltage between a common voltage Vcom supplied to the common electrode and a data signal supplied to the pixel electrode through the thin film transistor TR1c, and controls light transmittance by driving the liquid crystal according to the charged voltage. The storage capacitor Cst stably maintains the voltage charged in the liquid crystal capacitor Clc.

Fig. 14 is a circuit diagram illustrating a pixel P applied to a display device 900 according to another embodiment of the present invention. In detail, fig. 14 is an equivalent circuit diagram of a pixel of the organic light emitting display device.

The pixel P of the display apparatus 900 shown in fig. 14 includes an organic light emitting diode OLED corresponding to a display element and a pixel driver PDC configured to drive the display element. The organic light emitting diode OLED corresponding to the display element is connected to the pixel driver PDC.

The pixel driver PDC includes a first thin film transistor TR1 corresponding to the switching transistor and a second thin film transistor TR2 corresponding to the driving transistor.

The first thin-film transistor TR1 is connected to the gate line GL and the data line DL, and the first thin-film transistor TR1 is turned on or off by a gate pulse GP supplied via the gate line GL.

When the first thin film transistor TR1 is turned on, the data voltage Vdata supplied through the data line DL is supplied to the gate electrode of the second thin film transistor TR2 connected to the organic light emitting diode OLED. The data voltage Vdata is charged into the storage capacitor Cst formed between the source electrode and the gate electrode of the second thin film transistor TR 2.

The amount of current supplied to the organic light emitting diode OLED through the second thin film transistor TR2 is controlled according to the data voltage Vdata, and thus the gray level of light emitted from the organic light emitting diode OLED can be controlled.

Fig. 15 is a circuit diagram illustrating a pixel P applied to a display device 1000 according to another embodiment of the present invention. In detail, fig. 15 is an equivalent circuit diagram of a pixel of the organic light emitting display device.

The pixel P of the display device 1000 shown in fig. 15 includes an organic light emitting diode OLED corresponding to a display element and a pixel driver PDC configured to drive the display element. The organic light emitting diode OLED corresponding to the display element is connected to the pixel driver PDC.

In the pixel P, there is a signal line (DL, GL, PLA, PLB, SL, SPL) configured to supply a drive signal to the pixel driver PDC.

The data voltage Vdata is supplied to the data line DL, the gate pulse GP is supplied to the gate line GL, the first driving power ELVDD is supplied to the power line PLA, the second driving power EVSS is supplied to the driving power line PLB, the reference voltage Vref is supplied to the sensing line SL, and the sensing pulse SP is supplied to the sensing pulse line SPL.

Referring to fig. 15, when the gate line of the (n) th pixel P is referred to as "GL_nWhen the gate line of the adjacent (n-1) th pixel P is called "GL_n-1", corresponding to" GL of the gate line of the (n-1) th pixel P_n-1"serves as the sensing pulse line SPL of the (n) th pixel P.

For example, as shown in fig. 15, the pixel driver PDC includes: a first thin film transistor TR1 (switching transistor) connected to the gate line GL and the data line DL; a second thin film transistor TR2 (driving transistor) configured to control a current level supplied to the organic light emitting diode OLED according to the data voltage Vdata transferred through the first thin film transistor TR 1; and a third thin film transistor TR3 (sense transistor) configured to sense a characteristic of the second thin film transistor TR 2.

The first capacitor C1 is located between the organic light emitting diode OLED and the gate electrode of the second thin film transistor TR 2. The first capacitor C1 is referred to as a storage capacitor Cst.

As the first thin-film transistor TR1 is turned on by the gate pulse GP supplied to the gate line GL, the first thin-film transistor TR1 transfers the data voltage Vdata supplied to the data line DL to the gate electrode of the second thin-film transistor TR 2.

The third thin film transistor TR3 is connected to the sensing line SL and the first node n1 between the organic light emitting diode OLED and the second thin film transistor TR 2. The third thin film transistor TR3 is turned on or off by the sensing pulse SP, and the third thin film transistor TR3 senses a characteristic of the second thin film transistor TR2 corresponding to the driving transistor in the sensing period.

The second node n2 connected to the gate electrode of the second thin film transistor TR2 is connected to the first thin film transistor TR 1. The first capacitor C1 is formed between the second node n2 and the first node n 1.

When the first thin film transistor TR1 is turned on, the data voltage Vdata supplied through the data line DL is supplied to the gate electrode of the second thin film transistor TR 2. The first capacitor C1 formed between the source electrode and the gate electrode of the second thin film transistor TR2 is charged with the data voltage Vdata.

When the second thin film transistor TR2 is turned on, a current is supplied from the first driving power source ELVDD to the organic light emitting diode OLED through the second thin film transistor TR2, thereby emitting light from the organic light emitting diode OLED.

Fig. 16 is a circuit diagram illustrating a pixel P applied to a display device 1100 according to another embodiment of the present invention. In detail, fig. 16 is an equivalent circuit diagram of the pixel P of the organic light emitting display device.

The pixel P of the display device 1100 shown in fig. 16 includes an organic light emitting diode OLED corresponding to a display element and a pixel driver PDC configured to drive the organic light emitting diode OLED. The organic light emitting diode OLED corresponding to the display element is connected to the pixel driver PDC.

The pixel driver PDC includes thin film transistors (TR1, TR2, TR3, TR 4). According to another embodiment of the present invention, the thin film transistors (TR1, TR2, TR3, TR4) may be formed of any one of the thin film transistors (TFT1, TFT2, TFT3, TFT4, TFT5) shown in fig. 4 to 8.

In the pixel P, there is a signal line (DL, EL, GL, PLA, PLB, SL, SPL) configured to supply a drive signal to the pixel driver PDC.

The pixel P of fig. 16 further includes a light emitting line EL, compared to the pixel P of fig. 15. The emission control signal EM is supplied to the emission line EL. In addition, the pixel driver PDC of fig. 16 further includes a fourth thin film transistor TR4 corresponding to the light emitting transistor configured to control a light emitting time point of the second thin film transistor TR2, as compared with the pixel driver PDC of fig. 15.

However, the embodiments of the present invention are not limited to the above-described structure. The pixel driver PDC may be formed in various structures known to those skilled in the art. For example, the pixel driver PDC may include five or more thin film transistors.

Referring to fig. 16, when the gate line of the (n) th pixel P is referred to as "GL_nWhen the gate line of the adjacent (n-1) th pixel P is called "GL_n-1", corresponding to" GL of the gate line of the (n-1) th pixel P_n-1"serves as the sensing pulse line SPL of the (n) th pixel P.

The first capacitor C1 is located between one electrode of the organic light emitting diode OLED and the gate electrode of the second thin film transistor TR 2. The first capacitor C1 is referred to as a storage capacitor Cst. In addition, the second capacitor C2 is positioned between one electrode of the organic light emitting diode OLED and the terminal of the fourth thin film transistor TR4 to which the first driving power ELVDD is supplied.

As the first thin-film transistor TR1 is turned on by the gate pulse GP supplied to the gate line GL, the first thin-film transistor TR1 transfers the data voltage Vdata supplied to the data line DL to the gate electrode of the second thin-film transistor TR 2.

The third thin film transistor TR3 is connected to the sensing line SL. The third thin film transistor TR3 is turned on or off by the sensing pulse SP, and the third thin film transistor TR3 senses a characteristic of the second thin film transistor TR2 corresponding to the driving transistor in the sensing period.

The fourth thin film transistor TR4 transfers the first driving power ELVDD to the second thin film transistor TR2 or blocks the first driving power ELVDD according to the emission control signal EM. When the fourth thin film transistor TR4 is turned on, a current is supplied to the second thin film transistor TR2, thereby emitting light from the organic light emitting diode OLED.

It will be apparent to those skilled in the art that the present invention described above is not limited to the above embodiments and the accompanying drawings, and that various substitutions, modifications and changes can be made in the present invention without departing from the spirit or scope of the invention. Therefore, the scope of the present invention is defined by the appended claims, and all variations or modifications derived from the meaning, scope and equivalent concept of the claims fall within the scope of the present invention.