阅读说明：本技术 阵列基板及其制备方法、显示装置 (Array substrate, preparation method thereof and display device ) 是由 肖军城 艾飞 罗成志 于 2019-10-16 设计创作，主要内容包括：本发明公开了一种阵列基板及其制备方法、显示装置，阵列基板包括薄膜晶体管结构层；以及公共电极层设于薄膜晶体管结构层上；第一开孔设于公共电极层上；钝化层覆于公共电极层上且填充于第一开孔；像素电极层覆于钝化层上并穿过钝化层和第一开孔连接至薄膜晶体管结构层；开口从像素电极层延伸至公共电极层的表面；第一填充层覆于公共电极层、像素电极层上并填充于开口；所述钝化层的光的透过率小于所述第一填充层的光的透过率。本发明的阵列基板及其制备方法、显示装置，提高了阵列基板整体透过率。(The invention discloses an array substrate, a preparation method thereof and a display device, wherein the array substrate comprises a thin film transistor structure layer; the common electrode layer is arranged on the thin film transistor structure layer; the first opening is arranged on the common electrode layer; the passivation layer covers the common electrode layer and is filled in the first opening; the pixel electrode layer is covered on the passivation layer and connected to the thin film transistor structure layer through the passivation layer and the first opening; the opening extends from the pixel electrode layer to the surface of the common electrode layer; the first filling layer covers the public electrode layer and the pixel electrode layer and is filled in the opening; the light transmittance of the passivation layer is less than that of the first filling layer. The array substrate, the preparation method thereof and the display device improve the overall transmittance of the array substrate.)

1. An array substrate, comprising

A thin film transistor structure layer; and

the common electrode layer is arranged on the thin film transistor structure layer;

the first opening is arranged on the common electrode layer;

the passivation layer covers the common electrode layer and is filled in the first opening;

the pixel electrode layer is covered on the passivation layer and connected to the thin film transistor structure layer through the passivation layer and the first opening;

an opening extending from the pixel electrode layer to a surface of the common electrode layer;

and the first filling layer covers the common electrode layer and the pixel electrode layer and is filled in the opening, and the transmittance of the light of the passivation layer is smaller than that of the light of the first filling layer.

2. The array substrate of claim 1, wherein the thin film transistor structure layer comprises

A substrate;

an active layer disposed on the substrate;

a gate insulating layer covering the substrate and the active layer;

a gate electrode layer disposed on the gate insulating layer;

an interlayer dielectric layer covering the gate insulating layer and covering the gate layer;

a second opening extending from the interlayer dielectric layer to the surface of the active layer;

the source electrode and the drain electrode are arranged on the interlayer dielectric layer and are respectively connected to the active layer through a second opening;

the planarization layer is arranged on the interlayer dielectric layer and covers the source electrode and the drain electrode;

the pixel electrode layer is connected to the drain electrode.

3. The array substrate of claim 2, wherein the source electrode and the drain electrode overlie the walls of the second opening;

the thin film transistor structure layer further comprises a filling layer which is filled in the second opening and covers the surfaces of the source electrode and the drain electrode; the material used by the filling layer is silicon oxide or silicon nitride material.

4. The array substrate of claim 2, wherein the thin film transistor structure layer further comprises a metal light shielding layer disposed on a surface of the substrate away from the active layer and corresponding to a region where the active layer is located.

5. The array substrate of claim 2, wherein the base is made of silicon oxide and/or silicon nitride; the interlayer dielectric layer is made of silicon oxide and/or silicon nitride; the pixel electrode layer and the common electrode layer are made of indium tin oxide materials.

6. The array substrate of claim 1, wherein the passivation layer is made of a silicon nitride material, and all materials of the first filling layer are silicon oxide materials.

7. A method for preparing the array substrate of claim 1, comprising the steps of:

preparing the thin film transistor structure layer;

forming the common electrode layer on the thin film transistor structure layer;

forming the first opening penetrating the common electrode layer;

forming the passivation layer in the first opening and on the surface of the common electrode layer;

forming a third opening penetrating through the passivation layer and the first opening and extending into the thin film transistor structure layer;

forming the pixel electrode layer in the third opening and on the passivation layer;

coating photoresist material on the pixel electrode layer to form a photoresist layer, and exposing and developing the photoresist layer to form a pixel electrode pattern;

according to the formed pixel electrode pattern, wet etching the pixel electrode layer to form a pixel electrode and a first gap between the pixel electrodes;

in the first gap, dry etching the passivation layer to form a second gap, wherein the first gap and the second gap form the opening;

removing the photoresist layer;

and depositing a filling material in the opening and the surfaces of the common electrode layer and the pixel electrode layer to form the first filling layer.

8. The method for preparing a thin film transistor structure layer according to claim 7, wherein the step of preparing the thin film transistor structure layer comprises

Providing a substrate;

forming an active layer on the substrate;

forming a gate insulating layer on the substrate and covering the active layer;

forming a gate electrode layer on the gate insulating layer;

forming an interlayer dielectric layer on the gate insulating layer and covering the gate layer;

forming a second opening extending from the interlayer dielectric layer to a surface of the active layer;

forming a source electrode and a drain electrode on the interlayer dielectric layer, the hole wall of the second opening and the active layer at the hole bottom of the second opening;

depositing a silicon oxide or silicon nitride material in the second opening to form a filling layer;

forming a planarization layer on the interlayer dielectric layer and covering the source electrode, the drain electrode and the filling layer; in the forming of the third opening, the third opening extends to a surface of the drain electrode.

9. The method as claimed in claim 7, wherein in the step of providing a substrate, a metal light shielding layer is disposed on a surface of the substrate away from the active layer and corresponding to a region of the active layer.

10. A display device comprising the array substrate according to any one of claims 1 to 6.

Technical Field

The invention relates to the technical field of display, in particular to an array substrate, a preparation method of the array substrate and a display device.

Background

In recent years, in TFT-LCDs, development of items for saving electric power, achieving high definition, and improving color reproducibility is being advanced. Among them, improving the penetration performance, increasing the brightness of TFT-LCD, and reducing the power consumption are the difficulties in all panel factories around the world. The transmittance of the TFT-LCD panel refers to the ratio of the light intensity before and after the backlight transmits through the TFT-LCD panel. In general, the transmittance of light of a TFT-LCD is only 3-10%, that is, light exceeding 90% cannot be utilized. For the array substrate (TFT) of TFT-LCD, besides the metal wiring, the multilayer film structure composed of silicon oxide, silicon nitride, indium tin oxide and the material used for the flat layer has a large influence on the penetration rate. The refractive index and extinction coefficient of each film can have an effect on the overall transmittance of the multilayer film. Therefore, the transmittance of the multilayer film can be improved by adjusting parameters such as the refractive index, extinction coefficient, film layer structure, and the like of each film.

The bottom buffer layer of the film structure of the array substrate commonly used in the art at present is composed of silicon nitride and silicon oxide, the inter-insulating layer is composed of silicon nitride and silicon oxide, and the passivation layer 13' (PV) is composed of silicon nitride. Generally, the refractive index of silicon nitride is greater than that of silicon oxide, and thus light is reflected when passing through the interface between silicon nitride and silicon oxide, resulting in a decrease in transmittance. In order to increase the transmittance, silicon nitride may be replaced with silicon oxide. As shown in fig. 1, for the silicon nitride of the passivation layer 13 ' (PV), a part of the silicon nitride is exposed in the opening 3 ' and is in contact with air, i.e., the silicon nitride at the opening 3 ' is in contact with air; a portion of the silicon nitride is in contact with the pixel electrode 14' made of indium tin oxide material on its top surface. If silicon nitride of the passivation layer 13 '(PV) is directly replaced with silicon oxide, the transmittance of silicon oxide at the contact with air is greatly improved due to a small difference in refractive index between silicon oxide and air, but the transmittance at the contact with the pixel electrode 14' is reduced due to a large difference in refractive index between silicon oxide and the pixel electrode. The final result is that the transmittance of the array substrate as a whole is not significantly improved.

Disclosure of Invention

In order to solve the technical problems: the invention provides an array substrate, a preparation method thereof and a display device, which aim to improve the light transmittance of the whole array substrate.

The technical scheme for solving the problems is as follows: the invention provides an array substrate, which comprises a thin film transistor structure layer; the common electrode layer is arranged on the thin film transistor structure layer; the first opening is arranged on the common electrode layer; the passivation layer covers the common electrode layer and is filled in the first opening; the pixel electrode layer is covered on the passivation layer and connected to the thin film transistor structure layer through the passivation layer and the first opening; an opening extending from the pixel electrode layer to a surface of the common electrode layer; the first filling layer covers the public electrode layer and the pixel electrode layer and is filled in the opening; the light transmittance of the passivation layer is less than that of the first filling layer.

In an embodiment of the present invention, the thin film transistor structure layer includes a substrate; an active layer disposed on the substrate; a gate insulating layer covering the substrate and the active layer; a gate electrode layer disposed on the gate insulating layer; an interlayer dielectric layer covering the gate insulating layer and covering the gate layer; a second opening extending from the interlayer dielectric layer to the surface of the active layer; the source electrode and the drain electrode are arranged on the interlayer dielectric layer and are respectively connected to the active layer through a second opening; the planarization layer is arranged on the interlayer dielectric layer and covers the source electrode and the drain electrode; the pixel electrode layer is connected to the drain electrode.

In an embodiment of the invention, the source and the drain cover the hole wall of the second opening; the thin film transistor structure layer further comprises a filling layer which is filled in the second opening and covers the surfaces of the source electrode and the drain electrode; the material used by the filling layer is silicon oxide or silicon nitride material.

The thin film transistor structure layer further comprises a metal shading layer which is arranged on one surface of the substrate, far away from the active layer, and corresponds to the area where the active layer is located.

In an embodiment of the present invention, the substrate is made of silicon oxide and/or silicon nitride; the interlayer dielectric layer is made of silicon oxide and/or silicon nitride; the pixel electrode layer and the common electrode layer are made of indium tin oxide materials.

In an embodiment of the invention, the passivation layer is made of a silicon nitride material, and all the materials of the first filling layer are silicon oxide materials

The invention also provides a preparation method for preparing the array substrate, which is characterized by comprising the following steps of: preparing the thin film transistor structure layer; forming the common electrode layer on the thin film transistor structure layer; forming the first opening penetrating the common electrode layer; forming the passivation layer in the first opening and on the surface of the common electrode layer; forming a third opening penetrating through the passivation layer and the first opening and extending into the thin film transistor structure layer; forming the pixel electrode layer in the third opening and on the passivation layer; coating photoresist material on the pixel electrode layer to form a photoresist layer, and exposing and developing the photoresist layer to form a pixel electrode pattern; according to the formed pixel electrode pattern, wet etching the pixel electrode layer to form a pixel electrode and a first gap between the pixel electrodes; in the first gap, dry etching the passivation layer to form a second gap, wherein the first gap and the second gap form the opening; removing the photoresist layer; and depositing a filling material in the opening and the surfaces of the common electrode layer and the pixel electrode layer to form the first filling layer.

In an embodiment of the present invention, the step of preparing the thin film transistor structure layer includes providing a substrate; forming an active layer on the substrate; forming a gate insulating layer on the substrate and covering the active layer; forming a gate electrode layer on the gate insulating layer; forming an interlayer dielectric layer on the gate insulating layer and covering the gate layer; forming a second opening extending from the interlayer dielectric layer to a surface of the active layer; forming a source electrode and a drain electrode on the interlayer dielectric layer, the hole wall of the second opening and the active layer at the hole bottom of the second opening; depositing a silicon oxide or silicon nitride material in the second opening to form a filling layer; forming a planarization layer on the interlayer dielectric layer and covering the source electrode, the drain electrode and the filling layer; in the forming of the third opening, the third opening extends to a surface of the drain electrode.

In an embodiment of the invention, in the step of providing a substrate, a metal light shielding layer is disposed on a surface of the substrate away from the active layer and corresponding to a region where the active layer is located.

The invention also provides a display device comprising the array substrate.

The invention has the beneficial effects that: according to the array substrate and the display device, silicon nitride in the passivation layer at the position in contact with air is replaced by silicon oxide, so that interface reflection is reduced, and the transmittance at the position in contact with air is improved; and the first filling layer is added on the upper part of the part which is in contact with the pixel electrode layer, so that the interface reflection between the pixel electrode layer and the air is reduced, and the light transmittance of the whole array substrate is greatly improved. The preparation method of the array substrate is simple and convenient to operate, and the purpose of improving the integral transmittance of the array substrate can be effectively achieved.

Drawings

The invention is further explained below with reference to the figures and examples.

Fig. 1 is a structural diagram of an array substrate in the prior art, which mainly shows a positional relationship among a passivation layer, an opening, and a pixel electrode, and a portion of the passivation layer is exposed in the opening and contacts with air, and a portion of the passivation layer is disposed below the pixel electrode and contacts with the pixel electrode.

Fig. 2 is a structural diagram of the array substrate after forming the second opening according to the embodiment of the invention.

Fig. 3 is a structural diagram of the array substrate after the planarization layer is formed according to the embodiment of the invention.

Fig. 4 is a structural diagram of the array substrate after the first opening is formed according to the embodiment of the invention.

Fig. 5 is a structural diagram of the array substrate after the third opening is formed according to the embodiment of the invention.

Fig. 6 is a structural view of an array substrate in which a pixel electrode pattern is formed by exposing and developing a photoresist layer according to an embodiment of the present invention.

Fig. 7 is a structural diagram of the array substrate after the first notch is formed according to the embodiment of the invention.

Fig. 8 is a structural diagram of the array substrate after forming the second notch, i.e., forming the opening, according to the embodiment of the invention.

Fig. 9 is a structural diagram of the array substrate after the first filling layer is formed according to the embodiment of the invention.

Fig. 10 is a structural diagram of a device in which a mask is used to mask an array substrate and a deposited silicon oxide material is in an opening and on a common electrode layer according to an embodiment of the present invention.

Fig. 11 is a graph of the thickness of the first filling layer and the transmittance thereof according to the embodiment of the invention, in which a is a graph of the transmittance of the array substrate at the contact position of the passivation layer and the air and the thickness of the first filling layer at the contact position, and B is a graph of the transmittance of the array substrate at the contact position of the passivation layer and the pixel electrode layer and the thickness of the first filling layer at the contact position.

Reference numerals:

1 an array substrate; 10 a display device;

11 thin film transistor structure layer; 12 a common electrode layer;

13. 13' a passivation layer; 14. 14' a pixel electrode layer;

15 a first filling layer; 110 a metallic light-shielding layer;

a 111 substrate; 112 an active layer;

113 a gate insulating layer; 114 a gate layer;

115 an interlayer dielectric layer; 116 a source electrode;

117 drain electrode; 118 a filler layer;

119 a planarization layer; 21 a first opening;

22 second opening; 23, third opening holes;

31 a first notch; 32 a second notch;

3. a 3' opening; 4, photoresist layer;

5, masking a film plate; 6 a glass substrate.

Detailed Description

The following description of the embodiments refers to the accompanying drawings for illustrating the specific embodiments in which the invention may be practiced. The directional terms used in the present invention, such as "up", "down", "front", "back", "left", "right", "top", "bottom", etc., refer to the directions of the attached drawings. Accordingly, the directional terms used are used for explanation and understanding of the present invention, and are not used for limiting the present invention.

As shown in fig. 9, in an embodiment, the array substrate 1 of the present invention includes a thin film transistor structure layer 11, a common electrode layer 12, a passivation layer 13, a pixel electrode layer 14, and a first filling layer 15.

As shown in fig. 2 to 3, the thin film transistor structure layer 11 includes a substrate 111, an active layer 112, a gate insulating layer 113, a gate layer 114, an interlayer dielectric layer 115, source and drain electrodes 116 and 117, a planarization layer 119, and a filling layer 118. Specifically, the active layer 112 is disposed on the substrate 111; the gate insulating layer 113 covers the substrate 111 and covers the active layer 112; the gate layer 114 is disposed on the gate insulating layer 113; the interlayer dielectric layer 115 covers the gate insulating layer 113 and covers the gate layer 114; the second opening 22 extends from the interlayer dielectric layer 115 to the surface of the active layer 112; the source electrode 116 and the drain electrode 117 are disposed on the interlayer dielectric layer 115 and are respectively connected to the active layer 112 through a second opening 22; the planarization layer 119 is disposed on the interlayer dielectric layer 115 and covers the source 116 and the drain 117.

The thin film transistor structure layer 11 further includes a metal light shielding layer 110, and the metal light shielding layer 110 is disposed on a surface of the substrate 111 away from the active layer 112 and corresponds to a region where the active layer 112 is located. The substrate 111 is made of silicon oxide and/or silicon nitride; the interlayer dielectric layer 115 is made of silicon oxide and/or silicon nitride.

As shown in fig. 4, the common electrode layer 12 is disposed on the thin film transistor structure layer 11, and the common electrode layer 12 has a first opening 21 therein, where the first opening 21 corresponds to the drain electrode 117. The common electrode layer 12 is made of indium tin oxide.

As shown in fig. 5, the passivation layer 13 covers the common electrode layer 12 and fills the first opening 21, and the material of the passivation layer 13 is silicon nitride.

As shown in fig. 6, the pixel electrode layer 14 overlies the passivation layer 13 and is connected to the drain electrode 117 of the thin film transistor structure layer 11 through the passivation layer 13 and the first opening 21. The pixel electrode layer 14 has an opening 3, and as shown in fig. 7 to 8, the opening 3 extends from the pixel electrode layer 14 to the surface of the common electrode layer 12. The pixel electrode layer 14 is made of indium tin oxide. The thickness of the pixel electrode layer 14 is 10nm to 100 nm.

As shown in fig. 9, the first filling layer 15 covers the common electrode layer 12 and the pixel electrode layer 14 and fills the opening 3, the first filling layer 15 is made of a silicon oxide material, and the transmittance of the passivation layer 13 is smaller than that of the first filling layer 15.

The invention also provides a preparation method for preparing the array substrate 1, which comprises the following steps.

Preparing the thin film transistor structure layer 11; specifically, as shown in fig. 2, in the step of preparing the thin film transistor structure layer 11, a substrate 111 is provided, and in the step of providing the substrate 111, a metal light shielding layer 110 is provided on a surface of the substrate 111 away from the active layer 112 and corresponding to a region where the active layer 112 is located; forming an active layer 112 on the substrate 111; forming a gate insulating layer 113 on the substrate 111 and covering the active layer 112; forming a gate electrode layer 114 on the gate insulating layer 113; forming an interlayer dielectric layer 115 on the gate insulating layer 113 and covering the gate layer 114; referring to fig. 3, forming a second opening 22 extending from the interlayer dielectric layer 115 to the surface of the active layer 112; forming a source 116 and a drain 117 on the interlayer dielectric layer 115 and on the hole wall of the second opening 22 and on the active layer 112 at the bottom of the second opening 22; referring to fig. 4, a silicon oxide or silicon nitride material is deposited in the second opening 22 to form a filling layer 118; a planarization layer 119 is formed on the interlayer dielectric layer 115 and covers the source 116, the drain 117 and the filling layer 118.

Referring to fig. 4, the common electrode layer 12 is formed on the thin film transistor structure layer 11. Specifically, an indium tin oxide material is deposited on the planarization layer 119 to form the common electrode layer 12.

Referring to fig. 4, the first opening 21 is formed through the common electrode layer 12.

Referring to fig. 5, silicon nitride is deposited in the first opening 21 and on the surface of the common electrode layer 12 to form the passivation layer 13.

Referring to fig. 5, a third opening 23 is formed through the passivation layer 13 and the first opening 21 and extends into the thin film transistor structure layer 11; in the step of forming the third opening 23, the third opening 23 extends to a surface of the drain electrode 117.

Referring to fig. 6, the pixel electrode layer 14 is formed in the third opening 23 and on the passivation layer 13.

Referring to fig. 6, a photoresist material is coated on the pixel electrode layer 14 to form a photoresist layer 4, and the photoresist layer 4 is exposed and developed to form a pixel electrode pattern.

Referring to fig. 7, according to the formed pixel electrode pattern, wet etching the pixel electrode layer 14 to form a pixel electrode and a first gap 31 between the pixel electrodes; referring to fig. 8, in the first gap 31, the passivation layer 13 is dry etched to form a second gap 32, and the first gap 31 and the second gap 32 form the opening 3.

Referring to fig. 9, the photoresist layer 4 is stripped off. Depositing silicon oxide material in the opening 3 and the surfaces of the common electrode layer 12 and the pixel electrode layer 14 to form the first filling layer 15. Specifically, as shown in fig. 10, the lower edge non-display region of each array substrate 1 on the glass substrate 6 is masked by the masking plate 5, and then the first filling layer 15 is prepared to have a thickness of 1nm to 2000nm by a chemical vapor deposition method. The mask 5 is used to prevent the first filling layer 15 from covering the terminal region and being unable to connect with an IC, a flexible circuit board, etc.

As shown in fig. 11, a is a curve of the transmittance of the array substrate at the contact position of the passivation layer and the air and the thickness of the first filling layer at the contact position, and B is a curve of the transmittance of the array substrate at the contact position of the passivation layer and the pixel electrode layer and the thickness of the first filling layer at the contact position. As can be seen from fig. 11, when the first filling layer has a thickness of 1nm to 2000nm, the transmittance of the entire array substrate with respect to light is 80% or more.

Referring to fig. 9, the present invention further provides a display device 10 including the array substrate 1. The design point of the invention is that the array substrate 1 is not repeated for other devices of the display device 10, such as a color film substrate, an encapsulation structure, and the like.

The present invention is not limited to the above preferred embodiments, and any modifications, equivalent substitutions and improvements made within the spirit and principle of the present invention should be included in the protection scope of the present invention.