Method for quantitatively evaluating compactness of phosphating film

文档序号:855515 发布日期:2021-04-02 浏览:2次 中文

阅读说明:本技术 一种定量评价磷化膜致密性的方法 (Method for quantitatively evaluating compactness of phosphating film ) 是由 孟凡月 李涛 夏明生 齐建群 周慧春 王浩宇 魏焕君 张静 韩鹏 于 2020-11-20 设计创作,主要内容包括:本发明涉及一种定量评价磷化膜致密性的方法,属于磷化测量评定技术领域。本发明的技术方案是:通过使用Adobe Photoshop CS6,快速选择工具选取照片典型磷化区域,魔棒工具在SEM照片上选择选取相似,记录测量,即可得到磷化面积S1。通过反选,再次记录测量得到非磷化区域面积S2,磷化区域面积占比=S1/(S1+S2)。本发明的有益效果是:无需用尺测量、对标图谱,简便快捷,不受人为因素影响,误差小,是一种快速定量评价磷化膜致密性的方法,对提高磷化后续电泳板性能检测及耐蚀性检测等均有很好的帮助。(The invention relates to a method for quantitatively evaluating the compactness of a phosphating film, belonging to the technical field of phosphating measurement evaluation. The technical scheme of the invention is as follows: the phosphorization area S1 can be obtained by using Adobe Photoshop CS6, selecting a typical phosphorization area of a photo by a quick selection tool, selecting a similar selection on an SEM photo by a magic stick tool, and recording the measurement. By counter-selection, the measurement was again recorded resulting in a non-phosphated zone area S2, phosphated zone area ratio = S1/(S1+ S2). The invention has the beneficial effects that: the method has the advantages of no need of measuring by using a ruler and calibrating a chart, simplicity, convenience and quickness, no influence of human factors, small error, capability of quickly and quantitatively evaluating the compactness of the phosphating film, and good help for improving performance detection, corrosion resistance detection and the like of a phosphating subsequent electrophoresis plate.)

1. A method for quantitatively evaluating the compactness of a phosphating film is characterized by comprising the following steps:

(1) opening Adobe Photoshop CS6, creating a new canvas with Ctrl + N, and opening an SEM phosphorization photo to be processed with Ctrl + O;

(2) selecting a quick selection tool, adjusting the size of the quick selection tool to 6 pixels, and selecting a plurality of typical phosphorization areas on an SEM picture;

(3) selecting a magic stick tool, right clicking on the SEM picture, and selecting similar tools;

(4) finding an image in a menu bar, analyzing, recording and measuring, namely finding a phosphorization area S1 below the software;

(5) ctrl + Shift + I, and obtaining a non-phosphorized area through reverse selection;

(6) finding an image in a menu bar, analyzing, recording and measuring, namely finding a non-phosphorized area S2 below software;

(7) the phosphorized region area ratio = S1/(S1+ S2).

Technical Field

The invention relates to a method for quantitatively evaluating the compactness of a phosphating film, belonging to the technical field of phosphating measurement evaluation.

Background

After being punched and welded, the automobile plate enters a coating workshop to be subjected to the working procedures of phosphorization, electrophoresis and the like, and the quality of the phosphorization quality of the automobile plate directly influences the performance and the corrosion resistance of the subsequent working procedures of electrophoresis and the like. In addition, the quality of the phosphate coating is evaluated before the cold-rolled sheet, the galvanized sheet and the hot stamping steel quenching bare sheet produced by a steel mill are sold to customers and in the using process of the customers.

The industrial standard for evaluating the quality of the phosphating film after phosphating the automobile plate is generally that the phosphating appearance is uniform in color, has no metal bright spots, has no lime, rust and the like, the phosphating film is heavy, the phosphating crystal size is large, the phosphating film is uniform and compact, and sometimes some technicians pay attention to the phosphating crystal form and other data.

The compactness of the phosphating film directly influences the adhesion and corrosion resistance of the electrophoretic paint, and the compactness is too high or too low. Conventionally, the compactness of the phosphating film is evaluated only by direct observation of technicians according to SEM (scanning electron microscope) photos, the compactness of the phosphating film is judged according to experience, if the compactness of the phosphating crystal is further refined and compared, quantitative evaluation can be carried out by adopting some chemical methods, for example, P ratio detection is carried out, the P ratio detection value is high, and the generated phosphating crystal is generally considered to be fine, uniform and compact. However, chemical detection generally requires large-scale equipment or chemical agents, and if these basic conditions are not met, rapid quantitative evaluation of the density of the phosphorized crystal cannot be performed.

Disclosure of Invention

The invention aims to provide a method for quantitatively evaluating the compactness of a phosphating film, which utilizes Adobe Photoshop CS6 to automatically and accurately distinguish a target phosphating area from a non-target phosphating area, directly calculates the non-target phosphating area of the target phosphating area, does not need ruler measurement and calibration spectrum, is simple, convenient and quick, is very helpful for improving the performance detection, the corrosion resistance detection and the like of a phosphating subsequent electrophoresis plate, and effectively solves the problems in the background technology.

The technical scheme of the invention is as follows: a method for quantitatively evaluating the compactness of a phosphating film comprises the following steps:

(1) opening Adobe Photoshop CS6, creating new canvas with Ctrl + N, and opening SEM phosphorization photo to be processed with Ctrl + O;

(2) selecting a 'quick selection tool', adjusting the size of the quick selection tool to 6 pixels, and selecting a plurality of typical phosphorization areas on an SEM picture;

(3) selecting a magic rod tool, right clicking on the SEM picture, and selecting 'similar selection';

(4) finding an 'image' -analysis '-record measurement' in the menu bar, namely finding a phosphorization area S1 below the software;

(5) ctrl + Shift + I, and obtaining a non-phosphorized area through reverse selection;

(6) finding an 'image' -analysis '-record measurement' in the menu bar, namely finding a non-phosphorized area S2 below the software;

(7) the phosphorized region area ratio = S1/(S1+ S2).

The invention has the beneficial effects that: the method has the advantages that the Adobe Photoshop CS6 is utilized to automatically and accurately distinguish the target phosphorization area from the non-target phosphorization area, the non-target phosphorization area of the target phosphorization area is directly calculated, ruler measurement and a calibration chart spectrum are not needed, simplicity and rapidness are achieved, and good help is provided for improving performance detection, corrosion resistance detection and the like of a phosphorized subsequent electrophoresis plate.

Drawings

FIG. 1 is a photograph of a pending SEM phosphorization of example 1 of the present invention;

FIG. 2 is a diagram of selected exemplary phosphating areas of example 1 of the present invention;

FIG. 3 is a diagram of a selected similar phosphating representative area in example 1 of the invention;

FIG. 4 is a diagram of a non-phosphated region of example 1 of the present invention;

FIG. 5 is a photograph of a pending SEM phosphorization of example 2 of the present invention;

FIG. 6 is a diagram of selected exemplary phosphating areas of example 2 of the invention;

FIG. 7 is a diagram of a selected similar phosphating representative area in example 2 of the invention;

FIG. 8 is a diagram of a non-phosphated region of example 2 of the present invention;

FIG. 9 is a photograph of a pending SEM phosphorization of example 3 of the present invention;

FIG. 10 is a diagram of selected exemplary phosphating areas of example 3 of the invention;

FIG. 11 is a diagram of a selected similar phosphating representative area in example 3 of the invention;

FIG. 12 is a diagram of a non-phosphated region of example 3 of the present invention;

FIG. 13 is a photograph of a pending SEM phosphorization of example 4 of the present invention;

FIG. 14 is a diagram of selected exemplary phosphating areas of example 4 of the invention;

FIG. 15 is a diagram of a selected similar phosphating representative area in example 4 of the invention;

FIG. 16 is a diagram of a non-phosphated region of example 4 of the present invention;

FIG. 17 is a photograph of a pending SEM phosphorization of example 5 of the present invention;

FIG. 18 is a diagram of selected exemplary phosphating areas of example 5 of the invention;

FIG. 19 is a graph of a selected similar phosphide representative region in example 5 of the present invention;

FIG. 20 is a diagram of a non-phosphated region of example 5 of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions of the embodiments of the present invention with reference to the drawings of the embodiments, and it is obvious that the described embodiments are a small part of the embodiments of the present invention, rather than all embodiments, and all other embodiments obtained by a person of ordinary skill in the art without creative work based on the embodiments of the present invention belong to the protection scope of the present invention.

A method for quantitatively evaluating the compactness of a phosphating film comprises the following steps:

(1) opening Adobe Photoshop CS6, creating a new canvas with Ctrl + N, and opening an SEM phosphorization photo to be processed with Ctrl + O;

(2) selecting a 'quick selection tool', adjusting the size of the quick selection tool to 6 pixels, and selecting a plurality of typical phosphorization areas on an SEM picture;

(3) selecting a magic rod tool, right clicking on the SEM picture, and selecting 'similar selection';

(4) finding an 'image' -analysis '-record measurement' in the menu bar, namely finding a phosphorization area S1 below the software;

(5) ctrl + Shift + I, and obtaining a non-phosphorized area through reverse selection;

(6) finding an 'image' -analysis '-record measurement' in the menu bar, namely finding a non-phosphorized area S2 below the software;

(7) the phosphorized region area ratio = S1/(S1+ S2).

The method is characterized in that a cold-rolled sheet and a galvanized sheet are selected and phosphorized in pretreatment agents of different manufacturers, five specially selected phosphorization photos with complex phosphorization effects are used for verifying the feasibility of the method, and the specific embodiment is as follows. The five examples are counted in table 1:

TABLE 1 statistics of phosphating and non-phosphating information for five examples

Example 1

1. Adobe Photoshop CS6 was opened, Ctrl + N new canvas was created, Ctrl + O opened SEM phospho-photograph to be processed. As shown in fig. 1.

2.2. Select "quick select tool", resize 6 pixels, select several typical phosphorized regions on SEM pictures. As shown in fig. 2.

3. Select "magic wand tool", right click on SEM photo, select "pick similar". As shown in fig. 3.

4. Finding "image" - "analyze" - "record measure" in the menu bar, the bonderized area S1 can be found under the software.

Ctrl + Shift + I, and back-selecting to obtain a non-phosphorized area. As shown in fig. 4.

6. Finding "image" - "analyze" - "record measure" in the menu bar, one can find the non-phosphatized area under the software S2.

7. The phosphorized region area ratio = S1/(S1+ S2).

Example 2

1. Adobe Photoshop CS6 was opened, Ctrl + N new canvas was created, Ctrl + O opened SEM phospho-photograph to be processed. As shown in fig. 5.

2. Select "quick select tool", resize 6 pixels, select several typical phosphorized regions on SEM pictures. As shown in fig. 6.

3. Select "magic wand tool", right click on SEM photo, select "pick similar". As shown in fig. 7.

4. Finding "image" - "analyze" - "record measure" in the menu bar, the bonderized area S1 can be found under the software.

Ctrl + Shift + I, and back-selecting to obtain a non-phosphorized area. As shown in fig. 8.

6. Finding "image" - "analyze" - "record measure" in the menu bar, one can find the non-phosphatized area under the software S2.

7. The phosphorized region area ratio = S1/(S1+ S2).

Example 3

1. Adobe Photoshop CS6 was opened, Ctrl + N new canvas was created, Ctrl + O opened SEM phospho-photograph to be processed. As shown in fig. 9.

2. Select "quick select tool", resize 6 pixels, select several typical phosphorized regions on SEM pictures. As shown in fig. 10.

3. Select "magic wand tool", right click on SEM photo, select "pick similar". As shown in fig. 11.

4. Finding "image" - "analyze" - "record measure" in the menu bar, the bonderized area S1 can be found under the software.

5.Ctrl + Shift + I, and reverse selecting to obtain a non-phosphorized area. As shown in fig. 12.

6. Finding "image" - "analyze" - "record measure" in the menu bar, one can find the non-phosphatized area under the software S2.

7. The phosphorized region area ratio = S1/(S1+ S2).

Example 4

1. Adobe Photoshop CS6 was opened, Ctrl + N new canvas was created, Ctrl + O opened SEM phospho-photograph to be processed. As shown in fig. 13.

2. Select "quick select tool", resize 6 pixels, select several typical phosphorized regions on SEM pictures. As shown in fig. 14.

3. Select "magic wand tool", right click on SEM photo, select "pick similar". As shown in fig. 15.

4. Finding "image" - "analyze" - "record measure" in the menu bar, the bonderized area S1 can be found under the software.

Ctrl + Shift + I, and back-selecting to obtain a non-phosphorized area. As shown in fig. 16.

6. Finding "image" - "analyze" - "record measure" in the menu bar, one can find the non-phosphatized area under the software S2.

7. The phosphorized region area ratio = S1/(S1+ S2).

Example 5

1. Adobe Photoshop CS6 was opened, Ctrl + N new canvas was created, Ctrl + O opened SEM phospho-photograph to be processed. As shown in fig. 17.

2. Select "quick select tool", resize 6 pixels, select several typical phosphorized regions on SEM pictures. As shown in fig. 18.

3. Select "magic wand tool", right click on SEM photo, select "pick similar". As shown in fig. 19.

4. Finding "image" - "analyze" - "record measure" in the menu bar, the bonderized area S1 can be found under the software.

Ctrl + Shift + I, and back-selecting to obtain a non-phosphorized area. As shown in fig. 20.

6. Finding "image" - "analyze" - "record measure" in the menu bar, one can find the non-phosphatized area under the software S2.

7. The phosphorized region area ratio = S1/(S1+ S2).

Although the present invention has been described in detail with reference to the above embodiments, it should be understood by those skilled in the art that: modifications and equivalents may be made thereto without departing from the spirit and scope of the invention and it is intended to cover in the claims the invention as defined in the appended claims.

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