阅读说明：本技术 一种存储器译码方法 (Memory decoding method ) 是由 陈杰智 贾梦华 詹学鹏 于 2021-02-03 设计创作，主要内容包括：本发明公开一种存储器译码方法,本方法针对有横向电荷扩散现象的存储颗粒,通过额外的读操作和编程操作修复电荷流失,利用这些特殊的物理机制,对开放块的译码流程进行优化,能够有效降低边缘字线的误码率,提升可靠性容限,降低其可靠性开销,提高闪存存储系统的可靠性。(The invention discloses a memory decoding method, which aims at storage particles with a transverse charge diffusion phenomenon, repairs charge loss through additional reading operation and programming operation, optimizes a decoding process of an open block by utilizing special physical mechanisms, and can effectively reduce the error rate of edge word lines, improve the reliability tolerance, reduce the reliability cost and improve the reliability of a flash memory storage system.)

1. A memory decoding method, comprising: the method comprises the following steps:

s01), the user reads the data in the memory grain open block, and judges whether the read data is at the position of the edge word line, if yes, the step S02 is carried out, and if not, the step S04 is carried out;

the open block refers to a block in which word lines have both programmed and unprogrammed word lines;

in an open block, if the next word line of the common storage layer of one word line is in an unprogrammed state and is capable of a normal program operation, such a word line is called an edge word line;

s02), abandoning the data read in the step S01, carrying out a second read operation on the edge word line of the open block, carrying out hard decoding on the data read out for the second time, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S03;

s03), programming the next word line of the shared storage layer corresponding to the edge word line, reading the edge word line data again, carrying out hard decoding operation on the read data, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S05;

s04), carrying out hard decoding operation on the data, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S05;

s05), carrying out soft decoding processing on the data, if the decoding is successful, returning the read data to the host user, otherwise, returning decoding failure information or starting a subsequent deeper data recovery process.

2. The memory decoding method of claim 1, wherein: the method is applicable to any memory type with lateral charge diffusion phenomenon.

3. The memory decoding method of claim 1, wherein: in step S03, when the next word line in which the edge word lines share the memory layer is programmed, the write data is random data or data in a fixed pattern.

4. The memory decoding method of claim 1, wherein: and searching relevant information about the position of the read data through a flash translation layer of the memory or at a specific position inside the memory particle so as to judge whether the read data is at the position of the edge word line.

Technical Field

The invention relates to a memory decoding method, which optimizes the decoding process of a special storage scene based on an inherent physical mechanism in a storage particle and belongs to the technical field of firmware error correction module (ECC) application of a memory.

Background

The flash memory belongs to a nonvolatile memory, and has extremely high erasing speed, good shock resistance and lower power consumption. The flash memory chip mainly comprises two flash memory architectures: NAND-type flash memory architectures and NOR-type flash memory architectures. NAND type flash memory has a number of significant advantages over NOR type flash memory. After years of market updating iteration, a storage system taking a NAND-type architecture flash memory as a medium is widely applied to the current storage market, gradually and firmly occupies a main share of a nonvolatile storage market, and is favored by consumers and enterprise users.

The most common NAND flash memories are SSD (solid state disk) and UFS (universal flash storage). The SSD is mainly used for fixed scene storage, and has the advantages of large storage capacity, high reliability requirement, good compatibility, large volume and high power consumption; the UFS is mainly used for mobile terminal storage, and has the main advantages of small size and low power consumption compared with the SSD, and is suitable for high-density integration. In the current data explosion era, the application of NAND flash memory covers most of the memory area: enterprise data center, 5G related field, artificial intelligence and mobile phone and tablet computer, etc.

Both SSD and UFS are generally composed of memory particles and a control chip, wherein the control chip controls, manages and optimizes the memory based primarily on the memory particles. An ECC (error Correction code) module is arranged in the control chip and mainly used for correcting error data read by the NAND flash memory and improving the reliability of the system. Once the error condition in the flash memory grain exceeds the ECC error correction capability, the decoding fails, which causes data loss and generates a large reliability overhead.

Flash memory grains are one of the core parts of their performance for different memories. Since the advent of NAND flash Memory, the technology of which has been constantly evolving, each Memory Cell has been able to store charge rising from 1 bit to the maximum of 4 bits today. In addition, the space structure of the NAND flash memory is also greatly changed, as shown in fig. 1, the internal memory structure of the NAND flash memory undergoes a transition from planar 2D to stereoscopic 3D, so that the memory density is greatly improved.

Fig. 2 is a basic physical structure diagram of a NAND flash memory cell. Essentially, a NAND flash memory is a MOS (metal-oxide semiconductor) transistor, and the physical units are, in order from top to bottom as shown, a control gate, an oxide layer, a memory layer, a tunneling layer, and a channel. NAND flash memory particles are classified into two major types, namely, FG (Floating-Gate) type and CT (Charge-Trap) type, depending on the material of the memory layer.

Fig. 3 is a memory array diagram of a 3D NAND flash memory. Each row of Memory stripes constitutes a Word Line (WL, Word-Line), each Word Line consisting of one or more logical pages (pages) according to the amount of stored charge in the Memory Cell. Block is a NAND-based erase unit, consisting of several stacked layers, each containing several word lines.

In the daily usage scenario of NAND flash memory, user data does not always fill the entire Block area. This means that there are some blocks, where there are both programmed and unprogrammed word lines, such blocks are called Open blocks. In the case of a 3D CT NAND flash memory having a common memory layer in a physical structure, if a Word Line in an Open Block, the next Word Line of the common memory layer is in an unprogrammed state, and a normal programming operation can be performed, such a Word Line is an Edge Word-Line (Edge Word-Line). Due to the structural specificity of the 3D CT NAND flash memory, there is an LCM (lateral charge diffusion) caused by stress, which is a difference in charge density gradient, between the word lines sharing one memory layer. In particular, for Open Block, the next word line sharing the same storage layer with the edge word line is in an unprogrammed state, and the concentration gradient difference between the next word line and the edge word line is particularly obvious, so that the edge word line has a serious lateral charge leakage problem (fig. 4) and faces a great reliability risk, and the probability of decoding failure is far higher than that of the rest word lines.

The basic erase, write, and read operations of NAND flash are achieved by applying different voltages to the control gate or substrate. As shown in fig. 5, when the target word line is read, under the influence of the applied reading voltage electric field, a part of the electric charges diffused by the CT storage layer returns to the storage layer again, so as to achieve the effect of data recovery; in addition, when a program operation is performed on a certain word line, program disturb may occur on the remaining non-target program word lines under the influence of Vpass. Vprogram also creates overlay interference to the word line nearest to the programmed word line due to the effects of parasitic capacitive coupling. The superposed electric fields of two kinds of interference in the programming operation are stronger than the reading operation, a large amount of lost electrons enter the storage layer of the programming word line adjacent to the word line under the action of the superposed electric fields, and the charge leakage repairing effect on the adjacent word line is more obvious than the reading operation. In particular, the repair effect of these two operations on open block edge word line reliability problems is much more significant than other scenarios. The reliability of the open block can be greatly improved by reasonably utilizing the two operations.

Disclosure of Invention

The technical problem to be solved by the invention is to provide a memory decoding method, which can effectively reduce the error rate of the open block edge word line of a 3D CT-like NAND flash memory, greatly improve the tolerance of the error rate and the probability of successful decoding, and has very obvious effect on data recovery.

In order to solve the technical problem, the technical scheme adopted by the invention is as follows: a memory decoding method, comprising: the method comprises the following steps:

s01), the user reads the data in the storage particle open block and judges whether the read data is at the edge position, if yes, the step S02 is carried out, and if not, the step S04 is carried out;

the open block refers to a block in which word lines have both programmed and unprogrammed word lines;

in an open block, if the next word line of the common storage layer of one word line is in an unprogrammed state and is capable of a normal program operation, such a word line is called an edge word line;

s02), abandoning the data read in the step S01, carrying out a second read operation on the edge word line of the open block, carrying out hard decoding on the data read out for the second time, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S03;

s03), programming the next word line of the shared storage layer corresponding to the edge word line, reading the edge word line data again, carrying out hard decoding operation on the read data, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S05;

s04), carrying out hard decoding operation on the data, if the decoding is successful, returning the read data to the host user, otherwise, carrying out the step S05;

s05), carrying out soft decoding processing on the data, if the decoding is successful, returning the read data to the host user, otherwise, returning decoding failure information or starting a subsequent deeper data recovery process.

Further, the method is applicable to any memory type having a lateral charge diffusion phenomenon.

Further, in step S03, when the next word line sharing the memory layer for the edge word lines is programmed, the written data is random data or data in a fixed pattern.

Further, whether the read data is in the edge word line position is judged by searching relevant information about the read data position through a flash translation layer of the memory or in a specific position inside the memory particle.

The invention has the beneficial effects that: the method is suitable for any particles similar to 3D CT NAND flash with a lateral charge diffusion phenomenon, the edge word line of an open block has great potential reliability hazard, and the read operation and the programming operation have obvious repairing effect on charge loss. By utilizing the special physical mechanisms, the decoding process of the open block is optimized, so that the bit error rate of the edge word line can be effectively reduced, the reliability tolerance is improved, the reliability overhead is reduced, and the reliability of the flash memory storage system is improved.

Drawings

FIG. 1 is a diagram of the internal space of a NAND flash memory with 2D and 3D structures;

FIG. 2 is a basic physical structure diagram of a NAND flash memory cell;

FIG. 3 is a memory array diagram of a 3D NAND flash memory;

FIG. 4 is a schematic diagram of charge loss encountered by 3D CT NAND open block edge word lines;

FIG. 5 is a schematic diagram of word line disturb caused by different voltages applied during read and program operations of a 3D NAND flash memory pellet;

5a is a read repair schematic, 5b is a program repair schematic;

FIG. 6 is the bit error rate at different read sequences for various Retention times;

FIG. 7 is a graph illustrating the variation in bit error rate after programming the next word line of the edge word line common storage layer based on a read operation;

FIG. 8 is a graph illustrating the bit error rate degradation caused by an extra read operation and an extra program operation in comparison to the case where no scheme is applied;

FIG. 9 is a flow chart of the present invention;

FIG. 10 is a flowchart of example 1;

in the figure: 1. drain electrode, 2, selection transistor, 3, word line, 4, source electrode, 5, channel, 6, control gate, 7, deposition column, 8, channel, 9, oxidation tunneling layer, 10, storage layer, 11, oxide layer, 12, control gate, 3 (0) represents word line (0), 3 (1) represents word line (1), 3 (n-1) represents word line (n-1), 3 (n) represents word line 3 (n), 13, common storage layer, curve a represents programming state, curve B represents erasing state, and arrow between curve a and curve B has head charge leakage.

Detailed Description

The invention is further described with reference to the following figures and detailed description.

Example 1

Open blocks are a common scenario for users when using flash memory, however due to the special spatial structure of 3D CT NAND flash memory granules, the edge word lines of open blocks face a serious reliability risk. Once the decoding failure of the edge word line causes data loss, the use experience of the user is greatly reduced. In combination with the additional physical impact of NAND flash memory grains in performing read and program operations, open block edge word line reliability problems due to charge loss can be repaired. Therefore, the present embodiment provides a method for improving data reliability during open block edge word line decoding, and improves and optimizes the decoding process.

Fig. 9 is a flowchart illustrating a technical solution of the present invention, and in particular, the 3D CT NAND flash memory array diagram shown in fig. 3 is referred to in this embodiment. According to the number of layers of the stacked flash memory particles and the number of word lines included in each Block, the position of the next unprogrammed word line corresponding to the programmed word line can be calculated. This embodiment is a 3D CT NAND flash memory grain with 64 layers stacked, each Block contains 256 word lines, and the programming mode is sequential programming (in this embodiment, the programming is from word-line [0] to word-line [63 ]). So derived, each pair stack contains 256/64=4 word lines, and the next word line of the common memory layer of word-line [60] to word-line [63] is in an unprogrammed state, i.e., an edge word line.

According to the inventive content of the present invention, the implementation case proceeds as shown in fig. 9:

step 1, in an open block, programming user data to word-line [63 ];

step 2, a user reads data stored in the open block word-line [ n ], whether the word-line [ n ] is located between the word-line [60] and the word-line [63] or not is judged, if yes, the step 3 is carried out, and if not, the step 5 is carried out;

step 3, abandoning the data read out for the first time by the word-line [ n ], carrying out the second reading operation, then carrying out hard decoding, if the decoding is successful, returning the data to the host user, otherwise, carrying out the step 4;

step 4, programming word-line [ n +4], reading the data in the word-line [ n ] again, carrying out hard decoding on the data, and returning the data to a user if decoding is successful; otherwise, executing step 6;

step 5, carrying out hard decoding on the data in the word-line [ n ], if the decoding is successful, returning the data to a host user, otherwise, executing step 6;

step 6, soft decoding is carried out on the data read out by the word-line [ n ], and if the decoding is successful, the data are returned to the user; otherwise, returning decoding failure information or starting a subsequent data recovery process of a deeper layer.

In this embodiment, a special 3D CT NAND flash memory grain is taken as an example to calculate the word line number of the edge word line and the position of the next word line of the common memory layer corresponding to the edge word line. The remaining 3D CT NAND flash memory particles can also be calculated according to the memory size and technology level (Block size, number of stacked layers, programming method, etc.) to find edge word lines and their corresponding next word lines.

In this embodiment, the data written by the program operation is random data, and the same is true for the special data pattern.

Before the solution described in this embodiment is proposed, the actual reliability test and data collection of the flash memory granule is performed. As shown in fig. 6, when the data Retention time is 1080h (room temperature), the error rate of the second read operation is reduced by 57.73% compared with the error rate of the first read operation. And comparing the error rates of the data of the second read operation and the third read operation, it can be seen that the change is not obvious. Therefore, the error rate restoration can be achieved with only one additional reading operation. On the basis of three read operations, we have performed a program operation again on the next Word Line (defined herein as Dummy Word-Line) where the edge Word lines share the memory layer. As can be seen from fig. 7, the bit error rate under the additional program operation is still significantly reduced relative to the second and third read operations, which indicates that the reliability recovery effect of the program operation is stronger than that of the additional read operation.

Fig. 8 illustrates the effect of bit error rate degradation caused by additional read operations and program operations at different data retention times. It can be seen from the figure that the bit error rate of both the extra read scheme and the extra program scheme is lower than the baseline (no technical scheme is applied), and the reliability of the extra program scheme is further improved by 26% relative to the extra read operation scheme.

In view of the practical test effect of the present invention, the extra read operation scheme can reduce the error rate by 56.40% on average only by consuming one read time. The programming scheme requires longer operation time, but the resulting bit error rate degradation can reach 82.01%. And (3) combining the advantages and disadvantages of the two schemes, firstly adopting a read operation scheme, and when the scheme is not enough to enable the error rate to reach the decoding level, adopting programming operation to further reduce the error rate. The invention reasonably utilizes the two schemes, greatly improves the reliability degree of the open block, obviously reduces the error rate, and effectively improves the decoding efficiency and the success rate of the word line at the edge of the open block.

The method provided by the embodiment utilizes the effect of the 3D CT NAND flash memory programming interference on charge loss recovery, can obviously reduce the error rate of the edge word line in the open block, and improves the decoding success probability. The method effectively improves the reliability of the flash memory storage system and greatly reduces the reliability overhead caused by the overhigh error rate of the open block.

The foregoing description is only for the basic principle and the preferred embodiments of the present invention, and modifications and substitutions by those skilled in the art are included in the scope of the present invention.