阅读说明：本技术 一种探测装置外参数标定方法、数据处理装置和探测系统 (Detection device external parameter calibration method, data processing device and detection system ) 是由 陈涵 邢万里 吴特思 于 2019-01-30 设计创作，主要内容包括：一种探测装置外参数标定方法、数据处理装置和探测系统。其中,方法适用于对第一探测装置(60)和第二探测装置(70)之间的外参数进行标定,所述第一探测装置(60)与所述第二探测装置(70)的可视区域互不重叠,所述第一探测装置(60)经过N次移动后的可视区域与第二探测装置(70)在初始状态下的可视区域有重叠,所述N大于等于1,该方法包括：计算所述第一探测装置(60)每次移动前后的坐标系之间的第一偏移参数(S101)；计算所述第一探测装置(60)经过N次移动后的坐标系与所述第二探测装置(70)在初始状态下的坐标系之间的第二偏移参数(S102)；根据所述第一偏移参数和所述第二偏移参数计算所述第一探测装置(60)和所述第二探测装置(70)之间的外参数(S103)。如此可以提高探测装置外参数标定的效率。(A method for calibrating external parameters of a detection device, a data processing device and a detection system are provided. The method is suitable for calibrating the external parameter between a first detection device (60) and a second detection device (70), the visual areas of the first detection device (60) and the second detection device (70) are not overlapped, the visual area of the first detection device (60) after N times of movement is overlapped with the visual area of the second detection device (70) in the initial state, and N is more than or equal to 1, and the method comprises the following steps: calculating a first offset parameter between the coordinate systems before and after each movement of the first detecting device (60) (S101); calculating a second offset parameter between the coordinate system of the first detection device (60) after N times of movement and the coordinate system of the second detection device (70) in the initial state (S102); calculating an external parameter between the first probe device (60) and the second probe device (70) based on the first offset parameter and the second offset parameter (S103). Therefore, the efficiency of calibrating the external parameters of the detection device can be improved.)