Small cycle slip repairing method based on GNSS high sampling rate data

文档序号:1566620 发布日期:2020-01-24 浏览:31次 中文

阅读说明:本技术 一种基于gnss高采样率数据的小周跳修复方法 (Small cycle slip repairing method based on GNSS high sampling rate data ) 是由 冯威 黄丁发 于 2019-11-19 设计创作,主要内容包括:本发明公开了一种基于GNSS高采样率数据的小周跳修复方法,包括以下步骤:采集双频GNSS数据,并根据GNSS数据构建组合观测量;对组合观测量进行差分处理,得到差分后的组合观测量<Image he="77" wi="220" file="DDA0002278315050000011.GIF" imgContent="drawing" imgFormat="GIF" orientation="portrait" inline="no"></Image>根据差分后的组合观测量<Image he="80" wi="225" file="DDA0002278315050000012.GIF" imgContent="drawing" imgFormat="GIF" orientation="portrait" inline="no"></Image>获取小周跳,并对小周跳进行修复。本发明复杂度低,易于实现,且计算效率高,无需引入伪距观测值,能够很好的探测与修复小周跳;同时,本发明无需接收机位置信息,适用于动态和静态模式下的周跳探测与修复。(The invention discloses a small cycle slip repairing method based on GNSS high sampling rate data, which comprises the following steps: acquiring dual-frequency GNSS data, and constructing a combined observed quantity according to the GNSS data; carrying out difference processing on the combined observed quantity to obtain the combined observed quantity after difference From the combined observations after differencing And acquiring and repairing the small cycle slip. The method has low complexity, easy realization and high calculation efficiency, does not need to introduce pseudo-range observed values, and can well detect and repair the small cycle slip; meanwhile, the invention does not need the position information of the receiver, and is suitable for cycle slip detection and repair under dynamic and static modes.)

1. A small cycle slip repairing method based on GNSS high sampling rate data is characterized by comprising the following steps:

s1, collecting dual-frequency GNSS data, and constructing a combined observed quantity by utilizing the GNSS data;

s2, acquiring small cycle slip of each frequency carrier phase according to the combined observed quantity;

and S3, acquiring a cycle slip candidate value, determining a final cycle slip value, and repairing the small cycle slip.

2. The GNSS high-sampling-rate-data-based small cycle slip recovery method according to claim 1, wherein the combined observations in step S1Comprises the following steps:

Figure FDA0002278315020000012

wherein the content of the first and second substances,

Figure FDA0002278315020000013

3. The GNSS high-sampling-rate-data-based small cycle slip recovery method of claim 1, wherein in step S2, the small cycle slip is:

Figure FDA0002278315020000019

Figure FDA00022783150200000110

wherein, | δ N'1|<β1,δN'1Is shown and

Figure FDA00022783150200000111

4. The small cycle slip of claim 3 based on GNSS high sample rate dataThe repairing method is characterized in that the cycle slip candidate value in the step S3 is δ Ni(1) And δ Ni(2) δ N of saidi(1) And δ Ni(2) The method specifically comprises the following steps:

Figure FDA0002278315020000021

wherein, i is 1 or 2, when i is 1, i' is 2; when i is 2, i' is 1; sgn (·) denotes a sign operation.

5. The GNSS high-sampling-rate-data-based small cycle slip recovery method according to claim 1, wherein the final cycle slip value δ N is determined in step S3 "iThe specific method comprises the following steps:

wherein, δ Ni(1) And δ Ni(2) All represent cycle slip candidates, R (·) represents a rounding operation, dni (X) ═ R (X) -X |.

Technical Field

The invention relates to the field of dual-frequency GNSS cycle slip repair, in particular to a small cycle slip repair method based on GNSS high sampling rate data.

Background

The high-precision positioning of the GNSS depends on a millimeter-level precision carrier phase observation value, and continuous high-precision positioning of the GNSS requires that the cycle slip of the carrier phase of each epoch can be correctly detected and processed. Even a cycle slip of one week has a great influence on high-precision positioning. Although various cycle slip processing methods of GNSS carrier phases exist at present, the prior art has the following problems:

1. the method for cycle slip detection and repair by satellite often needs to introduce pseudo-range observed quantity, and the pseudo-range precision is low, so that the method is difficult to detect small cycle slips;

2. although small cycle slip can be better detected and repaired, the performance of the method is reduced when small cycle slip occurs to a plurality of satellites under a dynamic observation condition, and the method generally needs larger calculation amount, so the method cannot be well suitable for data with high sampling rate, especially when the number of observation satellites is more;

3. although the commonly used geometric distance independent combination method can well detect the cycle slip, the frequency of the cycle slip cannot be positioned, and the size of the cycle slip cannot be repaired.

Disclosure of Invention

Aiming at the defects in the prior art, the small cycle slip repairing method based on GNSS high sampling rate data solves the problems in the prior art.

In order to achieve the purpose of the invention, the invention adopts the technical scheme that: a small cycle slip repairing method based on GNSS high sampling rate data comprises the following steps:

s1, collecting dual-frequency GNSS data, and constructing a combined observed quantity by utilizing the GNSS data;

s2, acquiring small cycle slip of each frequency carrier phase according to the combined observed quantity;

and S3, acquiring a cycle slip candidate value, determining a final cycle slip value, and repairing the small cycle slip.

Further, in the step S1, the observation quantities are combined

Figure BDA0002278315030000021

Comprises the following steps:

Figure BDA0002278315030000022

wherein the content of the first and second substances,

Figure BDA0002278315030000023

and

Figure BDA0002278315030000024

denotes the observed values of the carrier phase in cycles, λ, at different frequencies1Indicating carrier phase

Figure BDA0002278315030000025

Wavelength of (a)2Indicating carrier phase

Figure BDA0002278315030000026

Wavelength of (1), N1Indicating carrier phase

Figure BDA0002278315030000027

Integer ambiguity of (N)2Indicating carrier phase

Figure BDA0002278315030000028

The whole-cycle ambiguity of (a).

Further, in the step S2, the small cycle slip is:

Figure BDA0002278315030000029

wherein, | δ N'1|<β1,δN'1Is shown and

Figure BDA00022783150300000211

corresponding to small cycle slip, | δ N 'of the carrier'2|<β2,δN'2Is shown and

Figure BDA00022783150300000212

corresponding to the small cycle-slip of the carrier,representing groups of k epochsResultant observed quantity

Figure BDA00022783150300000214

Combined observation representing the difference between epochs, (-)dDenotes a decimal operation, e denotes an integer, and

Figure BDA00022783150300000215

sgn (·) denotes sign-taking operation, λ1Indicating carrier phase

Figure BDA00022783150300000216

Wavelength of (a)2Indicating carrier phase

Figure BDA00022783150300000217

Wavelength of beta of1Is shown and

Figure BDA00022783150300000218

cycle slip calculation coefficient, beta, of the corresponding carrier2Is shown and

Figure BDA00022783150300000219

cycle slip calculation coefficient, beta, of the corresponding carrieri=fi/(f1-f2) I is 1 or 2, f1Indicating carrier phase

Figure BDA00022783150300000220

Frequency of (f)2Indicating carrier phase

Figure BDA00022783150300000221

Of (c) is detected.

Further, the cycle slip candidate value in step S3 is δ Ni(1) And δ Ni(2) δ N of saidi(1) And δ Ni(2) The method specifically comprises the following steps:

Figure BDA00022783150300000222

wherein, i is 1 or 2, when i is 1, i' is 2; when i is 2, i' is 1; sgn (·) denotes a sign operation.

Further, in the step S3, a final cycle slip value δ N is determinediThe specific method comprises the following steps:

wherein, δ Ni(1) And δ Ni(2) All represent cycle slip candidates, R (·) represents a rounding operation, dni (X) ═ R (X) -X |.

The invention has the beneficial effects that:

(1) when the small cycle slip is repaired, pseudo-distance observation quantity is not required to be introduced, and the small cycle slip can be accurately detected.

(2) The method has the advantages of low complexity, high calculation efficiency, easy realization and good suitability for high sampling rate data.

(3) The invention does not need the position information of the receiver and is suitable for cycle slip detection and repair under dynamic and static modes.

Drawings

Fig. 1 is a flowchart of a small cycle slip recovery method based on GNSS high sampling rate data according to the present invention.

Detailed Description

The following description of the embodiments of the present invention is provided to facilitate the understanding of the present invention by those skilled in the art, but it should be understood that the present invention is not limited to the scope of the embodiments, and it will be apparent to those skilled in the art that various changes may be made without departing from the spirit and scope of the invention as defined and defined in the appended claims, and all matters produced by the invention using the inventive concept are protected.

Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

As shown in fig. 1, a method for repairing a small cycle slip based on GNSS high sampling rate data includes the following steps:

s1, collecting dual-frequency GNSS data, and constructing a combined observed quantity by utilizing the GNSS data;

s2, acquiring small cycle slip of each frequency carrier phase according to the combined observed quantity;

and S3, acquiring a cycle slip candidate value, determining a final cycle slip value, and repairing the small cycle slip.

In this embodiment, the carrier phase observation equation of the dual-frequency GNSS data collected in step S1 is:

Figure BDA0002278315030000041

where ρ represents the distance from the satellite to the receiver, c represents the speed of light, dT represents the receiver clock offset, dT represents the satellite clock offset, T represents the tropospheric delay, γ represents the ionospheric coefficient, and γ ═ f1 2/f2 1,f1Indicating carrier phase

Figure BDA0002278315030000042

Frequency of (f)2Indicating carrier phase

Figure BDA0002278315030000043

The frequency of (a) of (b) is,

Figure BDA0002278315030000044

and

Figure BDA0002278315030000045

denotes the observed values of the carrier phase in cycles, λ, at different frequencies1Indicating carrier phase

Figure BDA0002278315030000046

Wavelength of (a)2Indicating carrier phase

Figure BDA0002278315030000047

Wavelength of (1), N1Indicating carrier phaseInteger ambiguity of (N)2Indicating carrier phase

Figure BDA0002278315030000049

Integer ambiguity of (1)1Indicating carrier phase

Figure BDA00022783150300000410

The ionospheric delay of (a).

Combining the observed quantities in the step S1

Figure BDA00022783150300000411

Comprises the following steps:

Figure BDA00022783150300000412

in this embodiment, the step S2 includes the following sub-steps:

s2.1, representing the combined observed quantity by an epoch to obtain a combined observed quantity of k epochs as

Figure BDA00022783150300000413

S2.2, measuring the combined observation of k epochs

Figure BDA00022783150300000414

Carrying out difference processing between epochs, neglecting the change of an ionosphere between epochs of the high sampling rate data, and obtaining a combined observed quantity after differenceComprises the following steps:

Figure BDA00022783150300000416

wherein the content of the first and second substances,

Figure BDA00022783150300000417

represents a combined observation of k epochs,

Figure BDA00022783150300000418

a combined observation representing the difference between epochs,

Figure BDA00022783150300000419

Figure BDA00022783150300000420

represents a combined observation of k-1 epochs, δ represents the difference between epochs, δ N1Is shown and

Figure BDA00022783150300000421

cycle slip, δ N, of the corresponding carrier2Is shown and

Figure BDA00022783150300000422

cycle slip, δ N, of the corresponding carrier1And δ N2Are all integers;

s2.3, observing quantity according to the combination after differenceObtaining cycle slip δ N1And cycle slip δ N2The relationship of (1) is:

Figure BDA0002278315030000051

s2.4, slip the cycle delta N1And cycle slip δ N2The decimal operation is performed to obtain formula 6 and formula 7:

Figure BDA0002278315030000052

Figure BDA0002278315030000053

s2.5, let betai=fi/(f1-f2) Equation 8 and equation 9 can be derived:

Figure BDA0002278315030000054

Figure BDA0002278315030000055

s2.6, if | δ N11If | is less than 1, then the carrier phaseThe corresponding cycle slip is small cycle slip, and the cycle slip is delta N1Less than 4 weeks; if delta N22If | is less than 1, then the carrier phase

Figure BDA0002278315030000057

The corresponding cycle slip is small cycle slip, and the cycle slip is delta N2Less than 3 weeks; and the small cycle slip expression can be obtained from equation 8 and equation 9 as follows:

Figure BDA0002278315030000058

Figure BDA0002278315030000059

wherein, | δ N'1|<β1,δN'1Indicating carrier phaseCorresponding small cycle slip, | δ N'2|<β2,δN'2Indicating carrier phase

Figure BDA00022783150300000511

Corresponding small cycle slip, f1Indicating carrier phaseFrequency of (f)2Indicating carrier phase

Figure BDA00022783150300000513

Frequency of (1)dDenotes a decimal operation, e denotes an integer, and

Figure BDA00022783150300000514

i is 1 or 2, Sgn (·) denotes sign operation, β1Is shown and

Figure BDA00022783150300000515

cycle slip calculation coefficient, beta, of the corresponding carrier2Is shown and

Figure BDA00022783150300000516

and calculating the coefficient of cycle slip of the corresponding carrier.

In the present embodiment, because | (δ N)11)d|<1,

Figure BDA00022783150300000517

Can obtain | e | ≦ 1, and the symbol of e and

Figure BDA00022783150300000518

so as to obtain a candidate value of e as:

Figure BDA00022783150300000519

in this embodiment, the step S3 includes the following sub-steps:

s3.1, determining a cycle slip candidate value delta N after repairing according to the candidate value of ei(1) And δ Ni(2);

S3.2, judging the cycle slip candidate value and determining the final cycle slip value delta Ni";

S3.3, according to the final cycle slip value delta N "iAnd repairing the small cycle slip.

The cycle slip candidate in step S3 is δ Ni(1) And δ Ni(2) δ N of saidi(1) And δ Ni(2) The method specifically comprises the following steps:

Figure BDA0002278315030000061

wherein, i is 1 or 2, when i is 1, i' is 2; when i is 2, i' is 1; sgn (·) denotes a sign operation.

The final cycle slip value δ N' is determined in said step S3 "iThe specific method comprises the following steps:

Figure BDA0002278315030000062

wherein R (·) represents a rounding operation, dni (X) ═ R (X) -X |.

When the small cycle slip is repaired, pseudo-distance observation quantity is not required to be introduced, and the small cycle slip can be accurately detected. The method has the advantages of low complexity, high calculation efficiency, easy realization and good suitability for high sampling rate data. The invention does not need the position information of the receiver and is suitable for cycle slip detection and repair under dynamic and static modes.

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