阅读说明：本技术 一种皮秒级分辨率电信号边沿到达时间测量的装置与方法 (Device and method for measuring edge arrival time of picosecond-level resolution electric signal ) 是由 许文 赵妍 徐兴利 李明春 何玉璋 于 2020-06-23 设计创作，主要内容包括：本发明公开了一种皮秒级分辨率电信号边沿到达时间测量的装置与方法,该装置包括：被测信号/校准选择器MUX1、可调节延迟单元DLY_CELL组成的被测信号链、时钟信号/校准选择器MUX2、可调节延迟单元DLY_CELL组成的时钟信号链、多个数据寄存器DREG、多个同步寄存器组REGs以及校准电路CAL。本发明采用CMOS工艺,利用数据和时钟双延迟链,采用双链关联锁定方式,具有低成本、细粒度,误差与输入具有较小的统计相关性的特征。(The invention discloses a device and a method for measuring the edge arrival time of an electric signal with picosecond-level resolution, wherein the device comprises the following components: the measured signal/calibration selector MUX1, the measured signal chain consisting of the adjustable delay CELLs DLY _ CELL, the clock signal/calibration selector MUX2, the clock signal chain consisting of the adjustable delay CELLs DLY _ CELL, the plurality of data registers DREG, the plurality of synchronous register sets REGs, and the calibration circuit CAL. The invention adopts CMOS process, uses data and clock double delay chain, adopts double chain correlation locking mode, and has the characteristics of low cost, fine granularity and smaller statistical correlation between error and input.)

1. An apparatus for picosecond resolution measurement of edge arrival times of electrical signals, the apparatus comprising: a measured signal/calibration selector MUX1, a measured signal chain composed of adjustable delay units DLY _ CELL, a clock signal/calibration selector MUX2, a clock signal chain composed of adjustable delay units DLY _ CELL, a plurality of data registers DREG, a plurality of synchronous register sets REGs and a calibration circuit CAL;

the inputs of the signal under test/calibration selector MUX1 are the calibration signal sig _ CAL from the external signals sig, CAL and the calibration enable CAL _ en of the external input, respectively;

the signal chain to be tested is formed by cascading a plurality of DLY _ CELL units, the DLY _ CELL units have a common control input C of a CAL unit, an inlet signal input of a first stage is an output from the MUX1, and each stage has a tap output;

the inputs to the clock signal/calibration selector MUX2 are the calibration clock ck _ CAL from the external clock inputs ck, CAL output and the calibration enable CAL _ en from the external input, respectively;

the clock signal chain is formed by cascading a plurality of DLY _ CELL units, wherein the DLY _ CELL units have a common control input C from a CAL unit, an inlet signal input of a first stage is an output from a MUX2, and each stage is provided with a tap output;

the clock input of the data register DREG comes from the tap output of the clock signal chain, the data input comes from the tap output of the tested signal chain, and the outputs of the DREG form a bus d and are sent to the synchronous register REGS.

2. The device for measuring the edge arrival time of an electric signal with picosecond-level resolution according to claim 1, wherein the DLY _ CELL circuit structure adopts a two-stage cascade inverter, the input ends of the two-stage cascade inverter are I and C, the output end of the DLY _ CELL circuit structure is O, the output stage of the first-stage inverter is connected in parallel with an adjustable equivalent capacitance system, the equivalent capacitance system is formed by connecting a capacitor and a varactor in series, and the bias voltage of the varactor is supplied from the input end C through a resistor.

3. The picosecond-resolution electrical signal edge arrival time measuring device according to claim 2, comprising a master-slave switching circuit having a port sig, a port ck _ o and a port dp _ o, wherein the port sig is an input signal and the port ck is an input reference clock; the port ck _ o is an output clock, and the dp _ o is output parallel data; the master-slave switching circuit further comprises a measuring device SYS _ A, SYS _ B, a master-slave scheduling unit SCH _ CTL and a measuring structure selection arbitration unit SEL _ ARB, wherein the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are connected in parallel, signals are input to the measuring device SYS _ A, SYS _ B through a port sig and a port ck, signals are input to the master-slave scheduling unit SCH _ CTL through the port ck, output ends of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are input to the measuring structure selection arbitration unit SEL _ ARB, the output end of the measuring structure selection arbitration unit SEL _ ARB is respectively connected with a port ck _ o and a port dp _ o, and connection of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH.

4. The device for measuring the edge arrival time of an electrical signal with picosecond resolution of claim 3, wherein the device is integrated on a silicon wafer using CMOS process.

5. The method for measuring the edge arrival time of an electrical signal with picosecond resolution according to claim 4, wherein the device can be operated in two modes with different time periods specified by cal _ en:

in calibration mode, the CAL unit outputs a calibration signal sig _ CAL and a calibration clock ck _ CAL, where the calibration signal enters a data delay chain consisting of several stages DLY _ CELL via MUX 1; the last stage output of the data delay chain is fed back to a calibration unit CAL, and the calibration unit adjusts the delay of the signal delay chain according to a clock technology and an edge time comparison method, so that the delay of the delay chain is equal to M times of a clock period; the calibration clock enters a clock delay chain consisting of a plurality of DLY _ CELL stages through MUX2, the output of the last stage of the data delay chain is fed back to a calibration unit, and the calibration unit adjusts the delay of the signal delay chain according to the clock technology and the edge time comparison method, so that the delay of the delay chain is equal to N times of the clock period, wherein N must be more than M, N, M is an integer;

in a measurement mode, an input end sig signal enters a data delay chain consisting of a plurality of stages of DLY _ CELL through a MUX1, and each stage of tap of the data delay chain is output to a corresponding data end of the DREG for registering; the clock input end ck enters a clock delay chain consisting of a plurality of DLY _ CELL stages through the MUX2, and each stage tap of the clock delay chain is output to the corresponding clock end of the DREG;

parallel data buses with linear delay difference are formed by the output of each stage of DREG, resynchronization and metastable state elimination are carried out by a later stage of REGs unit, the obtained data can accurately reflect the occurrence and time of input events, and theoretically the obtained time measurement granularity G is T/LCM (M, N); where T is the period of the input clock and LCM is the least common multiple function.

Technical Field

The invention relates to the fields of laser radar, laser ranging, accurate time service and the like, in particular to a device and a method for measuring the edge arrival time of an electric signal with picosecond-level resolution.

Background

The current techniques for event time measurement are mostly single data chain fixed delay unit measurement, or differential method, but not locking the reference clock. This causes the following problems:

in the first existing method, a fixed CMOS delay unit is adopted in the simplest way, and a low skew global clock is uniformly used for measurement processing. The minimum delay that can be achieved by the delay unit cannot be too small, resulting in a measurement that cannot be fine-grained, typically 20 to 50 ps.

The principle of the existing method II is similar to that of the existing method I, and the difference is that special processes are needed to make the granularity smaller, but the special processes are expensive and not beneficial to integration.

In the third existing method, a fixed delay unit is adopted for measuring unlocking, an additional asynchronous rounding error of one cycle at most is generated, so that the measurement error is related to the arrival phase of an input event in a unit reference clock, the input forms nonlinear modulation on the error, the error no longer has a random characteristic irrelevant to the input, and the statistical processing is not facilitated.

Aiming at the problems, the invention provides a brand-new method for overcoming the defects.

Disclosure of Invention

The invention discloses a device and a method for measuring the edge arrival time of an electric signal with picosecond resolution, which adopt a CMOS process, utilize a data and clock double delay chain and adopt a double-chain correlation locking mode to realize the method and the device for supporting the edge arrival time measurement of the electric signal with the picosecond resolution at one stroke.

An apparatus for picosecond resolution measurement of edge arrival times of electrical signals, the apparatus comprising: a measured signal/calibration selector MUX1, a measured signal chain composed of adjustable delay units DLY _ CELL, a clock signal/calibration selector MUX2, a clock signal chain composed of adjustable delay units DLY _ CELL, a plurality of data registers DREG, a plurality of synchronous register sets REGs and a calibration circuit CAL;

the inputs of the signal under test/calibration selector MUX1 are the calibration signal sig _ CAL from the external signals sig, CAL and the calibration enable CAL _ en of the external input, respectively;

the signal chain to be tested is formed by cascading a plurality of DLY _ CELL units, the DLY _ CELL units have a common control input C of a CAL unit, an inlet signal input of a first stage is an output from the MUX1, and each stage has a tap output;

the inputs to the clock signal/calibration selector MUX2 are the calibration clock ck _ CAL from the external clock inputs ck, CAL output and the calibration enable CAL _ en from the external input, respectively;

the clock signal chain is formed by cascading a plurality of DLY _ CELL units, wherein the DLY _ CELL units have a common control input C from a CAL unit, an inlet signal input of a first stage is an output from a MUX2, and each stage is provided with a tap output;

the clock input of the data register DREG comes from the tap output of the clock signal chain, the data input comes from the tap output of the tested signal chain, and the outputs of a plurality of DREGs form a bus d and are sent to the synchronous register group REGS;

preferably, the DLY _ CELL circuit structure adopts a two-stage cascade inverter, the input ends of the two-stage cascade inverter are I and C, the output end of the two-stage cascade inverter is O, the output stage of the first-stage inverter is connected with an adjustable equivalent capacitance system in parallel, the equivalent capacitance system is formed by connecting a capacitor and a variable capacitance diode in series, and the bias voltage of the variable capacitance diode is supplied by the input end C through a resistor.

Preferably, the device comprises a main/standby switching circuit, wherein the main/standby switching circuit comprises a port sig, a port ck _ o and a port dp _ o, the port sig is an input signal, and the port ck is an input reference clock; the port ck _ o is an output clock, and the dp _ o is output parallel data; the master-slave switching circuit further comprises a measuring device SYS _ A, SYS _ B, a master-slave scheduling unit SCH _ CTL and a measuring structure selection arbitration unit SEL _ ARB, wherein the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are connected in parallel, signals are input to the measuring device SYS _ A, SYS _ B through a port sig and a port ck, signals are input to the master-slave scheduling unit SCH _ CTL through the port ck, output ends of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are input to the measuring structure selection arbitration unit SEL _ ARB, the output end of the measuring structure selection arbitration unit SEL _ ARB is respectively connected with a port ck _ o and a port dp _ o, and connection of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH.

Preferably, the device is integrated on a silicon chip by adopting a CMOS (complementary metal oxide semiconductor) process, the same unit has consistent operating environment temperature and power supply voltage, and the manufacturing cost is reduced.

A measuring method corresponding to a device for measuring the arrival time of an electric signal edge with picosecond-level resolution is disclosed, wherein the device can work in two modes according to the mode specified by cal _ en in different time periods: a calibration mode and a measurement mode;

in calibration mode, the CAL unit outputs a calibration signal sig _ CAL and a calibration clock ck _ CAL, where the calibration signal enters a data delay chain consisting of several stages DLY _ CELL via MUX 1; the last stage output of the data delay chain is fed back to a calibration unit CAL, and the calibration unit adjusts the delay of the signal delay chain according to a clock technology and an edge time comparison method, so that the delay of the delay chain is equal to M times of a clock period; the calibration clock enters a clock delay chain consisting of a plurality of DLY _ CELL stages through MUX2, the output of the last stage of the data delay chain is fed back to a calibration unit, and the calibration unit adjusts the delay of the signal delay chain according to the clock technology and the edge time comparison method, so that the delay of the delay chain is equal to N times of the clock period, wherein N must be more than M, N, M is an integer;

in a measurement mode, an input end sig signal enters a data delay chain consisting of a plurality of stages of DLY _ CELL through a MUX1, and each stage of tap of the data delay chain is output to a corresponding data end of the DREG for registering; the clock input end ck enters a clock delay chain consisting of a plurality of DLY _ CELL stages through the MUX2, and each stage tap of the clock delay chain is output to the corresponding clock end of the DREG;

parallel data buses with linear delay difference are formed by the output of each stage of DREG, resynchronization and metastable state elimination are carried out by a later stage of REGs unit, the obtained data can accurately reflect the occurrence and time of input events, and theoretically the obtained time measurement granularity G is T/LCM (M, N); where T is the period of the input clock and LCM is the least common multiple function.

On the basis of the method and the device, the uninterrupted continuous operation of calibration and measurement is realized by adopting the main-standby switching. The measurement devices SYS _ a and SYS _ B are supplemented by an active master-slave scheduling unit SCH _ CTL to alternately initiate measurement and calibration at acceptable intervals in real time, with a certain protection overlap reserved for measurement time to prevent detection leakage. A measurement configuration selection arbitration unit SEL _ ARB is added at the exit to enable the measurement results to be output without omission.

In conclusion, the beneficial effects of the invention are as follows:

1) in a circuit (DIE) manufactured on the same silicon chip, the same units have the same operating environment temperature and the same power supply voltage within the process consistency range, so that a delay unit chain with equal delay difference can be obtained by controlling the layout and the wiring length after the units with better output isolation characteristics are cascaded. The delay of the delay unit can be finely adjusted by finely adjusting the equivalent node capacitance of the circuit.

2) For asynchronous signals with changing levels, when the signals are sampled by a clock, if a changing edge (insufficient setup or hold time) happens to be adopted, the output can linger in a linear region, namely a middle level for a long time due to insufficient input energy and cannot be used as a correct logic signal, and the state is called a metastable state. The circuit therefore needs to cancel the occurrence of the meta-stable output through the synchronizer.

3) Locking a delay chain: by controlling the delay of the delay cells in the delay chain by a fine feedback system, the delay of an integer multiple of the delay cells can be made exactly equal to the period of the measurement clock, so that expressing the delay by a real number in units of the period of the measurement clock becomes free of additional asynchronous rounding errors.

4) Continuous real-time calibration and measurement can be realized through main-standby switching.

Drawings

Fig. 1 is a general block diagram of the present invention.

FIG. 2 shows the structure of the delay CELL DLY _ CELL circuit of the present invention.

Fig. 3 illustrates the real-time measurement calibration achieved by the active/standby switching.

FIG. 4 shows embodiment 1.

FIG. 5 shows embodiment 2.

FIG. 6 shows embodiment 3.

Detailed Description

The following sets of 3 different parameters, which were introduced into the invention described above, resulted in 3 specific examples with different characteristics.

An apparatus for picosecond resolution measurement of edge arrival times of electrical signals, the apparatus comprising: a measured signal/calibration selector MUX1, a measured signal chain composed of adjustable delay units DLY _ CELL, a clock signal/calibration selector MUX2, a clock signal chain composed of adjustable delay units DLY _ CELL, a plurality of data registers DREG, a plurality of synchronous register sets REGs and a calibration circuit CAL;

the inputs of the signal under test/calibration selector MUX1 are the calibration signal sig _ CAL from the external signals sig, CAL and the calibration enable CAL _ en of the external input, respectively;

the signal chain to be tested is formed by cascading a plurality of DLY _ CELL units, the DLY _ CELL units have a common control input C of a CAL unit, an inlet signal input of a first stage is an output from the MUX1, and each stage has a tap output;

the inputs to the clock signal/calibration selector MUX2 are the calibration clock ck _ CAL from the external clock inputs ck, CAL output and the calibration enable CAL _ en from the external input, respectively;

the clock signal chain is formed by cascading a plurality of DLY _ CELL units, wherein the DLY _ CELL units have a common control input C from a CAL unit, an inlet signal input of a first stage is an output from a MUX2, and each stage is provided with a tap output;

the clock input of the data register DREG comes from the tap output of the clock signal chain, the data input comes from the tap output of the tested signal chain, and the outputs of a plurality of DREGs form a bus d and are sent to the synchronous register group REGS;

preferably, the DLY _ CELL circuit structure adopts a two-stage cascade inverter, the input ends of the two-stage cascade inverter are I and C, the output end of the two-stage cascade inverter is O, the output stage of the first-stage inverter is connected with an adjustable equivalent capacitance system in parallel, the equivalent capacitance system is formed by connecting a capacitor and a variable capacitance diode in series, and the bias voltage of the variable capacitance diode is supplied by the input end C through a resistor.

Preferably, the device comprises a main/standby switching circuit, wherein the main/standby switching circuit comprises a port sig, a port ck _ o and a port dp _ o, the port sig is an input signal, and the port ck is an input reference clock; the port ck _ o is an output clock, and the dp _ o is output parallel data; the master-slave switching circuit further comprises a measuring device SYS _ A, SYS _ B, a master-slave scheduling unit SCH _ CTL and a measuring structure selection arbitration unit SEL _ ARB, wherein the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are connected in parallel, signals are input to the measuring device SYS _ A, SYS _ B through a port sig and a port ck, signals are input to the master-slave scheduling unit SCH _ CTL through the port ck, output ends of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH _ CTL are input to the measuring structure selection arbitration unit SEL _ ARB, the output end of the measuring structure selection arbitration unit SEL _ ARB is respectively connected with a port ck _ o and a port dp _ o, and connection of the measuring device SYS _ A, SYS _ B and the master-slave scheduling unit SCH.

A method for measuring the edge arrival time of an electrical signal with picosecond resolution, the device can work in two modes according to the mode specified by cal _ en in different time periods: a calibration mode and a measurement mode;

in calibration mode, the CAL unit outputs a calibration signal sig _ CAL and a calibration clock ck _ CAL, where the calibration signal enters a data delay chain consisting of several stages DLY _ CELL via MUX 1; the last stage output of the data delay chain is fed back to a calibration unit CAL, and the calibration unit adjusts the delay of the signal delay chain according to a clock technology and an edge time comparison method, so that the delay of the delay chain is equal to M times of a clock period; the calibration clock enters a clock delay chain consisting of a plurality of DLY _ CELL stages through MUX2, the output of the last stage of the data delay chain is fed back to a calibration unit, and the calibration unit adjusts the delay of the signal delay chain according to the clock technology and the edge time comparison method, so that the delay of the delay chain is equal to N times of the clock period, wherein N must be more than M, N, M is an integer;

in a measurement mode, an input end sig signal enters a data delay chain consisting of a plurality of stages of DLY _ CELL through a MUX1, and each stage of tap of the data delay chain is output to a corresponding data end of the DREG for registering; the clock input end ck enters a clock delay chain consisting of a plurality of DLY _ CELL stages through the MUX2, and each stage tap of the clock delay chain is output to the corresponding clock end of the DREG;

parallel data buses with linear delay difference are formed by the output of each stage of DREG, resynchronization and metastable state elimination are carried out by a later stage of REGs unit, the obtained data can accurately reflect the occurrence and time of input events, and theoretically the obtained time measurement granularity G is T/LCM (M, N); where T is the period of the input clock and LCM is the least common multiple function.

The device is integrated on a silicon chip by adopting a CMOS (complementary metal oxide semiconductor) process, the same units have the same operating environment temperature and the same power supply voltage, and the manufacturing cost is reduced.