阅读说明：本技术 一种激光雷达调试装置及调试方法 (Laser radar debugging device and method ) 是由 丁志田 陈浩 严伟振 于 2021-09-29 设计创作，主要内容包括：本发明提供了一种激光雷达调试装置及调试方法,涉及激光雷达技术领域,用于对包括激光器组及激光透镜组的激光雷达发射端进行调测,激光器组上分布半导体激光二极管,激光雷达调试装置包括调试台、固定支架、调整支架、测试板、拍摄器、发散角测量机构及处理机构,固定支架用于固定激光透镜组,调整支架用于对激光器组进行调整,测试板相对调试台设置,测试板上绘制有参考标记,拍摄器用于对测试板进行拍摄,发散角测量机构用于对激光透镜组准直后的一束激光进行测量,处理机构用于显示拍摄器及发散角测量机构的测量结果,并确定调整结果。激光雷达调试装置及调试方法可同时调整方位角及发散角,调试简便,提高了调试的效率。(The invention provides a laser radar debugging device and a laser radar debugging method, relates to the technical field of laser radars, and is used for debugging and testing a laser radar transmitting end comprising a laser group and a laser lens group, wherein semiconductor laser diodes are distributed on the laser group, the laser radar debugging device comprises a debugging table, a fixed support, an adjusting support, a testing plate, a shooting device, a divergence angle measuring mechanism and a processing mechanism, the fixed support is used for fixing the laser lens group, the adjusting support is used for adjusting the laser group, the testing plate is arranged relative to the debugging table, a reference mark is drawn on the testing plate, the shooting device is used for shooting the testing plate, the divergence angle measuring mechanism is used for measuring a beam of laser after the laser lens group is collimated, and the processing mechanism is used for displaying the measuring results of the shooting device and the divergence angle measuring mechanism and determining the adjusting result. The laser radar debugging device and the laser radar debugging method can simultaneously adjust the azimuth angle and the divergence angle, are simple and convenient to debug and improve the debugging efficiency.)

1. A laser radar debugging device is characterized in that the device is used for debugging and testing a laser radar transmitting end, the laser radar transmitting end comprises a laser group and a laser lens group, a plurality of semiconductor laser diodes are distributed on the laser group, the laser radar debugging device comprises a debugging table, a fixed support, an adjusting support, a testing plate, a shooting device, a divergence angle measuring mechanism and a processing mechanism, the fixed support and the adjusting support are fixed on the debugging table, the fixed support is used for fixing the laser lens group, the adjusting support is used for fixing the laser group and adjusting the laser group, the testing plate is arranged opposite to the debugging table, a reference mark is drawn on the testing plate, the shooting device and the divergence angle measuring mechanism are electrically connected with the processing mechanism, and the shooting device is used for shooting the testing plate, the divergence angle measuring mechanism is used for measuring a beam of laser after the laser lens group is collimated, and the processing mechanism is used for displaying the measuring results of the shooting device and the divergence angle measuring mechanism and determining an adjusting result.

2. The lidar debugging device of claim 1, wherein the divergence angle measuring mechanism comprises a lens barrel, an attenuation plate, a double cemented lens, an optical filter and an industrial camera, the attenuation plate, the double cemented lens, the optical filter and the industrial camera are sequentially disposed in the lens barrel, the attenuation plate is configured to attenuate laser light entering the lens barrel to a range that the industrial camera can bear, and the optical filter is configured to filter ambient light around.

3. The lidar debugging device of claim 1, wherein a power supply is disposed on said debugging platform for supplying power to said laser group.

4. The lidar debugging device of claim 1, wherein a positioning structure is disposed on the fixed bracket, and the positioning structure is configured to position the position of the laser lens assembly, so as to keep the laser lens assembly horizontal.

5. The lidar debugging device of claim 1, wherein said adjustment bracket is a manual adjustment bracket.

6. The lidar debugging device of claim 1, wherein said reference marks are drawn on said test board according to the distribution positions of semiconductor laser diodes on said laser group.

7. The lidar debugging device of claim 1, wherein said camera is an infrared CCD camera.

8. The lidar debugging device of claim 1, wherein said processing mechanism comprises a dual-display computer.

9. A debugging method, based on the lidar debugging apparatus of any one of claims 1 to 8, characterized in that the debugging method comprises:

placing a laser radar transmitting end with debugging function in the laser radar debugging device;

projecting the laser emitted by the laser group onto the test board;

monitoring the laser emitted by the laser group through the shooting device and the divergence angle measuring mechanism;

adjusting the position of the laser group through the adjusting bracket;

and fixing the adjusted and measured laser radar transmitting end.

10. The commissioning method of claim 9, wherein the divergence angle measuring mechanism determines its divergence angle by measuring the beam width or beam diameter at the focal plane of the focusing element.

Technical Field

The invention relates to the technical field of laser radars, in particular to a laser radar debugging device and a laser radar debugging method.

Background

With the development of the photoelectric technology, the laser radar is more and more widely applied to scenes such as automatic driving, surveying and mapping, robot navigation, space modeling and the like, and meanwhile, the requirement on the distance measuring capability of the laser radar is higher and higher. At present, most of mechanical laser radars for automatic driving are based on a pulse laser ranging principle, and most of used lasers are semiconductor lasers. The semiconductor laser has small volume, light weight, safe use and low maintenance cost, so the application field of the semiconductor laser is increasingly expanded. However, semiconductor lasers have the following disadvantages: the performance is greatly influenced by temperature, the divergence angle of a light beam is large (generally, the divergence angle between a few degrees and 20 degrees exists between a fast axis and a slow axis of a semiconductor laser, the divergence angle between the fast axis and the slow axis is greatly different, and the divergence angle in the direction of the fast axis is far larger than that in the direction of the slow axis), so that the semiconductor laser is poor in the aspects of directivity, monochromaticity, coherence and the like. Therefore, the semiconductor laser needs to be collimated by the emission optical system, so that the laser spot becomes large, the beam divergence angle becomes small, and the beam directivity becomes good, and is used in the laser radar. During the assembly and debugging process of the laser radar, the azimuth angles of a plurality of beams of emitted laser light and the divergence angle of each beam of laser light must be ensured.

In the prior art, the existing laser radar emission debugging scheme is mainly adopted, a plurality of semiconductor lasers are placed on one circuit board, a plurality of circuit boards are placed in parallel, and each circuit board is independent and movable, so that the problem that the vertical field angle resolution of the laser radar is too low can be effectively solved, however, each circuit board needs to be independently debugged, and when the field angle of the laser radar is larger and the vertical resolution is higher, more circuit boards need to be debugged, so that the debugging time is long and the difficulty is great; and because the movable part is too many, fixed difficulty after debugging, need fix for every moving part, producibility is relatively poor.

Disclosure of Invention

In order to overcome the defects in the prior art, the application provides a laser radar debugging device and a laser radar debugging method.

The application provides a laser radar debugging device for debugging and surveying laser radar transmitting end, laser radar transmitting end includes laser unit group and laser lens group, it has a plurality of semiconductor laser diode to distribute on the laser unit group, laser radar debugging device includes debugging platform, fixed bolster, adjustment support, survey test panel, shooting device, divergence angle measuring mechanism and processing mechanism, the fixed bolster reaches the adjustment support is fixed in on the debugging platform, the fixed bolster is used for fixing the laser lens group, the adjustment support is used for fixing the laser unit group, and adjust the laser unit group, survey the test panel and relatively the debugging platform sets up, draw the reference mark on surveying the board, the shooting device reaches divergence angle measuring mechanism and processing mechanism electricity are connected, the shooting device is used for surveying the test panel and shoot, the divergence angle measuring mechanism is used for measuring a beam of laser after the laser lens group is collimated, and the processing mechanism is used for displaying the measuring results of the shooting device and the divergence angle measuring mechanism and determining an adjusting result.

In a possible implementation manner, the divergence angle measuring mechanism includes a lens barrel, an attenuation sheet, a double cemented lens, an optical filter, and an industrial camera, where the attenuation sheet, the double cemented lens, the optical filter, and the industrial camera are sequentially disposed in the lens barrel, the attenuation sheet is configured to attenuate laser light entering the lens barrel to a range that the industrial camera can bear, and the optical filter is configured to filter ambient light around.

In a possible embodiment, a power supply is provided on the commissioning table for supplying power to the laser group.

In a possible implementation manner, a positioning structure is arranged on the fixed support, and the positioning structure is used for positioning the position of the laser lens group so as to enable the laser lens group to be kept horizontal.

In one possible embodiment, the adjustment bracket is a manual adjustment bracket.

In a possible embodiment, the reference marks are drawn on the test board according to the distribution of the semiconductor laser diodes on the laser group.

In one possible embodiment, the camera is an infrared CCD camera.

In one possible embodiment, the processing mechanism employs a dual display computer.

The application provides a debugging method, which comprises the following steps:

placing a laser radar transmitting end with debugging function in the laser radar debugging device;

projecting the laser emitted by the laser group onto the test board;

monitoring the laser emitted by the laser group through the shooting device and the divergence angle measuring mechanism;

adjusting the position of the laser group through the adjusting bracket;

and fixing the adjusted and measured laser radar transmitting end.

In one possible embodiment, the divergence angle measuring device determines the divergence angle of the focusing element by measuring the beam width or beam diameter at the focal plane of the focusing element.

Compared with the prior art, the beneficial effects of the application are that:

the application provides a laser radar debugging device and debugging method, adopt the laser instrument integrated laser unit together to through survey test panel with the predetermined position mark of laser unit facula, through the position of shooter monitoring facula, simultaneously, measure one of them laser through divergence angle measuring mechanism, can confirm azimuth angle and divergence angle simultaneously, adjust azimuth angle and divergence angle simultaneously, the number of times of reducible debugging, the debugging is simple and convenient, the efficiency of debugging has been improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 shows a schematic structural diagram of a laser radar debugging apparatus according to an embodiment of the present application;

fig. 2 shows a schematic structural diagram of a laser group to be debugged in the present application;

FIG. 3 is a schematic diagram of an adjusting bracket of the laser radar debugging device shown in FIG. 1;

FIG. 4 is a schematic view of another view of the adjustment bracket of FIG. 3;

fig. 5 is an enlarged schematic view showing a partial structure of the laser radar debugging apparatus shown in fig. 1;

fig. 6 is a schematic structural diagram showing a divergence angle measuring mechanism of the laser radar debugging apparatus shown in fig. 1.

Description of the main element symbols:

100-laser radar debugging device; 10-debugging platform; 11-a power supply; 20-fixing a bracket; 30-adjusting the support; 40-a test board; 50-a camera; 60-a divergence angle measuring mechanism; 61-a lens barrel; 62-an attenuation sheet; 63-double cemented lens; 64-an optical filter; 65-industrial cameras; 70-a processing mechanism; 200-laser radar transmitting end; 201-laser group; 202-laser lens group.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

Example one

Referring to fig. 1, an embodiment of the present application provides a laser radar debugging apparatus 100. The laser radar debugging apparatus 100 is used for debugging and measuring the azimuth angle and the divergence angle of the laser radar transmitting end 200, so as to ensure the ranging distance and the ranging precision of the laser radar 200.

The laser radar transmitting end 200 includes a laser group 201 and a laser lens group 202. The laser lens group 202 is used for collimating the laser light emitted by the laser group 201.

As shown in fig. 2, in the present embodiment, the laser group 201 is a multi-line semiconductor emitting device, and a plurality of semiconductor laser diodes are precisely distributed in the emitting device according to a pre-design, and the position of each semiconductor laser diode is precisely processed according to the design, so that the heat dissipation is better.

Since the semiconductor laser diodes are the same parts, the divergence angle of each path of laser light is the same.

In this embodiment, the semiconductor laser diode emits infrared laser light.

The laser lens group 202 is provided with a laser radar emitting lens group and a receiving lens group, the emitting lens group is used for emitting laser emitted by the laser group 201 in a collimating way, and the receiving lens group is used for collecting scattered light returning from a target.

The laser radar debugging apparatus 100 includes a debugging table 10, a fixing support 20, an adjusting support 30, a testing board 40, a camera 50, a divergence angle measuring mechanism 60, and a processing mechanism 70.

The debugging table 10 is used for fixing the fixing support 20 and the adjusting support 30. The debugging station 10 provides a robust working table for laser debugging, and can adjust the level of corresponding elements.

In some embodiments, the debugging table 10, the fixing bracket 20 and the adjusting bracket 30 are fixed in relative position, and the fixing bracket 20 and the debugging table 10 are kept horizontal, so as to facilitate debugging.

In some embodiments, a power supply 11 is further disposed on the debugging table 10 for supplying power to the laser group 201. But not limited thereto, in other embodiments, the laser group 201 may also be powered by an external wire.

The fixing bracket 20 is used for fixing the laser lens group 202.

In some embodiments, the fixing bracket 20 is provided with a positioning structure, which can position the position of the laser lens group 202 to keep the laser lens group 202 horizontal.

Referring to fig. 3 and fig. 4, the adjusting bracket 30 is used for fixing the laser set 201 and adjusting the laser set 201. The adjusting bracket 30 can adjust the vertical position, the horizontal position, the front-back position and the left-right direction inclination of the laser group 201 relative to the laser lens group 202.

In some embodiments, the adjustment bracket 30 is a manually adjustable adjustment bracket, but is not limited thereto, and in other embodiments, the adjustment bracket 30 may be a motor-driven automated adjustment bracket.

The test board 40 is arranged opposite to the debugging table 10, the test board 40 is a projection position where the laser group 201 emits laser, and reference marks are drawn on the test board 40 and drawn on the test board 40 according to the distribution position of the semiconductor laser diodes on the laser group 201. That is, the reference mark is obtained from the position of the light spot formed on the test board 40 by the laser light emitted from each semiconductor laser diode of the laser group 201 after the accurate debugging.

In some embodiments, the relative position between the test board 40 and the debugging station 10 is fixed, facilitating debugging.

The shooting end of the camera 50 faces the test board 40, and is used for shooting the light spots and the reference marks emitted by the laser groups 201 on the test board 40. Thereby adjusting the laser group 201 according to its relative position.

In some embodiments, the relative position between the camera 50 and the test board 40 is fixed, facilitating debugging.

In some embodiments, the corresponding camera 50 is an infrared CCD (Charge-coupled Device) camera.

The divergence angle measuring mechanism 60 is used for measuring a laser beam collimated by the laser lens group 202 to determine the divergence angle of the laser beam. The laser group 201 can be adjusted according to its divergence angle.

In order to ensure that the divergence angle of the laser beam is within the preset range, the light emitting surface of the laser group 201 must be near the focal plane of the emitting lens group of the laser lens group 202 to ensure the minimum divergence angle of the laser beam, which can be realized by adjusting the front-back distance between the laser group 201 and the laser lens group 202.

The processing means 70 is electrically connected to the camera 50 and the divergence angle measuring means 60. The processing unit 70 can display the measurement results of the imaging device 50 and the divergence angle measuring unit 60, and determine the adjustment result according to the measurement results of the imaging device 50 and the divergence angle measuring unit 60.

In some embodiments, the processing mechanism 70 is a computer and employs dual displays to simultaneously display the measurement results of the camera 50 and the divergence angle measuring mechanism 60. But not limited thereto, in other embodiments, the processing mechanism 70 further uses a single-display computer to switch and display the measurement results of the camera 50 and the divergence angle measuring mechanism 60, or uses a display screen to display the measurement result of the camera 50, and uses a single-chip microcomputer or the like to display the measurement result of the divergence angle measuring mechanism 60 numerically.

Referring to fig. 5, during debugging, first, the laser lens group 202 to be debugged is fixed on the fixed support 20, and the optical axis of the laser lens group 202 is ensured to be perpendicular to the plane of the test board 40, and the laser group 201 to be debugged is fixed on the adjusting support 30, and the bottom edge of the laser group 201 is ensured to be parallel to the table surface of the debugging table 10; connecting a power supply 11 and a laser group 201, turning on the power supply 11, enabling the laser group 201 to emit multi-line infrared laser, and adjusting an adjusting bracket 30 to enable the laser emitted by the laser group 201 to penetrate through a laser lens group 202 and then to strike a test board 40; aligning the camera 50 with the test board 40, aligning the divergence angle measuring mechanism 60 with one laser beam collimated by the laser lens group 202, and ensuring that other laser beams are not blocked, so that the measurement results of the camera 50 and the divergence angle measuring mechanism 60 are displayed in the processing mechanism 70; by adjusting the adjusting bracket 30, specifically, by adjusting the up-down position, the left-right position, the front-back position, and the left-right direction inclination of the laser group 201, the light spots of the laser group 201 monitored by the camera 50 are all adjusted to the reference mark (within the adjustment error range); meanwhile, the divergence angle of the laser beam monitored by the divergence angle measuring mechanism 60 is adjusted to be within a preset range by adjusting the adjusting bracket 30, specifically by adjusting the front-back distance between the laser group 201 and the laser lens group 202, and since the semiconductor laser diodes in the laser group 201 are the same component, the divergence angle of one path of the laser beam in the laser group 201 can be monitored to ensure the divergence angles of other paths of the laser beam; when the spot position monitored by the camera 50 is at the reference mark and the divergence angle of the laser beam measured by the divergence angle measuring mechanism 60 is within the preset range, the debugging process is completed; finally, the set of laser 201 and the set of laser lenses 202 are fixed together by glue or other fixing members.

And after the solidification bonding is completed, removing the laser group 201 and the laser lens group 202 which are connected together.

The laser radar debugging device 100 provided by the embodiment integrates the lasers through the laser group 201, marks the preset positions of the light spots of the laser group 201 through the test board 40, monitors the positions of the light spots through the shooting device 50, and simultaneously measures one laser beam through the divergence angle measuring mechanism 60, so that the azimuth angle and the divergence angle can be determined at the same time, the azimuth angle and the divergence angle can be adjusted at the same time, the debugging frequency can be reduced, the debugging is simple and convenient, and the debugging efficiency is improved.

Example two

Referring to fig. 1 to fig. 6, the lidar debugging apparatus 100 according to the present embodiment may be used for debugging a lidar transmitting end 200. The present embodiment is an improvement on the technology of the first embodiment, and compared with the first embodiment, the difference is that:

as shown in fig. 6, the divergence angle measuring mechanism 60 includes a lens barrel 61, an attenuation sheet 62, a double cemented lens 63, a filter 64, and an industrial camera 65. The attenuation sheet 62, the double cemented lens 63, the optical filter 64, and the industrial camera 65 are sequentially disposed in the lens barrel 61. The attenuation sheet 62 attenuates the laser light entering the lens barrel 61 to a range that the industrial camera 65 can bear, and the optical filter 64 filters ambient light around, so as to provide a low-background-noise working environment for the detection of the industrial camera 65.

In this embodiment, the focal length of the cemented doublet 63 is 500 mm. The industrial camera 65 is a CCD camera having a CCD pixel size of 2.4 μm × 2.4 μm, a photosensitive surface size of 1 inch (13.19mm × 8.81mm), and a resolution of 5496 × 3672, and the exposure level of the CCD can be adjusted by adjusting the acquisition time in the software interface of the processing mechanism 70.

The divergence angle measuring method and principle of the divergence angle measuring mechanism 60 refer to the test method part 1 of GB/T26599.1-2011/ISO11146-1:2005 laser and laser related equipment laser beam width, divergence angle and beam transmission ratio: non-astigmatic and simple astigmatic beams, and measuring the divergence angle of laser emitted by the range radar by using a lens conversion method.

The specific method is to determine the divergence angle of the focusing element by measuring the width or diameter of the beam on the focal plane of the focusing element.

First, the laser beam should be transformed using an aberration-free focusing element. For a simple astigmatic beam, beam widths d σ xf and d σ yf are measured at a distance f from the principal plane behind the focusing element by one focal length, and the corresponding divergence angles Θ σ x and Θ σ y are determined by the following two equations;

and

the minimum angle that can be resolved by the optical system is 0.023mrad, and the divergence angle measurement range is approximately 26.34mrad horizontally and 17.6mrad vertically.

EXAMPLE III

Referring to fig. 1 to 6, the present embodiment further provides a debugging method for debugging the laser radar transmitting end 200, so as to improve the ranging distance and the ranging accuracy of the laser radar 200. The debugging method of the present embodiment is completed based on the laser radar debugging apparatus 100 provided in the above-described embodiment. The debugging method comprises the following steps:

s101: a laser radar debugging apparatus 100 is provided.

Specifically, the debugging table 10, the fixing bracket 20 and the adjusting bracket 30 are fixed in relative position, and the fixing bracket 20 and the debugging table 10 are kept horizontal. The test board 40 is disposed opposite to the debugging table 10, and the relative position is fixed. The relative position between the camera 50 and the test plate 40 is fixed.

S102: the laser radar transmitting end 200 with the debugging function is placed in the laser radar debugging device 100.

Specifically, the laser group 201 is fixed on the adjusting bracket 30, the bottom edge of the laser group 201 is ensured to be parallel to the table top of the debugging table 10, the laser lens group 202 is fixed on the fixing bracket 20 through a positioning structure, and the laser lens group 202 is kept horizontal.

S103: the laser light emitted by the laser group 201 is projected onto the test board 40.

Specifically, the power supply 11 and the laser set 201 are connected, the power supply 11 is turned on, the laser set 201 emits multi-line infrared laser, and the laser emitted by the laser set 201 penetrates through the laser lens set 202 and then strikes the test board 40 by adjusting the adjusting bracket 30.

S104: the laser light emitted by the laser group 201 is monitored.

The laser emitted from the laser group 201 is monitored by the camera 50 and the divergence angle measuring mechanism 60. Specifically, the camera 50 is aligned with the test board 40, the divergence angle measuring mechanism 60 is aligned with one laser beam collimated by the laser lens group 202, and other laser beams are ensured not to be blocked, so that the measurement results of the camera 50 and the divergence angle measuring mechanism 60 are displayed in the processing mechanism 70.

S105: the position of the laser group 201 is adjusted.

Specifically, by adjusting the adjusting bracket 30, specifically by adjusting the up-down position, the left-right position, the front-back position, and the left-right direction inclination of the laser group 201, the light spots of the laser group 201 monitored by the camera 50 are all adjusted to the reference mark (within the adjustment error range); meanwhile, the divergence angle of the laser beam monitored by the divergence angle measuring mechanism 60 is adjusted to be within a preset range by adjusting the adjusting bracket 30, specifically, by adjusting the front-back distance between the laser group 201 and the laser lens group 202.

Since the semiconductor laser diodes in the laser group 201 are the same components, monitoring the divergence angle of one path of laser beam in the laser group 201 can ensure the divergence angles of other multiple paths of laser beams.

S106: and fixing the adjusted laser radar transmitting end 200.

Specifically, when the spot position monitored by the camera 50 is at the reference mark and the divergence angle of the laser beam measured by the divergence angle measuring mechanism 60 is within the preset range, the commissioning process is completed, and the commissioned laser group 201 and the laser lens group 202 are fixed together with glue or other fixing members.

And after the glue is cured and bonded, removing the laser group 201 and the laser lens group 202 which are connected together.

The debugging method provided by the embodiment adopts the laser group 201 with integrated lasers, marks the preset position of the light spot of the laser group 201 through the test board 40, monitors the position of the light spot through the shooting device 50, measures one laser beam through the divergence angle measuring mechanism 60, can simultaneously determine the azimuth angle and the divergence angle, simultaneously adjusts the azimuth angle and the divergence angle, can reduce the debugging frequency, is simple and convenient to debug, and improves the debugging efficiency.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.