阅读说明：本技术 用于飞行时间和接近度的测量的半导体装置和方法 (Semiconductor device and method for time-of-flight and proximity measurements ) 是由 马丁·闵采尔 于 2018-12-03 设计创作，主要内容包括：一种电磁辐射的发射器(12),该发射器被配置用于提供不同宽度的照明场的运行模式,和光电检测器(11),该光电检测器被配置用于通过检测由发射器发射并且被反射到光电检测器的电磁辐射来进行飞行时间和接近度的测量。发射器由驱动器(13)操作,该驱动器(13)被配置用于运行模式之间的交替。当照明场窄时执行飞行时间测量,并且当照明场宽时执行接近度或环境光测量。(An emitter (12) of electromagnetic radiation configured to provide operating modes of illumination fields of different widths, and a photodetector (11) configured to make time-of-flight and proximity measurements by detecting electromagnetic radiation emitted by the emitter and reflected to the photodetector. The transmitter is operated by a driver (13), which driver (13) is configured for alternating between the operation modes. Time-of-flight measurements are performed when the illumination field is narrow, and proximity or ambient light measurements are performed when the illumination field is wide.)