阅读说明：本技术 半导体装置 (Semiconductor device with a plurality of semiconductor chips ) 是由 杨吴德 于 2020-11-11 设计创作，主要内容包括：本发明公开了一种半导体装置,包括基板以及芯片。芯片设置于基板上,且芯片包括主动表面及至少一个金属垫。金属垫设置于主动表面上,金属垫包括第一垫部及第二垫部,第一垫部及第二垫部相互分离以形成开路,其中第一垫部包括凸起结构,第二垫部包括凹入结构,第一垫部的凸起结构朝向第二垫部的凹入结构延伸,凸起结构与凹入结构提供导电物质的附载平台并增加所填入导电物质与金属垫之间的接触面积。(The invention discloses a semiconductor device, which comprises a substrate and a chip. The chip is arranged on the substrate and comprises an active surface and at least one metal pad. The metal pad is arranged on the active surface and comprises a first pad part and a second pad part, the first pad part and the second pad part are separated from each other to form an open circuit, the first pad part comprises a convex structure, the second pad part comprises a concave structure, the convex structure of the first pad part extends towards the concave structure of the second pad part, and the convex structure and the concave structure provide a loading platform for the conductive substance and increase the contact area between the filled conductive substance and the metal pad.)

1. A semiconductor device, comprising:

a substrate; and

a chip disposed on the substrate, the chip comprising:

an active surface; and

at least one metal pad disposed on the active surface, each of the metal pads including a first pad portion and a second pad portion separated from each other to form an open circuit, wherein the first pad portion includes a convex structure, the second pad portion includes a concave structure, and the convex structure of the first pad portion extends toward the concave structure of the second pad portion.

2. The semiconductor device of claim 1, wherein the recessed structure of the second pad surrounds the raised structure of the first pad.

3. The semiconductor device of claim 1, further comprising at least one metal ball contacting the first pad and the second pad to form a closed circuit.

4. The semiconductor device according to claim 3, wherein the metal ball contacts at least the convex structure of the first pad and the concave structure of the second pad.

5. The semiconductor device of claim 1, wherein the at least one metal pad of the chip comprises a first metal pad and a second metal pad, the first pad portion of the first metal pad contacting the first pad portion of the second metal pad.

6. The semiconductor device of claim 1, wherein the at least one metal pad of the chip comprises a first metal pad and a second metal pad, the second pad portion of the first metal pad contacting the second pad portion of the second metal pad.

7. The semiconductor device of claim 1, wherein the at least one metal pad of the chip comprises a first metal pad and a second metal pad, the first pad portion of the first metal pad contacting the second pad portion of the second metal pad.

8. The semiconductor device of claim 1, wherein the at least one metal pad of the chip comprises a first metal pad, the semiconductor device further comprising:

a first transceiver comprising an output, wherein the output is electrically connected to the first pad portion of the first metal pad; and

a second transceiver comprising an input, wherein the input is electrically connected to the second pad portion of the first metal pad.

9. The semiconductor device of claim 8, wherein the at least one metal pad of the chip comprises a second metal pad, wherein the second pad portion of the first metal pad contacts the first pad portion or the second pad portion of the second metal pad.

10. The semiconductor device of claim 8, wherein the at least one metal pad of the chip comprises an input metal pad, wherein the first pad portion or the second pad portion of the input metal pad is electrically connected to an input terminal of the first transceiver.

11. A semiconductor device, comprising:

a substrate;

a main chip disposed on the substrate, the main chip including:

an active surface; and

at least one metal pad disposed on the active surface; and

at least one sub-chip stacked on the active surface of the main chip, the sub-chip comprising:

a first active surface; and

at least one pad disposed on the first movable surface, each pad including a first pad portion and a second pad portion separated from each other to form an open circuit, wherein the first pad portion includes a convex structure, the second pad portion includes a concave structure, and the convex structure of the first pad portion extends toward the concave structure of the second pad portion.

12. The semiconductor device according to claim 11, wherein the concave structure of the second pad portion surrounds the convex structure of the first pad portion.

13. The semiconductor device according to claim 11, further comprising at least one solder ball, wherein the solder ball contacts the first pad portion and the second pad portion to form a closed circuit, and the solder ball is electrically connected to the metal pad of the main chip through a conductive wire.

14. The semiconductor device according to claim 13, wherein the solder ball contacts the convex structure of the first pad portion and the concave structure of the second pad portion.

15. The semiconductor device of claim 11, wherein the at least one pad of the sub-chip comprises a first pad and a second pad, and the first pad portion of the first pad contacts the first pad portion of the second pad.

16. The semiconductor device of claim 11, wherein the at least one pad of the sub-chip comprises a first pad and a second pad, and the second pad portion of the first pad contacts the second pad portion of the second pad.

17. The semiconductor device of claim 11, wherein the at least one pad of the sub-chip comprises a first pad and a second pad, and the first pad portion of the first pad contacts the second pad portion of the second pad.

18. The semiconductor device of claim 11, wherein the at least one pad comprises a first pad, and the chiplet further comprises:

a first transceiver comprising an output, wherein the output is electrically connected to the first pad portion of the first pad; and

a second transceiver comprising an input terminal, wherein the input terminal is electrically connected to the second pad portion of the first pad.

19. The semiconductor device according to claim 18, wherein the at least one pad comprises a second pad, wherein the second pad portion of the first pad contacts the first pad portion or the second pad portion of the second pad.

20. The semiconductor device according to claim 18, wherein the at least one pad comprises an input pad, and the first pad portion or the second pad portion of the input pad is electrically connected to an input terminal of the first transceiver.

Technical Field

The present invention relates to a semiconductor device, and more particularly, to a semiconductor device for three-dimensional packaging.

Background

The stacked semiconductor package device is fabricated by stacking and assembling a top semiconductor package device on a bottom semiconductor package structure. The top and bottom semiconductor packages may be electrically connected and/or physically coupled together at an interface therebetween.

Further, the bottom semiconductor package structure is electrically connected to a circuit on the printed circuit board through the interconnection structure, and the stacked semiconductor package device is mounted on the printed circuit board. Accordingly, the stack type packaging apparatus can stack and mount two semiconductor package structures on a printed circuit board.

To manufacture a stacked type semiconductor package device that is easy to assemble, less costly, and more robust, companies and academia have invested a great deal of resources to study related technologies.

Disclosure of Invention

In view of the above, an object of the present invention is to provide a semiconductor device that can solve the above problems.

In order to achieve the above object, one embodiment of the present invention discloses a semiconductor device including a substrate and a chip. The chip is arranged on the substrate and comprises an active surface and at least one metal pad. Each metal pad is arranged on the active surface and comprises a first pad part and a second pad part, the first pad part and the second pad part are separated from each other to form an open circuit, the first pad part comprises a convex structure, and the second pad part comprises a concave structure. In addition, the convex structures of the first pad extend toward the concave structures of the second pad.

In one or more embodiments of the invention, the concave structure of the second mat surrounds the convex structure of the first mat.

In one or more embodiments of the present invention, the semiconductor device further includes at least one metal ball contacting the first pad and the second pad to form a closed circuit.

In one or more embodiments of the invention, the metal balls contact at least the convex structures of the first pad and the concave structures of the second pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes a first metal pad and a second metal pad, and the first pad portion of the first metal pad contacts the first pad portion of the second metal pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes a first metal pad and a second metal pad, and the second pad portion of the first metal pad contacts the second pad portion of the second metal pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes a first metal pad and a second metal pad, and the first pad portion of the first metal pad contacts the second pad portion of the second metal pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes a first metal pad, the semiconductor device further includes a first transceiver and a second transceiver, the first transceiver includes an output terminal, and the output terminal is electrically connected to the first pad portion of the first metal pad. The second transceiver comprises an input end, wherein the input end is electrically connected with the second pad part of the first metal pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes a second metal pad, wherein the second pad portion of the first metal pad contacts the first pad portion or the second pad portion of the second metal pad.

In one or more embodiments of the present invention, the at least one metal pad of the chip includes an input metal pad, wherein a first pad portion or a second pad portion of the input metal pad is electrically connected to the input terminal of the first transceiver.

Another semiconductor device includes a substrate, a main chip, and at least one sub-chip. The main chip is arranged on the substrate and comprises an active surface and at least one metal pad. The metal pad is disposed on the active surface. At least one sub-chip is stacked on the active surface of the main chip, and the sub-chip comprises a first active surface and at least one welding pad. At least one pad is disposed on the first movable surface, each pad including a first pad portion and a second pad portion separated from each other to form an open circuit, wherein the first pad portion includes a convex structure, the second pad portion includes a concave structure, and the convex structure of the first pad portion extends toward the concave structure of the second pad portion.

In one or more embodiments of the present invention, the concave structure of the second pad portion surrounds the convex structure of the first pad portion.

In one or more embodiments of the present invention, the semiconductor device further includes at least one solder ball, the solder ball contacts the first pad portion and the second pad portion to form a closed circuit, and the solder ball is electrically connected to the metal pad of the main chip through the conductive wire.

In one or more embodiments of the present invention, the solder ball contacts the convex structure of the first pad portion and the concave structure of the second pad portion.

In one or more embodiments of the present invention, the at least one pad of the sub-chip includes a first pad and a second pad, and the first pad portion of the first pad contacts the first pad portion of the second pad.

In one or more embodiments of the present invention, the at least one pad of the sub-chip includes a first pad and a second pad, and the second pad portion of the first pad contacts the second pad portion of the second pad.

In one or more embodiments of the present invention, the at least one pad of the sub-chip includes a first pad and a second pad, and the first pad portion of the first pad contacts the second pad portion of the second pad.

In one or more embodiments of the present invention, the at least one pad includes a first pad, and the sub-chip further includes a first transceiver and a second transceiver. The first transceiver comprises an output end, wherein the output end is electrically connected with the first pad part of the first pad. The second transceiver includes an input terminal electrically connected to the second pad portion of the first pad.

In one or more embodiments of the present invention, the at least one pad includes a second pad, wherein the second pad portion of the first pad contacts the first pad portion or the second pad portion of the second pad.

In one or more embodiments of the present invention, at least one pad includes an input pad, and a first pad portion or a second pad portion of the input pad is electrically connected to the input terminal of the first transceiver.

In summary, the metal pads on the chip include the first metal pad portion and the second metal pad portion separated from each other to form an open circuit. The metal ball can be selectively formed on the metal pad, so as to form a closed circuit between the first metal pad portion and the second metal pad portion. By selectively forming the metal balls, the circuit of the chip can be simply and rapidly adjusted, and thus the chip can be applied to the field of packaging of semiconductors to reduce the production cost. In addition, the convex structure of the first metal pad part extends towards the concave structure of the second metal pad part, thereby providing a loading platform and increasing the contact area between the metal ball and the metal pad.

The foregoing is merely illustrative of the problems to be solved, solutions to problems, and effects produced by the present invention, and specific details thereof are set forth in the following description and the related drawings.

Drawings

In order to describe the manner in which the above-recited and other advantages and features of the invention can be obtained, a more particular description of the principles briefly described above will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings. The drawings are only for purposes of illustrating the invention and are not to be construed as limiting the scope. The principles of the present invention will be clearly explained with reference to the accompanying drawings, in which additional features and details are fully present, and in which:

fig. 1 illustrates a schematic perspective view of a semiconductor device, according to some embodiments of the present invention;

FIG. 2 is a schematic circuit diagram of a chip of the semiconductor device of FIG. 1;

FIG. 3 illustrates a schematic perspective view of a semiconductor device, according to some embodiments of the present invention;

FIG. 4 is a schematic circuit diagram of a main chip and a sub-chip of the semiconductor device shown in FIG. 3;

FIG. 5 illustrates a schematic perspective view of a semiconductor device, according to some embodiments of the present invention;

FIG. 6 is a schematic circuit diagram of a main chip and a sub-chip of the semiconductor device shown in FIG. 5;

FIG. 7 illustrates a schematic perspective view of a semiconductor device, according to some embodiments of the present invention; FIG. 8 is a circuit diagram of a main chip and a sub-chip of the semiconductor device shown in FIG. 7.

Description of the main reference numerals:

100,300,300a,300 b-semiconductor devices; 110, 310-substrate; 111-a contact pad; 150,150a,350 a,350b,350c,350 d-metal spheres; 200-chip; 210, 410-active surface; 230, 430-metal pad; 230a,430 a-first metal pad; 230b,430 b-second metal pad; 230c,430 c-third metal pad; 230d,430 d-input metal pad; 231,231a,231b,231c,231 d-first pad; 431,431a,431b,431c,431 d-first pad; 233,233a,233b,233c,233 d-second pad; 433,433a,433b,433c,433 d-second pad; 260,460,560-a first transceiver; 261,271,561,571-output terminal; 263,273,563,573-input terminal; 270,470,570-a second transceiver; 400-a main chip; 500-daughter chip; 500 a-first sub-chip; 500 b-a second chiplet; 500 c-a third chiplet; 510-a first active surface; 530-bonding pad; 530 a-first pad; 530 b-second pad; 530 c-third pad; 530 d-input pad; 531,531a,531b,531c,531 d-first pad portions; 533,533a,533b,533c,533 d-second pad portion; 550,550a,550b,550 c-solder balls.

Detailed Description

The invention may be embodied in many different forms. Representative embodiments are shown in the drawings and will be described in detail herein. The present disclosure encompasses examples or illustrations of principles and embodiments of the present disclosure are not to be limited to the embodiments shown.

Furthermore, relative terms (e.g., "upper" or "lower," "top" or "bottom," "left" or "right") may be used to describe the relationship of elements in the figures. It will be understood that relative terms encompass other relationships of the devices in addition to the relationships depicted in the figures. For example, if the device in one of the figures is turned over, elements described as "below" other elements would then be oriented "above" the other elements. The term "below" as illustrated can therefore also be interpreted as "above" and "below" in accordance with the structural relationship in the figures. Similarly, when an element is referred to as being "below" or "beneath" other elements in the drawings, it will be understood that the element is also "above" or "over" the other elements. Similarly, relative terms such as "below" or "beneath" may also be construed as "above" or "above" an element.

Please refer to fig. 1 and fig. 2. Fig. 1 illustrates a schematic perspective view of a semiconductor device 100 according to some embodiments of the present invention. Fig. 2 is a circuit diagram of the chip 200 of the semiconductor device 100 in fig. 1, but the circuit shown in fig. 2 is not limited to the semiconductor device 100 in fig. 1. In some embodiments of the present invention, the semiconductor device 100 includes a substrate 110 and a chip 200. The chip 200 is stacked on the substrate 110, and the chip 200 includes an active surface 210 and at least one metal pad 230. When the semiconductor device 100 includes two or more metal pads 230, the metal pads 230 are electrically connected to each other, but the metal pads 230 may be electrically separated from each other. Specifically, the metal pad 230 is located on the active surface 210, and the metal pad 230 includes a first pad 231 and a second pad 233, where the first pad 231 and the second pad 233 are separated from each other and form an open circuit. A conductive material may be selectively formed between the first pad 231 and the second pad 233 to form a closed circuit between the first pad 231 and the second pad 233.

The first pad 231 includes a convex structure and the second pad 233 includes a concave structure, wherein the convex structure of the first pad 231 extends toward the concave structure of the second pad 233. The concave structure of the second pad 233 surrounds the convex structure of the first pad 231. The convex structure of the first pad 231 may be triangular, rectangular or circular, and the shape of the concave structure of the second pad 233 corresponds to the convex structure of the first pad 231, which should not be construed as a limitation to the invention. When the formed conductive material simultaneously contacts the first pad 231 and the second pad 233, the raised structures and the recessed structures can be used as loading platforms and additional contact areas can be added to fix the conductive material.

In some embodiments of the present invention, the semiconductor device 100 further includes a metal ball 150, and the metal ball 150 contacts the first pad 231 and the second pad 233 to form a closed circuit. The metal balls 150 may be electrically connected to the contact pads 111 on the substrate 110 through conductive lines. The metal balls 150 contact at least the convex structure of the first pad portion 231 and the concave structure of the second pad portion 233, so that the metal balls 150 are stably disposed on the metal pad 230 through a large contact area.

In some embodiments of the present invention, the chip 200 includes a first metal pad 230a and a second metal pad 230b, and the second pad portion 233a of the first metal pad 230a contacts the second pad portion 233b of the second metal pad 230b to form a two-way switch (two-way switch). In other embodiments of the present invention, the first pad portion 231a of the first metal pad 230a contacts the first pad portion 231b of the second metal pad 230b, but the present invention is not limited thereto. According to some embodiments of the present invention, the first pad portion 231a of the first metal pad 230a contacts the second pad portion 233b of the second metal pad 230 b. According to other embodiments of the present invention, the second pad portion 233a of the first metal pad 230a contacts the first pad portion 231b of the second metal pad 230b, but the present invention is not limited thereto.

Referring to fig. 2, in some embodiments of the present invention, the semiconductor device 100 further includes a first transceiver 260 and a second transceiver 270, the first transceiver 260 includes an output end 261 and an input end 263, wherein the output end 261 is electrically connected to the first pad portion 231a of the first metal pad 230 a. The second transceiver 270 includes an output 271 and an input 273, wherein the input 273 is electrically connected to the second pad portion 233a of the first metal pad 230 a. Accordingly, a switch may be formed between the first transceiver 260 and the second transceiver 270. In some embodiments of the present invention, the second pad portion 233a of the first metal pad 230a contacts the second pad portion 233b of the second metal pad 230b to form a bidirectional switch, wherein the circuit can be selectively opened or closed by forming the metal ball 150 on the first metal pad 230a or the second metal pad 230 b.

In addition, the chip 200 may further include a third metal pad 230 c. When the second pad 233a of the first metal pad 230a contacts the second pad 233b of the second metal pad 230b, the first pad 231b of the second metal pad 230b contacts the first pad 231c or the second pad 233c of the third metal pad 230c to form a bidirectional switch. When the second pad portion 233a of the first metal pad 230a contacts the first pad portion 231b of the second metal pad 230b, the second pad portion 233b of the second metal pad 230b is electrically connected to the first pad portion 231c or the second pad portion 233c of the third metal pad 230 c. In this embodiment, the aforementioned bidirectional switch may determine whether a closed circuit or an open circuit is formed between the first transceiver 260 and the third metal pad 230c, and the bidirectional switch is located between the first transceiver 260, the second transceiver 270 and the third metal pad 230c, but the invention is not limited thereto.

In some embodiments of the present invention, the chip 200 further includes an input metal pad 230d, wherein the first pad 231d or the second pad 233d of the input metal pad 230d is electrically connected to the input terminal 263 of the first transceiver 260. When a conductive material (e.g., the metal ball 150a) is formed between the first pad 231d and the second pad 233d, a signal can be transmitted to the first transceiver 260 via the input metal pad 230 d. Accordingly, a signal transmission path within the chip 200 may be determined by selectively forming the metal balls 150 a.

In some embodiments of the present invention, the metal ball 150a simultaneously contacts the first pad 231d and the second pad 233d of the input metal pad 230d, and the other metal ball 150b simultaneously contacts the first pad 231a and the second pad 233a of the first metal pad 230a to form a closed circuit. In this embodiment, a signal may be transmitted from the input metal pad 230d to the second transceiver 270 via the first transceiver 260 and the first metal pad 230 a.

Referring to fig. 3 and 4, fig. 3 is a schematic perspective view of a semiconductor device 300 according to some embodiments of the present invention. Fig. 4 is a circuit diagram of the main chip 400 and the sub-chip 500 of the semiconductor device 300 in fig. 3. The semiconductor device 300 includes a substrate 310, a main chip 400, and at least one sub-chip 500. The main chip 400 is substantially identical to the chip 200. At least one metal pad 430 is disposed on the active surface 410 of the main chip 400, the metal pad 430 includes a first pad portion 431 and a second pad portion 433, and the first pad portion 431 and the second pad portion 433 are separated from each other, so that an open circuit is formed between the first pad portion 431 and the second pad portion 433, which is not limited thereto. In other embodiments of the present invention, metal pad 430 is integrally formed. The metal ball 350 may be disposed on the metal pad 430, and the metal ball 350 may simultaneously contact the first pad portion 431 and the second pad portion 433 to form a closed circuit therebetween. In addition, the main chip 400 is mounted on the substrate 310, and the main chip 400 includes an active surface 410 and at least one metal pad 430 on the active surface 410. The metal pads 430 may be electrically connected to the metal pads 430 on the substrate 310 through conductive wires. The main chip 400 may include metal pads 430 such as a first metal pad 430a, a second metal pad 430b, a third metal pad 430c and an input metal pad 430d, wherein the second metal pad 430b has a first pad portion 431b and a second pad portion 433b, the third metal pad 430c has a first pad portion 431c and a second pad portion 433c, and the input metal pad 430d has a first pad portion 431d and a second pad portion 433 d. The sub-chip 500 is stacked on the active surface 410 of the main chip 400, and the sub-chip 500 includes a first active surface 510 and at least one pad 530 on the first active surface 510. When the number of the pads 530 is greater than or equal to 2, the pads 530 may be electrically connected to each other. The pad 530 includes a first pad portion 531 and a second pad portion 533 separated from each other to form an open circuit between the first pad portion 531 and the second pad portion 533, wherein the first pad portion 531 includes a convex structure, and the second pad portion 533 includes a concave structure, and the convex structure of the first pad portion 531 extends toward the concave structure of the corresponding second pad portion 533. In addition, the concave structure of the second pad portion 533 surrounds the convex structure of the first pad portion 531. The convex structure of the first pad portion 531 may be triangular, rectangular or circular, and the concave structure of the second pad portion 533 may be correspondingly shaped, but the invention is not limited thereto.

Referring to fig. 3, the semiconductor device 300 further includes at least one solder ball 550, the solder ball 550 simultaneously contacts the first pad portion 531 and the second pad portion 533 of the pad 530 to form a closed circuit, and the solder ball 550 is electrically connected to the metal pad 430 of the main chip 400 through a conductive wire. Specifically, the solder ball 550 contacts the convex structure of the first pad portion 531 and the concave structure of the second pad portion 533 simultaneously, and the convex structure and the concave structure can be used as a loading platform and increase the contact area to fix the solder ball 550.

Referring to fig. 4, in some embodiments of the present invention, the pads 530 of the sub-chip 500 may be, for example, first pads 530a and second pads 530b, and the second pad portions 533a of the first pads 530a contact the second pad portions 533b of the second pads 530b to form a bidirectional switch, which can selectively open or close the circuit on the first pads 530a or the second pads 530b by selectively forming solder balls 550. In some embodiments of the present invention, the first pad portion 531a of the first pad 530a contacts the first pad portion 531b of the second pad 530b, but the present invention is not limited thereto. According to some embodiments of the present invention, the first pad portion 531a of the first pad 530a may contact the second pad portion 533b of the second pad 530 b.

In some embodiments of the present invention, the chiplet 500 further includes a first transceiver 560 and a second transceiver 570. The first transceiver 560 includes an output end 561 and an input end 563, wherein the input end 563 is electrically connected to the first pad portion 531a of the first pad 530 a. The second transceiver 570 includes an output end 571 and an input end 573, wherein the input end 573 is electrically connected to the second pad portion 533a of the first pad 530 a. Thus, the first pad 530a forms a switch between the first transceiver 560 and the second transceiver 570. In addition, the second pad portion 533a of the first pad 530a further contacts the second pad portion 533b of the second pad 530b to form a bidirectional switch, and an open circuit or a closed circuit can be selectively generated on the pad 530 (for example, the first pad 530a or the second pad 530b) by selectively forming the solder ball 550.

In addition, the sub-chip 500 further includes a third pad 530 c. When the second pad portion 533a of the first pad 530a contacts the second pad portion 533b of the second pad 530b, the first pad portion 531b of the second pad 530b is electrically connected to the first pad portion 531c or the second pad portion 533c of the third pad 530c to form the bidirectional switch. When the second pad portion 533a of the first pad 530a contacts the first pad portion 531b of the second pad 530b, the second pad portion 533b of the second pad 530b is electrically connected to the first pad portion 531c or the second pad portion 533c of the third pad 530c to form a bidirectional switch, which is not limited in the disclosure. In some embodiments, the bidirectional switch may determine whether a closed circuit or an open circuit is formed between the third pad 530c and the first transceiver 560, and the bidirectional switch is formed between the first transceiver 560, the second transceiver 570 and the third pad 530c of the sub-chip 500.

The sub-chip 500 may further include an input pad 530d, and the first pad portion 531d or the second pad portion 533d of the input pad 530d is electrically connected to the input end 563 of the first transceiver 560. If a conductive substance (e.g., a solder ball 550) is formed and contacted between the first pad portion 531d and the second pad portion 533d, a signal can be transmitted to the first transceiver 560 through the input pad 530 d.

In some embodiments of the present invention, the semiconductor device 300 includes a first sub-chip 500a fixed on the main chip 400. As shown in fig. 4, the metal ball 350a is disposed on the input metal pad 430d and simultaneously contacts the first pad portion 431d and the second pad portion 433 d. Another metal ball 350b is disposed on the first metal pad 430a and simultaneously contacts the first pad portion 431a and the second pad portion 433a of the first metal pad 430 a. Accordingly, a signal may be transmitted from the input metal pad 430d to the second transceiver 470 via the first transceiver 460 and the first metal pad 430 a. Moreover, the first transceiver 460 and the second transceiver 470 are substantially the same as the first transceiver 260 and the second transceiver 270, but the invention is not limited thereto.

In addition, the solder ball 550a is disposed on the second pad 530b of the first sub-chip 500a to contact the first pad portion 531b and the second pad portion 533b, and the solder ball 550a is electrically connected to the metal ball 350b on the first metal pad 430a through a conductive wire. Thereby, a signal may be transmitted from the input metal pad 430d of the main chip 400 to the second transceiver 570 of the first sub-chip 500 a.

Specifically, the first pad portion 531a and the second pad portion 533a of the first pad 530a are separated from each other, so that an open circuit is formed between the first transceiver 560 and the second transceiver 570 to prevent a signal from being transmitted from the first transceiver 560 to the second transceiver 570. Therefore, the circuit relationship between the first transceiver 560 and the second transceiver 570 can be easily adjusted to simplify the assembly process and reduce the manufacturing cost, and even to generate a stacked semiconductor package structure with good structural strength.

Referring to fig. 5 and 6, fig. 5 is a schematic perspective view of a semiconductor device 300a according to some embodiments of the present invention. Fig. 6 is a circuit diagram of the main chip 400 and the sub-chips 500a and 500b of the semiconductor device 300a in fig. 5, but fig. 6 is not intended to limit the circuit structure of the semiconductor device 300a in fig. 5. In some embodiments of the present invention, the semiconductor device 300a includes a substrate 310, a main chip 400 fixed on the substrate 310, a first sub-chip 500a, and a second sub-chip 500 b. The first sub-chip 500a is stacked on the active surface 410 of the main chip 400, and the second sub-chip 500b is stacked on the first active surface 510 of the first sub-chip 500 a. As shown in fig. 6, three metal balls 350a,350b,350c are disposed on the first metal pad 430a, the second metal pad 430b and the input metal pad 430d, respectively. In addition, two solder balls 550a and 550b are respectively disposed on the second pads 530b of the first sub-chip 500a and the second pads 530b of the second sub-chip 500 b. The first conductive line is formed between the metal ball 350b on the first metal pad 430a and the solder ball 550a on the second pad 530b in the first sub-chip 500 a. The second conductive line is formed between the metal ball 350c on the second metal pad 430b and the solder ball 550b on the second pad 530b in the second sub-chip 500 b. The second transceiver 570 of the first sub-chip 500a and the second transceiver 570 of the second sub-chip 500b are electrically connected to the first transceiver 460. Therefore, signals can be transmitted from the input metal pads 430d to the second transceivers 570 of the first and second chiplets 500a and 500b without being interfered by the first transceivers 560 of the first and second chiplets 500a and 500 b.

Referring to fig. 7 and 8, fig. 7 is a schematic perspective view of a semiconductor device 300b according to some embodiments of the present invention. Fig. 8 is a circuit diagram of the main chip 400 and the sub-chips 500a, 500b, and 500c of the semiconductor device 300b in fig. 7, but fig. 8 does not limit the circuit structure of the semiconductor device 300b in fig. 7. Compared to the semiconductor device 300a, the semiconductor device 300b further includes a third sub-chip 500c, and the third sub-chip 500c is stacked on the first active surface 510 of the second sub-chip 500 b. As shown in fig. 8, four metal balls 350a,350b,350c,350d are disposed on the first metal pad 430a, the second metal pad 430b, the third metal pad 430c, and the input metal pad 430d, respectively. In addition, three solder balls 550a,550b,550c are respectively disposed on the second pads 530b of the first sub-chip 500a, the second pads 530b of the second sub-chip 500b, and the second pads 530b of the third sub-chip 500 c. The first conductive line is formed between the metal ball 350b on the first metal pad 430a and the solder ball 550a on the second pad 530b in the first sub-chip 500 a. The second conductive line is formed between the metal ball 350c on the second metal pad 430b and the solder ball 550b on the second pad 530b in the second sub-chip 500 b. The third conductive line is formed between the metal ball 350d on the third metal pad 430c and the solder ball 550c on the second pad 530b in the third sub-chip 500 c. The second transceivers 570 of the first sub-chip 500a, the second sub-chip 500b and the third sub-chip 500c are electrically connected to the first transceiver 460. Therefore, signals can be transmitted from the input metal pads 430d to the second transceivers 570 of the first, second and third sub-chips 500a, 500b and 500c without being interfered by the first transceivers 560 of the first, second and third sub-chips 500a, 500b and 500 c.

In summary, the metal pads on the chip include the first metal pad portion and the second metal pad portion separated from each other to form an open circuit. The metal ball can be selectively formed on the metal pad, so as to form a closed circuit between the first metal pad portion and the second metal pad portion. By selectively forming the metal balls, the circuit of the chip can be simply and rapidly adjusted, and thus the chip can be applied to the field of packaging of semiconductors to reduce the production cost. In addition, the convex structure of the first metal pad part extends towards the concave structure of the second metal pad part, thereby providing a loading platform and increasing the contact area between the metal ball and the metal pad.

From the above detailed description of the specific embodiments of the present invention, it is obvious that although the present invention has been disclosed in the above embodiments, the present invention is not limited thereto, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, so that the scope of the present invention is defined by the appended claims.